Patents Examined by John Trimmings
  • Patent number: 8484522
    Abstract: An apparatus, system, and method are disclosed for bad block remapping. A bad block identifier module identifies one or more data blocks on a solid-state storage element as bad blocks. A log update module writes at least a location of each bad block identified by the bad block identifier module into each of two or more redundant bad block logs. A bad block mapping module accesses at least one bad block log during a start-up operation to create in memory a bad block map. The bad block map includes a mapping between the bad block locations in the bad block log and a corresponding location of a replacement block for each bad block location. Data is stored in each replacement block instead of the corresponding bad block. The bad block mapping module creates the bad block map using one of a replacement block location and a bad block mapping algorithm.
    Type: Grant
    Filed: August 2, 2012
    Date of Patent: July 9, 2013
    Assignee: Fusion-io, Inc.
    Inventors: David Flynn, John Strasser, Jonathan Thatcher, David Atkisson, Michael Zappe, Joshua Aune, Kevin Vigor
  • Patent number: 8479059
    Abstract: Provided is a radio communication device for performing radio communication with another radio communication device includes a control unit that controls to prepare for data loss during radio communication of transmission data and a transmission unit that transmits the transmission data by radio according to the control of the control unit. One of the radio communication device and the other radio communication device estimates a distance from the other based on a field intensity of a radio signal which is judged to satisfy a certain requirement regarding noise component among received radio signals received from the other of the radio communication device and the other radio communication device. The control unit performs a control of a content according to the distance estimation result.
    Type: Grant
    Filed: October 2, 2008
    Date of Patent: July 2, 2013
    Assignees: Sony Corporation, Sony Computer Entertainment Inc.
    Inventors: Michinari Kohno, Kenji Yamane
  • Patent number: 8479070
    Abstract: An integrated circuit chip includes a mainline function logic path communicatively connected to a first input/output (I/O) pin, a test logic path communicatively connected to the first I/O pin, a latch disposed between the communicative connection between the test logic function path and the first I/O pin, a second I/O pin communicatively connected to the latch, the second I/O pin operative to send a signal operative to change a state of the latch.
    Type: Grant
    Filed: June 24, 2010
    Date of Patent: July 2, 2013
    Assignee: International Business Machines Corporation
    Inventors: Ulrich Baur, Lawrence D. Curley, Ronald J. Frishmuth, Ralf Ludewig, Ching L. Tong, Tobias Webel
  • Patent number: 8479081
    Abstract: A user may easily confirm a relationship between an edited packet and the output serial data derived from the edited packet. The user may edit a packet with known method (step 104) to display a packet structure of the edited packet (step 106). A signal generator converts the packet to serial data through striping, scramble and 8b/10b conversion to display a serial data bar corresponding to the serial data derived from the packet (step 116). The user may designate a range on the serial data bar to distinctively display portions of the packet structure corresponding to the designated range (step 120).
    Type: Grant
    Filed: June 24, 2010
    Date of Patent: July 2, 2013
    Assignee: Tektronix, Inc.
    Inventor: Kazunao Sugaya
  • Patent number: 8479080
    Abstract: A method for data storage includes, in a memory that includes multiple memory blocks, specifying at a first time a first over-provisioning overhead, and storing data in the memory while retaining in the memory blocks memory areas, which do not hold valid data and whose aggregated size is at least commensurate with the specified first over-provisioning overhead. Portions of the data from one or more previously-programmed memory blocks containing one or more of the retained memory areas are compacted. At a second time subsequent to the first time, a second over-provisioning overhead, different from the first over-provisioning overhead, is specified, and data storage and data portion compaction is continued while complying with the second over-provisioning overhead.
    Type: Grant
    Filed: June 24, 2010
    Date of Patent: July 2, 2013
    Assignee: Apple Inc.
