Patents Examined by K. Hantis
  • Patent number: 5777734
    Abstract: The instant invention discloses method and apparatus for calibrating particulate emissions monitors, in particular, and sampling probes, in general, without removing the instrument from the system being monitored. A source of one or more specific metals in aerosol (either solid or liquid) or vapor form is housed in the instrument. The calibration operation is initiated by moving a focusing lens, used to focus a light beam onto an analysis location and collect the output light response, from an operating position to a calibration position such that the focal point of the focusing lens is now within a calibration stream issuing from a calibration source. The output light response from the calibration stream can be compared to that derived from an analysis location in the operating position to more accurately monitor emissions within the emissions flow stream.
    Type: Grant
    Filed: January 11, 1996
    Date of Patent: July 7, 1998
    Assignee: Sandia Corporation
    Inventors: William L. Flower, Ronald F. Renzi
  • Patent number: 5777728
    Abstract: A light meter comprising: a light sensitive charge storage array having at least one charge storage cell, and reading circuit means connected to said array for generating a light reading from charge stored in said array, said light reading being indicative of the quantity of light incident on said array; wherein said reading circuit means collects charge from said array and compares said collected charge to a threshold to generate said light reading.
    Type: Grant
    Filed: November 8, 1996
    Date of Patent: July 7, 1998
    Assignees: Sony Corporation, Sony United Kingdom Limited
    Inventor: Richard Friedrich Schiller
  • Patent number: 5777748
    Abstract: An arrangement is proposed for determining the density and concentration of visible constituents in fluids, particularly for measuring the turbidity of motor vehicle exhaust gases. A measuring chamber (10) which can receive the fluid to be measured is provided at two oppositely disposed points a first light detector (16) and a light source (15) which directs a light beam at the light detector (16). This arrangement allows the opacimetric measuring method in which the light attenuation is evaluated as a function of the turbidity. In addition, a second light detector (19) is arranged outside of and lateral to the radiation path through the measuring chamber (10) for capturing scattered light. This allows use of the scattered light method in which the scattered light portion is captured as a measure for the concentration of the light-scattering particles in the investigated medium. In an evaluation arrangement, the measuring signals (turbidity and scattered light) can be evaluated simultaneously or selectively.
    Type: Grant
    Filed: May 29, 1996
    Date of Patent: July 7, 1998
    Assignee: Robert Bosch GmbH
    Inventor: Karl Stengel
  • Patent number: 5774212
    Abstract: An inspection system for imaging and analyzing anisotropically reflecting surface flaws uses a side-looking borescope-type optical probe device for acquiring images of a region on the surface of an object and a computer for analyzing the images. The head of the probe includes a special integral lighting arrangement for illuminating the surface of the object in a manner that assures detection of anisotropically reflecting surface flaws. The borescope configuration of the optical probe along with its integral lighting and imaging arrangement allows it to be used in spatially confined environments where conventional methods and equipment for viewing anisotropically reflecting surface flaws would not be feasible. The special lighting arrangement employs multiple single light sources arranged in a circular array around a central image receiving device.
    Type: Grant
    Filed: March 19, 1997
    Date of Patent: June 30, 1998
    Assignee: General Electric Co.
    Inventor: Nelson Raymond Corby, Jr.
