Patents Examined by John Teresinski
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Patent number: 6664776Abstract: Parallel measurements on a plurality of working electrodes E1-E4 during the same pulse-sequence permits voltammetric characterization by, during each cycle of a predetermined pulse-sequence, performing a predetermined number of measurement procedures, each including the steps of: 1) removing the applied first potential P1 from all but one of the working electrodes E1-E4, 2) registering the current passing through the working electrode E1, E2, E3 or E4 still having the first potential P1 applied thereto, 3) storing the registered value in a data storage unit, and 4) applying the first potential P1 on all working electrodes. Thereafter, the stored values are analyzed using a predetermined mathematical model to produce a result.Type: GrantFiled: December 18, 2001Date of Patent: December 16, 2003Assignee: OTRE ABInventor: Arnold Olofsson
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Patent number: 6661235Abstract: The present invention provides a method and device for detecting a discharge in an electrical device comprising, providing a bushing having a bottom lower flange and a top upper flange, providing a shield inside the bushing extending from the bottom lower flange to a position at least below the top upper flange and providing an antenna outside the bushing at least above the position for measuring an output signal from the device for detecting the discharge.Type: GrantFiled: June 8, 2001Date of Patent: December 9, 2003Assignee: Hitachi, Ltd.Inventors: Toshiaki Rokunohe, Hirohiko Yatsuzuka
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Patent number: 6661234Abstract: A failure determining apparatus for a gas-insulated electrical appliance where the appliance is a cylindrical metal container with a charged conductor, insulating gas, and a plurality of insulating spaces inside for supporting the conductor and partitioning the container. The failure determining apparatus has a high-speed developing sensor which detects a high-speed phenomenon caused by a failure within the gas sections; a first failure determining circuit which determines the presence of a failure from an output of the high-speed developing sensor; a low-speed developing sensor which detects a low-speed phenomenon caused by a failure within the gas sections; a second failure determining circuit which determines the presence of a failure from an output of the low-speed developing sensor; and an arithmetic control circuit which identifies a gas section of the metal container in which a failure occurs from an output of the first and second failure determining circuits.Type: GrantFiled: January 9, 2001Date of Patent: December 9, 2003Assignee: Mitsubishi Denki Kabushiki KaishaInventors: Kuniaki Nakashima, Hiroshi Doi, Yasuhiro Maeda, Hirohide Aoki, Hiroyuki Hama, Naoyuki Kajita, Yoshikatsu Honda
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Patent number: 6653825Abstract: The present invention is a meter lead holder device. It includes a base, arm securing mechanism attached to the base, and a first arm having a first end and a second end. The first arm is movably connected to the arm securing mechanism, as well as being moveable in at least a first plane relative to the arm securing mechanism. A meter lead holding mechanism for holding a meter lead is located at the second end of the first arm. Rotation mechanism is connected to at least two of the base, the arm securing mechanism, the first arm and the meter lead holding means. The rotation mechanism is adapted for rotation of the meter lead holder device relative to the base, and includes a locking mechanism for locking and unlocking the first arm in a plurality of positions relative to the arm securing mechanism.Type: GrantFiled: November 29, 2001Date of Patent: November 25, 2003Inventor: Theodore G. Munniksma
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Patent number: 6646447Abstract: There is provided a method for identifying one of a plurality of neutral wires of a power transmission cable. The method comprises (a) applying a signal to a selected neutral wire, at a first point on the power transmission cable, (b) sensing a relative magnitude of the signal on each of the plurality of neutral wires at a second point on the power transmission cable that is remote from the first point, and (c) identifying the selected neutral wire from the relative magnitudes. There is also provided a system for identifying one of a plurality of neutral wires of a power transmission cable.Type: GrantFiled: September 7, 2001Date of Patent: November 11, 2003Assignee: Ambient CorporationInventors: Yehuda Cern, George Kaplun
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Patent number: 6646453Abstract: A method for capacitively measuring the thickness of multi-layer films (10), the layers (32, 34) the dielectric constants of which differ at least at a particular temperature, wherein, in addition to the capacitive measurement, at least one further thickness measurement is carried out under different conditions, and wherein the thicknesses (d1, d2) of the individual layers is determined by comparing the measurement results and by means of the different dielectric constants.Type: GrantFiled: November 6, 2001Date of Patent: November 11, 2003Assignee: Plast-Control Gerätebau GmbHInventors: Frank Müller, Stefan Konermann, Norbert Sappelt
