Patents Examined by K. Hantis
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Patent number: 5657121Abstract: A spectrum measuring device for measuring optical spectrum of input light includes first and second double-image elements which separate input light to be measured into two polarized wave components having respective planes of polarization perpendicularly intersecting each other and having different optical axes, a third double-image element which separates the two polarized wave components from the first and second double-image elements into four polarized wave components each two of which having respective planes of polarization perpendicularly intersecting each other and having different optical axes, a dispersing element which is irradiated by the four polarized wave components from the third double-image element in which the dispersing element separates optical components of each wavelength contained in the four polarized wave components at the same angle of separation, and a photodetector for measuring an overall intensity of the four polarized wave components of the same wavelength separated by the disType: GrantFiled: October 16, 1995Date of Patent: August 12, 1997Assignee: Advantest CorporationInventor: Shigeki Nishina
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Patent number: 5654794Abstract: A portable flash tube intensity monitoring system which includes: an internal power supply; a human eye spectral response photodiode for producing analog signals, each of which is directly proportional to the intensity of each flash from the flash tube; electronics for converting each of the analog signals to a digital time function proportional to the intensity of the corresponding flash; electronics, including a microprocessor, for monitoring the digital time function, for flagging a time function which is below a preselected minimum, for communicating status signals to a localized operator display when the time function is below the preselected minimum, and for testing of an internal power source; a fixed distance indicator which allows accurate measurement from a remote coordinate location; and an operator display. The monitoring system is preferably integrally formed for ease of use and portability.Type: GrantFiled: January 13, 1995Date of Patent: August 5, 1997Assignee: Devore AviationInventors: Robert E. Rutter, Timothy Towne Hewit
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Patent number: 5648847Abstract: In an etch monitor system, a method and apparatus for adjusting the angle of incidence to normal between a laser beam and a reflective surface, such as a silicon wafer, includes a rotatable mirror having a pinhole formed therethrough, the rotatable mirror moveably mounted to be positioned in a first location within a light path and a second location out of said light path. When the rotatable mirror is located in the light path, the pinhole allows a beam of the laser beam to pass from a laser source to the reflective surface. If the beam is normal to the reflective surface, the beam is directed back toward the laser source through the pinhole. If the beam is not normal to the reflective surface, the beam is reflected by the rotatable mirror to a target, allowing observation on a lit spot of the target to enable normalization by making appropriate adjustments.Type: GrantFiled: March 7, 1995Date of Patent: July 15, 1997Assignee: Applied Materials, Inc.Inventor: Peter Ebbing
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Patent number: 5646736Abstract: An instrument kit includes a photometric instrument and a standardizing ampoule. The standardizing ampoule includes a machine readable code that is recognized by the instrument when the ampoule is inserted to initiate a standardizing routine. An analysis kit includes an optical filter assembly and a sample ampoule to be used with the instrument. The filter assembly also includes a machine readable code that is detected by the instrument when inserted to identify the particular test to be conducted by the instrument. The instrument automatically applies the relationship between detected light and concentration of a substance for the particular test and displays the sample concentration in numeric digital form. The instrument operates automatically, and there are no buttons or other external input devices.Type: GrantFiled: December 19, 1995Date of Patent: July 8, 1997Assignee: CHEMetrics, Inc.Inventors: Gordon A. Rampy, Rame Bull, Henry Castaneda, Teresa A. Neale, G. Neil Spokes, Edgar Watson, Jr.
