Patents Examined by Jonathan Moffat
  • Patent number: 7191091
    Abstract: The present invention is a method for determining the center to center spacing of conductors in an insulated, multi-conductor, flat cable. The method comprising applying an X-ray field to the cable, detecting the X-ray field intensity that passes through the cable, obtaining a digitized output waveform of the X-ray field intensity as a function of cable position, and determining a trough location of the waveform by averaging calculated position values for the center of the conductor at several longitudinal positions along a cross section of the conductor.
    Type: Grant
    Filed: December 1, 2004
    Date of Patent: March 13, 2007
    Assignee: 3M Innovative Properties Company
    Inventors: Donald E. Yuhas, James H. Voth, Patrick Schneider, Keith H. Foster
  • Patent number: 7191071
    Abstract: The invention is a method of determining all the components of an absolute permeability tensor of a porous medium sample from permeability measurements, obtained for example by placing the sample in a permeameter which is useful for fast determination of permeability anisotropies of rocks and detention of internal heterogeneities. A pressure difference ?P is applied between the inlet and outlet faces of a laboratory rock sample, with zero flow conditions on the edges parallel to the mean flow obtained by confining it in a sheath under pressure. Starting from conventional permeability measurements in three directions and from the measurements of the two components of the viscous forces transverse to the sample, a permeability tensor k can be “inverted” by numerical solution of the corresponding boundary-value problem.
    Type: Grant
    Filed: December 2, 2004
    Date of Patent: March 13, 2007
    Assignee: Institut Francais du Petrole
    Inventors: Moussa Kfoury, Benoit Noetinger, Michel Quintard
  • Patent number: 7191093
    Abstract: A computed tomography unit includes a radiation detector with several detector elements, a data recording system for reading the electrical signals generated by the detector elements and the processing thereof to give raw data may be supplied via a data transmission path. The computed tomography unit further includes an analytical device for the automatic determination of the quality of the data recording system and/or of the data transmission path and optionally the radiation detector in addition. The analytical unit in particular initiates a measurement for the generation of raw data, calculates at least one value for at least one parameter which permits a quality determination therefrom and displays an analytical result, which incorporates the calculated value, on a display device.
    Type: Grant
    Filed: May 23, 2003
    Date of Patent: March 13, 2007
    Assignee: Siemens Aktiengesellschaft
    Inventors: Peter Hein, Jürgen Simon
  • Patent number: 7184927
    Abstract: An adaptive, sensorless position sensing apparatus (250) derives rotor position of a synchronous machine (200). The apparatus (250) comprises a first rotor position deriving unit (300) for generating first rotor position values by applying a first sensorless rotor position calculation technique, which emulates a resolver; a second rotor position deriving unit (400) for generating second rotor position values by applying a second sensorless rotor position calculation technique; and a rotor position result output unit (450) for outputting rotor position results over a range of rotor speeds as a function of the first rotor position values, the second rotor position values, and rotor speed.
    Type: Grant
    Filed: March 26, 2004
    Date of Patent: February 27, 2007
    Assignee: Honeywell International Inc.
    Inventors: Cristian E. Anghel, Rocco DiVito, Nicolae Morcov
  • Patent number: 7177778
    Abstract: Provided is a method and system for managing data processing rates at a network adapter using a temperature sensor. A temperature of a component in the adapter transmitting data over a network is measured. A rate at which data is processed in the adapter over the network is reduced in response to determining that the measured temperature exceeds a threshold.
    Type: Grant
    Filed: November 30, 2004
    Date of Patent: February 13, 2007
    Assignee: Intel Corporation
    Inventors: Daniel R. Gaur, Patrick L. Connor, Scott P. Dubal
  • Patent number: 7174271
    Abstract: It is possible to significantly reduce a prediction error of the high-speed RFV and the high-speed TFV in a tire having a large PRO growth amount at high speed. Three or more sample tires are extracted from each lot. The PRO and RFV are measured and the least-square method is used to predict (100) the upper and lower and front and back natural angle frequency, attenuation ratio, upper and lower spring constant, and rolling radius coefficient. By using the PRO measurement apparatus, the PRO during idling is measured. By using an AAV measurement apparatus, an actual measurement value AAVL of the angle acceleration fluctuation at a low speed is measured (102). The PRO and AAV at a high speed are predicted (104) and the actual measurement value and prediction value are used to predict the high-speed RFV and TFV.
    Type: Grant
    Filed: October 11, 2002
    Date of Patent: February 6, 2007
    Assignee: Bridgestone Corporation
    Inventor: Katsuo Obunai
  • Patent number: 7171332
    Abstract: A method of assessing a profile of a surface of a fuel injector assembly. The method includes the steps of measuring the surface to obtain a set of data points, selecting a subset of the set of data points, fitting a regression line to the subset, establishing a tolerance limit for the regression line, and determining whether the data points are within the tolerance limits.
