Abstract: A flash memory card test device with multiple interfaces is disclosed. The flash memory card test device comprises at least one connection interface adaptor board and a test circuit board. The test circuit board is adapted for determining a specification of a flash memory to be tested and transmitting a test signal to test the flash memory.
Abstract: Combining a plurality of local flow measurements made at more than one location to generate a composite flow value can improve the accuracy of the overall measurement. The reliability and long term accuracy of a multi-sensor flow measurement are improved by a two-step process. During an initial learning period, when all of the local sensors are providing accurate local measurements, a calibration table is built up that associates each calculated composite flow value with the set of local flow signal values from which it was calculated. In a subsequent operational period each time the composite flow rate is to be determined the flow meter apparatus first checks to see if all the local sensors are working properly and, if one of them is not working properly, its output is replaced with the corresponding value from the calibration table.
Abstract: A performance adder for providing a running total of performance values within an integrated circuit chip. The performance adder is triggered by various performance events as determined through multiplexer logic for detecting occurrence of a particular performance event. The multiplexer logic can also trigger the performance adder through atomic, edge, toggle, or on/off signals related to the performance events or through a logical function of a combination of performance events. The performance adders can be used to compute average latency of a component in the circuit.
Type:
Grant
Filed:
June 9, 2004
Date of Patent:
January 20, 2009
Assignee:
Hewlett-Packard Development Company, L.P.
Abstract: A system and method for providing an additional option function to existing functionality of a meter device configured for measuring parameters of energy is provided. The meter device is coupled with an option device for exchanging data between the meter and the option devices along at least one data path, including exchanging initialization data provided by the option device between the meter device and the option device, wherein the initialization data is useable by the meter device for configuring the meter device to be in condition to operate with the option device. The data exchanged between the meter device and the option devices are processed by at least one processor. Upon the coupling of the devices and the exchanging of the initialization data, the meter device is operated with the option device for adding the option function to existing functionality of the meter device.
Abstract: A sensing system, including: a sensing assembly, the sensing assembly having: a trim resistor; and a controller removably secured to the sensing assembly, the controller being configured to determine a resistance value of the trim resistor; a database in operable communication with the controller, the database having a plurality of resistance values, each identifying a pair of compensation values; a microprocessor receiving the resistance value of the trim resistor, a first signal and a second signal, the resistance value of the trim resistor being used to define a selected pair of compensation values from the database, one of the selected pair of compensation values is used to adjust the first signal and the other one of the selected pair of compensation values is used to adjust the second signal.
Type:
Grant
Filed:
January 26, 2007
Date of Patent:
January 13, 2009
Assignee:
Delphi Technologies, Inc.
Inventors:
Charles Scott Nelson, David Cabush, Kenneth D. Mowery
Abstract: An apparatus for detecting spectral components in a predetermined frequency band within a signal includes first and second processing devices and first, second, and third connectors tuned to the frequency band. The first processing device includes first, second, and third elements. The second processing device includes fourth, fifth, and sixth elements. The first connector is coupled to the first and fourth elements, the second connector to the second and fifth elements, and the third connector to the third and sixth elements. An apparatus for analyzing spectral components in predetermined frequency bands within a signal includes an input for receiving the signal, a device for isolating a portion of the signal, and frequency detectors coupled in parallel to the device. Each frequency detector corresponds to a frequency band and generates an output signal component corresponding to a proportion of energy of the spectral components detected by the frequency detector.
Abstract: Apparatus including functional components of circuitry defined on a semiconductor chip, the functional components including a component having modifiable operating characteristics, a performance measuring circuit providing an output indicative of operating characteristics of the circuitry defined on the semiconductor chip during operation of the circuitry, and computer implemented software means for controlling a value for an operating characteristic of the component having modifiable operating characteristics in response to the output provided by the performance measuring circuit.
Abstract: The system provides a technique for detecting changes in behavior of a computer system. An address data storing unit obtains an address being accessed by a CPU at prescribed sampling intervals, stores address data comprising the address and its acquisition time in an address record table in time series. Then an executed process detector detects the name of the process that was executed when the address data was obtained, and sets the process name for the address data in the address record table. When an analysis request specifying an analysis time period is made, an analyzer counts up each of the process names included in the address data being stored in the address record table for each specified analysis time period, and analyzes the breakdown of executed processes for each analysis time period. Then a display unit displays the analysis result of the analyzer.
Abstract: A surface profile measuring method using a broad bandwidth light source illuminating a sample surface and a reference surface through a splitter is provided. By changing a distance between the sample surface and the reference surface with a constant step, an interference diagram with a waveform composed of interference data points depicting a relationship of surface height versus illumination intensity is generated. In the beginning, a first data point with greatest illumination intensity is selected from the interference data points on the waveform. Then, a second data point is selected from the data points on the waveform within a predetermined range centered at the first data point to have the waveform showing best quality of symmetry. Then, a peak of a fringe defined by the second data point and its neighboring data points is estimated by using phase compensating approach.
