Patents Examined by Jermele M. Hollington
  • Patent number: 11988727
    Abstract: A magnetic gradiometer sensor comprising a substrate with at least a pair of resonators disposed thereon, wherein each of the at least a pair of resonators is coated with a magnetostrictive film. The resonators are preferably connected to sustaining circuits to form oscillators and the oscillators are preferably used within a phase lock loop to detect a difference in the magnetic field between the at least a pair of resonators.
    Type: Grant
    Filed: July 17, 2020
    Date of Patent: May 21, 2024
    Assignee: HRL LABORATORIES, LLC
    Inventors: Randall L. Kubena, Walter S. Wall
  • Patent number: 11988702
    Abstract: The present invention relates to a film quality inspection method and system for providing a stress evaluation scheme for inspection of film quality of a magnetic tunnel junction (MTJ) cell of spin-transfer torque magnetic random access memory (STT-MRAM), wherein a bipolar signal and a unipolar signal including a unipolar hole (positive polarity) and a unipolar electron (negative polarity) are simultaneously applied to the same MTJ cell, and then according to a result of a comparison of a cycling gap, the quality of a thin film having a thickness of about 1 nm may be inspected.
    Type: Grant
    Filed: March 26, 2019
    Date of Patent: May 21, 2024
    Assignee: Samsung Electronics Co., Ltd.
    Inventor: Yun Heub Song
  • Patent number: 11984075
    Abstract: A system reads a desired circuit parameter from a pixel circuit that includes a light emitting device, a drive device to provide a programmable drive current to the light emitting device, a programming input, and a storage device to store a programming signal. One embodiment of the extraction system turns off the drive device and supplies a predetermined voltage from an external source to the light emitting device, discharges the light emitting device until the light emitting device turns off, and then reads the voltage on the light emitting device while that device is turned off. The voltages on the light emitting devices in a plurality of pixel circuits may be read via the same external line, at different times. In-pixel, charge-based compensation schemes are also discussed, which can be used with the external parameter extraction implementations.
    Type: Grant
    Filed: September 28, 2021
    Date of Patent: May 14, 2024
    Assignee: Ignis Innovation Inc.
    Inventor: Gholamreza Chaji
  • Patent number: 11984371
    Abstract: Systems, methods, circuits, and apparatus including computer-readable mediums for testing bonding pads in multi-die packages, e.g., chiplet systems. In one aspect, a chiplet system includes multiple integrated circuit devices electrically connected together. The integrated circuit devices include an integrated circuit device including: an integrated circuit, a plurality of first type bonding pads electrically connected to the integrated circuit and electrically connected to at least one other of the integrated circuit devices, and one or more second type bonding pads electrically isolated from the at least one other of the integrated circuit devices. At least one of the plurality of first type bonding pads is configured to be electrically connected to a corresponding one of the one or more second type bonding pads.
    Type: Grant
    Filed: June 27, 2023
    Date of Patent: May 14, 2024
    Assignee: Macronix International Co., Ltd.
    Inventors: Chun-Hsiung Hung, Su-Chueh Lo
  • Patent number: 11982548
    Abstract: Disclosed is a sensor comprising a sensor element that detects a measurand, the sensor element being in electrical contact with a sensor circuit that processes values derived from data from a secondary coil and/or from the measurand. The sensor circuit is in electrical contact with an ex-circuit. The sensor circuit is supplied a maximum input voltage and a maximum input current. The ex-circuit includes the secondary coil that receives an electrical signal from a primary coil. The electrical signal includes the data that are modulated onto the electrical signal. The sensor also includes a voltage limit that limits the voltage of the electrical signal to the maximum input voltage of the sensor circuit and a current limit that limits the current of the electrical signal to the maximum input current of the sensor circuit. Also disclosed are a sensor arrangement and a use of a sensor.
