Abstract: Disclosed are a decoding method and a decoding device. The decoding method includes: performing a permutation processing on a receiving sequence and a generator matrix to obtain a permuted receiving sequence and an intermediate generator matrix according to a reliability of each bit of the receiving sequence; performing a Gaussian elimination processing on the intermediate generator matrix to obtain a systematic generator matrix generator matrix; performing a hard-decision decoding on the permuted receiving sequence to obtain a hard-decision decoding sequence; in response to determining a preset decoding end condition is not achieved, selecting a target error pattern from an error pattern set; and generating a decoding result based on the target error pattern, the hard-decision decoding sequence, and the systematic generator matrix. The decoding method can ensure the decoding performance and reduce the decoding complexity.

Abstract: Methods, systems, and devices for bit retiring to mitigate bit errors are described. A memory device may retrieve a set of bits from a first row of an address space and may determine that the set of bits includes one or more errors. The memory device may remap at least a portion of the first row from a first row index to a second row index, where the second row index, before the remapping, corresponds to a second row within the address space addressable by the host device. Additionally or alternatively, the memory device may receive a first command to access a first logical address of a memory array that is associated with a first row index. The memory device may determine that the first row includes one or more errors and may transmit a signal indicating that the first row includes the one or more errors.

Abstract: The present technology may include an error correction code engine configured to generate a parity bit and syndrome information by performing an operation according to operation source data, and a data processing circuit configured to simultaneously output the parity bit and first delay data, which is generated by delaying input data by a first time according to a write operation, simultaneously output the syndrome information and second delay data, which is generated by delaying input data by a second time according to a read operation, and to share substantially the same signal path in generating the first delay data and in generating the second delay data.

Abstract: A method may include, during a PEI phase BIOS, responsive to a flag being set in a previous boot session of an information handling system to test a first designated region of a memory of the information handling system: testing the first designated region for a memory fault; in response to detecting the memory fault, mapping out the first designated region and designating an additional region of the memory as a designated region for SMRAM and repeating testing of additional designated regions, mapping out of failed additional designated regions, and designating new additional regions of the memory until a designated region passes testing without memory fault; and in response to detecting passage of testing without memory fault of a designated region comprising either of the first designated region or an additional region of the memory, configuring the designated region for use as the SMRAM for the information handling system.

Abstract: Reduced complexity encoders and related systems, apparatuses, and methods are disclosed. An apparatus includes a data storage device and a processing circuitry. The data storage device is to store a first data part of a transmit data frame. The transmit data frame is received from one or more higher network layers that are higher than a physical layer. The transmit data frame includes the first data part and a second data part. The second data part includes data bits having known values. The processing circuitry is to retrieve the first data part of the transmit data frame from the data storage device and determine parity vectors for the transmit data frame independently of the second data part responsive to the first data part.

Abstract: The present disclosure provides a chip test method, apparatus, and a device, and a storage medium. The chip test method includes: determining a register test adaptation file based on a register description file under a preset test environment, wherein a form of the register test adaptation file matches that of a predetermined test case template; constructing a test case based on the register test adaptation file and the test case template, and executing the test case to test a chip, wherein the determining a register test adaptation file further includes: when the preset test environment changes, determining change information of the register description file in response to the change; and changing the register test adaptation file based on the change information.

Abstract: A semiconductor device which includes a termination circuit coupled to a first pad and suitable for providing a termination resistance according to a first control code and a second control code during a normal operation in which data are input and output through the first pad; a stress replica circuit suitable for replicating a stress applied to the termination circuit during the normal operation and for generating a detection code during a second calibration mode; a first calibration circuit suitable for adjusting the first control code to match an impedance of a resistor part coupled to a second pad to an external resistor during a first calibration mode; and a second calibration circuit suitable for generating the second control code by adjusting the first control code according to the detection code during the second calibration mode.

Abstract: Technology is disclosed for a fast ECC engine for a mixed read of MRAM cells. A codeword read from MRAM cells using a referenced read is decoded using a first ECC mode. If decoding passes, results are provided to a host. If decoding fails, a self-referenced read (SRR) is performed. The data read using the SRR is decoded with a second ECC mode that is capable of correcting a greater number of bits than the first ECC mode. The second ECC mode may have a higher mis-correction rate than the first ECC mode (for a given raw bit error rate (RBER)). However, the RBER may be lower when using the second ECC mode. Therefore, the first and second ECC modes may result in about the same probability of an undetectable error (or mis-correction).

Abstract: Disclosed is a test circuit for testing an integrated circuit core or an external circuit of the integrated circuit core. The test circuit may not only transmit a cell function input to a cell function output using only one multiplexer in a bypass mode, may but also use a clock gating scheme capable of blocking a clock signal from transmitting to a scan flip-flop to hold a capture procedure.

Abstract: A system and method for detecting and correcting memory errors in CXL components is presented. The method includes receiving, into a decoder, a memory transfer block (MTB), wherein the MTB comprises data and parity information, wherein the MTB is arranged in a first dimension and a second dimension. An error checking and a correction function on the MTB is performed using a binary hamming code logic within the decoder in the first dimension. An error checking and a correction function on the MTB is performed using a non-binary hamming code logic within the decoder in the second dimension. Further, the binary hamming code logic and the non-binary hamming code logic perform the error checking on the MTB simultaneously.