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Patent number: 6646448Abstract: A writer coil in a data head of a data storage system is tested by coupling detection circuitry to the writer coil and driving the writer coil with a periodic pulse signal generated by the detection circuitry. As a result, voltage is generated, with the detection circuitry, as a function of an inductance of the writer coil. An inductance of the writer coil is calculated as a function of the generated voltage. Electrical short circuits and discontinuities in the writer coil are identified as a function of the calculated inductance.Type: GrantFiled: September 21, 2001Date of Patent: November 11, 2003Assignee: Seagate Technology LLCInventors: Beng Theam Ko, Eng Hock Lim, Myint Ngwe, Kah Liang Gan, Beng Wee Quak
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Patent number: 6642738Abstract: The disclosure describes a method and apparatus for FET current sensing using the voltage drop across the drain to source resistance that eliminates dependencies on temperature of the FET and/or statistical distribution of the initial value of drain to source resistance of the FET. In one embodiment, first and second FETs are provided. Each of the first and second FETs include a gate, a source, and a drain. The gate of the first FET is configured to receive a first voltage, and the source of the first FET is configured to be coupled to ground. The gate of the second FET is configured to receive a second voltage, and the source of the second FET is configured to be coupled to ground. A circuit is also provided and includes first and second input nodes coupled to the drain of the first and second FETs, respectively.Type: GrantFiled: October 23, 2001Date of Patent: November 4, 2003Assignee: Fairchild Semiconductor CorporationInventor: Alaa Elbanhawy
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Patent number: 6642739Abstract: A single apparatus for magnetizing permanent magnet segments mounted on a cylindrical shell for use in a flywheel magneto or the like. Not only are the segments magnetized but also their magnetic strength is measured when the magnetized element is moved out of the magnetizing section. Prior to that, however, the circumferential location of the timing mark on the flywheel is also verified, within the single apparatus.Type: GrantFiled: April 27, 2001Date of Patent: November 4, 2003Assignee: Kabushiki Kaisha MoricInventors: Kazuyoshi Takagi, Takahiro Yamamoto
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Patent number: 6636054Abstract: A low capacitance probe contact has electrically conductive contacts having fingers with opposing interior flat surfaces forming a slit there between. The fingers extend in a first direction with a mounting member extending in the opposite direction having a flat surface that is parallel to the flat surfaces of the fingers. The first and second electrically conductive contacts are secured to respective first and second electrically conductive contact pads formed on a substrate with the flat surfaces of the mounting members being positioned on the contact pads. The substrate and the electrically conductive contacts are captured within a housing having first and second members. One member has a base and extending sidewalls forming a recess that receives the substrate and the electrically conductive contacts and the other member has a periphery coextensive with the first member to capture the substrate and the electrically conductive contacts therein.Type: GrantFiled: November 16, 2001Date of Patent: October 21, 2003Assignee: Tektronix, Inc.Inventors: J. Steve Lyford, Mike A. Vilhauer
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Patent number: 6633168Abstract: A method and apparatus for detecting a partial discharge in a voltage transformer, the transformer having a first voltage winding and a second voltage winding. A grounded electrostatic shield being operably attached to the transformer, preferably between the windings. A radio frequency current transformer is operably connected to the electrostatic shield wherein the partial discharge occurring within the voltage transformer is detected.Type: GrantFiled: March 30, 2001Date of Patent: October 14, 2003Assignee: Square D CompanyInventors: Philip J. Hopkinson, Vadim Raff
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Patent number: 6630834Abstract: The apparatus includes a first gain adjuster, a second gain adjuster, an amplifier, a demodulator, a controller, and a change measuring unit. The first gain adjuster adjusts the gain of an input signal and outputs the gain-adjusted input signal as a first modulating signal, while the second gain adjuster adjusts the gain of an inverted input signal and outputs the gain-adjusted inverted input signal as a second modulating signal. The amplifier amplifies a modulated signal output from a junction between the first and second capacitors and outputs the amplified results. The demodulator demodulates the amplified results received from the amplifier in response to a control signal and outputs the demodulated result. The controller generates the control signal per unit period of the input signal and outputs the generated control signal to the demodulator. The change measuring unit measures the change in capacitance from the demodulated results received from the demodulator.Type: GrantFiled: September 21, 2001Date of Patent: October 7, 2003Assignee: Samsung Electronics Co., Ltd.Inventors: Dong-ki Min, Jong Up Jeon
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Patent number: 6624640Abstract: An apparatus and method of measuring capacitances are provided in which charge packets of known value are delivered to a capacitor of unknown value until a final voltage is determined, and the capacitance is calculated based on the known total charge and measured voltage.Type: GrantFiled: February 7, 2001Date of Patent: September 23, 2003Assignee: Fluke CorporationInventors: John M. Lund, Benjamin Eng, Jr.