  • Patent number: 5774226
    Abstract: Method of scanning register marks produced in multicolor printing which includes generating signals by means of at least one photoelectric receiver from register marks which are applied, respectively, in one color, in a register mark track on a print carrier transportable past the receiver, the register marks differing sharply in contrast with the ink on the ink carrier, determining in a circuit arrangement amplitudes of the signals from the register marks, and bringing a filter arrangement into a radiation path between a light source and the receiver for contrast matching, further includes automatically bringing one defined color filter of the filter arrangement into the radiation path and, after scanning at least one group of register marks wherein all of the colors present in the print are contained, determining a scattering of intensity maxima of the signals generated from the register marks of the one group of register marks, the defined color filter automatically brought into the radiation path having a
    Type: Grant
    Filed: January 20, 1995
    Date of Patent: June 30, 1998
    Assignee: Heidelberger Druckmaschinen AG
    Inventor: Tobias Muller
  • Patent number: 5774225
    Abstract: A method for color measurement and control and a color measurement and control system for determining during printing, on-press, the color value of at least one location on a printed substrate. The color measurement and control system includes a camera for acquiring an image of an area of the printed substrate, a color measurement device for measuring a color value of a location of the printed substrate, the color measurement device and the camera are operating substantially simultaneously, and a processing unit for receiving the image captured by the camera and the color measurement and for providing a position of the location with respect to the image employing the image itself. The processing unit is also operative to provide a color value of a desired position, the desired position is selected from the determined position and a position other than the determined position.
    Type: Grant
    Filed: March 27, 1996
    Date of Patent: June 30, 1998
    Assignee: Advanced Vision Technology, Ltd.
    Inventors: Michael D. Goldstein, Noam Noy, Roy Tenny
  • Patent number: 5767973
    Abstract: A process for accurately and automatically measuring the properties of wheelset profiles while the wheelsets are in normal operation. In the first step of the process, the wheelset is rotated at a speed of at least 400 revolutions per minute while moved at a speed of at least 45 miles per hour, and a laser detection system is used to measure the profile of both wheels of the wheelset. In the second step of the process, the wheelset is rotated at a speed of less than 75 revolutions per minute while moved at a speed of less 6 miles per hour while its wheel profile properties are evaluated by a laser detection system.
    Type: Grant
    Filed: February 7, 1996
    Date of Patent: June 16, 1998
    Assignee: Simmons Machine Tool Corporation
    Inventor: Hans J. Naumann
  • Patent number: 5767974
    Abstract: An apparatus and method for inspecting photomask pattern defects, discriminating true defects from false ones, efficiently detects only the true defects. The apparatus includes a light source; an irradiation section for transmitting light from the light source to a photomask; a light detecting section for detecting the light passing through transparent parts of the photomask; an image processing section for acquiring image data of the pattern according to signals from the light detecting section; a first condition setting section for setting a coordinate threshold that defines a misregistration defect in the pattern; a second condition setting section for setting an area threshold that defines an area defect of the pattern; a testing section that determines whether the coordinates of a pattern feature and the area of the pattern satisfy the thresholds upon comparison to a second pattern; and an output section for outputting a signal indicating a defect only when at least one of the thresholds is exceeded.
    Type: Grant
    Filed: January 17, 1996
    Date of Patent: June 16, 1998
    Assignees: Mitsubishi Denki Kabushiki Kaisha, Ryoden Semiconductor System Engineering Corporation
    Inventors: Hisayoshi Higashiguchi, Kunihiro Hosono
  • Patent number: 5767966
    Abstract: Light source 1 emits light composed of various wavelength components from an emission end 1a. An optical fiber 2 receives the light from one end portion 2a and emits the light from the other end portion 2b. A Czerny-Turner dispersion spectroscope is formed by this end portion 2b, concave mirrors 3 and 5, a diffraction grating 4, and an emission slit 6. A mask 9 restricts the aperture diameter, so as to remove light which has spread wider than the aperture diameter of the mask 9 from the light which has passed through the emission slit 6.
    Type: Grant
    Filed: September 25, 1996
    Date of Patent: June 16, 1998
    Assignee: Ando Electric Co., Ltd.
    Inventor: Takashi Iwasaki
  • Patent number: 5764349
    Abstract: An apparatus for producing a pair of beams of light at a desired angle to each other. A light emitter and any associated optics generate a first beam of light which is directed to a remote target. The target reflects the light back, which is detected by a light detector. Separately, a second light emitter and any associated optics generates a second beam of light at an angle to the first plane of light. The second light emitter and optics is on a support structure which is moveable with respect to the first structure, and in one embodiment shares the same axis as the first support structure for holding the first light emitter and its optics. An angle measuring device indicates the angle of the second light beam with respect to the first light beam. The angle is maintained by adjusting the first support structure to maintain the reflection of the first beam to the detector.
