Patents Examined by Jonathan Moffat
  • Patent number: 7454318
    Abstract: This invention relates to a method and a terminal for detecting a fake and/or modified smart card inserted into a physical interface of a terminal, the method comprising the steps of performing a sequence of current measurements by a current monitor in order to obtain a first current signature, comparing the obtained first current signature with a second current signature, representing a unique current signature of a smart card, and determining whether a difference exists within a predetermined range between the first current signature and the second current signature. This allows for simple detection of fake and/or modified smart cards. Further, it is possible to detect (and thereby protect against) false cards and/or ‘rouge’ application residing on a smart card.
    Type: Grant
    Filed: December 5, 2003
    Date of Patent: November 18, 2008
    Assignee: NXP B.V.
    Inventor: Keith Baker
  • Patent number: 7451058
    Abstract: A device and method for estimating an adaptive pace depending on a user with a different pace. An adaptive pace estimation device includes a GPS receiver for receiving position information from a GPS satellite; an acceleration sensor for measuring vibrations due to walking to output an acceleration value; a memory for storing an instruction data set with a walking pattern representative value updated in accordance with an instruction corresponding to at least one walking pattern group; and an instruction data generator for calculating a mean value of input walking pattern data and updating a value approximate to the mean value of the input walking pattern data and the walking pattern representative value as a walking pattern representative value.
    Type: Grant
    Filed: February 15, 2007
    Date of Patent: November 11, 2008
    Assignees: Samsung Electronics Co., Ltd, Seoul National University Industry Foundation
    Inventors: Kyong-Ha Park, Hyun-Su Hong, Jae-Myeon Lee, Hee Jung, Chan-Gook Park
  • Patent number: 7440857
    Abstract: The invention relates to a method of detecting and identifying a defect or an adjustment error of a rotorcraft rotor using an artificial neural network (ANN), the rotor having a plurality of blades and a plurality of adjustment members associated with each blade; the network (ANN) is a supervised competitive learning network (SSON, SCLN, SSOM) having an input to which vibration spectral data measured on the rotorcraft is applied, the network outputting data representative of which rotor blade presents a defect or an adjustment error or data representative of no defect, and where appropriate data representative of the type of defect that has been detected.
    Type: Grant
    Filed: February 23, 2007
    Date of Patent: October 21, 2008
    Assignee: Eurocopter
    Inventor: Hervé Morel
  • Patent number: 7437255
    Abstract: A method for calibrating a sensor includes providing a fixture that defines a first coordinate system, providing a chassis, and orienting a plurality of sensor elements to form a misaligned coordinate system, wherein the misaligned coordinate system axes are oriented at other than right angles with respect to each other. The method also includes coupling the sensor to be calibrated to the fixture and mathematically compensating the misaligned coordinate system to correspond with the first coordinate system.
    Type: Grant
    Filed: January 22, 2007
    Date of Patent: October 14, 2008
    Assignee: General Electric Company
    Inventors: Mark Allen Woodmansee, Jeffrey Alan Ham, Lam Arthur Campbell, Elizabeth Anne Oakden, Robert Paul Stachow, David John Sevey
  • Patent number: 7433799
    Abstract: A method to determine the shape data of a complex curve surface using reference templates from a copy of the workpiece before it was used and the undamaged portion of the used workpiece so that the damaged portion of the workpiece can be reconstructed. The reference template is scanned in layers, including the portion corresponding to that which has been damaged in the workpiece, as well as adjacent undamaged portions of the used workpiece. Offsets of the reference template and workpiece are generated, based on corresponding portions of the reference template and the used workpiece. A new set of offsets of the damaged portion of the workpiece is then calculated. This calculated set of offsets is then used to calculate further profiles until a complete profile of the damaged portion has been predicted.