    Type: Grant
    Filed: July 30, 2019
    Date of Patent: May 14, 2024
    Assignee: Endress+Hauser Conducta GmbH+Co. KG
    Inventors: Sven-Matthias Scheibe, Stefan Pilz
  • Patent number: 11982700
    Abstract: The disclosure relates to a quantum detector configured to receive a microwave signal from a microwave source. The quantum detector comprises a main element formed by a main Josephson junction and a Josephson transmission line which is coupled to the main element for outputting a measurement signal. The Josephson transmission line comprises at least a first set of JTL elements and a second set of JTL elements. The capacitively shunted Josephson junction in each JTL element in the first set is weakly damped, and the JTL element in the second set are more strongly damped than the JTL elements in the first set.
    Type: Grant
    Filed: January 25, 2021
    Date of Patent: May 14, 2024
    Assignee: TEKNOLOGIAN TUTKIMUSKESKUS VTT OY
    Inventors: Joonas Govenius, Juha Hassel
  • Patent number: 11982705
    Abstract: A substrate analysis apparatus is provided. The substrate analysis includes: an interlayer conveying module configured to transport a first FOUP; an exchange module which is connected to the interlayer conveying module, and configured to transfer a wafer from the first FOUP to a second FOUP; a pre-processing module configured to form a test wafer piece using the wafer inside the second FOUP; an analysis module configured to analyze the test wafer piece; and a transfer rail configured to transport the second FOUP containing the wafer and a tray containing the test wafer piece. The wafer includes a first identifier indicating information corresponding to the wafer, the test wafer piece includes a second identifier indicating information generated by the pre-processing module which corresponds to the test wafer piece, and the analysis module is configured to analyze the first identifier and the second identifier in connection with each other.
    Type: Grant
    Filed: March 9, 2022
    Date of Patent: May 14, 2024
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Youn Gon Oh, Ji Hun Kim, Sae Yun Ko, Gil Ho Gu, Dong Su Kim, Eun Hee Lee, Ho Chan Lee, Seong Sil Jeong, Seong Pyo Hong
  • Patent number: 11982706
    Abstract: The present disclosure relates to burn-in apparatus, transfer method, burn-in chamber, and interchangeable frame thereof for semiconductor devices burn-in process. The burn-in apparatus comprises of a burn-in chamber with an incomplete base which is adapted to be completed and thermally insulated in cooperation with a thermal insulation base of at least one interchangeable frame which is adapted to be removably moved into and docked in the burn-in chamber to complete the burn-in apparatus. The burn-in apparatus comprises the burn-in chamber and at least one frame. The apparatus is complete and thermally insulated when the frame is moved into the burn-in chamber and docked therein. The apparatus is incomplete and thermally uninsulated when the frame is moved out of the burn-in chamber and undocked therefrom.
    Type: Grant
    Filed: December 30, 2020
    Date of Patent: May 14, 2024
    Assignee: MSV SYSTEMS & SERVICES PTE LTD
    Inventors: Teck Huat Tan, Chun Hong Low
  • Patent number: 11977118
    Abstract: A tester for a frequency-dependent ground fault interrupt wiring device, including: a tester circuit, including: a switch disposed between a first terminal and a second terminal, wherein a leakage current flows through a leakage path between the first terminal and the second terminal when a voltage is applied across the first terminal and the second terminal, a magnitude of the leakage current being determined, at least in part, by a conductivity of the switch; and a waveform generator configured to generate a periodic output signal having a frequency, wherein the switch is driven to modulate the magnitude of the leakage current such that the leakage current has a frequency substantially equal to a frequency of the waveform generator.
    Type: Grant
    Filed: March 1, 2021
    Date of Patent: May 7, 2024
    Assignee: Pass & Seymour, Inc.
    Inventors: Joshua P. Haines, Michael F. McMahon
  • Patent number: 11977112
    Abstract: The present invention is directed to a system for testing printed circuit boards. The system is configured to test the simultaneously test a multiplicity of printed circuit boards. The system examines the electrical characteristics of a printed circuit board and is operable to identify if a printed circuit board meets a desired characteristic.
    Type: Grant
    Filed: July 12, 2023
    Date of Patent: May 7, 2024
    Assignee: LAT Enterprises Inc.