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Patent number: 5646727Abstract: A peristaltic pump comprises a rotatable drum 2 having rollers 5 or cams 5' for squashing a flexible tube 9 against a profiled surface 10 of a presser plate 7. Tube 9 is mounted between supports 14 and 15 on presser plate 7 and is automatically movable between an inoperative and operative (pumping) position by pivotal movement of plate 7 about axis 8 produced by an electro mechanical actuator. A flexible membrane 33 is sandwiched between rollers 5 or cams 5' for eliminating shear forces on the tube 9. The construction of the pump and shape of profile 10 are such as to mimimise pulsations in the output flow. Systems for supplying a sample for analysis to spectroscopic apparatus using the peristaltic pump are also described.Type: GrantFiled: January 24, 1995Date of Patent: July 8, 1997Assignee: Varian Associates, Inc.Inventors: Michael Ron Hammer, Christopher John Park, Brian Lawrence Allen, Thomas Robert Turney
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Patent number: 5642190Abstract: A dual-axis plasma imaging system for use in spectroscopic analysis of material. The system includes a plasma torch having a tubular member with an upstream inlet end for receiving a flow of material to be analyzed and a downstream end for discharge of the material. An induction coil is provided for effecting plasma optical emission from the material, and a spectrometer for analyzing the emission. A first optical imaging device collects and focuses an axial emission component onto a primary aperture of the spectrometer. The first device is in a principal optical path between the tubular member and the spectrometer. A second optical imaging device in a secondary optical path collects and focuses a radial emission component onto the primary aperture of the spectrometer. The secondary path is angularly offset from the principal path. A folding mirror in the principal optical path, when in a stowed position, permits the first device to collect and focus the axial emission component onto the primary aperture.Type: GrantFiled: September 1, 1995Date of Patent: June 24, 1997Assignee: Thermo Jarrell Ash Corp.Inventors: Robert J. Krupa, Edward E. Owen
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Patent number: 5640240Abstract: A surface-measuring apparatus comprising a probe and means for moving the probe towards and away from a surface under examination and for monitoring such movement, the probe comprising a plurality of closely spaced light-collecting elements arranged in a light-collecting plane, lens means positioned to produce a sharply focussed image of said light collecting elements at an image plane movable relative to said surface by movement of the probe, illuminating means so arranged that the lens unit forms an illuminated spot image of it in the image plane in co-incidence with the image In the image plane of one of the light-collecting elements, and means for measuring the incidence of light on the said one of the light-collecting elements and on surrounding ones of those elements. In one embodiment (FIG.Type: GrantFiled: June 27, 1994Date of Patent: June 17, 1997Assignee: British Technology Group Ltd.Inventors: Clive Butler, Gregorios Gregoriou
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Patent number: 5638171Abstract: A spectrophotometer which accommodates a self-contained sample module. Sample modules are interchangeable and can be readily inserted into, or removed from, the spectrophotometer without tools. Guides in the spectrophotometer assure that the modules are properly aligned when inserted. The module houses the sample(s) to be tested. Sample cell holders may be removed from the module and replaced with other cell holders. When the module is inserted into the spectrophotometer, optical alignment, mechanical alignment, proper electrical connection and software interface are all achieved in one common installation procedure for all sample modules.Type: GrantFiled: March 3, 1995Date of Patent: June 10, 1997Inventors: Jordan S. Honig, Robert S. Blythe
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Patent number: 5636035Abstract: A method and apparatus for conducting laser absorption spectroscopy uses a frequency tunable laser aligned to pass a laser beam through a sample volume and to an optical detector. A two-step modulation is used to generate frequency components that may be used to both lock the tunable laser to the absorbance signal, and generate an output signal proportional to the absorbance signal. The method includes frequency modulating the tunable laser at a first frequency while further modulating the tunable laser with a triangular waveform having a second frequency, and generating a feedback control signal based upon an antisymmetrical signal demodulated from the optical detector using a first predetermined harmonic of the second frequency. The tunable laser is locked to the absorbance signal with the feedback control signal. An output signal proportional to the absorbance signal is generated using a symmetrical signal demodulated using a second predetermined harmonic of the second or triangular waveform frequency.Type: GrantFiled: June 7, 1995Date of Patent: June 3, 1997Assignee: The Trustees of the Stevens Institute of TechnologyInventors: Edward A. Whittaker, Hoi C. Sun
