Patents Examined by Jonathan Moffat
  • Patent number: 7313483
    Abstract: The invention disclosed herein employs an algorithm, the Gas Formation Model (“GFM”), to calculate the formation of free gas in a human body. The GFM is based on a novel theory of the formation of free gas relative to the physiology of the human cardiovascular system. Additionally, the GFM utilizes a novel means for the solution of integro-differential equations, the type of equations that derive from the introduction of physiological parameters. GFM-based dive computers utilize novel inputs, including a measure of exercise at depth to reflect the state of an individual's cardiovascular system. GFM-based dive computers also produce novel outputs, including the actual volume of free gas present in a diver's cardiovascular system. The GFM is implemented as a practical computational tool by means of a incorporating the algorithm into a dive computer.
    Type: Grant
    Filed: October 21, 2005
    Date of Patent: December 25, 2007
    Inventors: Steven Crow, John Lewis
  • Patent number: 7313485
    Abstract: The claimed invention relates to a method for determining the extent of an oxidation reaction of a coated metallic turbine component within a turbine, comprising determining a plurality of reference oxidation rates for a plurality of locations on the turbine component for a plurality of different turbine operating conditions. The invention also relates to selecting an appropriate oxidation rate from a family of reference oxidation rate data and estimating the oxidation of the coated turbine blade or vane.
    Type: Grant
    Filed: July 30, 2004
    Date of Patent: December 25, 2007
    Assignee: Siemens Power Generation, Inc.
    Inventors: Kurt Augustus Plotts, Malberto Fernandez Gonzalez, Andrew Jeremiah Burns
  • Patent number: 7310588
    Abstract: A computer-implemented method for verifying geometries of airfoils includes the steps of providing a part having an airfoil having an intended positional geometry and an intended feature geometry; measuring a first set of points of a primary datum system; determining an actual positional geometry of the airfoil based on the primary datum system measurements; calculating a first deviation between the intended positional geometry and the actual positional geometry of the airfoil; measuring a plurality of sets of points of at least one secondary datum system; determining an actual feature geometry of the airfoil based on the at least one secondary datum system measurement; calculating a second deviation between the intended feature geometry and the actual feature geometry of the airfoil; and performing a verification of the intended positional geometry and the intended feature geometry of the airfoil based upon the first deviation and the second deviation.
    Type: Grant
    Filed: October 24, 2005
    Date of Patent: December 18, 2007
    Assignee: United Technologies Corporation
    Inventors: Karl A. Mentz, Bryan P. Dube, Richard M. Salzillo, Jr.
  • Patent number: 7310593
    Abstract: An apparatus for determining a state parameter of an object to be monitored comprises a means for providing a plurality of measurement values, wherein the measurement values comprise information relating to the state parameter of the object to be monitored, a comparison means for comparing the measurement value to a predeterminable comparison parameter, wherein the comparison means is formed to output a first comparison signal when a predeterminable number of measurement values falls below the comparison parameter within a measurement interval, or to output a second comparison signal when the predeterminable number of measurement values exceeds or reaches the comparison parameter, wherein the first comparison signal or the second comparison signal indicate the state parameter.
    Type: Grant
    Filed: March 4, 2005
    Date of Patent: December 18, 2007
    Assignee: Infineon Technologies AG
    Inventor: Dirk Hammerschmidt
  • Patent number: 7305319
    Abstract: Methods and systems for controlling motion of and optically tracking a mechanically unattached probe (202) in three-dimensions are disclosed. A mechanically unattached magnetic probe (202) is placed in the system under test. The position of the probe is optically tracked in three dimensions by sensing light scattered by the probe and direct light from a light source. Magnetic poles (200) positioned about the probe are selectively magnetized to control motion of the probe in three dimensions by minimizing error between a sensed position and a desired position. In one implementation, the coil currents are time division multiplexed such that the average force on the probe produces motion in a desired direction.
    Type: Grant
    Filed: September 30, 2002
    Date of Patent: December 4, 2007
    Assignee: The University of North Carolina
    Inventors: Leandra Vicci, Richard Superfine
  • Patent number: 7302356
    Abstract: A Coriolis flowmeter having an improved measurement accuracy, especially in measurement applications, where conventional Coriolis flowmeters may have a reduced accuracy due to erroneous flow spiking or outputs during no-flow situations is described, comprising: a measurement tube, a driver for imparting a force proportional to an applied excitation signal to the measurement tube for setting the measurement tube into an oscillatory motion, motion sensors for measuring the motion of the measurement tube, an excitation signal generator, for generating the excitation signal to be supplied to the driver based on the measurement signals derived by the motion sensors, means for monitoring the excitation signal or a damping-coefficient of a damping of the measurement tube and for determining whether an amplitude (A) of the excitation signal or the damping coefficient exceeds an application-specific range, and means for determining a corrected flow (Fc) of a fluid through the measurement tube, wherein the corrected fl
    Type: Grant
    Filed: September 15, 2004
    Date of Patent: November 27, 2007
    Assignee: Endress + Hauser Flowtec AG
    Inventors: Paul Logue, Jerry E. Stevens
  • Patent number: 7295937
    Abstract: A method and system is provided for determining noise components of an analog-to-digital converter. In one aspect of the invention, a method comprises providing an input signal to a signal input and a clock input of the ADC, outputting a plurality of samples at a sampled phase on the input signal for a plurality of sampled phases, and determining a jitter noise factor value, a reference noise factor value, and a total noise spectrum based on the plurality of samples for each of the plurality of sampled phases. A least means square algorithm is performed on the plurality of jitter noise factor values, reference noise factor values, and total noise spectra to estimate at least one of a jitter noise component and a reference noise component.
