Abstract: Disclosed are methods and apparatus for testing opto-electronic devices. Test data is shifted into a first boundary-scan cell. A test is then launched from the first boundary-scan cell by outputting the shifted test data to a signal generator. The signal generator, in turn, provides conditioned test data to an opto-electronic transmitter, in response to the shifted test data and at least one constraint for operating the opto-electronic transmitter. Finally, a response to the test is captured.

Abstract: Embodiments of the invention describe a method and apparatus used to determine the position of a wiper on a potentiometer without the need for an external ADC. Two capacitors are each connected to an end of a potentiometer, and then are charged or discharged simultaneously by a current source or current sink attached to the wiper of the potentiometer. The time required for each of the capacitors to charge or discharge to a threshold voltage level is measured and subsequently used to determine the position of the wiper on the potentiometer.

Abstract: A method and system for determining an operating voltage for a semiconductor device. A first plurality of lifetimes may be determined for a first plurality of semiconductor device where the polysilicon lines in each of the first plurality of semiconductor devices have the same total area but different peripheral lengths. A second plurality of lifetimes may be determined for a second plurality of semiconductor devices where the polysilicon lines in each of the second semiconductor device have the same peripheral length but different total areas. Further, the STI structures (used to separate one or more active areas) in each of the second plurality of semiconductor devices may have the same length as the STI structures (used to separate one or more active areas) in each of the first plurality of semiconductor devices. The operating voltage may be determined based on the first and second plurality of lifetimes.

Abstract: A procedure and a system for the evaluation of the quality and/or efficiency of a cable or a cable segment by a current measurement is disclosed. This is achieved by supplying between the core and the screen of a cable a voltage with alternating polarity and rectangular shape. The periodic duration' of this voltage is selected in a way so as to permit the current measurement of the charge current shortly before a polarity reversal, providing a current value equal to the leakage current.

Abstract: Disconnection defects, short-circuit defects and the like in wiring patters of submicron sizes within TEGs (a square of 1 to 2.5 mm for each) numerously arranged in a large chip (a square of 20 to 25 mm) can be inspected with respect to all the TEGs, with good operability, high reliability and high efficiency. A conductor probe for applying voltage to the wiring patterns by mechanical contact is composed of synchronous type conductor probe that synchronizes with movement of a sample stage (16), and fixed type conductor probe means (21) that is relatively fixed to an FIB generator (10). Positions of probe tips are superimposed to an SIM image and displayed on a display unit (19).

Abstract: A short-circuit detector has connected between positive and negative terminals of a DC power source a series connection including sequentially a first switch, a first detection resistor, a second detection resistor and a second switch, a third switch between a grounding terminal such as a vehicle chassis and a point between the first and second detection resistors and a voltage detector circuit connected in parallel with the first and second detection resistors.

Abstract: A conductivity sensor configuration which has essentially no external electrical field so that the calibration of the sensor is not affected by the existence of nearby external objects or fouling on the exterior parts of the sensor. Additionally, the sensor is relatively insensitive to electrode fouling or electrode polarization. The sensor includes a tube through which the liquid to be measured flows. An inner electrode plate extends partially along the length of the tube dividing the central portion of the tube into two sections. Two inner electrodes are located on the inner wall, one on each side, and two outer electrodes are located on the inside of the tube opposite the inner electrodes.

Abstract: A pair of sensing capacitors, each having a capacitance C1 and C2 respectively, based on a process variable, are coupled to a bridge node which is coupled to a summing node. A reference capacitor, coupled to the summing node, has a capacitance CREF greater than an expected maximum difference between the capacitances of the pair of sensing capacitors. Switches selectively couple the sensing capacitors and the reference capacitor to at least first and second voltages to derive charges representative of C1-C2 and CREF. In one embodiment the sensing capacitors are operated to charge and discharge during respective first and second phases of first cycles and the reference capacitor is operated to charge and discharge during respective first and second phases of second cycles.

Abstract: A pulsed eddy current two-dimensional sensor array probe for electrically conducting component inspection includes a drive coil disposed adjacent to a structure under inspection, a pulse generator connected to the drive coil and operable to energize in a pulsed manner the drive coil to transmit transient electromagnetic flux into the structure under inspection, and an array of sensors arranged in a two-dimensional array and substantially surrounded by the drive coil and operable to sense and generate output signals from the transient electromagnetic flux in the structure under inspection.