    Type: Grant
    Filed: November 17, 2003
    Date of Patent: October 7, 2008
    Assignee: Agency For Science, Technology and Research
    Inventors: Wen-Jong Lin, Tsong Jye Ng, Xiao Qi Chen, Zhiming Gong
  • Patent number: 7430490
    Abstract: A method and system for implementing capturing and rendering geometric details for mesostructure surfaces is described herein. A mesostructure distance function is defined as a function of a given reference point and a given viewing direction. A distance from a reference point to a mesostructure surface point along a viewing direction is measured using the mesostructure distance function. This distance is used to determine the visibility of mesostructure surface for rendering silhouettes. The lighting visibility of the mesostructure surface point may also be determined and used for determining whether the mesostructure surface point is in shadow. This determination may then be used for rendering shadow silhouettes.
    Type: Grant
    Filed: March 29, 2006
    Date of Patent: September 30, 2008
    Assignee: Microsoft Corporation
    Inventors: Xin Tong, Yanyun Chen, Baining Guo, Heung-Yeung Shum, Jiaping Wang, John Michael Snyder
  • Patent number: 7428470
    Abstract: A method is provided for measuring edge exclusion on a workpiece that includes a wafer having a film disposed thereon. The method is performed by a CMP system employing a platen and a thickness sensor coupled to the platen and positioned to repeatedly travel a path over the edge of the film during polishing. The method comprises measuring the thickness of the workpiece during selected iterations of the probe path, and establishing from the wafer thickness measurements the length of time the probe is over the film (ton) during the selected iterations. Edge exclusion is determined for at least one iteration utilizing a function related to ton.
    Type: Grant
    Filed: February 19, 2007
    Date of Patent: September 23, 2008
    Assignee: Novellus Systems, Inc.
    Inventors: Brian Brown, Paul Franzen
  • Patent number: 7428467
    Abstract: It is possible to significantly reduce a prediction error of the high-speed RFV and the high-speed TFV in a tire having a large PRO growth amount at high speed. Three or more sample tires are extracted from each lot. The PRO and RFV are measured and the least-square method is used to predict (100) the upper and lower and front and back natural angle frequency, attenuation ratio, upper and lower spring constant, and rolling radius coefficient. By using the PRO measurement apparatus, the PRO during idling is measured. By using an AAV measurement apparatus, an actual measurement value AAVL of the angle acceleration fluctuation at a low speed is measured (102). The PRO and AAV at a high speed are predicted (104) and the actual measurement value and prediction value are used to predict the high-speed RFV and TFV.
    Type: Grant
    Filed: December 19, 2006
    Date of Patent: September 23, 2008
    Assignee: Bridgestone Corporation
    Inventor: Katsuo Obunai
  • Patent number: 7418351
    Abstract: The present invention provides methods for analyzing measurement errors in measured signals obtained in an experiment, e.g., measured intensity signals obtained in a microarray gene expression experiment. In particular, the invention provides a method for transforming measured signals into a domain in which the measurement errors in the transformed signals are normalized by errors as determined from an error model. The methods of the invention are particularly useful for analyzing measurement errors in signals in which at least portion of the error is dependent on the magnitudes of the signals. Such transformed signals permit analysis of data using traditional statistical methods, e.g., ANOVA and regression analysis. Magnitude-independent errors can also be used for comparing level of measurement errors in signals of different magnitudes.
    Type: Grant
    Filed: January 30, 2003
    Date of Patent: August 26, 2008
    Assignee: Rosetta Inpharmatics LLC
    Inventor: Lee Weng
  • Patent number: 7415387
    Abstract: A system and method for classifying failures of semiconductor integrated circuit dies using a unique input vector created from die level characterization data to classify wafer (process related) and die level (defect related) patterns. The failure classification may then be used to assign the appropriate yield loss by die. The classification results produced by the plurality of classifiers are examined with a preference towards assigning a wafer level failure classification to failure data for a die when any of the plurality of failure classification results indicates a presence of a wafer level failure.
