Abstract: In one embodiment, an apparatus for measuring a color of a non-solid colored sample includes an integrating sphere having a sensor port, a sample port, and a plurality of registration marks affixed to an interior surface of the integrating sphere, outside a periphery of the sample port, a camera positioned near the sensor port, and a plurality of filters positioned between the integrating sphere and camera. An optical axis of the camera extends from the camera, through at least one of the plurality of filters, through the sensor port, to the sample port.

Abstract: There is provided a forming mold 40 made on the basis of a standard more reliable than an average roughness of a surface of a metal film that generates surface plasmon resonance, the forming mold being capable of improving an S/N ratio of an optical element 20. A forming mold 40 for a substrate 21 of an optical element 20 used for measurements utilizing surface plasmon, wherein an Spc value of a molding surface 51t for transferring a shape onto a surface 21a of the substrate 21 on a side facing an object to be measured is equal to or less than 100 [1/mm].

Abstract: A plasma spectroscopic analysis method includes a concentration process of concentrating a target in a sample, in the vicinity of one of a pair of electrodes in the presence of the sample; a plasma generation process of generating plasma in the sample by applying a voltage to the pair of electrodes; and a detection process of detecting emission of the target generated by the plasma, wherein the plasma generation process is performed in the presence of a defoaming agent.

Abstract: Systems and methods for transmitting power and information using acoustic energy produced by transducers are provided. The systems have particular application for powering and communication with electronics through drilling and pipe systems. Pairs of acoustic wedges holding transducers are provided for sending energy and information through a substrate which may be a steel pipe. Each wedge has an angled transducer which can be used to produce shear waves. The waves propagate through the substrate and are received by a second acoustic wedge. The shear waves, on reaching the second acoustic wedge, are converted back into electrical signals by a second transducer. Tangential shear waves, high, shallow wave transmission angles, and direct steel-steel bonding between wedges and substrates may be used.

Abstract: An inspection method includes: irradiating light through a prism to an inspection object; scanning an inspection region of the inspection object using a photographing unit; receiving, by the photographing unit, reflected light that is reflected from the inspection object; converting the reflected light received by the photographing unit into an intensity of light; and detecting a defect of the inspection object by comparing a thickness of the inspection object corresponding to the intensity of the light with a predetermined thickness of the inspection object. Therefore, the encapsulation layer is inspected before post-processes of cells or the module process, such that the yield and productivity of the OLED device can be improved.

Abstract: Calibrated brightness estimation using an ambient color sensor, involving determination and use of lighting cluster parameters effective for automatically identifying which of multiple lighting clusters is associated with a color measurement obtained for the ambient color sensor, and per-cluster sensor brightness estimation factors for each of the first plurality of lighting clusters.

Abstract: A system and method of dynamically localizing a measurement of parameter characterizing tissue sample with waves produced by spectrometric system at multiple wavelengths and detected at a fixed location of the detector of the system. The parameter is calculated based on impulse response of the sample, reference data representing characteristics of material components of the sample, and path lengths through the sample corresponding to different wavelengths. Dynamic localization is effectuated by considering different portions of a curve representing the determined parameter, and provides for the formation of a spatial map of distribution of the parameter across the sample. Additional measurement of impulse response at multiple detectors facilitates determination of change of the measured parameter across the sample as a function of time.

Abstract: A differential mode delay (DMD) measurement system for an optical fiber is provided. The system includes an optical test fiber with a plurality of modes; a single mode light source that provides a continuous light wave signal to a modulator; and a pulse generator that provides an electrical pulse train signal to the modulator and a triggering signal to a receiver. The modulator is configured to generate a modulated optical test signal through the optical fiber based at least in part on the received light wave and pulse train signals, and the receiver is configured to receive the test signal transmitted through the fiber and evaluate the test signal based at least in part on the triggering signal. The system can be employed to create DMD waveform and centroid charts to obtain minEMBc bandwidth information for a fiber within a wavelength range.

Abstract: The present invention relates to a film-thickness measuring method for detecting a film thickness by analyzing optical information contained in a reflected light from a substrate. The film-thickness measuring method includes producing a spectral waveform indicating a relationship between intensity and wavelength of reflected light from a substrate; performing Fourier transform processing on the spectral waveform to determine strengths of frequency components and corresponding film thicknesses; determining local maximum values (M1, M2) of the strengths of the frequency components; and selecting, according to a preset selection rule, one film thickness from film thicknesses (t1, t2) corresponding respectively to the local maximum values (M1, M2). The selection rule is either to select an N-th largest film thickness or to select an N-th smallest film thickness, and N is a predetermined natural number.

Abstract: An arrangement for an inspection of plate-shaped objects moving relative to a camera device in a direction of motion through at least two observation areas. The arrangement includes the camera device which includes one single camera which comprises a matrix sensor, and an image processor. In a first detection state, a first observation area running diagonally opposite to the direction of motion is represented on a first image area of the camera device and is recorded as a strip-shaped image. In a second detection state, a second observation area is represented on a second image area of the camera device and is recorded as a strip-shaped image. The image processor merges the strip-shaped images recorded in the first detection state and in the second detection state to form two-dimensional images. All image areas are located on the matrix sensor.

Abstract: A spatial filter is made by forming a structure comprising a focusing element and an opaque surface, the opaque surface being disposed remotely from the focusing element in substantially the same plane as a focal plane of the focusing element; and by forming a pinhole in the opaque surface at or adjacent to a focal point of the focusing element by transmitting a substantially collimated laser beam through the focusing element so that a point optimally corresponding to the focal point is identified on the opaque surface and imperfection of the focusing element, if any, is reflected on the shape and position of the pinhole so formed.

