Abstract: A calibration configuration for setting an adjustable impedance has a voltage divider with a variable resistor and a resistor connected in series, which circuit is supplied with potentials of a supply voltage and has, between the resistors, a partial voltage tap off terminal. A circuit has a further resistor, whose value is in a fixed relationship with a resistance of the first voltage divider resistor, and generates a voltage dependent upon a value derived from the further resistor. The voltage and the partial voltage are fed to a comparator for outputting a comparison result to a downstream control logic unit, which logic unit is coupled to the resistor of the first voltage divider and generates a control signal dependent upon the comparator output signal. The control logic unit control signal is used to set the variable resistor until the voltages fed to the comparator correspond to one another.

Abstract: Radio Frequency (RF) signal network measurement data of a device under test are acquired by exciting the device using a modulated RF excitation signal, while measuring RF signal data at the signal ports of the device, measuring bias signal data, and processing the RF signal data and the bias signal data, providing the RF signal network measurement data of the device. By acquiring bias signal data, in particular by measuring variations in the bias signals, a more accurate and reliable characterization of the non-linear behavior of the device under test can be provided. A Non-linear Network Measurement System (NNMS) is arranged for acquiring the RF and biasing signal data and characterizing the non-linear signal behavior of a device under test.

Abstract: A method and system to locate and detect voids in films that are involved in critical dimension (CD) structures and non-critical dimension structures in semiconductor devices are presented. One or more test structures (resolution devices) are formed on a semiconductor wafer. A scanning electron microscope is operated in voltage contrast mode to obtain a digital representation of the test structure. The voltage contrast image of the test structure is then analyzed with a system which automates the location, identification, and categorization of voids in the test structure. Additionally, the method is more sensitive to electrical marginalities caused by voids than other wafer electrical testing methods. The method is suitable inline monitoring during a manufacturing process by utilizing the automation of void identification, location, and categorization as a process monitoring parameter.

Abstract: A method for determining the location of a target subterranean structure from within an adjacent borehole is disclosed which uses first and second gravity measurement devices disposed at corresponding first and second positions in the adjacent borehole and a magnetic field measurement device disposed one of the first and second positions. The method includes processing a total local magnetic field, a reference magnetic field, and a local azimuth determined using the gravity measurement devices to determine a portion of the total magnetic field attributable to the subterranean structure multiple points in the adjacent borehole. The location of the subterranean structure is determined using the portion of the total magnetic field attributable thereto. A system adapted to execute the disclosed method and a computer system including computer-readable logic configured to instruct a processor to execute the disclosed method are also provided.

Abstract: A cable for use with an electronic battery tester includes first and second electrical connections configured to couple to terminals of a battery. A memory is configured to store digital data. Electrical terminals are configured to couple the cable to the electronic battery tester.

Abstract: A method and a circuit for detecting variations of at least one environmental parameter of an integrated circuit, including evaluating a propagation delay of an edge in delay elements sensitive to variations of the environmental parameter, and comparing the present or measured delay with at least one reference value.

Abstract: Carbon nanotubes are formed on projections on a substrate. A metal, such as nickel is deposited on the substrate with optional platforms, and heated to form the projections. Carbon nanotubes are formed from the projections by heating in an ethylene, methane or CO atmosphere. A heat sensor is also formed proximate the carbon nanotubes. When exposed to IR radiation, the heat sensor detects changes in temperature representative of the IR radiation. In a gas sensor, a thermally isolated area, such as a pixel is formed on a substrate with an integrated heater. A pair of conductors each have a portion adjacent a portion of the other conductor with projections formed on the adjacent portions of the conductors. Multiple carbon nanotubes are formed between the conductors from one projection to another. IV characteristics of the nanotubes are measured between the conductors in the presence of a gas to be detected.

Abstract: Precision measurement of optical signal power is provided. In one implementation, a Wilson current mirror senses current through an avalanche photodiode (APD) that has been exposed to the optical signal. The output of this APD may also be used to recover data. By incorporating a high voltage transistor as the buffer, the Wilson current mirror is able to operate in series with the APD at a high bias level.

Abstract: A welding system having a welding gun, comprising a casing that is grounded through a ground conductor, and a monitoring device, which detects the resistance of the ground conductor. A blanking device deactivates the monitoring device during the welding operation to reduce the danger of shut-downs through the ground integrity monitor. It is proposed to either deactivate the measuring circuit of the ground integrity monitor or to switch off the welding power interruption associated therewith as long as a welding current may flow or is flowing through the ground conductor. The monitoring device is deactivated or blanked out only for an essentially negligible fraction of the entire time, and there is no danger of any impairment of safety due to this short-term deactivation.

Abstract: Driver circuit (1) for actuating an electrical device via a control line (3) and for diagnosing the state of the control line (3) and/or of the actuated device, having a test circuit (Q1-Q6, R1-R6), connected to the control line (3), for measuring the electrical output current flowing via the control line (3), and an evaluation unit (5-8), connected to the test circuit, for generating a diagnostic signal (DIAG) on the basis of the measured output current, the test circuit having at least one current mirror circuit (Q1, Q2; Q4-Q5).

Abstract: A pulsed eddy current sensor probe includes a sensor array board. A number of sensors are arranged on the sensor array board and are operable to sense and generate output signals from the transient electromagnetic flux in a part being inspected. Each of the sensors has a differential output with a positive and a negative output. At least one drive coil is disposed adjacent to the sensors and is operable to transmit transient electromagnetic flux into the part. A first and a second multiplexer are arranged on the sensor array board and are operable to switch between the sensors. The first and second multiplexers are connected to the positive and negative outputs of the sensors, respectively.

