Patents Examined by K. Hantis
  • Patent number: 6025920
    Abstract: Method and apparatus for determining the opacity of exhaust plumes from moving emissions sources. In operation, a light source is activated at a time prior to the arrival of a diesel locomotive at a measurement point, by means of a track trigger switch or the Automatic Equipment Identification system, such that the opacity measurement is synchronized with the passage of an exhaust plume past the measurement point. A beam of light from the light source passes through the exhaust plume of the locomotive and is detected by a suitable detector, preferably a high-rate photodiode. The light beam is well-collimated and is preferably monochromatic, permitting the use of a narrowband pass filter to discriminate against background light. In order to span a double railroad track and provide a beam which is substantially stronger than background, the light source, preferably a diode laser, must provide a locally intense beam.
    Type: Grant
    Filed: May 6, 1996
    Date of Patent: February 15, 2000
    Assignee: Sandia Corporation
    Inventor: John Edward Dec
  • Patent number: 6018395
    Abstract: An alignment method useable with an original having a pattern and a substrate having a surface area on which the pattern of the original is printed. The alignment method comprises detecting plural marks, calculating plural times, the amount of rotational deviation on the basis of different combinations of marks, calculating the quantity of rotational correction of the original and the substrate by using the computed rotational deviations, and aligning on the basis of the calculated quantity of the rotational deviation.
    Type: Grant
    Filed: December 16, 1996
    Date of Patent: January 25, 2000
    Assignee: Canon Kabushiki Kaisha
    Inventors: Makiko Mori, Shunichi Uzawa, Kunitaka Ozawa, Hirohisa Ohta, Noriyuki Nose
  • Patent number: 5936715
    Abstract: A method and apparatus for determining a condition of a fluid which circulates within a fluid circuit in which the optical characteristics of the fluid change dynamically due to the presence of physical contaminates in the fluid. An optical source is provided for generating light, and an optical detector is provided for receiving the light from the optical source. The fluid is positioned between the optical source and the optical detector. A signal analyzer is coupled to the optical detector. The signal analyzer monitors an output of the optical detector and determines the condition of the fluid in accordance with the output of the optical detector. Such fluid circuits are used in liquid type electrical transformers used for power distribution in the electrical power industry.
    Type: Grant
    Filed: January 29, 1997
    Date of Patent: August 10, 1999
    Assignee: Art Group, Inc.
    Inventors: Vincent F. Shapanus, Kevin J. Phipps, Tomislav Posavec
  • Patent number: 5920397
    Abstract: An adjustment device of the invention is used for an electronic part installation apparatus having a head portion for holding an electronic part and a moving device for moving the head portion from a supply section to an assembly section. The adjustment device is formed of a base member moving under the head portion, a detecting device for detecting the electronic part held by the head portion, and a control device electrically connected to the detecting device. The detecting device is fixed to the base member and moved under the electronic part while the electronic part is moving from the supply section to the assembly section. During the movement, the electronic part and a position of the electronic part relative to the head portion are recognized. The control device has a memory to which ideal data for the electronic part and the position of the electronic part relative to the head portion are inputted in advance.
    Type: Grant
    Filed: November 18, 1996
    Date of Patent: July 6, 1999
    Assignee: Tenryu Technics Co., Ltd.
    Inventor: Hiroshi Itoh
  • Patent number: 5912729
    Abstract: A method of measuring cell size of an open cell foam sample is provided including the step of providing an amount of a material suitable for obtaining foam sample impressions upon at least partial hardening in a vessel. A foam sample is placed on a surface of the material prior to hardening of the material. The foam sample is peeled away from the material after the material has begun to harden in order to provide a three-dimensional impression of at least a layer of the foam sample including a plurality of partial spherical impressions corresponding to cells of the foam sample. The cell size is measured by measuring a diameter of a plurality of the partial spherical impressions.