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Patent number: 5633719Abstract: A lenticular print (13) having image bundles (19), and method and apparatus for aligning and centering image bundles (19) in the print (13) under lenticules in a lenticular overlay (11). On the print are provided one or more two-dimensional fiducial indicia (17) containing one or more angular or linear alignment elements (18, 29, 45) disposed at about two lenticules widths apart.Type: GrantFiled: October 28, 1994Date of Patent: May 27, 1997Assignee: Eastman Kodak CompanyInventors: Martin E. Oehlbeck, Stephen J. Hassall
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Patent number: 5633722Abstract: A system for monitoring and controlling the color and shade in a decolorization or fading process for textiles. The system contains a visible light source which illuminates a sample of a dyed textile. A scanner reads the illuminated sample and provides an optical image which is sensed by optical transducers which transforms it into an representative electronic signal which is analyzed for a chroma signal component (image color content) and/or luminance component (image shade/gray scale content). A process control computer monitors and adjusts the process speed and at predetermined color and shade finish stops the decolorization process based on the measured and processed image contents which is tracked by a calibrated and sensed optical image represented by processed electronic signals.Type: GrantFiled: June 8, 1995Date of Patent: May 27, 1997Inventors: Eric M. Wasinger, Otto Fanini
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Patent number: 5633721Abstract: A surface position detection apparatus for detecting a surface position on a surface to be detected, comprises a projection pattern formed on a first surface, a projection optical system for projecting the pattern from an oblique direction onto the surface to be detected, a condensing optical system for condensing a light beam reflected by the surface to be detected, and forming an image of the pattern on a second surface, and a detector for photoelectrically detecting the image of the pattern. The first surface and the surface to be detected are arranged to satisfy a Scheimpflug condition in association with a principal plane of the projection optical system. The surface to be detected and the second surface are arranged to satisfy a Scheimpflug condition in association with a principal plane of the condensing optical system.Type: GrantFiled: May 6, 1996Date of Patent: May 27, 1997Assignee: Nikon CorporationInventor: Hideo Mizutani
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Patent number: 5633711Abstract: Samples such as thin polymeric films are analyzed using optically induced phonons by excitation of the sample using radiation preferably absorbed by the sample and probe radiation, preferably not absorbed by the sample, that is diffracted from the surface of the sample. The pulse width of the probe is preferably on the order of the detectable diffraction signal so that the phonon decay from each excitation pulse can be detected and analyzed. The technique is applicable to various samples by inducing a ripple morphology on the sample surface and detection of light diffracted substantially from surface ripple.Type: GrantFiled: December 5, 1994Date of Patent: May 27, 1997Assignee: Massachusettes Institute of TechnologyInventors: Keith A. Nelson, Anil R. Duggal, John A. Rogers
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Patent number: 5631734Abstract: Fluorescently marked targets bind to a substrate 230 synthesized with polymer sequences at known locations. The targets are detected by exposing selected regions of the substrate 230 to light from a light source 100 and detecting the photons from the light fluoresced therefrom, and repeating the steps of exposure and detection until the substrate 230 is completely examined. The resulting data can be used to determine binding affinity of the targets to specific polymer sequences.Type: GrantFiled: February 10, 1994Date of Patent: May 20, 1997Assignee: Affymetrix, Inc.Inventors: David Stern, Peter Fiekowsky
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Patent number: 5627640Abstract: The present invention relates to a method for measuring radical species distribution in plasma by determining the intensity of the light emitted from the radical species and plasma parameters in plasma with the aid of optical and electrostatic probes, and an apparatus for measuring the radical species distribution. The method of the invention comprises the steps of: (i) measuring integral light intensity in a vacuum container by an optical probe inserted to the vacuum container; (ii) determining light intensity at each point of the vacuum container by differentiating the integral light intensity; (iii) measuring current and voltage applied to the electrostatic probe in the vacuum container; (iv) determining plasma parameters from the measured current and voltage; and, (v) measuring distribution of radical species from the light intensity and plasma parameters.Type: GrantFiled: January 18, 1996Date of Patent: May 6, 1997Assignee: Korea Advanced Institute of Science and TechnologyInventors: Hong-Young Chang, Pyung-Woo Lee, Yong-Jin Kim
