Patents Examined by Isiaka O. Akanbi
  • Patent number: 11333533
    Abstract: A grating measuring module includes a light source, a collimating device, a first grating, a second grating, and an image sensing chip. The first grating is arranged on an optical path of the collimating device and the second grating is arranged on an optical path of the first grating. Each of the two gratings comprises a first pattern and a plurality of second patterns locating at the both sides of the first pattern. The first and second gratings can each be attached to an object which may be displaced in relation to another object, so allowing light of a certain pattern to pass depending on the magnitude of the displacement. The image sensing chip arranged on an optical path from the second grating receives light emitted from the light source and forms an image from which a displacement can be calculated and displayed.
    Type: Grant
    Filed: April 7, 2020
    Date of Patent: May 17, 2022
    Assignee: TRIPLE WIN TECHNOLOGY (SHENZHEN) CO. LTD.
    Inventors: Wen-Ching Lai, Chao-Yu Qin, Yu-An Cho
  • Patent number: 11326865
    Abstract: A calibration configuration for a chromatic range sensor (CRS) optical probe of a coordinate measurement machine (CMM) includes a cylindrical calibration object and a spherical calibration object. The cylindrical calibration object includes at least a first nominally cylindrical calibration surface having a central axis that extends along a Z direction that is intended to be aligned approximately parallel to a rotation axis of the CRS optical probe. The spherical calibration object includes a nominally spherical calibration surface having a first plurality of surface portions. The CMM is operated to obtain radial distance measurements and determine cylindrical calibration data using radial distance measurements of the cylindrical calibration object and to determine spherical calibration data using radial distance measurements of the spherical calibration object.
    Type: Grant
    Filed: August 24, 2020
    Date of Patent: May 10, 2022
    Assignee: Mitutoyo Corporation
    Inventor: Joseph Daniel Tobiason
  • Patent number: 11326980
    Abstract: Disclosed is a method for determining a parameter of an optical device including at least an optical lens, the method including: an optical system providing step, during which an optical system including a visual target, the optical device and an image acquisition module is provided in an initial configuration state, a parameter determining step during which a parameter of the optical device is determined based on the blur level of the images of the visual target acquired by the image acquisition module through the optical device in at least two different configuration states.
    Type: Grant
    Filed: February 22, 2016
    Date of Patent: May 10, 2022
    Assignee: Essilor International
    Inventors: Dominick Hubacz, Stéphane Gueu
  • Patent number: 11326997
    Abstract: A surface wettability determination system includes a sprayer, a light emission device and an optical detector. The sprayer is provided to spray a liquid on a detected surface of a detected object. The light emission device is provided to emit a light beam toward the detected surface. The light beam is reflected by the liquid on the detected surface to generate a reflected light. The optical detector is provided to receive the reflected light and output a determining signal, and the determining signal is related to a wettability of the detected surface.
    Type: Grant
    Filed: September 27, 2019
    Date of Patent: May 10, 2022
    Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Jen-You Chu, Feng-Sheng Kao, Yun-Hsin Wang
  • Patent number: 11327007
    Abstract: A method for detecting foreign particles in a liquid, the method may include transmitting transmitted pulses of radiation, by a transmitter, towards a liquid conduit that is filled with liquid; wherein the transmitted pulses comprises pulses that differ from each by being associated with absorbance frequencies of different foreign particles; receiving, by a receiver, received pulses that propagated through liquid as a result of the transmission of the multiple transmitted pulses; comparing between the transmitted pulses and the received pulses to provide a comparison result; determining a liquid contamination based on the comparison result; and cleaning, by a cleaning unit, the liquid conduit with a cleaning solution; wherein a cleaning material of the cleaning solution is supplied from a compressible cleaning material reservoir.
    Type: Grant
    Filed: September 26, 2019
    Date of Patent: May 10, 2022
    Inventor: Giora Erlich
  • Patent number: 11320370
    Abstract: An enclosure permits ingress of an infrared light beam and ultrasonic signal entering the enclosure from two different locations and facilitates their exit from the enclosure along a substantially similar egress path. The enclosure contains fluid which propagates the ultrasonic wave and a glass element which reflects the ultrasonic wave from its ingress direction onto an egress path. The fluid is an index matching fluid having a refractive index the same as the refractive index of the glass element, rendering the glass element transparent to the infrared light beam. Thus, the infrared light beam, having been induced into the enclosure on an entry path directed through the glass element, passes through the glass element without being reflected or refracted by it, placing the infrared light beam on a substantially similar path to that of the ultrasonic wave for egress of both waves from the enclosure at substantially the same point.