    Type: Grant
    Filed: December 19, 2006
    Date of Patent: August 19, 2008
    Assignee: Qimonda North America Corp.
    Inventors: Kevin L. Fields, Timothy J. A. Bynum
  • Patent number: 7415388
    Abstract: A method is provided for the automated determination of the indirect and direct extent of damages in objects resulting from a failure of technical components integrated in a production cycle. The invention involves the detection of the components that are affected by a failure, a determination of the number of clients and/or users dependant on each affected component, and a determination of the point in time of the expected renewed availability of each affected component. The extent of the resulting indirect and indirect monetary damages is determined on the basis of this information.
    Type: Grant
    Filed: May 19, 2004
    Date of Patent: August 19, 2008
    Assignee: T-Mobile Deutschland GmbH
    Inventors: Frank Hachmann, Christian Sachgau, Dietmar Peschel
  • Patent number: 7412343
    Abstract: Systems and methods for delay-fault testing field programmable gate arrays (FPGA's), applicable both for off-line manufacturing and system-level testing, as well as for on-line testing within the framework of the roving self-test area (STARs) approach are described. In one described method, two or more paths under test receive a test pattern approximately simultaneously. The two paths are substantially identical and thus should propagate the signal in approximately the same amount of time. An output response analyzer receives the signal from each of the paths and determines the interval between them, and then determines whether a delay fault has occurred based at least in part on the interval. The output response analyzer may include an oscillator and a counter. The oscillator generates an oscillating signal during the interval between when the test signal propagates through the first path and the last path under test.
    Type: Grant
    Filed: July 1, 2003
    Date of Patent: August 12, 2008
    Assignee: University of North Carolina at Charlotte
    Inventors: Charles Eugene Stroud, Miron Abramovici
  • Patent number: 7412347
    Abstract: An apparatus and corresponding method measure physical parameters using a plurality of low-cost sensors coupled in series is provided. These sensors can be thermal sensors for measuring the temperature of a heating pad. Different types of sensors to measure temperature, moisture, pressure, or state change of a switch may be employed. Such sensors may be distributed throughout a building to concurrently monitor multiple physical parameters at numerous locations. The sensors are easily manufactured, thus reducing sensor cost. Costs are further reduced by the use of two wires to connect the series of sensors. Moreover, the wires can be run easily through conduit or cable troughs.
    Type: Grant
    Filed: January 17, 2007
    Date of Patent: August 12, 2008
    Assignee: Sherwood Engineering Design Services, Inc.
    Inventors: Robert A. Sherwood, Roy A. Griffin
  • Patent number: 7409314
    Abstract: Provided is a method for monitoring resources in a utility computing environment (UCE). Measurements are evaluated to determine whether or not a particular resource requires remedial or other type of action. A sliding measurement window is employed to assemble a number of measurements corresponding to a particular resource. The number of intervals in a sliding measurement window is based upon best practices corresponding to the resource being measured and analyzed. A first threshold-crossing event and subsequent events are stored until the window is full, or closed. When the window is closed, the threshold-crossing measurements are analyzed to determine whether or not there exists an issue with the resource that requires action. Once a window has been closed and analyzed, the first threshold-crossing event and each subsequent event up to a second threshold-crossing event are discarded and the window reopens.
    Type: Grant
    Filed: July 29, 2004
    Date of Patent: August 5, 2008
    Assignee: International Business Machines Corporation
    Inventors: Rhonda L. Childress, Miguel E. Gasca, Jr., Elfred Pagan, Abigail A. Tittizer
  • Patent number: 7409302
    Abstract: The invention provides a method for determining vibration-related information by projecting an aerial image at an image position in a projection plane, mapping an intensity of the aerial image into an image map, the image map arranged for comprising values of coordinates of sampling locations and of the intensity sampled at each sampling location, and measuring intensity of the aerial image received through a slot pattern. The method further includes determining from the image map a detection position of a slope portion of the image map, at the detection position of the slope portion, measuring of a temporal intensity of the aerial image and measuring of relative positions of the slot pattern and the image position, the relative positions of the slot being measured as position-related data of the slot pattern and determining from the temporal intensity of the aerial image vibration-related information for said aerial image.