    Type: Grant
    Filed: June 17, 1996
    Date of Patent: June 15, 1999
    Assignee: BASF Corporation
    Inventors: Jerome S. Jourdan, Michael L. Iglehart, Kurt A. Reimann
  • Patent number: 5886783
    Abstract: An apparatus for isolating and sensing optical signals from a plurality of adjacent fiber optical strands. Ends of the adjacent optical fiber strands are aligned with a plurality of light reception areas on a pixel array. Each of the light reception areas is associated with one or more of the optical strands and is formed from one or more pixels from the pixel array. Adjacent light reception areas on the pixel array are separated by a pixel mask which is also formed from pixels on the pixel array. A signal processor is coupled to an output of the pixel array. The signal processor determines a total intensity value corresponding to each light reception area on the pixel array. In determining the total intensity value for a light reception area, the signal processor combines pixel intensity values only from unmasked pixels within the light reception area to determine the total intensity value for that light reception area.
    Type: Grant
    Filed: June 27, 1997
    Date of Patent: March 23, 1999
    Inventors: Vincent F. Shapanus, Kevin J. Phipps
  • Patent number: 5872632
    Abstract: A cluster tool layer thickness measurement apparatus is part of a reactor cluster that includes a plurality of substrate processing reactors arranged around a sealed chamber in which a robot is located. The cluster tool layer thickness measurement apparatus is also mounted on the sealed chamber. After a layer is deposited on a substrate in one of the reactors, the robot removes the substrate from the reaction chamber of the reactor and places the substrate directly in the cluster tool layer thickness measurement apparatus on a substrate support. A carriage assembly moves the substrate support and consequently the substrate under an optical thickness measurement assembly. Optical thickness measurement assembly generates a signal representative of the thickness of the layer at one point that is transmitted to a monitor computer. After the measurement is completed, the carriage assembly moves the substrate so that the thickness of a layer on the substrate is measured at each of a plurality of locations.
    Type: Grant
    Filed: February 2, 1996
    Date of Patent: February 16, 1999
    Assignee: Moore Epitaxial, Inc.
    Inventor: Gary M. Moore
  • Patent number: 5870185
    Abstract: A method and apparatus for fluid analysis includes a sensor for determining the index of refraction of a fluid. Advanced methods of fluid analysis relate index of refraction and other measured physical characteristics of the fluid.
    Type: Grant
    Filed: October 21, 1996
    Date of Patent: February 9, 1999
    Assignees: C.F.C. Technology, Inc., Univ. of Alabama at Huntsville
    Inventors: Harold J. See, Kenneth D. Turner, David B. Smith, Dan L. Cooper, Gary L. Workman, David B. Purves, G. Wayne Thompson, Robert A. Mattes, Darell E. Engelhaupt
  • Patent number: 5864398
    Abstract: The isotopic composition of a multiatomic isotope-bearing species such as CO.sub.2 in an analyte is measured by maintaining the analyte in a condition such that isotope-bearing species are present in an excited state and directing light at wavelengths corresponding to transition energies of isotope-bearing species with different isotopes. The interaction between the analyte and light at the different wavelengths is monitored, as by monitoring the optogalvanic effect caused by the light of the different wavelengths. The light may be supplied by a laser including the isotope-bearing species. A stable isotope such as .sup.13 C or .sup.18 O can be used as a tracer in a chemical or biological test and detected using the composition-determining method.
    Type: Grant
    Filed: June 6, 1995
    Date of Patent: January 26, 1999
    Assignee: Rutgers, The State University
    Inventor: Daniel E. Murnick
  • Patent number: 5841545
    Abstract: A fused fiberoptic probe having a protective cover, a fiberoptic probe system, and embodiments thereof for conducting electromagnetic spectral measurements are disclosed. The fused fiberoptic probe comprises a probe tip having a specific geometrical configuration, an exciting optical fiber and at least one collection optical fiber fused within a housing, preferrably silica, with a protective cover disposed over at least a portion of the probe tip. The specific geometrical configurations in which the probe tip can be shaped include a slanted probe tip with an angle greater than 0.degree., an inverted cone-shaped probe tip, and a lens head.
    Type: Grant
    Filed: September 15, 1995
    Date of Patent: November 24, 1998
    Assignee: Lockheed Martin Energy Systems, Inc.
