Abstract: A sensor system, particularly for monitoring the mixing of at least two fluids and a method for monitoring the mixture of at least two liquids. The present invention provides a sensor system for fluids, comprising at least two level sensor which are arranged vertically one upon the other on and connected to an electronic circuit board, four electrodes of four conductivity sensors which are arranged horizontally next to each other at the bottom of and connected to the electronic circuit board; and a temperature sensor which is connected to the electronic circuit board; a connector for connecting the electronic circuit board to a controller; wherein the electronic circuit board is embedded in a hot melt compound which is surrounded by an injection molded housing.

Abstract: A fingerprint sensor package includes a first substrate including a core insulating layer; a first bonding pad on the core insulating layer; and an external connection pad between an edge of the second surface of the core insulating layer and the first bonding pad, a second substrate on the core insulating layer, the second substrate including: a plurality of first sensing patterns spaced apart in a first direction and extending in a second direction intersecting with the first direction; a plurality of second sensing patterns spaced apart from each other in the second direction and extending in the first direction; and a second bonding pad, a conductive wire connecting the first bonding pad to the second bonding pad; a controller chip on the second substrate; and a molding layer covering the second substrate and the first bonding pad and spaced apart from the external connection pad.

Abstract: In an optical carrier injection method, a pulsed optical beam having pulse duration of 900 fs or lower is applied on a backside of a substrate of an integrated circuit (IC) wafer or chip, and is focused at a focal point in an active layer on a frontside of the substrate. Photons of the optical beam are absorbed at the focal point by nonlinear optical interaction(s) to inject carriers. The pulsed optical beam may be applied using a fiber laser in which the fiber is doped with Yb and/or Er. An output signal may be measured, comprising an electrical signal or a light output signal produced by the IC wafer or chip in response to the injected carriers. By repeating the applying, focusing, and measuring over a grid of focal points in the active layer, an image of the IC wafer or chip may be generated.

Abstract: A magnetic resonance imaging device may include a field generator for generating at least one magnetic gradient field. The field generator may include a first magnet and a second magnet confining an imaging volume of the magnetic resonance imaging device in two spatial directions. The first magnet and the second magnet may be arranged asymmetrically with respect to the imaging volume. The magnetic resonance imaging device may be used to perform a method for acquiring an image of a diagnostically relevant body region of a patient.

Abstract: An example of the present disclosure provides a protective relay inspection device including: a connection unit connected to a protective relay; and an inspection unit which, upon receiving a relay setting-providing signal including relay setting information for the protective relay via the connection unit, processes an inspection of a relay function of the protective relay on the basis of the relay setting-providing signal. Here, the inspection unit includes: a plan generation unit which generates inspection plan information for an automatic inspection function on the basis of the relay setting-providing signal; and an inspection processing unit which inspects the relay function of the protective relay on the basis of the inspection plan information.

Abstract: A method of determining a linear or angular position of a magnetic sensor device relative to a magnetic source, or vice versa, the sensor device includes at least four magnetic sensor elements. The method involves the steps of: a) determining a first magnetic field gradient; b) determining a second magnetic field gradient; c) determining a ratio of the first and second magnetic field gradient; d) converting the ratio into a position; while matching signal paths of the magnetic sensor elements so as to improve signal-to-noise.

Abstract: A method for testing a photovoltaic panel connected to an electronic module. The electronic module includes an input attached to the photovoltaic panel and a power output. The method activates a bypass to the electronic module. The bypass provides a low impedance path between the input and the output of the electronic module. A current is injected into the electronic module thereby compensating for the presence of the electronic module during the testing. The current may be previously determined by measuring a circuit parameter of the electronic module. The circuit parameter may be impedance, inductance, resistance or capacitance.

Abstract: An electrical stability testing device includes a cup configured to receive a fluid sample. The testing device also includes a pair of electrodes positioned at least partially within the cup. The electrodes are spaced apart from one another by a predetermined gap. The electrodes are configured to have the fluid sample positioned within the predetermined gap while performing an ES test on the fluid sample in the cup. The testing device also includes a wiper positioned at least partially within the cup. The wiper is configured to pass between the electrodes after the ES test has concluded. A width of the wiper is greater than the predetermined gap between the electrodes. The wiper is configured to deform as the wiper passes through the predetermined gap such that the width becomes substantially equal to the predetermined gap and sides of the wiper contact ends of the electrodes to clean the electrodes.

Abstract: A current detecting circuit includes a first switching element, a second switching element, and a third switching element electrically coupled in series with the first switching element. An output side of the third switching element is electrically coupled to an output terminal. The current detecting circuit includes a current amplifier configured to detect a difference between a first output voltage of the first switching element and a second output voltage of the second switching element. The current amplifier outputs a relative current to be used for detecting an output current that flows out from the output terminal. A ratio of resistance associated with the first switching element to resistance associated with the second switching element is n:1.

Abstract: Embodiments of the present disclosure provide a spin-qubit quantum magnetometer and radar apparatus, entirely implemented in silicon and with full electrical control. By default, each detection element of the silicon-based spin-qubit quantum magnetometer and radar apparatus with full electrical control of the invention is built around a Field Effect Transistor (FET) on silicon over insulator with a back-gate as well as two front gates, which can be adjacent to one another along the Drain-Source FET channel or alternatively placed across that same channel and facing each other as corner gates.

