Abstract: Disclosed herein is a semiconductor integrated circuit capable of detecting an abnormality that can cause a malfunction in signal transmission via an isolation element and of issuing a stop signal to the target to be controlled. The semiconductor integrated circuit includes a transmission circuit generating and outputting a transmission signal reflecting transmission data supplied from outside, a reception circuit reproducing the transmission data based on a reception signal, an isolation element isolating the transmission circuit from the reception circuit and transmitting the transmission signal as the reception signal, an abnormality detection part detecting an abnormality that can cause a malfunction in signal transmission via the isolation element, and a control part outputting a stop signal if the abnormality detection part detects the abnormality, regardless of the transmission data supplied to the transmission circuit from outside.

Abstract: A method begins by a dispersed storage (DS) processing module of a DS unit selecting a data slice for corruption analysis and requesting integrity information for the data slice from one or more other DS units of a dispersed storage network. When the one or more requested integrity information is received, the method continues with the DS processing module analyzing the one or more received integrity information and local integrity information of the data slice stored in the DS unit. When the analysis of the one or more received integrity information and the local integrity information of the data slice is unfavorable, the method continues with the DS processing module identifying the data slice as being corrupted.

Abstract: A method begins by a dispersed storage (DS) processing module receiving a modified data object, wherein the modified data object is a modified version of a data object and the data object is divided into a plurality of data segments and stored in the DSN. The method continues with the DS processing module mapping portions of the modified data object to the plurality of data segments that includes creating a middle data segment of a second plurality of data segments based on a corresponding middle data segment of the plurality of data segments when a portion of the portions corresponds to middle data of the modified data object. The method continues with the DS processing module encoding the middle data segment using a dispersed storage error coding function to produce an encoded data segment and overwriting the corresponding middle data segment with the encoded data segment in the DSN.

Abstract: A data protection method adapted to a rewritable non-volatile memory module having a plurality of physical blocks is provided. The data protection method includes following steps. If the rewritable non-volatile memory module is powered on, a power-off period from last time the rewritable non-volatile memory module is powered off till present is obtained. If the power-off period is longer than a time threshold, whether each physical block satisfies an update condition is determined according to a block information of the physical block. An update procedure is executed on the physical blocks that satisfy the update condition. The update procedure is configured to read data from a physical block and rewrite the data into one of the physical blocks. Thereby, data in the physical blocks is protected from being easily lost, and the lifespan of the rewritable non-volatile memory module is prolonged.

Abstract: Various embodiments of the present invention provide systems and methods for a data processing system with failure recovery. For example, a data processing system is disclosed that includes a data processing circuit operable to process a block of data from an input and to yield a plurality of possible results based on the block of data, and an error detection circuit operable to test the plurality of possible results for errors and to report to the data processing circuit whether the plurality of possible results contain errors. The data processing system is operable to output any of the possible results in which the error detection circuit found no errors.

Abstract: Electronic apparatus, systems, and methods of operating and constructing the electronic apparatus and/or systems include an embedded processor disposed in a logic chip to direct, among other functions, self-testing of an electronic device structure in conjunction with a pattern buffer disposed in the logic chip, when the electronic device structure is coupled to the logic chip. Additional apparatus, systems, and methods are disclosed.

Abstract: A method of and an arrangement for determining electric connections at a printed circuit board between boundary-scan compliant circuit terminals of one or more boundary-scan compliant devices. An electronic processing unit retrieves properties of the or each boundary-scan compliant device and a list comprising boundary-scan cells operable as a driver and/or sensor. Based on this list, a boundary-scan cell connected to a circuit terminal is operated as a driver, and at least one other boundary-scan cell connected to another circuit terminal is operated as a sensor. Data from the boundary-scan register, comprising the driver and sensor data, is stored in a storage device. The steps of operating boundary-scan cells as driver and sensor are repeated for a plurality of cells. The data stored are analyzed for determining electric connections. A result of the analysis is presented.

Abstract: A memory device comprises a memory cell array and a bad page map. The memory cell array comprises a plurality of memory cells arranged in pages and columns, wherein the memory cell array is divided into a first memory block and a second memory block each corresponding to an array of the memory cells. The bad page map stores bad page location information indicating whether each of the pages of the first memory block is good or bad. A fail page address of the first memory block is replaced by a pass page address of the second memory block according to the bad page location information.

Abstract: A system includes a first device, a first storage element, a comparator and a second device. The first device is configured to test memory cells in an array of memory cells to detect defective memory cells. The defective memory cells include a first memory cell and a second memory cell. The first storage element is configured to store a first address of the first memory cell. The comparator is configured to compare a second address of the second memory cell to the first address.

Abstract: A method and apparatus for evaluating and optimizing a signaling system is described. A pattern of test information is generated in a transmit circuit of the system and is transmitted to a receive circuit. A similar pattern of information is generated in the receive circuit and used as a reference. The receive circuit compares the patterns. Any differences between the patterns are observable. In one embodiment, a linear feedback shift register (LFSR) is implemented to produce patterns. An embodiment of the present disclosure may be practiced with various types of signaling systems, including those with single-ended signals and those with differential signals. An embodiment of the present disclosure may be applied to systems communicating a single bit of information on a single conductor at a given time and to systems communicating multiple bits of information on a single conductor simultaneously.