    Type: Grant
    Filed: December 12, 1996
    Date of Patent: June 9, 1998
    Assignee: Laserline Manufacturing, Inc.
    Inventor: Robert W. Vanneman
  • Patent number: 5764366
    Abstract: A method and apparatus aligns device components based on an analysis of an image of features of the components to be aligned. The image is analyzed for deviation in component alignment, and a signal, based on the deviation, is sent to a positioning apparatus to adjust the position of the components relative to each other. The image of the components is advantageously a top view which permits measuring deviations in alignment of features on the top surfaces of components. The components are advantageously bonded together after alignment, and the alignment accuracy of the bonded components is checked.
    Type: Grant
    Filed: November 30, 1995
    Date of Patent: June 9, 1998
    Assignee: Lucent Technologies Inc.
    Inventors: Hung Ngoc Nguyen, Laurence Shrapnell Watkins
  • Patent number: 5760899
    Abstract: A high-sensitivity sensor configuration improves upon airborne hyperspectral and multispectral sensing, particularly for thermal/infrared military target detection and/or identification. The invention combines dispersive spectrometer and filtered TDI detector techniques to provide improved NESR through increased dwell time, along with interband temporal simultaneity and spatial registration. Embodiments relating to hyperspectral, multispectral, and dual-band arrangements are disclosed.
    Type: Grant
    Filed: September 4, 1996
    Date of Patent: June 2, 1998
    Assignee: ERIM International, Inc.
    Inventor: Michael T. Eismann
  • Patent number: 5757503
    Abstract: A method and apparatus measures a deviation in alignment between two components of a product wherein each component is characterized by a respective pattern and wherein each pattern comprises respective elements. The centroid of each element in each respective pattern is indicated, and based on the centroid indications, the center of each respective pattern is indicated. The deviation in alignment between the two components is determined as a function of the indicated position of the centers of the respective patterns, and positioning of the components is controlled as a function of the indicated position of the centers of the respective patterns.
    Type: Grant
    Filed: December 26, 1995
    Date of Patent: May 26, 1998
    Assignee: Lucent Technologies Inc.
    Inventors: Michael Francis Brady, Hung Ngoc Nguyen
  • Patent number: 5757507
    Abstract: A method of determining bias or overlay error in a substrate formed by a lithographic process uses a pair of straight vernier arrays of parallel elements, a staggered vernier array of parallel elements, and optionally at least one image shortening array on the substrate. The ends of the elements form the array edges. The vernier arrays are overlaid such that: i) the elements of the straight and staggered arrays are substantially parallel; ii) one of the edges of the staggered array intersects with one of the edges of one the straight arrays; and iii) the other of the edges of the staggered array intersects with one of the edges of the other of the straight arrays.
    Type: Grant
    Filed: November 20, 1995
    Date of Patent: May 26, 1998
    Assignee: International Business Machines Corporation
    Inventors: Christopher P. Ausschnitt, William A. Muth
  • Patent number: 5754290
    Abstract: A monolithic spectrometer is disclosed for use in spectroscopy. The spectrometer is a single body of translucent material with positioned surfaces for the transmission, reflection and spectral analysis of light rays.
    Type: Grant
    Filed: November 15, 1996
    Date of Patent: May 19, 1998
    Assignee: Lockheed Martin Energy Systems, Inc.