    Type: Grant
    Filed: July 20, 2005
    Date of Patent: November 13, 2007
    Assignee: Texas Instruments Incorporated
    Inventors: Goutam Dutta, Vineet Mishra
  • Patent number: 7292953
    Abstract: A semiconductor memory device for performing an OCD calibration control operation to adjust a data output impedance includes a decoder for decoding an address signal to generate an OCD default control signal, an OCD operation signal and plural data, a code generator for receiving plural-bit data to generate an OCD control code; a first circuit for receiving the OCD control code and the OCD operation signal to generate a plurality of impedance adjustment control signals; and a second circuit for receiving the plural data and adjusting the data output impedance in response to the plurality of impedance adjustment control signals.
    Type: Grant
    Filed: December 30, 2004
    Date of Patent: November 6, 2007
    Assignee: Hynix Semiconductor, Inc.
    Inventor: Hun-Sam Jung
  • Patent number: 7292954
    Abstract: Aspects of the present invention are directed to systems, methods, and computer-readable media for measuring certain actuator system parameters of an actuator, e.g., an EMA in its working environment. Stiction and backlash are examples of such parameters, and these indicate the impending failure of an actuator system than conventional approaches of measuring the elapsed time of operation. When the measured backlash and/or stiction parameters exhibit a deleterious increase over time, e.g., by exceeding a preset threshold, imminent failure or the need for service/repair of the system is indicated.
    Type: Grant
    Filed: July 27, 2005
    Date of Patent: November 6, 2007
    Assignee: HR Textron Inc.
    Inventors: Robert W. Deller, Joon H. Lee
  • Patent number: 7289915
    Abstract: A method of estimating load inertia for a motor is provided that can estimate the load inertia even when a cogging torque of the motor is large or resonance occurs in the mechanical system of the load. Vibration is detected in an acceleration feedback signal. An estimated inertia gain Kn is multiplied by a coefficient ? of zero (0) or more but less than one (1) when the detected vibration is equal to or more than a predetermined level, or the estimated inertia gain Kn is multiplied by a coefficient ? of one (1) when the detected vibration is less than the predetermined level.
    Type: Grant
    Filed: November 30, 2006
    Date of Patent: October 30, 2007
    Assignee: Sanyo Denki Co., Ltd.
    Inventor: Yuuji Ide
  • Patent number: 7289924
    Abstract: A method for self-calibrating a sensor can be implemented in a system having a calibration circuit. The calibration circuit has differential circuitry which compares an output signal of the sensor with a predetermined reference signal associated with a reference property. A bias controller increments or decrements the sensor operating bias according to the deviation between the predetermined reference signals and sensor output signal such that the sensor output corresponds to the predetermined reference voltage. The calibration circuit can be embedded in the sensor to provide a self-calibrating sensor. Logic circuitry can be used to form the calibration circuit.
    Type: Grant
    Filed: July 20, 2005
    Date of Patent: October 30, 2007
    Assignee: Honeywell International Inc.
    Inventors: Raghavendra Muniraju, Sudheer Pulikkara Veedu, James L. Blackstone
  • Patent number: 7283934
    Abstract: An improved technique of acceptance testing an actuator system involves measuring system parameters of the actuator system during operation of the actuator system, and storing the measured system parameters in computerized memory as a set of measured system parameters. The technique further involves obtaining a set of predetermined thresholds. Each predetermined threshold corresponds to a particular measured system parameter. The technique further involves electronically indicating whether the actuator system is in acceptable condition based on an electronic comparison of the set of measured system parameters stored in the computerized memory and the set of predetermined thresholds, e.g., providing a warning of a need for service or of imminent failure when one or more of the system parameters exceeds a corresponding threshold.
    Type: Grant
    Filed: July 27, 2005
    Date of Patent: October 16, 2007
    Assignee: HR Textron, Inc.
    Inventors: Robert W. Deller, Joon H. Lee
  • Patent number: 7283926
    Abstract: Counting circuits applied to distance estimation for ultra wideband (UWB) application, in which a first counting unit generates a sequence of pseudo-random number series not including zero, a first recoding unit records a first series and a second series from the sequence according to a first signal and a second signal, and a transfer unit generates a binary counting value according to the first series and second series from the recording unit.