Abstract: The present invention relates to a quantitative ex vivo method for the complementary diagnosis of the degree of dental demineralization through the use of Raman spectroscopy, which comprises quantifying the intensities and areas of a plurality of Stoke bands of the spectrum, and defining and calculating indices that result from dividing the areas of certain bands of interest. The diagnosis is determined by the proximity of the values of these indices to the values previously obtained for the normal pattern of dental mineralization established by analyzing healthy dental parts. This method provides a complementary biomedical technique for quantitative ex vivo analysis of the degree of dental demineralization on dental tissue remains extracted by medical prescription, and the information obtained will facilitate the prescription of suitable treatment to reduce or prevent said demineralization.

Abstract: A bacterial detection platform integrating the sensitive SERS technique and the advanced mapping technique. Bacterial cells on the SERS substrate are detected using the mapping technique. The identification is based on the fingerprint of the bacterial SERS spectra. The quantification of the cells is based on the mapping technique. For different applications, silver or gold nanoparticles can be integrated onto a filter membrane for concentration and detection of bacterial cells in water or silver dendrites can be used as the SERS substrate. The SERS substrates are also modified with capturers and fixed in a vessel to concentrate cells from complex liquid matrices.

Abstract: A series of optical spectral sensors for gas and vapor measurements using a combination of solid-state light sources (LED or Broadband) and multi-element detectors, housed within an integrated package that includes the interfacing optics and acquisition and processing electronics. The sensor is designed to be produced at a low cost and capable of being fabricated for mass production. Spectral selectivity is provided by a custom detector eliminating the need for expensive spectral selection components. The multi-component gas monitor system of the present invention has no moving parts and the gas sample flows through a measurement chamber where it interacts with a light beam created from the light source, such as a MEMS broad band IR source or a matrix of LEDs. A custom detector(s) is/are configured with multi-wavelength detection to detect and measure the light beam as it passes through the sample within the measurement chamber.

Abstract: A device for analyzing the material composition of a sample via plasma spectrum analysis includes a laser assembly configured to emit a beam for plasma spectrum analysis and an optical assembly configured to direct the beam towards a target for plasma spectrum analysis of the target. The optical assembly is configured to collect a plasma emitted light emitted from a plasma and provide the plasma emitted light to a dispersion module. The dispersion module includes a first and second diffraction gratings. The first diffraction grating and second diffraction grating are positioned within the dispersion module such that light received from the optical assembly contacts the first diffraction grating at least two times before being directed out of the dispersion module.

Abstract: Methods for laser induced ablation spectroscopy are disclosed. A position sensor, and position motors can move a sample stage in three independent spatial coordinate directions, and a stage position control circuit can move an analysis sample site to selected coordinate positions for ablation. Light from laser ablation can be gathered into a lightguide fiber bundle that is subdivided into branches. One branch can convey a first portion of the light to a broadband spectrometer operable to analyze a relatively wide spectral segment, and a different branch can convey a second portion of the light to a high dispersion spectrometer operable to measure minor concentrations and/or trace elements. Emissions can be simultaneously analyzed in various ways using a plurality of spectrometers having distinct and/or complementary capabilities, and isotope analysis of a sample can be performed.

Abstract: Described herein are technologies to facilitate computed tomographic techniques to help identifying chemical species during plasma processing of a substrate (e.g., semiconductor wafer) using optical emission spectroscopy (OES). More particularly, the technology described herein uses topographic techniques to spatially resolves emissions and absorptions in at least two-dimension space above the substrate during the plasma processing (e.g., etching) of the substrate. With some implementations utilize optical detectors positioned along multiple axes (e.g., two or more) to receive incident incoming optical spectra from the plasma chamber during the plasma processing (e.g., etching) of the substrate. Because of the multi-axes arrangement, the incident incoming optical spectra form an intersecting grid.

Abstract: A high-speed, 3-D method and system for optically inspecting parts are provided. The system includes a part transfer subsystem including a transfer mechanism adapted to support a part at a loading station and transfer the supported part from the loading station to an inspection station at which the part has a predetermined position and orientation for inspection. The system also includes an illumination assembly to simultaneously illuminate an end surface of the part and a peripheral surface of the part. The system further includes a lens and detector assembly to form an optical image of the illuminated end surface and an optical image of the illuminated peripheral surface of the part and to detect the optical images. The system still further includes a processor to process the detected optical images to obtain an end view of the part and a 3-D panoramic view of the peripheral surface of the part.

Abstract: For detecting a crack formed on a structure surface without erroneously, an information processing device that detects a crack on a structure, includes a change detection unit that detects a change in positions of at least two measurement points on the structure; and a crack detection unit that detects a crack based on the change in the positions of the measurement points detected by the change detection unit.

Abstract: A system calibrates luminance of an electronic display panel. The system includes a luminance detection device, an actuator and a computing device. The luminance detection device comprises a plurality of detectors arranged along a width or length of the electronic display panel to simultaneously measure luminance parameters of at least one row or column of areas in the electronic display panel. Each of the plurality of detectors covers an area in the at least one row or column of the electronic display panel. The actuator is configured to cause a relative translational movement in a length direction or a width direction of the electronic display panel. The computing device is coupled to the luminance detection device to receive the measured luminance parameters, and the computing device is configured to generate calibration data for adjusting brightness of areas of the electronic display panel by processing the measured luminance parameters.