Abstract: A semiconductor wafer includes a first surface and an implantation area adjacent to the first surface and a certain distance away from the first surface, the implantation area including implanted particles and defects. A defect concentration in the implantation area deviates by less than 5% from a maximum defect concentration in the implantation area.

Abstract: An optical tweezer phonon laser system and method for modulating mechanical vibrations of an optically levitated mechanical oscillator to produce coherence is disclosed. A feedback loop is configured to simultaneously supply an electro-optic modulator with an amplification signal and a cooling signal representing an amplification force linear in the mechanical oscillator momentum and a cooling force nonlinear in the mechanical oscillator variable position and linear in the momentum, respectively controlling the intensity of a trap beam levitating the mechanical oscillator.

Abstract: The present disclosure relates to methods of verifying enhanced rock weathering using immobile trace elements found within a mineral amendment. Further disclosed are mineral amendments that enable enhanced rock weathering.

Abstract: The present invention discloses an ionization apparatus 10 for ionizing an analyte S, comprising an inlet E, an outlet A, a first electrode 1, a second electrode 2 and a dielectric element 3. The first electrode 1, the second electrode 2 and the dielectric element 3 are arranged relative to one another such that, by applying an electric voltage between the first electrode 1 and the second electrode 2, a dielectric barrier discharge is establishable in a discharge area 5 in the ionization apparatus 10. The first and second electrodes 1, 2 are arranged such that they are displaceable or movable relative to each other.

Abstract: A mass spectrometer (1) includes: an ionization section (201) configured to generate ions from a sample; a mass separation section (231, 235) configured to separate ions generated by the ionization section according to mass-to-charge ratio; an ion detector (237) configured to detect an ion separated by the mass separation section; an ion capture section (31) configured to capture ions separated by the mass separation section; and an electron beam detection section (32) configured to detect an electron beam diffracted by ions captured within the ion capture section (31). This mass spectrometer is capable of performing, in a single measurement operation, both a mass spectrometric analysis and an electron-beam diffraction measurement for distinguishing between isomers. The electron-beam diffraction measurement can be more efficiently performed than in a conventional device of this type.

Abstract: The invention relates to a method for generating a layout of electrodes for an ion guide for transporting ions along an ion path, the ion guide comprising electrodes arranged in the layout of electrodes along the ion path for transporting the ions along the ion path. For generating the layout of electrodes, a layout path corresponding to said the path is assumed and the layout of electrodes is generated along the layout path. The layout of electrodes and the layout path are in reference to a global reference system, wherein the layout of electrodes includes at least two layout subunits which are arranged in succession along the layout path, wherein each one of the at least two layout subunits is of one of at least one layout subunit type. The method includes defining the at least one layout subunit type, wherein each one of the at least one layout subunit type includes type information, the type information being adopted by each layout subunit of the respective one of the at least one layout subunit type.

Abstract: An ion guide includes a plurality of curved electrodes arranged along a curved central axis. The plurality of electrodes define a curved ion guide region, with the curved ion guide region beginning at an ion entrance and ending at an ion exit. The ion guide includes an ion deflecting device configured to apply a radial DC electric field across the ion guide region and along the curved central axis. The ion guide region has a radius of curvature that varies along the curved central axis, and the radius of curvature is at a maximum at the ion entrance and decreases along the curved central axis toward the ion exit.

Abstract: An ultraviolet light generation target includes a light emitting layer. The light emitting layer contains a YPO4 crystal to which at least scandium (Sc) is added, and receives an electron beam to generate ultraviolet light. Further, a method of manufacturing the ultraviolet light generation target includes a first step of preparing a mixture containing yttrium (Y) oxide, Sc oxide, phosphoric acid, and a liquid, a second step of evaporating the liquid, and a third step of firing the mixture.

Abstract: A super-resolution system for nano-patterning is disclosed, comprising an exposure head that enables a super-resolution patterning exposures. The super-resolution exposures are carried out using electromagnetic radiation and plasmonic structure, and in some embodiments, plasmonic structures having specially designed super-resolution apertures, of which the “bow-tie” and “C-aperture” are examples. These apertures create small but bright images in the near-field transmission pattern. A writing head comprising one or more of these apertures is held in close proximity to a medium for patterning. In some embodiments, a data processing system is provided to re-interpret the data to be patterned into a set of modulation signals used to drive the multiple individual channels and multiple exposures, and a detection means is provided to verify the data as written.

Abstract: Apparatus and method are proposed for the strong improvement of dynamic range (DR) of detectors and of data systems for time-of-flight mass spectrometers (TOF MS) with periodically repetitive signals. TOF separated ions are converted into secondary particles, primarily electrons, and the flow of secondary particles is controllably attenuated to sustain the data acquisition system in a counting mode above the electronic noise threshold. The acquisition time is split between at least two time segments, characterized by alternated transmission efficiency SE of secondary particles. Using strong electron suppression (SE«1) is employed for recording intense ion peak, while counting ions with either ADC, or TDC, or ADC with extracting peak centroids. A longer time segment employs an efficient electron transfer (SE=1) for detecting weak ion species.