    Type: Grant
    Filed: September 15, 2005
    Date of Patent: August 5, 2008
    Assignee: ASML Netherlands B.V.
    Inventors: Haico Victor Kok, Koen Kivits, Ron Van De Laak, Johannes Maria Kuiper, Gerbrand Van Der Zouw, Hoite Pieter Theodoor Tolsma
  • Patent number: 7406398
    Abstract: A system and method are provided for identifying underperformance in a pumping system used to produce a desired fluid. Various conditions are sensed during operation of the pumping system, and those sensed conditions are used to determine measured parameters that are provided with an associated confidence factor. The measured parameters in conjunction with the confidence factors are compared to a reference composite curve for the specific pumping system to determine whether actual performance has satisfied underperformance criteria or moved across a threshold into underperformance.
    Type: Grant
    Filed: May 6, 2004
    Date of Patent: July 29, 2008
    Assignee: Schlumberger Technology Corporation
    Inventors: Albert G. Ollre, Jan Dolejsi, Antonio Vizurraga
  • Patent number: 7406388
    Abstract: A method for calibration process management of a calibration testing unit and a plurality of units under test, comprising configuring a user interface in communication with a calibration process management software system, configuring a communications link in communication with the software system, the software system capable of communicating with the calibration testing unit and the plurality of units under test, wherein the software system manages the user interface and the communications link in a manner permitting an operator to calibrate the plurality of units under test. Tracking of the calibrated units under test uses a permanent unique identifier and a dynamic unique identifier.
    Type: Grant
    Filed: September 11, 2003
    Date of Patent: July 29, 2008
    Assignee: Southern California Edison
    Inventors: Curtis V. Casto, Kevin C. Sullivan, Laurence E. Nielsen
  • Patent number: 7403868
    Abstract: If a tool breakage occurs, a cutting time T and a maximum value (absolute value) G of a slope of a drop in a cutting load become small. A cutting load integrated value S increases as a tool wears and becomes small when the breakage occurs. Therefore, these values T, G, and S are obtained in a machining cycle, moving variable thresholds are obtained (updated) based on values T, G, and S obtained in a preceding machining cycle, and the thresholds and the values T, G, and S obtained in the current machining cycle are compared with each other to thereby determine an abnormal condition of the tool.
    Type: Grant
    Filed: September 15, 2003
    Date of Patent: July 22, 2008
    Assignee: Fanuc Ltd
    Inventors: Susumu Maekawa, Kuniharu Yasugi
  • Patent number: 7395169
    Abstract: A memory test engine performs memory tests on an embedded memory located in a device under test (DUT) simultaneous to analog tests performed by an automatic tester. The automatic tester provides coded information to the memory test engine, which includes a description of the embedded memory within the DUT. The memory test engine operates autonomous to the automatic tester; apply addresses, data and control and comparing results of the memory test to expected values. The automatic tester and the memory test engine use the same DUT data bus; and therefore, arbitrate the use of the bus of the DUT.
    Type: Grant
    Filed: June 5, 2006
    Date of Patent: July 1, 2008
    Assignee: Dialog Semiconductor
    Inventor: Hans Martin Vonstaudt
  • Patent number: 7392145
    Abstract: An automotive speedometer drive apparatus is disclosed that replaces an existing speedometer cable of the type used to drive mechanical speedometer instruments. The drive being an electronically controlled motor made to rotate at the correct rate to give an accurate speed indication, taking into consideration the specific tire size and specific speedometer involved. The drive may also be easily installed and field-calibrated by the user without the need of any special knowledge or equipment.
    Type: Grant
    Filed: April 16, 2007
    Date of Patent: June 24, 2008
    Inventor: James P. Romano