Abstract: Used batteries are screened based on a measured Sectional Constant-Current Impulse Ratio (SCCIR). A used battery is partially charged over a small voltage range using a Constant Current (CC) until a voltage target is reached, and the current integrated to obtain the CC charge applied, Qcc. Then the battery continues to be charged using a Constant Voltage (CV) of the voltage target until the charging current falls to a midrange current target before the battery is fully charged. The current is integrated over the CV period to obtain the CV charge applied, Qcv. The measured SCCIR is the ratio of Qcc to (Qcc+Qcv) and is input to a calibration curve function to obtain a modeled State of Health (SOH) value for sorting. The calibration curve function is obtained by aging new batteries to obtain SCCIR and SOH data that are modeled using a neural network.

Abstract: A scan chain designing method includes: obtaining test points according to a gate-level netlist; determining integers M and N, wherein M and N are no greater than an amount X of the test points; selecting M and N test points to be a first and second set test points according to a priority; obtaining a first test coverage and a first test pattern count according to the first set test points and obtaining a second test coverage and a second test pattern count according to the second set test points; obtaining a predicted test coverage curve according to the first and second test coverages; determining an optimum amount O according to the predicted test coverage curve, the first and second test pattern counts, wherein O is no greater than X; and selecting O test points to arrange a scan chain according to the priority and the optimum amount O.

Abstract: The present disclosure is directed to methods and systems for remote access hardware testing. A user can remotely control probes connected to an oscilloscope to collect signal measurements of test points on a circuit board. The user can control the probe point position on the circuit board using an application on a device to enter the test point locations. In some implementations, a user controls the probe machine using remote controls and a camera video feed to identify the test points on the circuit board and capture measurements. The hardware testing system can automate the measurement process with a script or by using machine learning to identify test points via a camera, controlling the probe machine, and capturing measurements of the test point.

Abstract: An electrical system comprising a match network comprising a plurality of capacitors, a controller, and a life-consumed module. The controller is configured to operate the plurality of capacitors and relay telemetry data for at least one of the plurality of capacitors to the life-consumed module. The life-consumed module is configured to receive the telemetry data from the controller, environmental data from an environmental input, and reliability data comprising a reliability curve for at least one of the plurality of capacitors from a reliability data datastore, compare the telemetry data and the environmental data to the reliability curve of at least one of the plurality of capacitors, determine the cumulative life consumed of at least one of the plurality of capacitors, and report an estimate of indicative life consumed for at least one of the plurality of capacitors.

Abstract: Provided is an apparatus for measuring a droplet length using a capacitive electrode including: a disposable panel; a board separated from the disposable panel and configured to be reused separately from the disposable panel; a sensing electrode unit patterned on an upper surface of the board and configured to measure a length of a droplet depending on a voltage value measured depending on a capacitance value of the fluid passing through the microfluid channel; a thin film provided on a lower surface of the disposable panel; and a negative pressure forming means configured to apply a negative pressure between the disposable panel and the board so that the disposable panel and the board are attached to or detached from each other.

Abstract: Silicon test structures are described that enable separate measurement of n-channel metal-oxide semiconductor (NMOS) and p-channel metal-oxide semiconductor (PMOS) transistor delays. NMOS and PMOS specific non-inverting stages may be used to construct a multi-stage ring oscillator. Each of the non-inverting stages generates either a rising or falling primary transition that is determined by either NMOS or PMOS transistors, respectively. The opposing transition for a particular non-inverting stage is triggered by propagation of the primary transition to a subsequent non-inverting stage (producing a “reset” pulse). A frequency of the ring oscillator is determined by the primary transition and one transistor type (NMOS or PMOS). Specifically, the frequency is determined by the propagation delay of the primary transition through the entire ring oscillator.

Abstract: A magnetic sensor chip includes a substrate including a first main surface, and a magnetoresistive element having a magnetosensitive direction parallel or substantially parallel to the first main surface. The magnetoresistive element includes a reference layer, an intermediate layer, and a free layer stacked in a stacking direction perpendicular or substantially perpendicular to the first main surface. A direction of magnetic anisotropy of the free layer where no external magnetic field acts on the magnetic sensor chip is parallel or substantially parallel to the stacking direction and perpendicular or substantially perpendicular to the magnetosensitive direction. When a stress acts on the substrate predominantly in a first direction parallel or substantially parallel to the first main surface, a direction of stress-induced magnetic anisotropy in the free layer is perpendicular or substantially perpendicular to the magnetosensitive direction and the stacking direction.

