Patents Examined by Lee E Rodak
  • Patent number: 12235312
    Abstract: A method is provided for checking the plausibility of insulation monitoring of a high-voltage system (100) of an electric vehicle during the charging of a traction battery of the electric vehicle. The electrical insulation of the high-voltage system (100) is monitored by an insulation monitoring device (101), and a check is carried out cyclically to determine whether a further insulation monitoring device is active on a high-voltage bus of the high-voltage system (100).
    Type: Grant
    Filed: September 13, 2022
    Date of Patent: February 25, 2025
    Assignee: Dr. Ing. h. c. F. Porsche AG
    Inventors: Moritz Eitler, Oliver Lehmann
  • Patent number: 12237792
    Abstract: Provided is a method for determination of a location of a short circuit fault in a generator arrangement, wherein the generator arrangement includes an electrical machine and at least one channel, wherein the or each channel includes a breaker, a converter unit and a set of stator windings of the electrical machine connected to the converter unit via the breaker, wherein upon an occurrence of a short circuit in a channel, the connection between the set of stator windings and the converter unit is interrupted by opening the breaker, wherein depending on at least one measured signal of a measurand, wherein the measured signal is measured by at least one sensor of the electric machine and wherein the measurand describes a torque ripple of the electrical machine, either the electrical machine or the converter unit of the channel is determined as location of the short circuit fault.
    Type: Grant
    Filed: December 20, 2019
    Date of Patent: February 25, 2025
    Assignee: Siemens Gamesa Renewable Energy A/S
    Inventors: Nuno Miguel Amaral Freire, Rahul R Pillai, Zhan-Yuan Wu
  • Patent number: 12228604
    Abstract: A method for monitoring an ideal diode comprises controlling a source-gate voltage of a MOSFET of the ideal diode such that the ideal diode can be changed between an off and an on state with a first target value for a source-drain voltage. To detect error states, the source-drain voltage and the source-gate voltage are measured. A check is carried out to determine whether the source-drain voltage reaches the first target value within predefined error limits in the on state. A test mode is carried out, in which a second target value, smaller than the first target value, is set for the source-drain voltage. A check is carried out to determine whether the source-gate voltage reaches an upper threshold value when the test mode is being carried out. An error signal is output when the first target value and/or the upper threshold value is/are not reached.
    Type: Grant
    Filed: June 2, 2021
    Date of Patent: February 18, 2025
    Assignee: Continental Automotive Technologies GmbH
    Inventors: Sebastien Bernard, Timo Dietz
  • Patent number: 12228588
    Abstract: A device, system, and method are provided for providing vibration data for rotating machinery. A sensor device is provided as a one-piece unit that is mechanically mounted to a pump. The sensor includes a vibration sensor, a processor, a wireless communications interface for exchanging data with a user device, and an internal battery. The processor is configured to receive a measurement request from the user device via the wireless communications interface. In response, the processor is further configured to configure the vibration sensor, receive data samples for multiple axes from the vibration sensor, and calculate a component velocity root mean square (vRMS) value, from the data samples, for each of the multiple axes. The processor may combine the component vRMS values into a sample vRMS value, and send a final vRMS value, based on the sample vRMS value, to the user device via the wireless communication interface.
    Type: Grant
    Filed: February 16, 2022
    Date of Patent: February 18, 2025
    Assignee: CORNELL PUMP COMPANY LLC
    Inventors: Aaron Arthur Weiss, Jonathan Cedarleaf
  • Patent number: 12228619
    Abstract: A circuit for through silicon via (TSV) detection includes a TSV to be tested, an equivalent adjustable resistor and a reverse output circuit. A first terminal of the TSV to be tested is connected to a second terminal of the equivalent adjustable resistor, and a second terminal of the TSV to be tested is grounded. An input terminal of the reverse output circuit is connected to the first terminal of the TSV to be tested. The method includes: adjusting a resistance value of the equivalent adjustable resistor to a preset first resistance value, and keeping a voltage of a first terminal of the equivalent adjustable resistor at a preset voltage value, the first resistance value is a maximum resistance value of an equivalent resistor corresponding to the TSV to be tested when the TSV to be tested is normal.