Abstract: A method and system to detect and evaluate harmonic distortion in an electrical power system is disclosed. A plurality of monitoring devices is installed in the electrical power system. The hierarchy of the electrical power system is received. Data indicative of harmonic distortion on the electrical power system is received from at least two of the monitoring devices. The data indicative of harmonic distortion is automatically aligned in a temporal or pseudo-temporal context. An electrical characteristic of the harmonic distortion from the data indicative of harmonic distortion is determined.
Abstract: Method and apparatus for determining the flow rates and/or composition of a fluid comprising a multi-component mixture of a gas and at least one liquid in a pipe. Electromagnetic loss and phase measurements are performed in at least two directions of the pipe; the degree of annular flow is determined based on these measurements; the permittivity of the flow mixture is calculated, including corrections for the degree of annular flow; the mixture density is measured and compensated for the degree of annular flow; the temperature and pressure are obtained; the velocity of liquid and gas are determined, and based on the knowledge of densities and permittivities of the components of the fluid mixture, and the result from the above steps, the volume and mass flow rates of the gas and liquid(s) of the fluid mixture are calculated.
Abstract: An integrity management system predicts abnormalities in complex systems before they occur based upon the prior history of abnormalities within the complex system. A topology of the nodes of a complex system is generated and data is collected from the system based on predetermined metrics. In combination with dynamic thresholding, fingerprints of the relevant nodes within a complex system at various time intervals prior to the occurrence of the abnormality are captured and weighted. The fingerprints can then be applied to real-time data provide alerts of potential abnormality prior to their actual occurrence.
Abstract: A circuit for detecting noise events in a system with time variable operating points is provided. A first voltage, which is averaged over time, is compared to a second voltage. A signal is generated to instruct circuits within a processor to initiate actions to keep a voltage from drooping further.
Type:
Grant
Filed:
May 30, 2006
Date of Patent:
December 16, 2008
Assignee:
International Business Machines Corporation
Inventors:
Daniel Douriet, Anand Haridass, Andreas Huber, Colm B. O'Reilly, Bao G. Truong, Roger D. Weekly
Abstract: The invention provides a method for testing a circuit operation (circuit simulation), which is conducted by using a model of high precision. After parameters are extracted by using a model of which physical precision is low and parameter extraction time is short from measurement data, the parameters are converted to those obtained by a model of which parameter extraction time is generally long and a circuit operation test is performed by a model of high physical precision. In other words, a parameter is extracted first by a model of low physical precision and then, the extracted parameter is converted into a parameter obtained by the model of high physical precision. Finally, a circuit operation test is performed by using the model having high physical precision.
Type:
Grant
Filed:
December 21, 2006
Date of Patent:
December 9, 2008
Assignee:
Semiconductor Energy Laboratory Co., Ltd.
Abstract: A system and method of indicating power quality in an electric power system that generates an indication of power quality reflective of the worst observed power quality event over both a short and a long interval of time in which each component of the indicator is weighted by a user programmable factor to control its relative influence.
Abstract: A method for estimating the concentration of a particular gas in a gas mixture having a fluctuating pressure is provided. A sensor output signal indicating the concentration of a particular gas in the gas mixture is received from a gas sensor. The received sensor output signal may vary over time due to the fluctuating pressure of the gas mixture. The received sensor output signal may be processed to determine an estimate of the concentration of the particular gas in the gas mixture. The processing may include performing an autocorrelation of the signal. In some embodiments, the particular gas is oxygen and the method is used to estimate the concentration of oxygen in a gas mixture having a fluctuating pressure.
Abstract: There is provided a system and method for monitoring an apparatus from a remote location. A vendor-side computer obtains operating state data obtained by a monitoring device provided in an apparatus via a communication line, and monitors the operating state of the apparatus from a remote location. Maintenance data at a part replacing time is transmitted from the apparatus, and the vendor-side computer that has received maintenance data calculates an optimal replacement period of a part based on this. The calculated optimal replacement period of each part is sent to a plant. The plant feeds the optimal replacement period back to the operating of the apparatus.
Abstract: A method and system for generating an uncertainty value. At least some of the illustrative embodiments are systems comprising a device in fluid communication with a conduit, and a flow computer electrically coupled to the device. The flow computer is configured to generate a flow value based on parametric data, and the flow computer is configured to generate an uncertainty value of the flow value based on the parametric data and on an accuracy value received from the device.
Type:
Grant
Filed:
May 22, 2006
Date of Patent:
November 4, 2008
Assignee:
Daniel Measurement and Control, Inc.
Inventors:
Damon J. Ellender, Duane B. Toavs, Randy R. Page
Abstract: Embodiments of the present invention use the results of a plurality of defect detecting tests and adjust the result of each test in a manner that reflects the accuracy of the test that produced it. A manufactured unit can then be evaluated using a mathematical combination of the adjusted results.
Abstract: An apparatus and method of processing flow meter data to filter out signal noise is provided. The method includes defining the flow meter data as a k-? plane, wherein the k-? plane includes a first k-plane quadrant separated from a second k-plane quadrant by a predetermined axis. The flow meter data includes a first data set disposed within the first k-plane quadrant and a second data set disposed within the second k-plane quadrant. The first data set and the second data set are disposed symmetrically about the predetermined axis and subtracting the first data set from the second data set to obtain a resultant data set.