Abstract: In a computer-implemented method of training a machine learning based processor, the processor can be trained to derive image data from signal data sets of multiple spin echo sequences. The trained processor can be configured to perform image processing for Magnetic Resonance Imaging (MRI) to derive the image data.

Abstract: A target value of magnetic flux density and magnetic flux density actually obtained are made to coincide precisely with each other. An electromagnet control device comprises a current value determining unit for determining, based on a magnetic flux density instruction value, a value of current that is made to flow through a coil. The current value determining unit is constructed to execute a second process for determining, based on a second function, a value of the current, if the magnetic flux density is to be decreased from that in a first magnetization state, and a fourth process for expanding or reducing the second function by use of a first scaling ratio for transforming it to a fourth function, and determining, based on the fourth function obtained after above transformation, a value of the current, if the magnetic flux density is to be decreased from that in a third magnetization state.

Abstract: A system and method for evaluating the reliability of semiconductor die packages are configured to sort a plurality of semiconductor dies with a Known Good Die (KGD) subsystem based on a comparison of an inline part average testing (I-PAT) score of each of the plurality of semiconductor dies to a plurality of I-PAT score thresholds, where the semiconductor die data includes the I-PAT score for each of the plurality of semiconductor dies, where the I-PAT score represents a weighted defectivity of the corresponding semiconductor die. The semiconductor dies may be filtered to remove at-risk semiconductor dies prior to sorting. The semiconductor die data may be received from a plurality of semiconductor die supplier subsystems. The KGD subsystem may transmit semiconductor die reliability data about the sorted plurality of semiconductor dies to a plurality of semiconductor die packager subsystems.

Abstract: The present invention provides a radio field intensity measurement device having a display portion with improved visibility, in the case of measuring a weak radiowave from a long distance. In the radio field intensity measurement device, a battery is provided as a power source for power supply and the battery is charged by a received radiowave. When a potential of a signal obtained from the received radiowave is higher than an output potential of the battery, the power is stored in the battery. On the other hand, when the potential of the signal obtained from the received radiowave is lower than the output potential of the battery, power produced by the battery is used as power to drive the radio field intensity measurement device. As an element to display the radio field intensity, a thermochromic element or an electrochromic element is used.

Abstract: Used batteries are screened based on a measured Constant-Current Impulse Ratio. A used battery is charged using a Constant Current (CC) until a voltage target is reached, and the current integrated to obtain the CC charge applied, QCC. Then the battery continues to be charged using a Constant Voltage (CV) of the voltage target until the charging current falls to a minimum current target. The current is integrated over the CV period to obtain the CV charge applied, QCV. The measured CCIR is the ratio of QCC to (QCC+QCV). The measured CCIR is input to a calibration curve function to obtain a modeled State of Health (SOH) value. The used battery is sorted for reuse or disposal based on the modeled SOH value. The calibration curve function is obtained by aging new batteries to obtain CCIR and SOH data that are modeled using a neural network.

Abstract: Examples described herein generally relate to wafer testing and structures implemented on a wafer for wafer testing. In an example method for testing a wafer, power is applied to a first pad in a test site (TS) region on the wafer. The TS region is electrically connected to a device under test (DUT) region on the wafer. The DUT region includes a DUT. The TS region and DUT region are in a first and second scribe line, respectively, on the wafer. A third scribe line is disposed on the wafer between the TS region and the DUT region. A signal is detected from a second pad in the TS region on the wafer. The signal is at least in part a response of the DUT to the power applied to the first pad.

Abstract: For determining a precise orientation and positioning of an endoscope in an electromagnetic field, an endoscope device has a proximal insertion head and has a shaft extending distally therefrom having a center axis. The shaft extends with at least one elongated lumen through the device. A sensor rod has at least two sensor coils arranged with finite spacing in relation to one another in the longitudinal direction. The at least two sensor coils are oriented in relation to one another at a finite angle.

Abstract: A test system for measuring electrical current consumption of a device under test (DUT) includes a capacitor with power and ground terminals; a voltage regulator with input and output terminals; first and second switching elements; and a controller. The voltage regulator generates a DUT operating voltage based on its input voltage. The first switching element is arranged between a direct current (DC) voltage source and the regulator input, and the second switching element is arranged between the DC voltage source and the capacitor. The controller operates the switching elements to charge the capacitor, and to configure the test system for measuring operating current of the DUT using the capacitor as the power source.

Abstract: A current sensor integrated circuit configured to sense a current through a current conductor includes a lead frame at least one signal lead, a fan out wafer level package (FOWLP), and a mold material enclosing the FOWLP and a portion of the lead frame. The FOWLP includes a semiconductor die configured to support at least one magnetic field sensing element to sense a magnetic field associated with the current, wherein the semiconductor die has a first surface on which at least one connection pad is accessible, a redistribution layer in contact with the at least one connection pad, and an insulating layer in contact with the redistribution layer, wherein the insulating layer is configured to extend beyond a periphery of the semiconductor die by a minimum distance. The die connection pad is configured to be electrically coupled to the at least one signal lead.

Abstract: In one example, a first tubular member has a first diameter and is configured to attach to a printed circuit board. A second tubular member has a second diameter different from the first diameter and is configured to hold an environmental sensor for collecting data relating to an environment of the printed circuit board. The second tubular member is vertically adjustable relative to the first tubular member.