    Type: Grant
    Filed: August 31, 2022
    Date of Patent: February 18, 2025
    Assignee: CHANGXIN MEMORY TECHNOLOGIES, INV
    Inventors: Weijie Cheng, Onegyun Na
  • Patent number: 12222371
    Abstract: The present disclosure is a system and method for measuring AC residual current and DC residual current using a singular type-B residual current monitoring device. The system includes a sensor comprising two or more cores that measure residual AC current and residual DC current from two or more current carrying conductors through the cores that carry AC current and DC current. The system includes a controller that sends both an AC excitation current to the cores, as well as a DC nulling current that cancels out the DC residual current, allowing the system to then accurately measure the AC residual current. The system also includes a self-test feature that injects known quantities of both AC current and DC current through the sensor to determine if the sensor is functioning properly.
    Type: Grant
    Filed: December 12, 2022
    Date of Patent: February 11, 2025
    Assignee: Vertiv Corporation
    Inventors: Kevin R. Ferguson, Jason Armstrong
  • Patent number: 12216178
    Abstract: A fail-safe operating method for a decentralized power generation plant DG includes determining a leakage capacitance of a generator of the DG before connecting the DG. The method also includes comparing the determined leakage capacitance with a predetermined first limit value, and connecting the DG to a grid only if the determined leakage capacitance is smaller than the predetermined first limit value. A decentralized power generation plant is configured to perform the method.
    Type: Grant
    Filed: June 13, 2022
    Date of Patent: February 4, 2025
    Assignee: SMA Solar Technology AG
    Inventors: Michael Viotto, Martin Putz, Christian Tschendel
  • Patent number: 12217640
    Abstract: A display panel includes a plurality of first pixels on a first region, a plurality of second pixels on a second region, and a test circuit. The second region has a transmittance less than a transmittance of the first region. The test circuit provides one or more test voltages to the first pixels and the second pixels. The test circuit includes a first test circuit and a second test circuit. The first test circuit provides the first pixels with a first voltage, and the second test circuit provides the second pixels with a second voltage different from the first voltage.
    Type: Grant
    Filed: January 26, 2022
    Date of Patent: February 4, 2025
    Assignee: SAMSUNG DISPLAY CO., LTD.
    Inventors: Jinsung An, Sungho Kim, Seokje Seong, Minwoo Woo, Seunghyun Lee, Wangwoo Lee, Jiseon Lee
  • Patent number: 12210046
    Abstract: The invention relates to a circuit assembly (10) for fault detection in an ungrounded high-voltage system (20) having a connected inverter (4) and having at least one resistor (5) between a high-voltage potential (7a, 7b) of the high-voltage system (20) and a reference potential (8), the circuit assembly (10) comprising: a sensing circuit (1), which is designed to tap a voltage from the resistor (5), to generate a first measurement value therefrom and to provide the first measurement value at an output (1c, 1d); and an evaluation device (2), which is connected to the output (1c, 1d) of the sensing circuit (1), the evaluation device (2) being designed to compare the first measurement value with a first limit value and to output a first signal if the first measurement value exceeds the first limit value.
    Type: Grant
    Filed: December 6, 2019
    Date of Patent: January 28, 2025
    Assignee: Robert Bosch GmbH
    Inventor: Martin Trunk
  • Patent number: 12209936
    Abstract: Interstory drift measurement systems and methods of using the same can include a laser beam source configured to emit a beam having at least a first width in a first direction and a sensor system comprising a plurality of diodes spaced apart from one another in the first direction. The plurality of diodes can include a first diode and a diode spacing width in the first direction as measured between a centerline of the first diode and a centerline of an adjacent diode of the plurality of diodes in the first direction. The beam width in the first direction is at least two times the diode spacing width.
    Type: Grant
    Filed: January 14, 2021
    Date of Patent: January 28, 2025
    Assignees: Nevada Research & Innovation Corporation, The Regents of the University of California
    Inventors: David B. McCallen, Patrick Laplace, Floriana Petrone
  • Patent number: 12204000
    Abstract: A precision magnetometer for detecting magnetic fields parallel to a static field B0 in which the magnetometer itself is immersed; this magnetometer is operative in the frequency range of the field b1 ranging from 10 MHz to 1 GHz. Another object is a technique for using the presented magnetometer.