Abstract: A reference electrode assembly including an extension device having a first end opposite a second end and a fluid reservoir disposed between the first end and the second end, a reference electrode engageable with the extension device at the first end of the extension device, an end cap having an external electrical connector positioned at the second end of the extension device, a selectively actuatable spout fluidly coupled to the fluid reservoir, and a conductive wire extending through the fluid reservoir to electrically couple the reference electrode with the external electrical connector.

Abstract: Methods and devices for the characterization of biological specimens by the use of electroluminescent materials. When placed in close proximity or direct contact to a biological specimen and an electrical signal is transmitted, electroluminescence is generated in response to the presence of the specimen. The electroluminescence produced can be in the form of an image of the specimen. The image is captured by an optical device that collects light and displays or otherwise processes the image according to the particular need or purpose. In general, the method requires preparing an electroluminescent assembly including the biological specimen, a dielectric layer, and a substrate, put together in any order. The method uses an electrical signal transmitted to the assembly. The device may be configured in a closed-circuit electrical configuration or it may be in a configuration where the EL assembly is at open circuit with respect to the power source.

Abstract: A system for testing a semiconductor may include a transfer chamber, at least one loadlock chamber and at least one test chamber. The transfer chamber may include a plurality of sidewalls. The loadlock chamber may be arranged on a first sidewall of the sidewalls of the transfer chamber. The loadlock chamber may include a carrier configured to receive a plurality of wafers. The test chamber may be arranged on a second sidewall of the sidewalls of the transfer chamber. When the transfer chamber is connected to the loadlock chamber, a pressure of the transfer chamber may be changed into a pressure of the loadlock chamber. When the transfer chamber is connected to the test chamber, the pressure of the transfer chamber may be changed into a pressure of the test chamber.

Abstract: Disclosed is a fixture including: a base including a bearing surface for bearing a T-CON board, and a limit mechanism for limiting displacement of the T-CON board in a direction parallel to the bearing surface; and a probe assembly for jointing with an upgrading lead port of the T-CON board, wherein the probe assembly is installed on the base and has an adjustable relative position with the bearing surface in a direction perpendicular to the bearing surface. When in upgrading, the T-CON board is arranged on the bearing surface of the base firstly, the position of the T-CON board is fixed by the limit mechanism, and the probe assembly is aligned with the upgrading lead port of the T-CON board, and is adjusted and moved in the direction perpendicular to the bearing surface so as to joint with the upgraded lead port of the T-CON board.

Abstract: A welding helmet can record a welding time based on an arc intensity detected by a sensor mounted on the helmet. A configured level is compared with the arc intensity detected by the sensor to determine a welding duration. Individual welding times from multiple welding instances can be accumulated over a period of time to provide a total welding time for an operator. The total welding time may be stored in the welding helmet.

Abstract: Superconducting integrated circuits may advantageously employ superconducting resonators coupled to a microwave transmission line to efficiently address superconducting flux storage devices. In an XY-addressing scheme, a global flux bias may be applied to a number of superconducting flux storage devices via a low-frequency address line, and individual superconducting flux storage devices addressed via application of high-frequency pulses via resonators driven by the microwave transmission line. Frequency multiplexing can be employed to provide signals to two or more resonators. A low-frequency current bias may be combined with a high-frequency current in one or more superconducting resonators to provide Z-addressing. A low-frequency current bias may be combined with a high-frequency current in one or more superconducting resonators to eliminate a flux bias line.

Abstract: Coaxial load pull tuners use one horizontally-only moving metallic reflective probe inserted in the slabline at fixed penetration and an adjustable RF energy absorbing eccentrically into the slabline rotated disc. The tuner does not use high precision vertical axes. The remotely adjustable attenuator is inserted adjacent to the test port and mitigates spurious high reflection. Calibration procedures using de-embedding or adapter removal techniques allow high resolution full tuner characterization in a few minutes.

Abstract: A method for measuring an electrical conductivity of a medium with a conductive conductivity sensor with four electrodes includes measuring a first impedance dependent on a first total impedance of the first voltage electrode and a medium layer adjacent to the first voltage electrode, measuring a second impedance dependent on a second total impedance of the second voltage electrode and a medium layer adjacent to the second voltage electrode, and making a conductivity measurement using an alternating electrical signal introduced into the medium via the first current electrode and measuring a potential difference between the first voltage electrode and the second voltage electrode. Based on the measured potential difference, the first impedance, and the second impedance a corrected potential difference is determined. Based on the corrected potential difference, a measured conductivity is determined.

Abstract: A method for testing a photovoltaic panel connected to an electronic module. The electronic module includes an input attached to the photovoltaic panel and a power output. The method activates a bypass to the electronic module. The bypass provides a low impedance path between the input and the output of the electronic module. A current is injected into the electronic module thereby compensating for the presence of the electronic module during the testing. The current may be previously determined by measuring a circuit parameter of the electronic module. The circuit parameter may be impedance, inductance, resistance or capacitance.

Abstract: A method for testing a device for monitoring an item of equipment of a motor vehicle. The method includes controlling a driver with a microcontroller in order that the driver performs at least one diagnosis, detecting an electrical fault of the monitoring device, positioning a switch connecting the driver and the circuit board in its open position, controlling the driver with the microcontroller in order that the driver reiterates the at least one diagnosis, and, in the event of the electrical fault being detected again, locating the electrical fault on the driver or, in the event of absence of detection of the electrical fault, locating the electrical fault outside the driver and in particular on the circuit board or between the driver and the circuit board.