    Inventor: Jack P. Young
  • Patent number: 5838430
    Abstract: A high precision alignment apparatus is provided that utilizes a semiconductor laser device, such as a laser diode, to provide a source laser beam. The alignment apparatus permits the division of a pair of beam components from the source laser beam useful for either linear or planar alignment. A centroid measurement between the beam components provides a corrected reference point that accounts for the inherent instability of the source laser beam to yield a high level of alignment accuracy. For linear alignment purposes, the beam components are collinearly directed. In the alternative, for planar alignment purposes, the beam components may be either collinear or directed in opposite directions, and rotated to sweep respective planar regions. The laser alignment apparatus is capable of providing a level of accuracy heretofore achievable only with gas lasers, while maintaining the economical attributes of commercial semiconductor laser diodes.
    Type: Grant
    Filed: July 3, 1996
    Date of Patent: November 17, 1998
    Assignee: Nearfield Systems Incorporated
    Inventors: Dan Slater, David M. Kramer
  • Patent number: 5828723
    Abstract: A non destructive method determines the three-dimensional structure of a body opaque to visible light, by means of radiations from a single body, particularly suitable for parts of a reinforced concrete structure, wherein the distance between the source and the sensitive plate is shorter than that of the prior art, and wherein the labor time at the body site is substantially less than that of the prior art.
    Type: Grant
    Filed: February 15, 1996
    Date of Patent: October 27, 1998
    Assignee: Tomografia De Hormigon Armado S.A.
    Inventor: Mario A. J. Mariscotti
  • Patent number: 5825485
    Abstract: A method and portable apparatus for self-powered, sensitive analysis of solid, liquid or gas samples for the presence of elements is provided. The apparatus includes a compact sensor system which utilizes a microwave power source and a shorted waveguide to induce a plasma. The microwave power source may be a magnetron or the like. The device includes a portable power supply and preferably includes a portable battery charger. The portable power supply includes a compact generator- internal combustion engine unit. The device can be operated by directly using power from the portable power supply or in a more compact embodiment by using power from batteries that are recharged by a separate portable power supply module. Pulsed microwave operation can be used to reduce average power requirements and facilitate the use of very compact units using batteries. The device is capable of being transported to and from remote sites for analysis by an individual without the need for heavy transportation equipment.
    Type: Grant
    Filed: November 3, 1995
    Date of Patent: October 20, 1998
    Inventors: Daniel R. Cohn, Paul Woskov, Charles H. Titus, Jeffrey E. Surma
  • Patent number: 5825484
    Abstract: The present invention has the object of preventing saturation of an optical detector by applying an inverted bias voltage so as to allow accurate measurement of optical spectra. In order to achieve this object, the present invention provides voltage applying means 8 controlled by a control section 6 for applying an inverted bias voltage to the optical detector 3 in order to prevent saturation of the optical detector 3.
    Type: Grant
    Filed: April 24, 1997
    Date of Patent: October 20, 1998
    Assignee: Ando Electric Co., Ltd.
    Inventor: Takashi Iwasaki
  • Patent number: 5825486
    Abstract: A spectrophotometer which is highly manufacturable at minimum cost nevertheless provides precision of measurement of spectra components of light which is projected therein by maintaining precise optical alignment of optical and electrical components thereof. These components are mounted in a module which is contained in a housing having an entrance aperture which defines an object area for light the spectrum of which is measured by a photodetector in the module at an image area. The module has a base plate provided by a printed circuit board on which a closed wall encompasses an area (a corral) on one side of the circuit board. The wall is a one piece structure which extends to the vicinity of the edge of the board. It is assembled with the board as a unitary structure so that the assembly is made torsionally rigid and resists bending in the plane of the board. The module may be of sufficiently small size so as to be located in a housing which is hand held, thereby providing a hand-held spectrophotometer.
    Type: Grant
    Filed: April 2, 1997
    Date of Patent: October 20, 1998
    Assignee: Lucid Technologies Inc.