Abstract: An apparatus for ion manipulation having improved duty cycle includes first and second separation regions separated by a switch that alternates between guiding ions to each of the separation regions. The separation regions separate the ions based on mobility over respective time periods that at least partially overlap. The apparatus can additionally or alternatively include a pre-separation region that filters ions prior to accumulating ions, thus allowing an accumulation region to accumulate for a longer time period. The apparatus can additionally or alternatively include a plurality of gates along the separation region(s) to simultaneously filter a plurality of ion packets sequentially released into the separation region(s).

Abstract: An device for measuring electron beam comprises a Faraday cup comprising an opening; a porous carbon material layer located on a surface of the Faraday cup and suspended at the opening; and an electricity meter electrically connected to the porous carbon material layer. A length of a suspended portion of the porous carbon material layer is greater than or equal to a maximum diameter of an electron beam to be measured. A diameter or a width of the porous carbon material layer is smaller than a minimum diameter of a cross section of the electron beam to be measured. The porous carbon material layer comprises a plurality of carbon material particles, and a plurality of micro gaps exist between the plurality of carbon material particles. A method for measuring an electron beam using the device for measuring electron beam is also provided.

Abstract: The improved mobile robot utilizes a cooperative wheeled support arrangement having a unique axle design that preferably cooperates with a base support module. A tri-axle is preferably used to support at least one omni-wheel on each axle section. Multiple omni-wheels on each section can be used for higher load applications. The tri-axle is of a fixed design and each wheel pivots on the individual axle section. Preferably, the axle sections are welded to each other.

Abstract: A time-of-flight mass spectrometer assembly includes a flange with a vacuum chamber facing surface and an environment facing surface. The flange defines an opening that extends between the vacuum chamber facing surface and the environment facing surface. A plurality of stacked components are supported by the vacuum chamber facing surface of the flange. A secondary flange is removably secured within the opening of the flange. The secondary flange includes a vacuum chamber facing surface and an environment facing surface. A supported spectrometer component is supported by the vacuum chamber facing surface of the secondary flange such that removal of the secondary flange from the flange acts to remove the supported component from the plurality of stacked components supported by the vacuum chamber facing surface of the flange.

Abstract: An apparatus for detecting a substance comprising a direct analysis in real time apparatus; a neutral excluder; a mass spectrometer; and a vessel in. The apparatus may also comprise a separator, a gas, an alcohol, a filter, and a pump. The apparatus may also comprise electrodes in communication with the direct analysis in real time apparatus and the neutral excluder. A method for detecting a substance comprising contacting the substance with a direct analysis in real time apparatus ion stream; forming an ion and a neutral particle; flowing the ion and the neutral particle into a neutral excluder; contacting the ion and the neutral particle with a gas; and flowing the ion into a mass spectrometer.

Abstract: An electrode assembly, such as for an ion mirror, comprising: a first layer having a plurality of electrodes that are separated by one or more gaps; a second layer arranged to cover said one or more gaps and prevent electric fields passing through said one or more gaps, said second layer having electrically conductive material located to be coincident with said one or more gaps in the first layer.

Abstract: A drive unit for driving an acceleration electrode of a mass spectrometer is disclosed. The drive unit includes a power converter comprising a switching element and pulsing circuitry that can form output pulses suitable for driving an acceleration electrode of a mass spectrometer. The drive unit also includes a controller that is configured to synchronise operation of the switching element with the pulsing circuitry.

Abstract: The present disclosure discloses a vortex-pair beam based optical tweezer system, including a laser device (1), a collimating beam expanding system, a spatial light modulator (6), a confocal beam shrinking system, a sample table (12), and an observation unit arranged according to a light path. The spatial light modulator (6) continuously loads different vortex-pair beam phase diagrams in real time, and manipulates and rotates a particle in real time by using a single vortex-pair beam. The optical tweezer system can realize precise regulation, control, and positioning of two spherical particles at any positions in a plane, and any controllable rotation operation of a rod-shaped particle in the plane, which makes application objects of the optical tweezer system richer, and effectively solves the problem that the rod-shaped particle is difficult to be controlled by the existing optical tweezer system.

Abstract: An ion detector comprises a surface configured to receive one or more ions and a detector configured to detect one or more ions by detecting electromagnetic radiation scattered by one or more ions at the surface.

Abstract: A method of doping a wafer includes implanting ions into a wafer by irradiating the wafer with an ion beam using an implantation device. The implantation device includes a filter frame and a filter held by the filter frame, wherein the filter is irradiated by the ion beam passing through the filter to the wafer, and the filter is arranged such that protruding microstructures of the filter face away from the wafer and towards the ion beam.