Abstract: A method begins by a dispersed storage (DS) processing module monitoring storage of data, wherein the data is encoded using a dispersed storage error coding function to produce a plurality of sets of encoded data slices and is stored as the plurality of sets of encoded data slices. The method continues with the DS processing module determining analysis priority of the data in accordance with an analysis prioritization protocol. When the analysis priority of the data compares unfavorably to a first priority threshold, the method continues with the DS processing module issuing a command to delete an encoded data slice from each set of at least some of the plurality of sets of encoded data slices.

Abstract: A resistive memory device and a system and method for testing the resistive memory device are provided. The resistive memory device includes a plurality of bit lines comprising at least one dummy bit line to which a plurality of resistive memory cells are connected, a conducting wire connected to the dummy bit line, a first switching element positioned between the dummy bit line and an external device outside the resistive memory device, and a second switching element positioned between the conducting wire and the external device. Accordingly, the operational reliability of the resistive memory device may be increased.

Abstract: A system includes a flash memory, an encoder, a first interface, a decoder and a controller. The encoder is configured to (i) receive data, and (ii) encode the data based on an error correction code. The first interface is configured to (i) write the encoded data to a memory cells in the flash memory, and (ii) read the encoded data back from the memory cells. The decoder is configured to (i) decode the encoded data read back from the memory cells, and (ii) based on the decoded data, determine a number of decoding errors for the plurality of memory cells. The controller is configured to, in response to the number of decoding errors being greater than or equal to a first threshold, cease accessing the memory cells. The first threshold is less than a maximum number of errors correctable by the error correction code for the memory cells.

Abstract: Various embodiments of the present inventions provide a symbol flipping LDPC decoding system. For example, a symbol flipping data processing system is disclosed that includes a low density parity check decoder operable to decode codewords and to identify unsatisfied parity checks, a symbol flipping controller operable to change values of at least one symbol in the codewords based on the unsatisfied parity checks to assist the low density parity check decoder to decode the codewords, a scheduler operable to control a decoding and symbol flipping mode in the low density parity check decoder and the symbol flipping controller, and a hard decision queue operable to store hard decisions for converged codewords from the low density parity check decoder.

Abstract: A probabilistic approach of symbol error estimation is disclosed. The probabilistic approach of symbol error estimation reflects the number of symbol errors more precisely than the number of unsatisfied checks. The more precise quality metric calculated in accordance with the present disclosure allows a codec system to achieve a better overall performance. In addition, many other features that previously depend on the number of unsatisfied checks as the sector quality metric may also benefit by adopting the more precise quality metric.

Abstract: The invention relates to a device and a method for storing binary data in a storage device, in which the binary data is transformed to and stored as ternary data. The storage device uses memory cells capable of storing three states. The device and method furthermore are configured to identify and correct falsified ternary data when reading and outputting the data from storage device.

Abstract: A semiconductor memory device includes a plurality of detecting code generators configured to generate a plurality of detecting codes to detect errors in a plurality of data items, respectively, a plurality of first correcting code generators configured to generate a plurality of first correcting codes to correct errors in a plurality of first data blocks, respectively, each of the first data blocks containing one of the data items and a corresponding detecting code, a second correcting code generators configured to generate a second correcting code to correct errors in a second data block, the second data block containing the first data blocks, and a semiconductor memory configured to nonvolatilely store the second data block, the first correcting codes, and the second correcting code.

Abstract: According to one embodiment, a wireless communications device includes a low-density parity check (LDPC) decoder configured to receive a codeword associated with a parity check H-matrix. The LDPC decoder includes multiple processing elements coupled to a memory for storing the parity check H-matrix comprising R rows and C columns. Each processing element is configured to perform LDPC decoding on different rows of the H-matrix during multiple sub-iterations. A first portion of the processing elements are configured to process certain rows in an upward direction in the H-matrix relative to other rows and a second portion of the processing elements are configured to process other certain rows in a downward direction in the H-matrix relative to the other rows.

Abstract: A system for testing an integrated circuit, in which the system includes a deserializer, a frame sync module, and a diagnostic module. The deserializer is external to the integrated circuit and is configured to receive messages in a serial data format, wherein the messages include test results associated with the integrated circuit, and deserialize the messages into data frames. The frame sync module is configured to provide control code based on the data frames, wherein the control code includes, in a digital format, status information associated with the messages deserialized into the data frames. The diagnostic module is configured to generate, based on the control code, diagnostic data associated with states of the integrated circuit.

Abstract: Apparatus and methods store error recovery data in different dimensions of a memory array. For example, in one dimension, block error correction codes (ECC) are used, and in another dimension, supplemental error correction codes, such as convolutional codes, are used. By using separate dimensions, the likelihood that a defect affects both error recovery techniques is lessened, thereby increasing the probability that error recovery can be performed successfully. In one example, block error correction codes are used for data stored along rows, and this data is stored in one level of multiple-level cells of the array. Supplemental error correction codes are used for data stored along columns, such as along the cells of a string, and the supplemental error correction codes are stored in a different level than the error correction codes.