Abstract: The invention relates to a method for checking a printing cylinder for defects in an engraved cylinder surface of the printing cylinder, comprising the steps: capturing a first and at least one further digital image of a cylinder surface of a printing cylinder by means of an optical capture unit, wherein the cylinder surface is cleaned before capturing the at least one further image, comparing the digital images each with a digital engraving master of the printing cylinder, the comparing comprising: determining deviations between each of the digital images and the digital engraving master, and checking the determined deviations for matching deviations between the digital images, wherein a pseudo defects is concluded if no matching deviations between the digital images have been detected when comparing, and wherein an engraving defect on the printing cylinder is concluded in the case of matching deviations. Furthermore, a corresponding arrangement is described.

Abstract: A grating measuring module includes a light source, a collimating device, a first grating, a second grating, and an image sensing chip. The first grating is arranged on an optical path of the collimating device and the second grating is arranged on an optical path of the first grating. Each of the two gratings comprises a first pattern and a plurality of second patterns locating at the both sides of the first pattern. The first and second gratings can each be attached to an object which may be displaced in relation to another object, so allowing light of a certain pattern to pass depending on the magnitude of the displacement. The image sensing chip arranged on an optical path from the second grating receives light emitted from the light source and forms an image from which a displacement can be calculated and displayed.

Abstract: Disclosed is a method for determining a parameter of an optical device including at least an optical lens, the method including: an optical system providing step, during which an optical system including a visual target, the optical device and an image acquisition module is provided in an initial configuration state, a parameter determining step during which a parameter of the optical device is determined based on the blur level of the images of the visual target acquired by the image acquisition module through the optical device in at least two different configuration states.

Abstract: A calibration configuration for a chromatic range sensor (CRS) optical probe of a coordinate measurement machine (CMM) includes a cylindrical calibration object and a spherical calibration object. The cylindrical calibration object includes at least a first nominally cylindrical calibration surface having a central axis that extends along a Z direction that is intended to be aligned approximately parallel to a rotation axis of the CRS optical probe. The spherical calibration object includes a nominally spherical calibration surface having a first plurality of surface portions. The CMM is operated to obtain radial distance measurements and determine cylindrical calibration data using radial distance measurements of the cylindrical calibration object and to determine spherical calibration data using radial distance measurements of the spherical calibration object.

Abstract: A method for detecting foreign particles in a liquid, the method may include transmitting transmitted pulses of radiation, by a transmitter, towards a liquid conduit that is filled with liquid; wherein the transmitted pulses comprises pulses that differ from each by being associated with absorbance frequencies of different foreign particles; receiving, by a receiver, received pulses that propagated through liquid as a result of the transmission of the multiple transmitted pulses; comparing between the transmitted pulses and the received pulses to provide a comparison result; determining a liquid contamination based on the comparison result; and cleaning, by a cleaning unit, the liquid conduit with a cleaning solution; wherein a cleaning material of the cleaning solution is supplied from a compressible cleaning material reservoir.

Abstract: A surface wettability determination system includes a sprayer, a light emission device and an optical detector. The sprayer is provided to spray a liquid on a detected surface of a detected object. The light emission device is provided to emit a light beam toward the detected surface. The light beam is reflected by the liquid on the detected surface to generate a reflected light. The optical detector is provided to receive the reflected light and output a determining signal, and the determining signal is related to a wettability of the detected surface.

Abstract: This disclosure provides a NDIR gas sensor comprising: an optical filter having a substrate and a multilayer film; and an infrared light emitting and receiving device having a semiconductor layer of a first conductive type, an active layer, and a semiconductor layer of a second conductive type; where the multilayer film has a structure in which a first layer and a second layer are alternately stacked; the active layer contains InAsySb1-y (0.1?y?0.2); and the optical filter includes a wavelength range having an average transmittance of 70% or more with a width of 50 nm or more in a wavelength range of 6 ?m to 10 ?m, and has a maximum transmittance of 10% or more in a wavelength range of 12.5 ?m to 20 ?m and an average transmittance of 5% or more and 60% or less in a wavelength range of 12.5 ?m to 20 ?m.

Abstract: An enclosure permits ingress of an infrared light beam and ultrasonic signal entering the enclosure from two different locations and facilitates their exit from the enclosure along a substantially similar egress path. The enclosure contains fluid which propagates the ultrasonic wave and a glass element which reflects the ultrasonic wave from its ingress direction onto an egress path. The fluid is an index matching fluid having a refractive index the same as the refractive index of the glass element, rendering the glass element transparent to the infrared light beam. Thus, the infrared light beam, having been induced into the enclosure on an entry path directed through the glass element, passes through the glass element without being reflected or refracted by it, placing the infrared light beam on a substantially similar path to that of the ultrasonic wave for egress of both waves from the enclosure at substantially the same point.

Abstract: A method for automatic defect classification, the method may include (i) acquiring, by a first camera, at least one first image of at least one area of an object; (ii) processing the at least one first image to detect a group of suspected defects within the at least one area; (iii) performing a first classification process for initially classifying the group of suspected defects; (iii) determining whether a first subgroup of the suspected defects requires additional information from a second camera for a completion of a classification; (iv) when determining that the first subgroup of the suspected defects requires additional information from the second camera then: (a) acquiring second images, by the second camera, of the first subgroup of the suspected defects; and (b) performing a second classification process for classifying the first subgroup of suspected defects.

Abstract: A device for measuring the optical power of an optical test system includes an optical-object-generating assembly, a support for the optical test system, a digital image detector, and a deflector assembly. The deflector assembly is intended to generate a lateral movement in respect of the initial optical image, thereby producing a shifted optical image and a reference optical image. The digital image detector captures the shifted optical image and the reference optical image in at least one digital image containing data relating to the lateral movement. The device also includes a processing component to calculate the optical power of the optical test system from the data relating to the lateral movement.