    Type: Grant
    Filed: November 1, 2004
    Date of Patent: January 30, 2007
    Assignee: Detroit Diesel Corporation
    Inventors: Roman Francis Kosiorek, Caley Roarke Edgerly
  • Patent number: 7171319
    Abstract: Disclosed are a method and system for calibrating grid parameters for a photolithographic tool. One embodiment of the invention utilizes at least two artifacts located on the wafer stage. The artifacts are located outside of the area where a substrate would be placed. Typically, four artifacts are used, with two artifacts located along the same axis. The stage moves a first artifact to the alignment system and the system measures the location of the first artifact. The stage then moves the second artifact, which is on the same axis but on the other side of the wafer stage, under the alignment system and measures the location of the second artifact. This is repeated for the other two artifacts that line up in a second axis (i.e., perpendicular to the first axis). Grid offsets are calculated to provide, for example, grid magnification and rotation calibrations.
    Type: Grant
    Filed: September 2, 2004
    Date of Patent: January 30, 2007
    Assignee: International Business Machines Corporation
    Inventors: Edward W. Conrad, Paul D. Sonntag
  • Patent number: 7162380
    Abstract: An apparatus and method for providing a reference voltage for regulating voltage levels. The apparatus includes a first voltage generation system configured to receive a first control signal and output a calibration voltage, a voltage adjustment system configured to receive the calibration voltage and a reference voltage and output a second control signal, and a second voltage generation system configured to receive the second control signal and output the reference voltage. The voltage adjustment system includes a latch system configured to receive a third control signal and a fourth control signal and output the first control signal.
    Type: Grant
    Filed: February 17, 2005
    Date of Patent: January 9, 2007
    Assignee: Semiconductor Manufacturing international (Shanghai) Corporation
    Inventor: Wenzhe Luo
  • Patent number: 7155361
    Abstract: A system and method for semiconductor test management. A second computer receives a scrap rule from a first computer, acquires an initial scrap threshold corresponding to the scrap rule, stores the scrap rule as a SBC/SBL (Statistic BIN Control/Statistic BIN Limit) rule when a scrap condition therein is less or equally restrictive than the initial scrap threshold, acquires a CP (Circuit Probing) test result for a wafer or wafer lot and generates an advisory report for the wafer or wafer lot by carrying the CP test result into the stored SBC/SBL rules.
    Type: Grant
    Filed: February 24, 2005
    Date of Patent: December 26, 2006
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventor: Joshua Huang
  • Patent number: 7143001
    Abstract: A method for use with an accelerometer that monitors movement of a machine component and generates acceleration values that include at least some noise associated therewith, the method for tracking machine component velocity via the acceleration values, the method comprising the steps of obtaining acceleration values from the accelerometer during machine operation, analyzing the acceleration values to distinguish noise signals from non-noise signals wherein a noise signal is an acceleration value likely solely attributable to noise, using the non-noise signals to identify a component velocity value and performing a secondary function to identify component velocity when noise signals are identified. The invention also contemplates a processor to perform the inventive methods.
    Type: Grant
    Filed: July 21, 2004
    Date of Patent: November 28, 2006
    Assignee: Rockwell Automation Technologies, Inc.
    Inventor: Milan Karasek
  • Patent number: 7136766
    Abstract: A control unit receives a sensor output and performs signal processing on the sensor output to produce an internal signal. The control unit produces internal data by adding time data to an internal signal and transmits the internal data to an in-vehicle network. A diagnostic unit receives the internal data from the in-vehicle network and stores the internal data in an internal data storing device. The diagnostic unit also receives a measurement signal produced based on the sensor output. The diagnostic unit produces external data by adding time data containing time at which the second timer resets a time count when an ignition switch is closed and stores the external data. The diagnostic unit reproduces the internal data and the external data and extracts the internal signal and the measurement signal. The diagnostic unit displays or stores the internal signal and the measurement signal according to the time data.
    Type: Grant
    Filed: December 2, 2004
    Date of Patent: November 14, 2006
    Assignee: Denso Corporation
    Inventor: Akio Yasuda
  • Patent number: 7133785
    Abstract: Embodiments of the present invention provide a system and method of valve control that eliminates, or at least substantially reduces, the shortcomings of prior art valve control systems and methods. More particularly, embodiments of the present invention provide systems and methods for multi-channel valve control. One embodiment of the present invention includes a system of valve control that comprises a processor, a computer readable medium accessible by the processor and a set of computer instructions that are executable by the processor to output a first signal on a first channel indicating an initial force to be applied to a valve by an actuator and output a second signal on a second channel indicating a control force to be applied to the valve.
    Type: Grant
    Filed: July 8, 2004
    Date of Patent: November 7, 2006
    Assignee: Celerity, Inc.