    Inventors: James M. Zavislan, Jay M. Eastman, Robert J. Hutchison
  • Patent number: 5822071
    Abstract: A system for normalizing measurements obtained from spectrometers to correct for measurement biases in individual spectrometers. The normalization system is adapted for use in spectrometers having an optical assembly for obtaining characteristic data from a test sample. A normalization factor is obtained in each spectrometer by placing a holographic dispersion filter between the light source and detector in the position normally occupied by the test sample, the filter having been encoded with a symbol representing a nominal value of light expected to pass through the filter. The spectrometer determines the value of light passing through the filter and calculates a normalization factor based on the ratio between the nominal value of the filter and the actual value obtained by the spectrometer. The normalization factor is stored in system memory and the filter removed so that the spectrometer may thereafter be used to evaluate a plurality of test samples.
    Type: Grant
    Filed: March 27, 1997
    Date of Patent: October 13, 1998
    Assignee: Bayer Corporation
    Inventors: Andrew J. Dosmann, Christine D. Nelson
  • Patent number: 5822061
    Abstract: The spectrometry apparatus of the present invention includes, in addition to conventional analysis, a first diaphragm having a first chosen variable aperture for spatially filtering a coherent-excitation beam. The apparatus also includes a first deflector stage (DF1) for sweeping an excitation beam over a sample according to a first chosen deflection. Additionally, there is included a second diaphragm having a second variable aperture conjugate with the first aperture for filtering the incoherent-scattering beam. The spectrometry apparatus further provides a second deflector stage placed downstream in order to sweep the spectral image of the incoherent-scattering beam thus filtered over the multichannel detection module according to a second chosen deflection.
    Type: Grant
    Filed: November 8, 1996
    Date of Patent: October 13, 1998
    Assignee: Dilor
    Inventors: Michel Delhaye, Jacques Barbillat, Edouard Da Silva
  • Patent number: 5822072
    Abstract: A fused fiberoptic probe, a system, method and embodiments thereof for conducting spectral measurements are disclosed. The fused fiberoptic probe comprises a probe tip having a specific geometrical configuration, an exciting optical fiber and at least one collection optical fiber fused within a housing, preferrably silica. The specific geometrical configurations in which the probe tip can be shaped include a slanted probe tip with an angle greater than 0.degree., an inverted cone-shaped probe tip, and a lens head.
    Type: Grant
    Filed: January 31, 1997
    Date of Patent: October 13, 1998
    Assignee: Lockheed Martin Energy Systems, Inc.
    Inventors: Sheng Dai, Jack P. Young
  • Patent number: 5822059
    Abstract: The invention intends to provide an atomic absorption spectrophotometer which can establish a uniform heat distribution during heating of a sample and can improve analysis accuracy and analyzing efficiency. For this purpose, a graphite tube type cuvette mounted in a graphite atomizer furnace for an atomic absorption spectrophotometer comprises a large-diameter portion for retaining a sample in place, a small-diameter portion connected to the large-diameter portion and having a smaller diameter than the large-diameter portion, and a step portion for demarcating between the large-diameter portion and the small-diameter portion. The graphite tube type cuvette is formed such that its cross-sectional area in a plane perpendicular to the direction of passage of an electric current supplied to the cuvette is the same in any of the large-diameter portion, the small-diameter portion and the step portion. The amount of resistance heat is thereby also the same in any portions.
    Type: Grant
    Filed: April 16, 1996
    Date of Patent: October 13, 1998
    Assignee: Hitachi Ltd.
    Inventors: Hayato Tobe, Kazuo Moriya, Yoshisada Ebata, Yasushi Terui
  • Patent number: 5818580
    Abstract: Analytical apparatus and methods for processing multiple samples simultaneously. Radiation such as laser light desirably including plural wavelengths is directed through multiple samples simultaneously, as by directing a beam of radiation along a single path through all of the samples. Response to each wavelength is monitored by monitoring an induced effect, other than the intensity of the applied radiation itself. Useful signal-to-noise ratios are obtained with low absorption in each sample. One sample desirably is of known composition, and serves as an internal calibration standard.
    Type: Grant
    Filed: March 12, 1996
    Date of Patent: October 6, 1998
    Assignee: Rutgers, The State University
    Inventor: Daniel E. Murnick