    Type: Grant
    Filed: May 21, 2021
    Date of Patent: January 21, 2025
    Assignee: ISTITUTO NAZIONALE DI FISICA NUCLEARE (I.N.F.N.)
    Inventor: Nicolo′ Crescini
  • Patent number: 12196784
    Abstract: A method and system for determining the state of one or both of an electrical conductor or an associated system utilizing a non-invasive sensor and a magnetostrictive response from the current of the electrical conductor. The method includes providing a sensor assembly including a magnetostrictive resonator sensor and a signal detector. A state of one or both of the electrical conductor or the associated system is determined with the fault detector in response to a first frequency profile and a second frequency profile obtained with the magnetostrictive resonator sensor. A fault monitoring system utilizing a magnetostrictive resonator sensor is also disclosed.
    Type: Grant
    Filed: January 18, 2022
    Date of Patent: January 14, 2025
    Assignee: National Technology & Engineering Solutions of Sandia, LLC
    Inventors: Sigifredo Gonzalez, Jack David Flicker, Todd Monson, Eric Langlois, Nicholas Sonny Gurule, Olga Lavrova
  • Patent number: 12196614
    Abstract: Disclosed are methods and devices for calibration in the field of optical sensors, e.g. characterizing and calibrating an optical sensor chip. In order to address complexity of sensor data with high accuracy the optical sensor, e.g. an optical sensor is not provided as an already calibrated unit. Rather, sensor response data may be recorded in a defined or standardized environment, e.g. at a production line, and with high precision. This high standard sensor response data can be obtained on a per device basis and, thus, is referenced with an unambiguous chip identification number, chip ID. The sensor data is complemented with a dedicated calibration algorithm which can be tailor-made to fit the optical sensor or the optical sensor chip. In order to retrieve the sensor response data and the calibration algorithm both can be made available by means of the chip ID, for example.
    Type: Grant
    Filed: October 30, 2019
    Date of Patent: January 14, 2025
    Assignee: AMS SENSORS GERMANY GMBH
    Inventors: Gunter Siess, Julius Komma, Thomas Höppler, Thomas Nimz, Mahmoud Jazayerifar
  • Patent number: 12196798
    Abstract: A monitoring circuit (2) for an interlock system (1), said interlock system comprising a first monitoring line (3), a second monitoring line (4), and at least one line bridge (5), by means of which the monitoring lines (3, 4) are electrically conductively connected in a closed state of the interlock system (1), said monitoring circuit comprising a signal generation device (11) which is configured for generating a monitoring signal for the first monitoring line (3) which alternates between a first monitoring voltage and a second monitoring voltage and which is referenced to a reference potential, and a signal evaluation device (17) by means of which a voltage profile (43, 48 to 51) which is referenced to the reference potential is detectable on the second monitoring line (4), wherein the signal evaluation device (17) is configured for determining a fault on one of the monitoring lines (3, 4) which is caused by a fault voltage referenced to the reference potential, and/or a fault in the monitoring circuit (2) b
    Type: Grant
    Filed: November 22, 2019
    Date of Patent: January 14, 2025
    Assignee: Valeo Siemens eAutomotive Germany GmbH
    Inventor: Rainer Edelhauser
  • Patent number: 12196700
    Abstract: A measuring method according to an exemplary embodiment includes acquiring a temperature by a temperature sensor at a first time, and acquiring a first parameter that sets an admittance of a phase adjustment circuit. The measuring method includes acquiring a second parameter corresponding to the temperature acquired at the first time. The second parameter is generated based on a second parameter group that is pre-stored. The measuring method includes acquiring a correction parameter group by correcting a second parameter group to correspond to the first parameter based on the first parameter and the second parameter.