Abstract: Provided is a communication device that implements error correction in a physical layer in combination with HARQ. The communication device on the transmitting side adds a CRC sequence to an information sequence, divides an information sequence having a CRC sequence added thereto into a plurality of sequences, implements first FEC coding by using a sequence obtained by division, adds a CRC sequence to a coded sequence obtained after first FEC coding, implements second FEC coding by using a coded sequence having a CRC sequence added thereto, couples coded sequences obtained after second coding, transmits a coded information sequence obtained after coupling to another communication device, and controls retransmission with a coded sequence obtained after first coding as a unit.

Abstract: Methods, systems, and devices for topology-based retirement in a memory system are described. In some examples, a memory system or memory device may be configured to evaluate error conditions relative to a physical or electrical organization of a memory array, which may support inferring the presence or absence of defects in one or more structures of a memory device. For example, based on various evaluations of detected errors, a memory system or a memory device may be able to infer a presence of a short-circuit, an open circuit, a dielectric breakdown, or other defects of a memory array that may be related to wear or degradation over time, and retire a portion of a memory array based on such an inference.

Abstract: A memory is provided in which a scan chain covers the redundancy logic for column redundancy as well as the redundancy multiplexers in each column. The redundancy logic includes a plurality of redundancy logic circuits arranged in series. Each redundancy logic circuit corresponds to a respective column in the memory. Each column is configured to route a shift-in signal through its redundancy multiplexers during a scan mode of operation.

Abstract: The present disclosure provides a DFT architecture for ICs and a method for testing the ICs with the proposed DFT architecture. The present disclosure also includes a focus on USB PD protocol with respect to the DFT architecture. The present disclosure also includes focus on testing IC with single I/O pin. The DFT architecture primarily comprises of a test mode controller and reuses the USBPD protocol framework logic comprising analog USBPD CC circuitry in analog block and the USBPD signaling, protocol logic in digital block for the test purposes. The DFT architecture is implemented with analog test modes and digital test modes using a single I/O pin, wherein analog test modes comprises of analog trims and observation modes and digital test modes comprises of LBIST, ATPG and digital observation modes. The method disclosed is directed to the functions associated with testing the USBPD ICS using single I/O pin.

Abstract: A UART includes a transmission register, a receive register, a virtual remappable pin, a parity error check circuit to evaluate contents of the receive register for a parity error, and control logic to determine contents of the transmission register. The contents include underlying data and a parity bit based thereupon. The control logic is to route the contents through the first virtual remappable pin to the receive register. The control logic is to, before reception of the entire contents at the receive register, cause modified contents to be provided to the receive register. The modified contents are to cause a parity error. The modified contents are to include different underlying data or a different parity bit than the contents of the transmission register. The control logic is to determine whether the parity error check circuit detected the parity error.

Abstract: A memory-testing circuit configured to perform a test of reference bits in a memory. In a read operation, outputs of data bit columns are compared with one or more reference bit columns. The memory-testing circuit comprises: a test controller and association adjustment circuitry configurable by the test controller to associate another one or more reference bit columns or one or more data bit columns with the data bit columns in the read operation. The test controller can determine whether the original one or more reference bit columns have a defect based on results from the two different association.

Abstract: A read disturb information determination system includes a storage device coupled to a global read temperature identification system. The storage device reads, from a first row in a storage subsystem in the storage device, data stored in bits that were previously identified as being susceptible to read disturb effects, and error correction information associated with the data. The storage device uses the error correction information to identify a number of the bits that store portions of the data with errors and, based on the number of bits that store portions of the data with errors, determines read disturb information for the first row in the storage subsystem in the storage device. The storage device then uses the read disturb information to generate a read temperature for a second row in the storage subsystem in the storage device, and provides the read temperature to the global read temperature identification system.

Abstract: Embodiment techniques map parity bits to sub-channels based on their row weights. In one example, an embodiment technique includes polar encoding, with an encoder of the device, information bits and at least one parity bit using the polar code to obtain encoded data, and transmitting the encoded data to another device. The polar code comprises a plurality of sub-channels. The at least one parity bit being placed in at least one of the plurality of sub-channels. The at least one sub-channel is selected from the plurality of sub-channels based on a weight parameter.

Abstract: A transmitter is provided. The transmitter includes: a Low Density Parity Check (LDPC) encoder configured to encode input bits to generate an LDPC codeword including the input bits and parity bits to be transmitted in a current frame; a parity permutator configured to perform by group-wise interleaving a plurality of bit groups configuring the parity bits based on a group-wise interleaving pattern comprising a first pattern and a second pattern; a puncturer configured to puncture some of the parity-permutated parity bits; and an additional parity generator configured to select at least some of the punctured parity bits to generate additional parity bits to be transmitted in a previous frame of the current frame, based on the first pattern and the second pattern.

Abstract: A memory system according to an embodiment includes a nonvolatile memory and a memory controller. The nonvolatile memory includes a plurality of memory cells. The memory controller is configured to control the nonvolatile memory. In read operation for the memory cells, the memory controller is configured to: perform tracking including a plurality of reads in which a read voltage is shifted; determine a hard bit read voltage based on results of the tracking; calculate a soft bit read voltage based on the determined hard bit read voltage; perform soft bit read using the calculated soft bit read voltage; and perform a soft bit decoding process using a result of the soft bit read and a log-likelihood ratio table associated with the calculated soft bit read voltage.