    Type: Grant
    Filed: June 25, 2020
    Date of Patent: May 3, 2022
    Assignee: Open Water Internet Inc.
    Inventor: Craig Newswanger
  • Patent number: 11320572
    Abstract: This disclosure provides a NDIR gas sensor comprising: an optical filter having a substrate and a multilayer film; and an infrared light emitting and receiving device having a semiconductor layer of a first conductive type, an active layer, and a semiconductor layer of a second conductive type; where the multilayer film has a structure in which a first layer and a second layer are alternately stacked; the active layer contains InAsySb1-y (0.1?y?0.2); and the optical filter includes a wavelength range having an average transmittance of 70% or more with a width of 50 nm or more in a wavelength range of 6 ?m to 10 ?m, and has a maximum transmittance of 10% or more in a wavelength range of 12.5 ?m to 20 ?m and an average transmittance of 5% or more and 60% or less in a wavelength range of 12.5 ?m to 20 ?m.
    Type: Grant
    Filed: March 30, 2020
    Date of Patent: May 3, 2022
    Assignee: Asahi Kasei Microdevices Corporation
    Inventor: Kengo Sasayama
  • Patent number: 11300521
    Abstract: A method for automatic defect classification, the method may include (i) acquiring, by a first camera, at least one first image of at least one area of an object; (ii) processing the at least one first image to detect a group of suspected defects within the at least one area; (iii) performing a first classification process for initially classifying the group of suspected defects; (iii) determining whether a first subgroup of the suspected defects requires additional information from a second camera for a completion of a classification; (iv) when determining that the first subgroup of the suspected defects requires additional information from the second camera then: (a) acquiring second images, by the second camera, of the first subgroup of the suspected defects; and (b) performing a second classification process for classifying the first subgroup of suspected defects.
    Type: Grant
    Filed: June 14, 2018
    Date of Patent: April 12, 2022
    Assignee: CAMTEK LTD.
    Inventors: Menachem Regensburger, Daniel Buzaglo
  • Patent number: 11300479
    Abstract: A device for measuring the optical power of an optical test system includes an optical-object-generating assembly, a support for the optical test system, a digital image detector, and a deflector assembly. The deflector assembly is intended to generate a lateral movement in respect of the initial optical image, thereby producing a shifted optical image and a reference optical image. The digital image detector captures the shifted optical image and the reference optical image in at least one digital image containing data relating to the lateral movement. The device also includes a processing component to calculate the optical power of the optical test system from the data relating to the lateral movement.
    Type: Grant
    Filed: June 28, 2018
    Date of Patent: April 12, 2022
    Assignees: CONSEJO SUPERIOR DE INVESTIGACIONES CIENTÍFICAS, 2EYES VISION S.L.
    Inventors: Carlos Dorronsoro Díaz, Enrique Gambra Urralburu, Xoana Barcala Gosende, Victor Rodríguez López, Susana Marcos Celestino
  • Patent number: 11287314
    Abstract: Described herein is a method of evaluating artificial lighting of a surface. The method may comprise measuring a first lumen output at a first location on the surface at a first altitude. The method may further comprise photographing the surface from a second altitude to obtain an aerial photograph of the surface comprising a plurality of pixels, each pixel of the plurality of pixels having a second lumen output, and performing an altitude adjustment on the second lumen output to obtain a third lumen output. The method may comprise dividing the aerial photograph into a plurality of zones, each zone corresponding to a section of the surface. The method may further comprise establishing a user-defined threshold lumen output for each zone of the plurality of zones, and identifying a percentage of the total number of pixels in each zone which meets or exceeds the user-defined threshold lumen output.
    Type: Grant
    Filed: February 26, 2021
    Date of Patent: March 29, 2022
    Assignee: Roof Asset Management USA Ltd.