    Inventors: Ofir Shalvi, Naftali Sommer, Yoav Kasorla
  • Patent number: 8473830
    Abstract: Apparatus and methods are disclosed for decoding data stored on a data storage medium. A disclosed decoding method and decoder include a radial incoherence (RI) detector that increases the probability of detecting RI and improves the decoding performance in terms of the bit error rate of the decoded signal. RI is detected by comparing an input signal to the decoder against a RI threshold value and generating a RI-type signal. The RI detector may include a filter for filtering out noise and error in the RI-type signal, an adaptive threshold unit that adjusts the RI threshold value based upon the RI-type signal, a transition-based threshold unit that adjusts the RI threshold value based upon each transition in the input signal, or a path-based threshold unit that adjusts the RI threshold value based upon a best surviving path corresponding to the input signal, in combination or alone.
    Type: Grant
    Filed: August 31, 2012
    Date of Patent: June 25, 2013
    Assignee: Marvell International Ltd.
    Inventors: Zaihe Yu, Michael Madden
  • Patent number: 8468415
    Abstract: Apparatus and methods store error recovery data in different dimensions of a memory array. For example, in one dimension, block error correction codes (ECC) are used, and in another dimension, supplemental error correction codes, such as convolutional codes, are used. By using separate dimensions, the likelihood that a defect affects both error recovery techniques is lessened, thereby increasing the probability that error recovery can be performed successfully. In one example, block error correction codes are used for data stored along rows, and this data is stored in one level of multiple-level cells of the array. Supplemental error correction codes are used for data stored along columns, such as along the cells of a string, and the supplemental error correction codes are stored in a different level than the error correction codes.
    Type: Grant
    Filed: August 8, 2012
    Date of Patent: June 18, 2013
    Assignee: Micron Technology, Inc.
    Inventor: William H. Radke
  • Patent number: 8468421
    Abstract: A memory system is provided. The memory system includes a memory element that is configured to selectively output data stored to and data fetched from the memory element. An error checking station is configured to receive the data stored to and the data fetched from the memory element. The error checking station is further configured to perform error checking on the data.
    Type: Grant
    Filed: June 23, 2010
    Date of Patent: June 18, 2013
    Assignee: International Business Machines Corporation
    Inventors: Michael Fee, Arthur J. O'Neill, Jr.
  • Patent number: 8464123
    Abstract: A plurality of information bits are encoded using a parity-check matrix that is equivalent to a modular code matrix. The modular code matrix is a diagonal sub-matrix structure immediately above a connection layer that includes a plurality of diverse connection layer sub-matrices, all but at most one of which are below corresponding diagonal matrix structure sub-matrices. The information bits are assembled with a plurality of parity bits produced by the encoding to provide a codeword that is exported to a medium. Preferably, all the diagonal matrix structure sub-matrices are identical. Preferably, some of the parity bits are computed using only diagonal matrix structure sub-matrices.
    Type: Grant
    Filed: May 6, 2010
    Date of Patent: June 11, 2013
    Assignee: Ramot At Tel Aviv University Ltd.
    Inventors: Idan Alrod, Eran Sharon, Simon Litsyn
  • Patent number: 8452919
    Abstract: An advanced memory having improved performance, reduced power and increased reliability. A memory device includes a memory array, a receiver for receiving a command and associated data, error control coding circuitry for performing error control checking on the received command, and data masking circuitry for preventing the associated data from being written to the memory array in response to the error control coding circuitry detecting an error in the received command. Another memory device includes a programmable preamble. Another memory device includes a fast exit self-refresh mode. Another memory device includes auto refresh function that is controlled by the characteristic device. Another memory device includes an auto refresh function that is controlled by a characteristic of the memory device.