Abstract: Provided is a welding management system that appropriately manages welding. The welding management system (100) includes a plurality of local magnetic sensors (10a to 10f) provided around a target joining position (K) and a correction magnetic sensor (20) curved to surround the target joining position (K). A data processing unit (30) generates information of a joining state of the target joining position (K) based on a difference between a detection value of each of the plurality of the local magnetic sensors (10a to 10f) and a detection value of the correction magnetic sensor (20).

Abstract: The invention relates to a sensor arrangement (7) for detecting a position and/or a displacement of a flux element assembly (8) along a longitudinal direction, with a coil assembly (1) and the flux element assembly (8), wherein the coil assembly (1) comprises at least two flat coils (2a, b), wherein the flux element assembly (8) comprises at least two flux elements (9a, b), wherein the at least two flux elements (9a, b) are arranged adjacent to one another in the longitudinal direction and offset in transverse direction, wherein the flux element assembly (8) and the coil assembly (1) are movable and/or displaceable relative to one another in the longitudinal direction, wherein the flat coils (2a, b) are designed, such that an actual inductance (L1, L2) of each flat coil (2a, b) is dependent on the actual displacement of the flux element assembly (8) relative to the coil assembly (1), with an evaluation device, which is set up to determine the actual inductance (L1, L2) for each flat coil (2a, b) and determine

Abstract: The present disclosure a program burning device configured to read or write to a program burning interface. The program burning device includes a microprocessor, a programming drive circuit and an overcurrent protection circuit. The microprocessor outputs a first test signal or a second test signal. The programming drive circuit outputs a high driving voltage or a low driving voltage to the program burning interface. After the programming drive circuit outputs the low driving voltage for a preset time, the programming drive circuit outputs the high driving voltage to make the program burning interface form a high impedance. Afterwards, the overcurrent protection circuit receives the first test signal to trigger the overcurrent protection, and then receives the second test signal to trigger the undercurrent protection. If triggering the overcurrent protection and the undercurrent protection are continuously failed over a preset number of times, the microprocessor determines that current protection is failed.

Abstract: A calibration amplifier includes: a plurality of transistors and a variable resistor configured to change in response to clock pulses. During a calibration cycle, one of the plurality of transistors switches on in each calibration step based on a plurality of enable signals, and a gain of the calibration amplifier changes until an output voltage of the calibration amplifier exceeds a reference voltage and is set to a calibrated gain. The calibration amplifier outputs the output voltage by amplifying an input voltage using the calibrated gain.

Abstract: A disconnection detecting system for detecting disconnection of any of a plurality of wires included in a cable is provided. The disconnection detecting system includes: a bending mechanism configured to periodically apply force to the cable so as to cause the cable to reciprocate between a first bending state to be bent in one direction of clockwise and counterclockwise directions and a second bending state to be bent in the other direction; and a measuring apparatus configured to measure a resistance value of the cable, which varies on a time series basis in accordance with the reciprocation of the bending mechanism, and extract a component of a bending frequency for reciprocating between the first and second bending states once from frequency components included in time-series variation in the resistance value of the cable. The disconnection is detected on a basis of amplitude of the component of the bending frequency.

Abstract: A test socket includes: a first body including a fixing portion configured to receive a sample having a plurality of test terminals; a second body facing the first body and coupled with the first body such that the second body rotates relative to the first body about a hinge pin; a test board provided on the second body and configured to test the sample, wherein the test board has a plurality of first openings provided therein; and a plurality of interface pins penetrating through the first openings, wherein each of the plurality of interface pins includes a contact pin and a spring, wherein the contact pin is provided in a first end portion of each of the plurality of interface pin and is configured to come into contact with a test terminal of the plurality of test terminals, and the spring elastically supports the contact pin.