Abstract: Described herein is a method of evaluating artificial lighting of a surface. The method may comprise measuring a first lumen output at a first location on the surface at a first altitude. The method may further comprise photographing the surface from a second altitude to obtain an aerial photograph of the surface comprising a plurality of pixels, each pixel of the plurality of pixels having a second lumen output, and performing an altitude adjustment on the second lumen output to obtain a third lumen output. The method may comprise dividing the aerial photograph into a plurality of zones, each zone corresponding to a section of the surface. The method may further comprise establishing a user-defined threshold lumen output for each zone of the plurality of zones, and identifying a percentage of the total number of pixels in each zone which meets or exceeds the user-defined threshold lumen output.

Abstract: An optical density measuring apparatus for measuring density of a gas or a liquid to be measured includes a light source capable of irradiating light into a core layer, a detector capable of receiving light propagated through the core layer, and an optical waveguide that includes a substrate and the core layer. The core layer includes a light propagation unit and a first diffraction grating unit that receives light from the light source and guides the light to the light propagation unit, which includes a propagation channel capable of propagating light in an extending direction of the light propagation unit. The first diffraction grating unit is disposed near to and facing a light-emitting surface of the light source. The first diffraction grating unit includes first diffraction gratings, at least two of which receive light emitted from the same light-emitting surface of the light source.

Abstract: The invention relates, inter alia, to a device (10) for analysing a material (101), comprising an excitation emission device (100) for generating at least one electromagnetic excitation beam (SA), particularly an excitation light beam, with at least one excitation wavelength, and further comprising a detection device (106) for detecting a reaction signal (SR), and a device (107) for analysing the material on the basis of the detected reaction signal (SR).

Abstract: A stylus is arranged on a coordinate measuring machine. A method for aligning a component in relation to the coordinate measuring machine includes positioning the stylus and the component in relation to one another according to a defined arrangement. The method includes acquiring at least one coordinate of the component. The method includes changing at least one of a position and an orientation of the component in relation to the coordinate measuring machine while maintaining the defined arrangement.

Abstract: Implementations of the disclosure provide methods for generating an in-die reference for die-to-die defect detection techniques. The inspection methods using in-die reference comprise finding similar blocks of a lithographic mask, the similar blocks are defined by similar CAD information. A comparison distance is selected based on (i) areas of the similar blocks and (ii) spatial relationships between the similar blocks. The similar blocks are aggregated, based on the comparison distance, to provide multiple aggregated areas; and comparable regions of the lithographic mask are defined based on the multiple aggregate blocks. Images of at least some of the comparable regions of the lithographic mask are acquired using an inspection module. The acquired images are compared.

Abstract: Systems and methods for measuring a curvature radius of a sample. The methods comprise: emitting a light beam from a laser source in a direction towards a beam expander; expanding a size of the light beam emitted from the laser source to create a broad laser beam; reflecting the broad laser beam off of a curved surface of the sample; creating a plurality of non-parallel laser beams by passing the reflected broad laser beam through a grating mask or a biprism; using the plurality of non-parallel laser beams to create an interference pattern at a camera image sensor; capturing a first image by the camera image sensor; and processing the first image by an image processing device to determine the curvature radius of the sample.

Abstract: A system and method for scanning of coherent LIDAR. The system includes a motor, a laser source configured to generate an optical beam, and a deflector. A first facet of the plurality of facets has a facet normal direction. The deflector is coupled to the motor and is configured to rotate about a rotation axis to deflect the optical beam from the laser source. The laser source is configured to direct the optical beam such that the optical beam is incident on the deflector at a first incident angle in a first plane, wherein the first plane includes the rotation axis, wherein the first incident angle is spaced apart from the facet normal direction for the first facet. A second facet of the plurality of facets includes an optical element configured to deflect the optical beam at the first incident angle into a deflected angle.

Abstract: A diffractive optical element is configured to receive a first patterned light beams, and diffracts the first patterned light beams to project a second patterned light beam outwardly. The second patterned light beam is formed of combined arrangement of a plurality of first patterned light beams, and the combined arrangement includes periodic arrangement in a first direction and a second direction. The first direction and the second direction are not perpendicular to each other. By designing the performance of the diffractive optical element, the outwardly projected structured light pattern is periodically arranged in two directions, and the two directions are not perpendicular to each other, such that spot patterns are highly unrelated in multiple directions, improving accuracy.

Abstract: Position detection apparatus includes illumination optical system for illuminating target, detection optical system for forming image of the illuminated target illuminated on photoelectric converter, first array having first aperture stops, second array having second aperture stops, first driving mechanism for arranging the selected first aperture stop on pupil of the illumination optical system by driving the first array such that first aperture stop crossing optical axis of the illumination optical system moves in first direction, second driving mechanism for arranging the selected second aperture stop on pupil of the detection optical system by driving the second array such that second aperture stop crossing optical axis of the detection optical system moves in second direction. The first and second driving mechanisms fine-tune positions of the selected first and second aperture stops in the first and second directions, respectively.

Abstract: Systems and methods for measuring a curvature radius of a sample. The methods comprise: emitting a light beam from a laser source in a direction towards a beam expander; expanding a size of the light beam emitted from the laser source to create a broad laser beam; reflecting the broad laser beam off of a curved surface of the sample; creating a plurality of non-parallel laser beams by passing the reflected broad laser beam through a grating mask or a biprism; using the plurality of non-parallel laser beams to create an interference pattern at a camera image sensor; capturing a first image by the camera image sensor; and processing the first image by an image processing device to determine the curvature radius of the sample.