    Inventors: Laura Thiel, Carlos Cid, Michael Tran, Giancarlo Urzi
  • Patent number: 11975632
    Abstract: The present application provide a control method of a power battery heating system. The method includes: controlling all upper bridge arms of a first bridge arm group and all lower bridge arms of a second bridge arm group to be turned on, and controlling all lower bridge arms of the first bridge arm group and all upper bridge arms of the second bridge arm group to be turned off, so as to form a first loop; controlling all the lower bridge arms of the first bridge arm group and all the upper bridge arms of the second bridge arm group to be turned on, and controlling all the upper bridge arms of the first bridge arm group and all the lower bridge arms of the second bridge arm group to be turned off, so as to form a second loop. The method is used to heat the power battery.
    Type: Grant
    Filed: December 28, 2021
    Date of Patent: May 7, 2024
    Assignee: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
    Inventors: Xiaojian Huang, Zhimin Dan, Jinfeng Gao, Jin Huang
  • Patent number: 11976921
    Abstract: A method and apparatus for reducing magnetic tracking error in the position and orientation determined in a magnetic tracking system having a magnetic field generator. In some embodiments, the measured position and orientation of a sensor is compared to an expected theoretical position and orientation. Any error is assumed to be from “floor distortion,” i.e., eddy currents in the floor caused by the magnetic field generated by the magnetic field transmitter. The floor distortion is modeled as being caused by eddy currents caused by a second magnetic field transmitter that is a reflection of the actual transmitter. An algorithm iteratively searches over a parameter space to minimize the difference between the measured position and orientation and the theoretical position and orientation, and applies a correction to the measured position and orientation. The measurements and corrections of the position and orientation run in real-time with no additional hardware or calibration required.
    Type: Grant
    Filed: June 7, 2022
    Date of Patent: May 7, 2024
    Assignee: Penumbra, Inc.
    Inventors: Michael D. Collins, Alejandro S. Diaz, Oded Y. Zur, Cameron J. Mahon, Branislav Vasilijevic, Amir Rubin
  • Patent number: 11977045
    Abstract: An embodiment humidity sensor device includes a humidity sensor including a measurement section for measuring humidity, a housing accommodating the humidity sensor while the measurement section is exposed to the outside, and a wall member protruding from a bottom surface of the housing and surrounding a periphery of the measurement section.
    Type: Grant
    Filed: November 12, 2019
    Date of Patent: May 7, 2024
    Assignee: Nippon Telegraph and Telephone Corporation
    Inventors: Hiroto Matsuoka, Takako Ishihara
  • Patent number: 11977098
    Abstract: A method of testing an integrated circuit of a device is described. Air is allowed through a fluid line to modify a size of a volume defined between the first and second components of an actuator to move a contactor support structure relative to the apparatus and urge terminals on the contactor support structure against contacts on the device. Air is automatically released from the fluid line through a pressure relief valve when a pressure of the air in the fluid line reaches a predetermined value. The holder is moved relative to the apparatus frame to disengage the terminals from the contacts while maintaining the first and second components of the actuator in a substantially stationary relationship with one another. A connecting arrangement is provided including first and second connecting pieces with complementary interengaging formations that restricts movement of the contactor substrate relative to the distribution board substrate in a tangential direction.
    Type: Grant
    Filed: January 26, 2023
    Date of Patent: May 7, 2024
    Assignee: AEHR TEST SYSTEMS
    Inventors: Scott E. Lindsey, Junjye Yeh, Jovan Jovanovic, Seang P. Malathong
  • Patent number: 11977110
    Abstract: A converter system includes a plurality of converters, a sampling circuit, and a control circuit. The plurality of converters are connected in parallel. Each converter includes a detection circuit which includes a first switch and at least two resistors. The first switch is connected in parallel with one of the at least two resistors. The control circuit control the sampling circuit to collect a first voltage and a second voltage, where the first voltage is a voltage that is between a second bus and a ground cable and that is collected by the sampling circuit when first switches in detection circuits of a first quantity are in a turn-on state, the second voltage is a voltage that is between the second bus and the ground cable and that is collected by the sampling circuit when first switches in detection circuits of a second quantity are in a turn-on state.
    Type: Grant
    Filed: February 8, 2022
    Date of Patent: May 7, 2024
    Assignee: HUAWEI DIGITAL POWER TECHNOLOGIES CO., LTD.