    Inventor: Joseph C. Cobb
  • Patent number: 11280728
    Abstract: The invention relates, inter alia, to a device (10) for analysing a material (101), comprising an excitation emission device (100) for generating at least one electromagnetic excitation beam (SA), particularly an excitation light beam, with at least one excitation wavelength, and further comprising a detection device (106) for detecting a reaction signal (SR), and a device (107) for analysing the material on the basis of the detected reaction signal (SR).
    Type: Grant
    Filed: December 7, 2016
    Date of Patent: March 22, 2022
    Assignee: DiaMonTech AG
    Inventors: Alexander Bauer, Otto Hertzberg, Thorsten Lubinski
  • Patent number: 11280729
    Abstract: An optical density measuring apparatus for measuring density of a gas or a liquid to be measured includes a light source capable of irradiating light into a core layer, a detector capable of receiving light propagated through the core layer, and an optical waveguide that includes a substrate and the core layer. The core layer includes a light propagation unit and a first diffraction grating unit that receives light from the light source and guides the light to the light propagation unit, which includes a propagation channel capable of propagating light in an extending direction of the light propagation unit. The first diffraction grating unit is disposed near to and facing a light-emitting surface of the light source. The first diffraction grating unit includes first diffraction gratings, at least two of which receive light emitted from the same light-emitting surface of the light source.
    Type: Grant
    Filed: March 23, 2020
    Date of Patent: March 22, 2022
    Assignee: Asahi Kasei Microdevices Corporation
    Inventors: Toshiro Sakamoto, Takaaki Furuya
  • Patent number: 11274913
    Abstract: A stylus is arranged on a coordinate measuring machine. A method for aligning a component in relation to the coordinate measuring machine includes positioning the stylus and the component in relation to one another according to a defined arrangement. The method includes acquiring at least one coordinate of the component. The method includes changing at least one of a position and an orientation of the component in relation to the coordinate measuring machine while maintaining the defined arrangement.
    Type: Grant
    Filed: April 10, 2020
    Date of Patent: March 15, 2022
    Assignee: Carl Zeiss Industrielle Messtechnik GmbH
    Inventors: Jochen Mühlbacher, Kurt Brenner, Dominic Bulling
  • Patent number: 11263741
    Abstract: Implementations of the disclosure provide methods for generating an in-die reference for die-to-die defect detection techniques. The inspection methods using in-die reference comprise finding similar blocks of a lithographic mask, the similar blocks are defined by similar CAD information. A comparison distance is selected based on (i) areas of the similar blocks and (ii) spatial relationships between the similar blocks. The similar blocks are aggregated, based on the comparison distance, to provide multiple aggregated areas; and comparable regions of the lithographic mask are defined based on the multiple aggregate blocks. Images of at least some of the comparable regions of the lithographic mask are acquired using an inspection module. The acquired images are compared.
    Type: Grant
    Filed: January 24, 2020
    Date of Patent: March 1, 2022
    Assignee: Applied Materials Israel Ltd.
    Inventors: Boaz Cohen, Gadi Greenberg, Sivan Lifschitz, Shay Attal, Oded O. Dassa, Ziv Parizat
  • Patent number: 11248904
    Abstract: Systems and methods for measuring a curvature radius of a sample. The methods comprise: emitting a light beam from a laser source in a direction towards a beam expander; expanding a size of the light beam emitted from the laser source to create a broad laser beam; reflecting the broad laser beam off of a curved surface of the sample; creating a plurality of non-parallel laser beams by passing the reflected broad laser beam through a grating mask or a biprism; using the plurality of non-parallel laser beams to create an interference pattern at a camera image sensor; capturing a first image by the camera image sensor; and processing the first image by an image processing device to determine the curvature radius of the sample.