Abstract: A test apparatus and method of measuring pulling of the frequency of an oscillator. The apparatus includes a bias tee, a power supply, a spectrum analyzer, a second power supply, a symmetrical resistive power splitter, a power meter and a synthesized signal generator. The method includes sweeping the synthesized signal generator frequency from the nominal frequency down to a first frequency. The first frequency is recorded when the oscillator goes out of frequency lock as a first pulling frequency. The synthesized signal generator frequency is then sweet from the nominal frequency up to a second frequency and the second pulling frequency is recorded when the oscillator goes out of frequency lock. The difference between the first and second pulling frequencies is the peak to peak pulling value.

Abstract: A high-bandwidth electrical test probe having a probe contact spring of reduced size and characteristic capacitance is presented. The probe includes a contact spring connected at one end to the input port of a probe circuit. The opposite end of the contact spring enters the a probe socket and a predetermined angle of entry. The probe socket has a bore formed therein which is arranged at a non-zero angle relative to the angle of entry of the contact spring into said probe socket bore, thereby guaranteeing electrical contact with the bore. The design allows the use of a very small contact spring, on the order of tens of mils, thereby reducing the parasitic capacitance of the spring and allowing much higher bandwidths than heretofore achievable.

Abstract: A capacitive fingerprint sensor against ESD damage and contamination interference includes a substrate, a plurality of plate electrodes, a metal mesh, a plurality of ESD units, a plurality of bonding pads, and a protection layer. The plate electrodes, bonding pads and metal mesh are positioned on the substrate at the same level, and are composed of the same material. The ESD units are connected to the metal mesh that is conducted to the ground, and are exposed via a plurality of first openings. Thus, electrostatic charges from a finger may be discharged through this path to the ground. The metal mesh is covered by the protection layer and is not exposed. The number of the ESD units is far less than that of the plate electrodes so as to reduce the contamination interference on the captured fingerprint image.

Abstract: A multiple electrode for measuring electro-physiological characteristics of a biological specimen includes a plurality of micro-electrode provided on a first region on a substrate, and a reference electrode provided in a second region on the substrate. The reference electrode includes at least one stimulus reference electrode for applying an electrical signal to the plurality of micro-electrodes. Preferably, the reference electrode includes at least one measurement reference electrode for detecting an electrical signal from the plurality of micro-electrodes, and the stimulus reference electrode is electrically insulated from the measurement reference electrode. Preferably, the second region is placed at a distance from an outer edge of the first region, and surrounds the first region.

Abstract: The invention relates to an internal solution ground for primary use with a pH sensor, and preferably with a multi-sensing instrument monitoring a pH sensor and one or more additional secondary sensors having non-isolated circuits. In one aspect, a pH sensor assembly includes a pH electrode, a reference electrode, and an internal solution ground wire. The internal solution ground wire shares a liquid junction with the reference electrode but is protected by the reference fill solution. In one embodiment, the internal solution ground can be electrically isolated through a capacitor or, alternately, a capacitor and resistor in parallel.

Abstract: An electric circuit arrangement and method for checking intactness of both a photodiode array and an electrical connection between an array output and a microprocessor input. The array output has a high resistance when the array is inactive and intact. In case of array error, the array output is connected via in each case a defined internal resistance to ground and supply voltages. The circuit arrangement enables at any time an assessment of the status of the connection and, if the connection is intact, enables an assessment of array intactness. This is achieved by connecting the array output via a first test resistor arranged in the spatial vicinity of the array to the ground voltage and by connecting the microprocessor input via a second test resistor arranged in the spatial vicinity of the microprocessor to a microprocessor port output which can be connected either to the ground or supply voltages.

Abstract: A measuring apparatus correctly measures the purity, mixing ratio, and the like of an insulative (nonconductive) fluid such as ultrapure water flowing through a passage. The apparatus includes first to third sensors (19, 21, 23) to detect capacitance changes on the passage (1a) covered with an insulating resin pipe, a memory (41) to store reference capacitance changes, and a controller (35) to compare the detected capacitance changes with the stored reference capacitance changes, measure a purity of the insulative fluid flowing through the passage, and control the purity of the insulative fluid.

Abstract: A testing mode is provided for self testing of the transmitter and receiver pair provided on-chip. The testing mode targets each module individually; wherein when one of the two devices is placed under test, the other is used as a tester. When the transmitter is the device under test and the receiver is the tester that receives a transmitted signal from the transmitter, the receiver is used to determine the data eye size with the transmitted signal. When the receiver is the device under test and the transmitter is the tester, the transmitter is used to determine the amount of noise and power loss tolerated by the receiver.

Abstract: Disclosed herein is a method of measuring a dielectric constant of a Printed Circuit Board (PCB) for a Rambus Inline Memory Module (RIMM), which includes the steps of measuring a length of a Rambus product of a PCB, applying an input waveform to the Rambus product at a certain probing position and obtaining a cross point of rising times of the input waveform and an output waveform generated by reflection of the input waveform, obtaining time corresponding to the cross point, and calculating a dielectric constant by substituting the measured length of the Rambus product and the obtained time for corresponding variables of a dielectric constant calculating equation.