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Patent number: 6624639Abstract: A molded plastic coaxial connector. The coaxial connector is fabricated within a stacking connector system of a mini PCI card. A plastic protuberance having a cavity and a corresponding depression having a center conductor pin are molded to the dimensions corresponding to a desired characteristic impedance. The plastic is then coated with a conductive material. When the protuberance is mated to the depression, the coated surfaces of each form the ground shield of a coaxial connection and the center conducting pin is mated to the cavity to form the drive point of the coaxial connection. Fabricating the coaxial connection from plastic reduces the number of processes and eliminates the need for individually machined parts, thereby reducing the production costs. In one embodiment multiple coaxial connectors may be implemented along a single piece of plastic. This allows for reduction in size as the tolerance buildup of conventional coaxial connectors is avoided.Type: GrantFiled: November 5, 2001Date of Patent: September 23, 2003Assignee: Intel CorporationInventor: Jeffrey L. Schiffer
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Patent number: 6621275Abstract: A system for probe-less non-invasive detection of electrical signals from integrated circuit devices is disclosed. The system includes an illumination source, collection optics, imaging optics, and a photon sensor. In a navigation mode, the light source is activated and the imaging optics is used to identify the target area on the chip and appropriately position the collection optics. Once the collection optics is appropriately positioned, the light source is deactivated and the photon sensor is used to detect photons emitted from the chip. No mention of cooling (active device measurement capability) and advanced optics to detect the features (SIL).Type: GrantFiled: November 28, 2001Date of Patent: September 16, 2003Assignee: Optonics Inc.Inventors: Daniel Murdoch Cotton, Nader Pakdaman, James Squire Vickers, Thomas Wong
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Patent number: 6614234Abstract: An electric discharge machine for machining a workpiece by an electric discharge by supplying a machining fluid to a gap between an electrode and the workpiece and supplying pulses to the workpiece while providing the electrode with a jump motion, the jump motion being a periodic motion of the electrode relative to the workpiece; wherein the electric discharge machine detects a state quantity caused in a main body of the electric discharge machine by a reactive force produced by a machining operation in the gap between the electrode and the workpiece and changes machining conditions of the workpiece in accordance with a detected value of the state quantity.Type: GrantFiled: August 31, 2000Date of Patent: September 2, 2003Assignee: Mitsubishi Denki Kabushiki KaishaInventors: Yoshihito Imai, Hidetaka Miyake, Takuji Magara, Akihiro Goto
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Patent number: 6614216Abstract: A system clock for a system for measuring at least one given quantity having a value which does not vary significantly from a given frequency, the system clock comprises a controller for sampling said given quantity at a rate determined by an oscillator frequency, and a programmable oscillator for generating the oscillator frequency, said programmable oscillator being programmable to produce said oscillator frequency at a frequency which is substantially identical to a high order harmonic of said given frequency of the quantity to be measured.Type: GrantFiled: February 7, 2001Date of Patent: September 2, 2003Assignee: Square D CompanyInventor: Avery D. Long
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Patent number: 6614213Abstract: A photonic integrated device includes a waveguide of semiconductor material and a detector for measuring optical power of light traveling along the waveguide. The detector which is monolithically integrated into the device measures a photocurrent on an electrode which has been generated in the waveguide by two photon absorption.Type: GrantFiled: March 1, 2001Date of Patent: September 2, 2003Assignee: Bookham Technology p.l.c.Inventors: Neil D Whitbread, Andrew C Carter, Michael J Wale
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Patent number: 6614237Abstract: According to one embodiment of the invention, there is provided an N-port automatic calibration device comprising N-ports, wherein each port is adapted to be coupled to a port of an N-port multiport test set. The N-port automatic calibration device comprises a single-pole, N−1 throw switch having a single-pole coupled to a first port of the automatic calibration device and having each throw of the N−1 throws coupled to a corresponding port of the automatic calibration device. In addition, the N-port automatic calibration device comprises at least one single-pole, double-throw switch, having a single-pole coupled to a second port of the N-ports of the automatic calibration device, having a first throw coupled to a first load impedance, and having a second throw coupled to a throw of the N−1 throws of the single-pole, N−1 throw switch.Type: GrantFiled: September 18, 2001Date of Patent: September 2, 2003Assignee: Agilent Technologies, Inc.Inventors: Vahe Ademian, Peter Phillips, J. Bradford Cole
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Patent number: 6608483Abstract: An electrostatic field sensor configuration and supporting signal processing electronics provides a wider bandwidth than prior art sensors, thus enabling the present sensor to replace three prior art instruments in the application of measuring atmospheric electricity. The quadrature, differential characteristics of the present sensor also provide suppression of unwanted disturbances and more accurate electrostatic field measurements. Besides application in the geophysical instrument known as a field mill, the present sensor may be employed in any system for measuring quasi-static and rapidly changing electrostatic fields.Type: GrantFiled: November 13, 2001Date of Patent: August 19, 2003Inventor: John P. Hill