    Inventors: Haibin Guo, Huan Zhao, Zhiwu Xu, Lin Li
  • Patent number: 11971380
    Abstract: A pump device has at least one chamber (22) or conduit containing or provided for containing a liquid, a concentration sensor (24) arranged in the chamber (22) or conduit for detecting a concentration of a substance in the liquid and an evaluation unit (28) connected to the sensor (24). The sensor (24) and the evaluation unit (28) are configured for an electrical impedance measurement. The evaluation unit (28) is configured such that a measurement for detecting the concentration is carried out by use of an electrical signal applied to the sensor (24) having at least one frequency corresponding to or above an upper cut-off frequency (f2) of a frequency range showing a constant electrical impedance (Rm). A method is provided for determining the concentration of a substance inside a liquid.
    Type: Grant
    Filed: February 26, 2020
    Date of Patent: April 30, 2024
    Assignee: GRUNDFOS HOLDING A/S
    Inventors: Gert Friis Eriksen, Jørgen Jensen
  • Patent number: 11971252
    Abstract: An inductive position measuring sensor comprises a fixed ruler and a sliding ruler which can move relatively along the direction of the measuring axis. A series of coupling coils are made on the fixed ruler in the measuring direction,-two sets of driving coils are disposed on the sliding ruler, and induction coils in a staggered manner are also disposed on the sliding ruler. The two sets of driving coils generate excitation signals, by interaction with the coupling coils on the fixed ruler, and being received by the induction coils of the sliding ruler, they are used for measuring the relative movement of the fixed ruler and the sliding ruler. By controlling the positions and winding directions of the driving coils and the induction coils, the sensor can effectively inhibit the direct space signal interference of the driving coils to the induction coils, and the signal-to-noise ratio is improved.
    Type: Grant
    Filed: November 5, 2019
    Date of Patent: April 30, 2024
    Inventor: Jia Hao
  • Patent number: 11971451
    Abstract: A method includes: constructing an on-wafer calibration piece model set that includes one or more on-wafer calibration piece models, where each of the one or more on-wafer calibration piece models has a corresponding on-wafer calibration piece; selecting an on-wafer calibration piece model from the on-wafer calibration piece model set; measuring the on-wafer calibration piece utilizing an on-wafer S parameter measurement system that is calibrated using a multi-thread TRL calibration method in a Terahertz frequency band, to obtain an S parameter of the on-wafer calibration piece; and calculating a plurality of different parameters that represent crosstalk of calibration pieces in the on-wafer calibration piece model, according to an admittance calculated according to the S parameter and an admittance formula corresponding to the on-wafer calibration piece model.
    Type: Grant
    Filed: December 14, 2021
    Date of Patent: April 30, 2024
    Assignee: The 13th Research Institute of China Electronics Technology Group Corporation
    Inventors: Aihua Wu, Yibang Wang, Faguo Liang, Chen Liu, Ye Huo, Peng Luan, Jing Sun, Yanli Li
  • Patent number: 11965938
    Abstract: In leakage detection device, coupling capacitor has a first end connected to a current path of power storage unit connected to load in a state of being insulated from a ground. Voltage output unit generates a periodic voltage that changes periodically, and applies the periodic voltage to a second end of coupling capacitor via impedance element. Voltage output unit measures a voltage at a node between coupling capacitor and impedance element. Leakage determination unit estimates at least one of an upper peak value and a lower peak value at a certain time, calculates a peak-to-peak value between the upper peak value and the lower peak value with virtually aligned time axes, and determines presence or absence of a leakage between a current path of power storage unit and the ground.
    Type: Grant
    Filed: June 15, 2020
    Date of Patent: April 23, 2024
    Assignee: SANYO Electric Co., Ltd.
    Inventors: Masato Nakayama, Taisuke Hamada
  • Patent number: 11965849
    Abstract: A sensor can include one or more of a semiconducting material, an oxidation catalyst, and an oxidation enhancer, the sensor being configured to detect an analyte, such as methane, a thiol, or both.
    Type: Grant
    Filed: April 29, 2021
    Date of Patent: April 23, 2024
    Assignee: Massachusetts Institute of Technology
    Inventors: Timothy Swager, Mate Bezdek, Richard Liu