    Type: Grant
    Filed: February 16, 2023
    Date of Patent: January 14, 2025
    Assignee: Tokyo Electron Limited
    Inventor: Takayuki Hatanaka
  • Patent number: 12196794
    Abstract: A measuring device includes a first measuring port connected to an optical interface which can be connected to an optical input or output of a device under test (DUT). The device includes a second measuring port which can be connected to a radio frequency (RF) input or output of the DUT. The optical interface is connected to the optical input of the DUT and the second measuring port is connected to the RF output of the DUT. The first measuring port generates an analog measuring signal and provides it to the optical interface. The optical interface generates an optical measuring signal based on the analog measuring signal and provides it to the optical input of the DUT. The second measuring port receives an analog measuring signal generated by the DUT based on the optical measuring signal. The processor determines S-parameters of the DUT based on the two analog measuring signals.
    Type: Grant
    Filed: March 14, 2023
    Date of Patent: January 14, 2025
    Assignee: Rohde & Schwarz GmbH & Co. KG
    Inventors: Steffen Heuel, Steffen Neidhardt, Thilo Bednorz
  • Patent number: 12188959
    Abstract: Speed and acceleration calculation and measuring methods and devices based on a regularization algorithm are disclosed. Speed and acceleration are calculated using the following steps: (1) acquiring position data or displacement data; and (2) using the position data or displacement data to calculate the speed and the acceleration with a disclosed regularization method. The disclosed methods and systems avoid the issue of noise amplification that arises when speed and acceleration are measured by existing speed and acceleration devices at high sampling rates. Noise amplification is prevented by first expressing the relationship between position data or displacement data and speed or acceleration into a typical Volterra integral equation of the first kind, and then using the disclosed regularization method to calculate speed and acceleration, thus suppressing noise amplification and accurately extracting speed and acceleration signal values.
    Type: Grant
    Filed: January 12, 2022
    Date of Patent: January 7, 2025
    Inventor: Peiliang Xu
  • Patent number: 12188767
    Abstract: A system includes a displacement-type capacitive sensor probe and at least one processor and at least one memory. The at least one memory stores instructions that, when executed by the at least one processor, cause the at least one processor to calibrate the sensor probe to a known dielectric constant of a first material, send an instruction to the sensor probe to measure a capacitive response of a composite article comprising the first material and a second material, receive the measured capacitive response from the calibrated sensor probe, determine, based on the measured capacitive response, an equivalent thickness of the first material in the composite article, and determine a percentage of the first material in the composite article based on the equivalent thickness of the first material and a thickness of the composite article.
    Type: Grant
    Filed: March 22, 2024
    Date of Patent: January 7, 2025
    Assignee: CONTINUUS MATERIALS INTELLECTUAL PROPERTY, LLC
    Inventors: Victoria L. Wan, Jack G. Winterowd, Richard Schnarre
  • Patent number: 12188956
    Abstract: One embodiment provides a system for analyzing a motion of a complex system. During operation, the system obtains movement data associated with the motion over a time interval and computes, over the time interval, a distribution of energy associated with the motion based on the obtained movement data. The system further identifies energy peaks based on the distribution of the energy over the time interval, computes an energy-occurrence-frequency distribution based on the identified energy peaks over a predetermined energy range, and generates a motion-analysis result for the complex system based on the computed energy-occurrence-frequency distribution.
    Type: Grant
    Filed: October 3, 2019
    Date of Patent: January 7, 2025
    Assignee: Surge Motion Inc.
    Inventors: Jeffrey Tai Kin Cheung, Derek T. Cheung, Vicky L. Cheung, Gary N. Jin
  • Patent number: 12181341
    Abstract: Described herein is a computer-implemented method for providing a match metric for matching and adjusting color of a target coating and at least one sample coating, the method including at least the steps of: obtaining, via at least one communications interface, spectral curve(s) of the target coating and spectral curves of the sample coating determined at at least one gloss geometry; producing normalized first derivative values of the normalized spectral curves of the target coating and of the sample coating; producing difference values between the normalized first derivative values of the target coating and of the sample coating; producing a first match metric for the target coating and the sample coating based at least on the difference values produced for the at least one gloss geometry; and producing the match metric based on the first match metric. Also described herein is a respective system.
    Type: Grant
    Filed: August 1, 2020
    Date of Patent: December 31, 2024
    Assignee: BASF COATINGS GMBH
    Inventor: Guido Bischoff