    Type: Grant
    Filed: October 24, 2005
    Date of Patent: October 16, 2007
    Assignee: Faraday Technology Corp.
    Inventor: Mau-Lin Wu
  • Patent number: 7280934
    Abstract: A method for testing an electronic component. The method includes connecting the electronic component to a test machine; specifying search range limits, low-to-high transition edge and high-to-low transition edge found criterion, and number of outcomes in a trial including multiple tests specified as proof of low-to-high transition or as high-to-low transition; computing values for initial trial parameters; if low-to-high transition edge not found: executing a low-to-high trial and adjusting trial parameter values based on results of step executing low-to-high trial; if high-to-low transition edge not found: executing high-to-low trial; and if either low-to-high or high-to-low transition edge not found: adjusting trial parameter values based on results of step executing high-to-low trial and repeating above steps beginning with the step having the condition if low-to-high transition edge has not been found.
    Type: Grant
    Filed: April 24, 2006
    Date of Patent: October 9, 2007
    Assignee: Verigy (Singapore) Pte. Ltd.
    Inventor: Gregory E. Thoman
  • Patent number: 7280933
    Abstract: A method for forming a pattern on a substrate, including the steps of: ejecting liquid drops from an ejection head having nozzles onto a reference plate on which a plurality of target positions are defined, the target positions being arranged in at least one row; detecting an amount of a displacement between the target positions and the positions at which the liquid drops have actually landed; determining a relative positional error relative to the ejection head for each of the at least one row of the target positions based on the amount of the displacement; determining a correction value for each of the at least one row based on the relative positional error; and sequentially changing a relative position of the substrate and the ejection head based on the corrections values when the liquid drops are being ejected onto the substrate.
    Type: Grant
    Filed: December 30, 2004
    Date of Patent: October 9, 2007
    Assignee: Seiko Epson Corporation
    Inventor: Nobuaki Nagae
  • Patent number: 7277812
    Abstract: A data generator configured to provide a predictable data pattern, including system and product-by-process therefore, is described. The data generator is coupled to a circuit under test via a first data interface. The data generator is configured to generate a predictable data pattern for the circuit under test. The predictable data pattern is associated with display on a screen. A display controller is coupled to the circuit under test via a second data interface. At least one of a data monitor and a display device is coupled to the display controller.
    Type: Grant
    Filed: February 18, 2005
    Date of Patent: October 2, 2007
    Assignee: Xilinx, Inc.
    Inventor: Jennifer R. Lilley
  • Patent number: 7275004
    Abstract: An integrated circuit is provided that includes a first port to receive a first signal from a first channel and a first device coupled to the first port to modify a channel response of the first signal received from the first channel. A waveform capture device may be coupled to the first device to capture a waveform of a signal modified by the first device.
    Type: Grant
    Filed: December 23, 2003
    Date of Patent: September 25, 2007
    Assignee: Intel Corporation
    Inventors: Bryan K. Casper, Aaron K. Martin, James E. Jaussi, Stephen R. Mooney, Ganesh Balamurugan
  • Patent number: 7272510
    Abstract: The invention relates to measuring instruments, preferably of the kind measuring absorbances, in an object, of electromagnetic radiation in at least two spectral ranges, such as IR instruments, and DXR, meaning Dual X-ray instruments, and more specifically to the determination of properties of food or feed, such as the fat content in milk or meat. The invention relates in particular to a method of providing a correction for a slave instrument of the kind measuring properties of an object by exposing the object to electromagnetic radiation, in particular X-rays, in at least two spectral ranges and obtaining one or more object responses thereto. The responses obtained being preferably based on detecting attenuation and/or reflection and/or scatter of the electromagnetic radiation in/from the object by use of one or more detectors and are obtained in a form where they express properties of the object either directly or via a transformation.
    Type: Grant
    Filed: December 11, 2002
    Date of Patent: September 18, 2007
    Assignee: Foss Analytical A/S
    Inventor: Per Waaben Hansen
  • Patent number: 7272540
    Abstract: In a method according to the invention or a corresponding device data generated in a technical system is captured and provided with an information element. A sequential data processing of the data takes place by means of at least two data processing modules in preferably random order, whereby the status of the information element is changed.
    Type: Grant
    Filed: July 31, 2004
    Date of Patent: September 18, 2007
    Assignee: Siemens Aktiengesellschaft
    Inventors: Michael Grühn, Ulrich Kunze
  • Patent number: 7269532
    Abstract: The present invention relates to a device for detecting the orientation of a solid including a sensor of angular position, capable of being affixed to the solid and of supplying at least a measuring datum representative of the orientation of the solid. The device also includes means for generating test data representative of an estimated orientation of the solid, and means for modification of the estimated orientation of the solid by confrontation of the measuring datum and test data.
    Type: Grant
    Filed: April 2, 2003
    Date of Patent: September 11, 2007
    Assignee: Commissariat a l'Energie Atomique
    Inventors: Dominique David, Yanis Caritu