    Inventors: Slobodan Rajic, Charles M. Egert, William K. Kahl, William B. Snyder, Jr., Boyd M. Evans, III, Troy A. Marlar, Joseph P. Cunningham
  • Patent number: 5751415
    Abstract: Apparatus and methods for analyzing the chemical composition of fluid streams using Raman spectroscopy are disclosed. The invention is particularly useful in continuously analyzing a fluid stream containing petroleum products, aqueous or biological fluids. The apparatus includes a laser source for producing light having an excitation wavelength. The light is introduced into a bundle of optical fibers connected to a tubular Raman enhancement cell. A transparent optical element (lens and/or window) acts as a barrier element to isolate the flowing sample stream from the optical components. The Raman enhancement cell is configured to allow continuous sample fluid flow therethrough, and it is preferably lined with a material having an index of refraction less than the index of refraction of the fluid stream. Scattered light from the enhancement cell preferably exits the optical fibers as a linear optical signal.
    Type: Grant
    Filed: May 13, 1996
    Date of Patent: May 12, 1998
    Assignee: Process Instruments, Inc.
    Inventors: Lee M. Smith, Robert E. Benner, Douglas A. Christensen, Joel M. Harris, Carl W. Johnson, Richard D. Rallison
  • Patent number: 5751428
    Abstract: An exposure method for use with an exposure apparatus that includes a projection optical system for projecting a pattern of a first object onto a second object, a mark position detecting optical system having a detection zone at a predetermined position with respect to the projection optical system, for detecting a position of a mark of the second object, and a plurality of surface position detecting devices having different detection zones at different positions predetermined with respect to the projection optical system, for detecting a surface position of the second object. The mark is moved into the detection zone of the mark position detecting optical system, and the surface position of the second object is detected by using the surface position detecting devices. The surface position detecting devices respectively produce plural detection results.
    Type: Grant
    Filed: June 7, 1995
    Date of Patent: May 12, 1998
    Assignee: Canon Kabushiki Kaisha
    Inventors: Yoshiharu Kataoka, Haruna Kawashima, Yuichi Yamada
  • Patent number: 5751421
    Abstract: An apparatus and method for combining NIR spectography with a combine for measuring major constituents of harvested grain in real time includes a monochromator having no moving optical parts. The monochromator includes a fixed diffraction grating and a photodiode collector comprised of a plurality of photodiodes. A radiation source irradiates a grain sample while a bundle of fiber optic strands transmits the reflected radiation to the diffraction grating. By analyzing the intensities and wavelengths of the reflected radiation at the photodiode collector, the presence and amount of major constituents of the harvested grain can be determined. The present invention may be used on a research combine along with the conventional instrumentation which measures the weight, moisture, and volume of grain harvested in a test plot.
    Type: Grant
    Filed: February 27, 1997
    Date of Patent: May 12, 1998
    Assignee: Pioneer Hi-Bred International, Inc.
    Inventors: Steven L. Wright, C. Fred Hood
  • Patent number: 5751422
    Abstract: A resonant optical cavity having a laser medium therein is positioned within a specific environment, such as a process and/or harsh environment, and a sensing region, also within the resonant optical cavity, receives light whereby particles at the sensing region affect, as by scattering, light at the sensing region. The affected light is optically collected within the specific environment and optically coupled to a processor outside the specific environment where an output is provided that is indicative of particles detected at the sensing region, including small particles having a size at least as small as about 0.05 to 10 microns. With a solid state laser medium utilized within the resonant optical cavity, the solid state laser medium is pumped by an actuator, such as a semiconductor diode laser, providing a light output that is optically coupled to the solid state laser medium.
    Type: Grant
    Filed: February 26, 1996
    Date of Patent: May 12, 1998
    Assignee: Particle Measuring Systems, Inc.
    Inventor: John R. Mitchell
  • Patent number: 5748308
    Abstract: The present invention provides a programmable filter for use as a standard in correlation spectrometers. Also provided is the use of the programmable standard in a process for determining the concentration of an optically absorbing compound. Also provided is a method and apparatus for noninvasively determining the concentration of an optically absorbing biological sample which incorporates the programmable standard of the invention.
    Type: Grant
    Filed: February 2, 1996
    Date of Patent: May 5, 1998
    Assignee: Abbott Laboratories
    Inventors: John M. Lindberg, Robert Eric Heinz