    Type: Grant
    Filed: August 6, 2012
    Date of Patent: May 28, 2013
    Assignee: International Business Machines Corporation
    Inventors: Kyu-Hyoun Kim, George L. Chiu, Paul W. Coteus, Daniel M. Dreps, Kevin C. Gower, Hillery C. Hunter, Charles A. Kilmer, Warren E. Maule
  • Patent number: 8448018
    Abstract: The present disclosure includes methods and devices for stripe-based memory operation. One method embodiment includes writing data in a first stripe across a storage volume of a plurality of memory devices. A portion of the first stripe is updated by writing updated data in a portion of a second stripe across the storage volume of the plurality of memory devices. The portion of the first stripe is invalidated. The invalid portion of the first stripe and a remainder of the first stripe are maintained until the first stripe is reclaimed. Other methods and devices are also disclosed.
    Type: Grant
    Filed: September 6, 2012
    Date of Patent: May 21, 2013
    Assignee: Micron Technology, Inc.
    Inventor: Joseph M. Jeddeloh
  • Patent number: 8438439
    Abstract: An IC having a scan chain and a testing method for a chip, comprising a first interface group, a second interface group and a scan data selector. The first interface group and the second interface group each comprise at least two input/output (I/O) interfaces which can be packaged as external pins of the IC. The I/O interfaces of the first interface group are connected to input terminals of the scan data selector in one-to-one correspondence, and an output terminal of the scan data selector is connected to a scan data input terminal of the scan chain. A scan data output terminal of the scan chain is connected to the I/O interfaces of the second interface group.
    Type: Grant
    Filed: January 26, 2012
    Date of Patent: May 7, 2013
    Assignee: Actions Semiconductor Co., Ltd.
    Inventor: Wuhong Xie
  • Patent number: 8438344
    Abstract: An electronic circuit (200) for use with an accessing circuit (110) that supplies a given address and a partial write data portion and also has dummy cycles. The electronic circuit (200) includes a memory circuit (230) accessible at addresses, an address buffer (410), a data buffer (440) coupled to the memory circuit (230), and a control circuit (246) operable in the dummy cycles to read data from the memory circuit (230) to the data buffer (440) from a next address location in the memory circuit (230) and to store that next address in the address buffer (410).
    Type: Grant
    Filed: May 6, 2010
    Date of Patent: May 7, 2013
    Assignee: Texas Instruments Incorporated
    Inventors: Sanjay Kumar, Amit Kumar Dutta, Rubin A. Parekhji, Srivaths Ravi
  • Patent number: 8437183
    Abstract: Methods of writing data to and reading data from memory devices and systems for writing and reading data are disclosed. In a particular embodiment, a method includes writing data bits a first time into a memory. Auxiliary parity bits are written in the memory, where the auxiliary parity bits are computed based on the data bits. Subsequent to writing the data bits a first time and writing the auxiliary parity bits, the data bits are written a second time into the memory. Writing the data bits the first time and writing the data bits the second time are directed to one or more storage elements at a common physical address in the memory. Subsequent to writing the data bits the second time, the auxiliary parity bits are discarded while maintaining the data bits in the memory.
    Type: Grant
    Filed: December 16, 2009
    Date of Patent: May 7, 2013
    Assignee: Sandisk IL Ltd.
    Inventors: Eran Sharon, Idan Alrod
  • Patent number: 8433964
    Abstract: Provided is a test apparatus comprising a synchronization module that operates according to a reference clock and outputs a synchronization signal with a prescribed period, and a test module that operates according to a high-frequency clock with a frequency that is n times a frequency of the reference clock. The test module includes a period emulator that emulates the synchronization signal, a phase shifter that shifts a phase of the high-frequency clock by an amount equal to a result of (i) the product of n and the emulated synchronization phase data by (ii) a period of the reference clock, and a test period generating section that generates a test period pulse signal that transitions at an edge timing of the shifted high-frequency clock and test period phase data indicating a phase difference between the test period signal and an edge timing of the test period pulse signal.