    Inventors: Dwight S. Larson, Kenneth E. Tinsley, Faisal Tariq
  • Patent number: 7124053
    Abstract: A system is provided for obtaining parameters about the position and orientation of a camera, where the camera has a fixed position and orientation, by using the image coordinates and world coordinates of markers included in an image photographed by the camera. This system uses a live-image display mode for successively obtaining images input to the camera and a still-image display mode for obtaining an image input to the camera at predetermined time. The markers can be extracted by using the image obtained in either mode. The system can select either automatic-extraction mode or manual-extraction mode for extracting the marker in live images, so that the markers can be extracted with a high degree of accuracy under all conditions to obtain the position and orientation parameters of the camera.
    Type: Grant
    Filed: April 29, 2004
    Date of Patent: October 17, 2006
    Assignee: Canon Kabushiki Kaisha
    Inventors: Rika Tanaka, Kiyohide Satoh, Kazuki Takemoto
  • Patent number: 7124037
    Abstract: Devices, systems, and methods for monitoring the operation of an injection molding machine, for example, a wax injection molding machine, are disclosed. The devices, systems, and methods may be used for injection molding machines having an injection die, a molding medium injection cylinder, and a control cylinder coupled to the injection cylinder, the control cylinder having a fluid supply conduit. Monitoring and/or control are practiced by monitoring the fluid pressure and the flow rate of the fluid in the conduit. This flow rate and pressure are used to calculate the fluid pressure and flow rate of the molding medium injected into the injection die. A data acquisition system may be used to calculate and output the calculated data. The system can be portable and adaptable for use with any type of injection molding machine and for any injection molding medium.
    Type: Grant
    Filed: October 29, 2004
    Date of Patent: October 17, 2006
    Assignee: MPI Incorporated
    Inventor: Keith B. Gardener
  • Patent number: 7120561
    Abstract: The present invention relates to a method and circuit arrangement for performing signal alignment, wherein signals to be aligned are controlled based on a frequency response of a phase error determined in the comparison. Thereby, the input and output signals can be aligned even in the presence of considerable distortion, as they are now compared using a quantity immune to the effects of both amplitude-based and phase-based distortions.
    Type: Grant
    Filed: December 18, 2002
    Date of Patent: October 10, 2006
    Assignee: Nokia Corporation
    Inventors: Richard Kybett, William Jenkins
  • Patent number: 7120553
    Abstract: A method of measuring a physical characteristic of a patterned substrate comprises determining a wavelength where a first reflectance from a patterned substrate equals a second reflectance from the patterned substrate. The first and second reflectances are generated from substrate regions having different pattern densities. A physical characteristic value that is associated with the determined wavelength is identified. The value identification may be done by looking up the determined wavelength in a database, for example by referring to a graph.
    Type: Grant
    Filed: July 23, 2004
    Date of Patent: October 10, 2006
    Assignee: Applied Materials, Inc.
    Inventor: Dominic J. Benvegnu
  • Patent number: 7113871
    Abstract: The invention makes a contribution in order that machines and installations are better utilized, their service life is extended, reliability is improved, the loss of valuable materials is avoided, test results are optimized, and energy consumption is diminished. It is an expert system that acquires and assesses the condition of installations, machines and apparatuses. The mechanism proceeds from a normal condition and permanently observes short-term, medium-term and long-term changes. If variations in the normal condition are detected promptly, major instances of damage can be avoided by promptly performing corrective actions before major instances of damage associated with prolonged downtimes occur.
    Type: Grant
    Filed: November 15, 2004
    Date of Patent: September 26, 2006
    Inventor: Peter Renner
  • Patent number: 7110906
    Abstract: The present invention is directed to a system and method for monitoring the performance of a heat exchanger. In accordance with the system and method, baseline values of a performance factor (E) for baseline sets of heat exchanger operating values are calculated and stored. A current value of E is calculated for a current set of the operating values and is compared to a retrieved baseline value of E for a baseline set of the operating values that at least substantially matches the current set of the operating values. E provides a measure of the performance of the heat exchanger and is calculated using differential temperatures across the heat exchanger and without using any information concerning the physical construction of the heat exchanger.
    Type: Grant
    Filed: July 22, 2004
    Date of Patent: September 19, 2006
    Assignee: ABB Inc.
    Inventor: Richard W. Vesel
  • Patent number: 7107177
    Abstract: Combining of reference measurement collections (RMCs) of at least three reference measurement systems into a weighted reference measurement collection (wRMC) is disclosed. Each RMC includes a plurality of corresponding sample measurements, each of which has a measurement value of the same sample. The invention plots corresponding measurement values to generate a plurality of data pairs for each possible RMC pairing. A best-fit line of the plurality of data pairs for each RMC pairing is then generated, and a residual for each data pair is calculated. A weight is then assigned to each sample measurement for each RMC based on the residuals associated with a respective RMC to which the sample measurement belongs, favoring a smaller residual more than a larger residual. A weighted reference measurement is then generated based on the weights, and the measurement value for the respective sample measurement for each RMC.
    Type: Grant
    Filed: February 14, 2005
    Date of Patent: September 12, 2006
    Assignee: International Business Machines Corporation
    Inventor: Matthew J. Sendelbach