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Patent number: 5627639Abstract: An imaging spectrometer that includes a mask (214) that has an array of n rows (302) and n columns (304) of transmissive elements (306) for transmitting the light from a plurality of locations of an image and of opaque elements (308) for blocking light from a plurality of locations of the image. The transmissive and opaque elements are arranged in a Hadamard pattern having rows (and columns) that are different cyclic iterations of an m-sequence. A grating (110) disperses the transmitted light from the transmissive elements (306) in a linear spatial relationship in a predetermined relationship to the wavelength of the transmitted light. A detector array (406) has a plurality of detector elements (408) arranged in a row to receive the dispersed transmitted light from the grating (110). Each detector element (408) provides an intensity signal indicative of the intensity of the light impinging thereon.Type: GrantFiled: June 6, 1995Date of Patent: May 6, 1997Assignee: Lockheed Missiles & Space Company, Inc.Inventors: Stephen B. Mende, Edward S. Claflin
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Patent number: 5625456Abstract: A method is disclosed for identifying an object. The method includes the steps of (a) providing individual ones of objects within a predetermined class of objects with a gain medium comprised of an electromagnetic radiation emitting and amplifying first phase and an electromagnetic radiation scattering second phase, the gain medium being responsive to electromagnetic radiation having a first wavelength for emitting electromagnetic radiation with wavelengths within a predetermined band of wavelengths; (b) irradiating the objects with the first wavelength; (c) detecting an emission from the irradiated objects, the emission including one or more second wavelengths that are within the predetermined band of wavelengths; and (d) identifying an object as belonging to a predetermined class of objects from the detected emission. Also disclosed is a method for detecting the presence of a structure within an object, which also employs the gain medium and the step of irradiating.Type: GrantFiled: March 9, 1995Date of Patent: April 29, 1997Assignee: Brown University Research FoundationInventor: Nabil M. Lawandy
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Patent number: 5623341Abstract: A method for monitoring a surface is provided. Nonlinear second order surface spectroscopy is used to monitor the condition of a surface. Conditions such as corrosion, contamination and deposition may be monitored. According to the present invention, electromagnetic radiation is directed towards the surface and the second harmonic or other second order frequency responses are monitored to detect the state of the surface. Preferably, a laser, input optics and output optics are utilized to create the second order frequency response that is detected.Type: GrantFiled: February 22, 1994Date of Patent: April 22, 1997Assignee: Rockwell International CorporationInventor: Jeffrey H. Hunt
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Patent number: 5621531Abstract: A method and apparatus for aligning individual sections of pipe includes directing a beam of collimated light in the general direction of the pipeline and scanning the beam laterally. A target, having a retro reflective portion, is positioned in a location that will be traversed by the scanning beam. A reflection of the beam produced by the reflective portion is received and processed. The scanning is discontinued when the reflective portion is located and the beam is aimed in a direction related to the position of the retro reflective target.Type: GrantFiled: April 3, 1995Date of Patent: April 15, 1997Assignee: Laser Alignment, Inc.Inventors: Richard J. Van Andel, Gary L. Utter, Gregory J. Nagel
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Patent number: 5621520Abstract: A method of determining the optical quality of blurriness in a windscreen transparency having a protective liner made of a particular material. A modulation transfer function (MTF) is measured through a clear transparency having a protective liner made of a particular material, resulting in measurements which are stored as a first data series. An MTF is measured through a degraded sample transparency having a protective liner made of the same particular material, resulting in measurements stored as a second data series. The first and second data series are combined to create a standard range template, which is stored in a data base record. An MTF is measured through an aircraft windscreen (a specimen transparency) having a protective liner made of the same particular material resulting in test measurements which are stored as a test data series.Type: GrantFiled: May 13, 1996Date of Patent: April 15, 1997Assignee: Northrop Grumman CorporationInventor: Joseph B. Hoffman