Abstract: Systems and methods are provided for characterizing shuttle capture events in a nanopore sensor. The method first collects time-dependent current blockage signatures for at least one bias voltage. The method then identifies each signature as corresponding to a permanent or transient event. The method then generates a protein dynamics landscape (PDL) for the transient event signatures. The PDL comprises a set of histograms of nanopore current data and characterizes current through the nanopore during shuttle capture events. The method can then comprise identifying an entrance level blockage value based on the permanent event signatures. Permanent event captures can be determined by time duration which is larger than a certain threshold time value. Applying a between the fluidic chambers above a threshold voltage level can be used to control that the vast majority of events are permanent.

Abstract: A tool, system, and method are disclosed for locating a hidden stud and identifying angles on a finished wall. The tool includes an elongated housing, at least one magnet, and at least one level. The housing has a generally planar contact surface disposed opposite a viewing surface. The at least one magnet is secured to the housing such that a magnetic field from the at least one magnet extends from the contact surface. The level is secured to the housing such that the level is viewable from the viewing surface. The at least one magnet, the level, and the housing are sized relative to each other such that a magnetic attraction between the at least one magnet and a metallic element in the wall is sufficient to maintain the tool on the wall without external support.

Abstract: A method and a measurement system for determining the noise power of a device under test especially the exact noise power is provided. The measurement method comprises determining a sideband gain of a measurement system using a calibration unit, connecting a device under test to the measurement system, measuring a noise power of the device under test with a receiver and correcting the measured noise power with the determined system gain including a sideband gain.

Abstract: The invention concerns a method for measuring a power (Pe, Pm) of an electric motor, that involves measuring a real current (I) of the motor, by means of a measurement sensor (11), the invention being characterised in that it involves inputting, on an interface (20), at least one piece of nominal power data (Pn), one piece of nominal speed data (Wn), one piece of nominal current data (In), one piece of nominal voltage data (Un), one piece of power factor data (cos ?) and the real current (I) of the engine, calculating, in the computer, a no-load current of the motor according to a first stored function depending on at least the data (Pn, In, Un, cos ?), calculating, in the computer, the active power (Pe) and/or the mechanical power (Pm) and/or the active energy and/or the mechanical energy according to at least one second stored function depending on at least the data (Pn, In), the real current (I) and the no-load current that has been calculated, and providing the power that has been calculated on an output

Abstract: An in-wall feature detection device of mutual capacitive technology comprises a housing, a detection baseplate, and at least one capacitive sensing baseplate. The detection baseplate is disposed in the housing and has a central processing module and a capacitance value conversion module and is electrically connected to at least one display module. The capacitive sensing baseplate is provided with driving modules and receiving modules, the driving and receiving modules are arranged in a crisscross manner and electrically connected to the capacitance value conversion module. The in-wall feature detection device is capable of using an electric field change between the driving and receiving modules to determine whether there is a blocking object in a wall, and further generating a corresponding light signal through the central processing module to display a shape of the blocking object. Thereby determining a position and the shape of the blocking object during construction.

Abstract: A superconducting electronic circuit includes at least two SQUID elements, an array of at least three Josephson Junctions, and a magnetic source element. Each SQUID element has no shared Josephson Junctions or at least one shared Josephson Junction with another SQUID element and at least one exclusive Josephson Junction. The array of at least three Josephson Junctions are connected in one, two, or three-dimensions. The magnetic source element has an electrically-tunable spatially non-uniform magnetic field.

Abstract: A heating, ventilation and air conditioning (HVAC) controller, a method of detecting multiplexed input signals and an HVAC system employing the controller or the method. In one embodiment, the HVAC controller includes: (1) a signal conditioner configured to convert received alternating current (AC) input signals into corresponding square wave signals of a digital logic voltage, (2) a multiplexer coupled to the signal conditioner and configured to select one of the square wave signals and (3) a sample analyzer coupled to the multiplexer and configured to evaluate multiple samples of the selected one of the square wave signals to derive a binary state.

Abstract: A test apparatus and method for testing a semiconductor device. The semiconductor device includes an integrated circuit and a plurality of external radiating elements located at a surface of the device. The external radiating elements include at least one transmit element and receive element. The test apparatus includes a plunger. The plunger includes a dielectric portion having a surface for placing against the surface of the device. The plunger also includes at least one waveguide. Each waveguide extends through the plunger for routing electromagnetic radiation transmitted by one of the transmit elements of the device to one of the receive elements of the device. Each waveguide comprises a plurality of waveguide openings for coupling electromagnetically to corresponding radiating elements of the device. The dielectric portion is configured to provide a matched interface for the electromagnetic coupling of the waveguide openings to the plurality of external radiating elements of the device.

Abstract: A position sensor system comprising: a magnetic field generator movable relative to two sensor devices or vice versa. The system has at least one processor adapted with a special algorithm for determining a position of the magnetic field generator in a manner which is highly robust against a disturbance field. A method for determining the position of the magnetic field generator based on a set of equations, in particular a set of linear equations which allows to completely eliminate the external disturbance field.

Abstract: A magnetic core structure for a Linear Variable Differential Transducer (LVDT) comprising an elongate core of magnetic material mounted within a protective tube and means for positioning the core within the protective tube, the means for positioning comprising a ball provided within the protective tube at one end of the core, the ball being formed of an elastic material having a coefficient of thermal expansion selected to compensate the difference in elongation between magnetic core structure components caused by thermal expansion.