    Type: Grant
    Filed: March 26, 2018
    Date of Patent: February 15, 2022
    Assignee: RUTGERS, THE STATE UNIVERSITY OF NEW JERSEY
    Inventors: Alexei Ermakov, Xiuyan Li, Eric Garfunkel, Leonard C. Feldman, Torgny Gustafsson
  • Patent number: 11237253
    Abstract: A system and method for scanning of coherent LIDAR. The system includes a motor, a laser source configured to generate an optical beam, and a deflector. A first facet of the plurality of facets has a facet normal direction. The deflector is coupled to the motor and is configured to rotate about a rotation axis to deflect the optical beam from the laser source. The laser source is configured to direct the optical beam such that the optical beam is incident on the deflector at a first incident angle in a first plane, wherein the first plane includes the rotation axis, wherein the first incident angle is spaced apart from the facet normal direction for the first facet. A second facet of the plurality of facets includes an optical element configured to deflect the optical beam at the first incident angle into a deflected angle.
    Type: Grant
    Filed: May 29, 2020
    Date of Patent: February 1, 2022
    Assignee: BLACKMORE SENSORS AND ANALYTICS, LLC
    Inventors: Ryan Moore Galloway, Edward Angus, Zeb William Barber
  • Patent number: 11237404
    Abstract: A diffractive optical element is configured to receive a first patterned light beams, and diffracts the first patterned light beams to project a second patterned light beam outwardly. The second patterned light beam is formed of combined arrangement of a plurality of first patterned light beams, and the combined arrangement includes periodic arrangement in a first direction and a second direction. The first direction and the second direction are not perpendicular to each other. By designing the performance of the diffractive optical element, the outwardly projected structured light pattern is periodically arranged in two directions, and the two directions are not perpendicular to each other, such that spot patterns are highly unrelated in multiple directions, improving accuracy.
    Type: Grant
    Filed: March 18, 2020
    Date of Patent: February 1, 2022
    Assignee: Orbbec Inc.
    Inventors: Xing Xu, Zhaomin Wang, Yuanhao Huang, Xu Chen
  • Patent number: 11231573
    Abstract: Position detection apparatus includes illumination optical system for illuminating target, detection optical system for forming image of the illuminated target illuminated on photoelectric converter, first array having first aperture stops, second array having second aperture stops, first driving mechanism for arranging the selected first aperture stop on pupil of the illumination optical system by driving the first array such that first aperture stop crossing optical axis of the illumination optical system moves in first direction, second driving mechanism for arranging the selected second aperture stop on pupil of the detection optical system by driving the second array such that second aperture stop crossing optical axis of the detection optical system moves in second direction. The first and second driving mechanisms fine-tune positions of the selected first and second aperture stops in the first and second directions, respectively.
    Type: Grant
    Filed: March 23, 2020
    Date of Patent: January 25, 2022
    Assignee: CANON KABUSHIKI KAISHA
    Inventors: Hironobu Fujishima, Hironori Maeda
  • Patent number: 11221212
    Abstract: A laser-based measurement device includes a motor comprising a hollow shaft. The laser-based measurement device also includes a laser transmitter disposed in the hollow shaft. The laser-based measurement device also includes an optical device disposed at the motor. The motor is configured to drive the optical device to rotate. The optical device is configured to guide a laser beam transmitted by the laser transmitter out of the hollow shaft, or to guide the laser beam reflected by an external environment into the hollow shaft.
    Type: Grant
    Filed: September 30, 2019
    Date of Patent: January 11, 2022
    Assignee: SZ DJI TECHNOLOGY CO., LTD.
    Inventors: Huai Huang, Wei Ren, Peng Wang
  • Patent number: 11221210
    Abstract: Systems and methods for measuring a curvature radius of a sample. The methods comprise: emitting a light beam from a laser source in a direction towards a beam expander; expanding a size of the light beam emitted from the laser source to create a broad laser beam; reflecting the broad laser beam off of a curved surface of the sample; creating a plurality of non-parallel laser beams by passing the reflected broad laser beam through a grating mask or a biprism; using the plurality of non-parallel laser beams to create an interference pattern at a camera image sensor; capturing a first image by the camera image sensor; and processing the first image by an image processing device to determine the curvature radius of the sample.
    Type: Grant
    Filed: March 26, 2018
    Date of Patent: January 11, 2022
    Assignee: RUTGERS, THE STATE UNIVERSITY OF NEW JERSEY
    Inventors: Alexei Ermakov, Xiuyan Li, Eric Garfunkel, Leonard C. Feldman, Torgny Gustafsson