    Type: Grant
    Filed: January 27, 2011
    Date of Patent: April 30, 2013
    Assignee: Advantest Corporation
    Inventor: Tokunori Akita
  • Patent number: 8433984
    Abstract: Techniques to support low density parity check (LDPC) encoding and decoding are described. In an aspect, LDPC encoding and decoding of packets of varying sizes may be supported with a set of base parity check matrices of different dimensions and a set of lifting values of different powers of two. A base parity check matrix G of dimension mB×nB may be used to encode a packet of kB=nB?mB information bits to obtain a codeword of nB code bits. This base parity check matrix may be “lifted” by a lifting value of L to obtain a lifted parity check matrix H of dimension L·mB×L·nB. The lifted parity check matrix may be used to encode a packet of up to L·kB information bits to obtain a codeword of L·nB code bits. A wide range of packet sizes may be supported with the set of base parity check matrices and the set of lifting values.
    Type: Grant
    Filed: January 24, 2008
    Date of Patent: April 30, 2013
    Assignee: Qualcomm Incorporated
    Inventors: Aamod Khandekar, Thomas Richardson
  • Patent number: 8427854
    Abstract: Searching for patterns stored on a hardware storage device. A method includes, as part of a memory refresh operation, performing a read to read contents of a portion of a memory. The method further includes writing the read contents of the portion of memory back to the portion of memory. The read contents are provided to data comparison logic. Using the data comparison logic; the read contents are compared to predetermined data patterns. A determination is made as to whether or not the contents match at least one of the predetermined data patterns. When the read contents match at least one of the predetermined data patterns, a software readable indicator is provided indicating that the read contents match at least one of the predetermined data patterns. Similar embodiments may be implemented using hard drive head wear leveling operations.
    Type: Grant
    Filed: April 15, 2010
    Date of Patent: April 23, 2013
    Assignee: Microsoft Corporation
    Inventors: Yaron Weinsberg, John Joseph Richardson
  • Patent number: 8423856
    Abstract: A method for activating a semi-persistent scheduled (SPS) resource using a user agent (UA) is presented. A downlink (DL) communication may be received by a UA using a physical downlink control channel (PDCCH). The DL communication may include a control message. When the control message is associated with an SPS Cell-Radio Network Terminal Identifier (C-RNTI) of the UA, the method may include retrieving a value of a New Data Indicator (NDI) field. When the value of the NDI field is equal to 0, the method may include inspecting the control message to determine whether the control message indicates an SPS activation. When the control message indicates an SPS activation, the method may include activating an SPS resource identified by the control message.
    Type: Grant
    Filed: March 26, 2010
    Date of Patent: April 16, 2013
    Assignee: Research In Motion Limited
    Inventor: Zhijun Cai
  • Patent number: 8423841
    Abstract: The present invention provides a method and system for improving memory testing efficiency, raising the speed of memory testing, detecting memory failures occurring at the memory operating frequency, and reducing data reported for redundancy repair analysis. The memory testing system includes a first memory tester extracting failed memory location information from the memory at a higher memory operating frequency, an external memory tester receiving failed memory location information at a lower memory tester frequency, and an interface between the first memory tester and the external memory tester. The memory testing method uses data strobes at the memory tester frequency to clock out failed memory location information obtained at the higher memory operating frequency. In addition, the inventive method reports only enough information to the external memory tester for it to determine row, column and single bit failures repairable with the available redundant resources.
    Type: Grant
    Filed: May 31, 2011
    Date of Patent: April 16, 2013
    Assignee: Marvell International Ltd.
    Inventors: Winston Lee, Albert Wu, Chorng-Lii Liou
  • Patent number: 8418020
    Abstract: A cost function is obtained. For each of a plurality of groups of check nodes associated with low-density parity-check (LDPC) encoded data, the cost function is evaluated using information associated with a variable node and/or information associated with a check node. One of the groups of check nodes is selecting based at least in part on the evaluated cost functions. Error correction decoding related processing is performed on the selected group of check nodes.
    Type: Grant
    Filed: June 7, 2012
    Date of Patent: April 9, 2013
    Assignee: SK hynix memory solutions inc.
    Inventors: Kin Man Ng, Lingqi Zeng, Yu Kou, Kwok W. Yeung