Abstract: In one embodiment to reduce unwanted acoustic fan noise, the control signal for a computer system cooling fan is modulated so that the acoustic noise power spectral density of the fan has a bandwidth greater than when the control signal is constant.

Abstract: A detection circuit is described which is configured, in particular, for line drivers for ascertaining the presence of an overshooting of a current flowing through a line above a predetermined value. The detection circuit has two current mirrors, in each case the input of one current mirror being connected to the output of the other current mirror. If the current feeds one current mirror, then an overshooting of the predetermined value can be ascertained on the basis of an output signal of the other current mirror.

Abstract: Apparatus for use in measuring and/or monitoring the relative position or displacement of two elements, includes a pair of elongate electrical conductors (10, 11) adapted to be associated with the respective elements, and means (12, 13, 18) for disposing the conductors at a mutual separation such that a detectable quantum tunnelling current may be generated between them on application of an electrical potential difference between the conductors.

Abstract: An interrogation of a switched state of a switch is carried out with a high interrogation current until a closed switch is detected. The following interrogations of the switched state are then carried out with a low interrogation current until a definable time period which runs starting from a detection of the closed switch or until a definable number of interrogations which is counted starting from the detection of the closed switch is exceeded. After the expiry of the time period or the number of interrogations, the interrogation is continued with the high interrogation current until a closed switch state of the switch is detected again.

Abstract: A capacitive sensor assembly is disclosed. In an exemplary embodiment, the assembly includes a capacitive strip having an elongated body for flexible mounting to a panel along a bottom surface of the elongated body. A first elongated planar conductor is contained within an upper section of the elongated body, while a longitudinal cavity is formed through a central portion of the elongated body. The longitudinal cavity is disposed between the planar conductor and the bottom surface. A capacitance detector module is inserted within the longitudinal cavity, the capacitance detector module including a capacitance detector circuit therein that is coupled to the first elongated planar conductor.

Abstract: An integrated circuit device having a self-resetting phase-locked loop (PLL) circuit. The PLL circuit generates an output clock signal having a first frequency in a first operating mode and a second frequency in a second operating mode, the second frequency being determined, at least in part, by a reference clock signal. A control circuit within the integrated circuit resets the PLL circuit by selecting the first operating mode for a predetermined time interval, then selecting the second operating mode.

Abstract: A probe is disclosed which is suitable for use with an apparatus for monitoring the corrosion of a material by accurately measuring changes in the resistance of an exposed element (101) in relation to a reference element (103). The two elements are electrically connected in series via a bridge (131). The elements are formed from the same piece of material divided along an elongate slot (167) and are proximate to one another so that the temperature difference between them is kept to a minimum. This prevents false indications of corrosion by ensuring that the temperature coefficient of the resistivities is the same in both elements. The reference element (103) is covered with a corrosion-resistant layer. (113). This layer (113) is preferably as thin as possible and also a good thermal conductor to further ensure equal temperature of the reference (103) and exposed (101) elements.

Abstract: In a method and system for assessing the stability of an electric power transmission network, where at least one pair of measurements including a first and a second measurement point (P1,P2), each measurement point comprising a voltage and a current phasor, is processed and where a Thévenin impedance (Zt) and a present stability margin (dS(k)) value are computed, a validity indicator (v) is computed which depends on whether there is a difference between the first and second measurement points and whether there is a difference between corresponding estimated first and second load impedances (Za). From all validity indicators (v) associated with all of the at least one pair of measurements a quality indicator (q) is computed that is associated with the Thévenin impedance value (Zt) and with the present stability margin (dS(k)). The invention allows to continuously compute and output a present stability margin (dS(k)) value and to provide a measure (q) of its quality.

Abstract: Integrated circuitry including a clock circuit powered by a first power supply and a secondary circuit powered by a second power supply. The secondary circuit includes a control signal output for supplying a control signal to the clock circuit and a clock data output for outputting new clock data to the clock circuit.

Abstract: A vehicle provides the automatic activation and deactivation of vehicle lights in a predetermined sequence upon user request to assist the user in making a sight inspection of operation of the lights without further human help.

Abstract: A container having an electrically conductive container body. The container body defines a container cavity. A sensor assembly is disposed within said container cavity. The sensor assembly is electrically isolated from the container body, and is configured for sensing a level of material within the container cavity.