Abstract: An induction sensor assembly for a securing and locking unit of a telescoping jib having at least one signal transmitter configured for generating an electromagnetic stray field oriented towards its active switching surface, and at least one switching element provided for contactless cooperation with the signal transmitter. The signal transmitter and switching element are displaceable relative to each other in relation to an adjusting direction extending in parallel with a main plane. To provide a simple and cost-effective installation of the induction sensor assembly despite having high detection security, the active switching surface of the signal transmitter and the main plane are inclined with respect to each other. As such, the electromagnetic stray field of the signal transmitter is also advantageously inclined whereby a possible displacement between the signal transmitter and switching element cannot exert an influence on the precision of the position detection in relation to the adjusting direction.

Abstract: A physiological state index calculation system, a physiological state index calculation method, and a non-transitory computer readable medium for capturing subtle changes in a physiological state of a living body are provided. The physiological state index calculation system includes a band-pass filter that filters cerebral blood flow waveform information obtained from a cerebral blood flow of a living body in at least one frequency band, and a complex number conversion unit configured to convert the filtered cerebral blood flow waveform information into a complex number for at least one frequency band. The cerebral blood flow waveform information converted into a complex number by the complex number conversion unit is an oscillator that reflects a physiological state of a living body.

Abstract: The present invention provides a system and method for measuring an intermittent operating life (IOL) of a GaN-based device under test (DUT) is provided. The system is operable in a stressing mode, a cooling mode and a measure mode. A power regulation approach is adopted to ensure that DUT of the same thermal resistance have same temperature increase during the IOL test. The present invention eliminates the influence caused by parasitic parameters of testing circuits and the inconsistency of threshold voltage and drain-source resistance of the device itself. Through power regulation, it is the junction temperature of the device, not the housing temperature of the device, being directly controlled. Therefore, higher measurement accuracy can be achieved.

Abstract: Provided are a voltage sensing circuit, including a first sub-sensing circuit including a light emitting device, and electrically connected in parallel to a battery, and a second sub-sensing circuit including a light receiving device optically coupled to the light emitting device, and electrically isolated from the first sub-sensing circuit. The light emitting device is for generating an optical signal in response to a voltage across the light emitting device. The second sub-sensing circuit is for outputting a voltage sensing signal indicating a level of voltage across the battery in response to the optical signal. When the voltage across the battery is equal to a first reference voltage indicating an overvoltage state of the battery, a second reference voltage which is lower than the first reference voltage is applied across the light emitting device. The second reference voltage is lower than a threshold voltage of the light emitting device.

Abstract: Systems, devices, and methods are described herein for measuring an impedance of a DUT using an integrated impedance measurement device. A system includes a plurality of measurement circuits, a FFT processor, and a controller. The measurement circuits are coupled to the DUTs. Each measurement circuit is configured to generate a clock signal for a respective DUT, detect a voltage of the respective DUT, and generate first voltage related data using the clock signal and the voltage. The FFT processor is coupled to the measurement circuits. The FFT processor is configured to convert the first voltage related data into second voltage related data using a fast Fourier transform for each measurement circuit. The controller is coupled to the measurement circuits and the FFT processor. The controller is configured to calculate an impedance using the second voltage related data for each measurement circuit and output the impedance to each DUT.

Abstract: A test system for a memory card includes a first circuit board. One side of the first circuit board is provided with a plurality of contact groups spaced apart from each other along a row direction. Another side of the first circuit board is provided with slots disposed along the row direction. The test system further includes a second circuit board. The second circuit board is provided with a test circuit, and is inserted into the slot along a direction perpendicular to the first circuit board. The second circuit board provides a test signal to the contact groups.

Abstract: A method is provided. The method includes obtaining sensor data indicative of a set of objects detected within an environment. The method also includes generating a state graph based on the sensor data. The state graph includes a set of object nodes and a set of property nodes. The method further includes obtaining user input data generated based on a natural language input. The method further includes updating the state graph based on the user input data to generate an enhanced state graph. The enhanced state graph includes additional nodes generated based on the user input data. The method further includes generating a set of instructions for a set of mechanical systems based on the enhanced state graph. The method further includes operating the set of mechanical systems to achieve a set of objectives based on the set of instructions.