Patents Examined by Lee E Rodak
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Patent number: 12222371Abstract: The present disclosure is a system and method for measuring AC residual current and DC residual current using a singular type-B residual current monitoring device. The system includes a sensor comprising two or more cores that measure residual AC current and residual DC current from two or more current carrying conductors through the cores that carry AC current and DC current. The system includes a controller that sends both an AC excitation current to the cores, as well as a DC nulling current that cancels out the DC residual current, allowing the system to then accurately measure the AC residual current. The system also includes a self-test feature that injects known quantities of both AC current and DC current through the sensor to determine if the sensor is functioning properly.Type: GrantFiled: December 12, 2022Date of Patent: February 11, 2025Assignee: Vertiv CorporationInventors: Kevin R. Ferguson, Jason Armstrong
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Patent number: 12216178Abstract: A fail-safe operating method for a decentralized power generation plant DG includes determining a leakage capacitance of a generator of the DG before connecting the DG. The method also includes comparing the determined leakage capacitance with a predetermined first limit value, and connecting the DG to a grid only if the determined leakage capacitance is smaller than the predetermined first limit value. A decentralized power generation plant is configured to perform the method.Type: GrantFiled: June 13, 2022Date of Patent: February 4, 2025Assignee: SMA Solar Technology AGInventors: Michael Viotto, Martin Putz, Christian Tschendel
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Patent number: 12217640Abstract: A display panel includes a plurality of first pixels on a first region, a plurality of second pixels on a second region, and a test circuit. The second region has a transmittance less than a transmittance of the first region. The test circuit provides one or more test voltages to the first pixels and the second pixels. The test circuit includes a first test circuit and a second test circuit. The first test circuit provides the first pixels with a first voltage, and the second test circuit provides the second pixels with a second voltage different from the first voltage.Type: GrantFiled: January 26, 2022Date of Patent: February 4, 2025Assignee: SAMSUNG DISPLAY CO., LTD.Inventors: Jinsung An, Sungho Kim, Seokje Seong, Minwoo Woo, Seunghyun Lee, Wangwoo Lee, Jiseon Lee
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Patent number: 12210046Abstract: The invention relates to a circuit assembly (10) for fault detection in an ungrounded high-voltage system (20) having a connected inverter (4) and having at least one resistor (5) between a high-voltage potential (7a, 7b) of the high-voltage system (20) and a reference potential (8), the circuit assembly (10) comprising: a sensing circuit (1), which is designed to tap a voltage from the resistor (5), to generate a first measurement value therefrom and to provide the first measurement value at an output (1c, 1d); and an evaluation device (2), which is connected to the output (1c, 1d) of the sensing circuit (1), the evaluation device (2) being designed to compare the first measurement value with a first limit value and to output a first signal if the first measurement value exceeds the first limit value.Type: GrantFiled: December 6, 2019Date of Patent: January 28, 2025Assignee: Robert Bosch GmbHInventor: Martin Trunk
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Patent number: 12209936Abstract: Interstory drift measurement systems and methods of using the same can include a laser beam source configured to emit a beam having at least a first width in a first direction and a sensor system comprising a plurality of diodes spaced apart from one another in the first direction. The plurality of diodes can include a first diode and a diode spacing width in the first direction as measured between a centerline of the first diode and a centerline of an adjacent diode of the plurality of diodes in the first direction. The beam width in the first direction is at least two times the diode spacing width.Type: GrantFiled: January 14, 2021Date of Patent: January 28, 2025Assignees: Nevada Research & Innovation Corporation, The Regents of the University of CaliforniaInventors: David B. McCallen, Patrick Laplace, Floriana Petrone
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Patent number: 12204000Abstract: A precision magnetometer for detecting magnetic fields parallel to a static field B0 in which the magnetometer itself is immersed; this magnetometer is operative in the frequency range of the field b1 ranging from 10 MHz to 1 GHz. Another object is a technique for using the presented magnetometer.Type: GrantFiled: May 21, 2021Date of Patent: January 21, 2025Assignee: ISTITUTO NAZIONALE DI FISICA NUCLEARE (I.N.F.N.)Inventor: Nicolo′ Crescini
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Patent number: 12196784Abstract: A method and system for determining the state of one or both of an electrical conductor or an associated system utilizing a non-invasive sensor and a magnetostrictive response from the current of the electrical conductor. The method includes providing a sensor assembly including a magnetostrictive resonator sensor and a signal detector. A state of one or both of the electrical conductor or the associated system is determined with the fault detector in response to a first frequency profile and a second frequency profile obtained with the magnetostrictive resonator sensor. A fault monitoring system utilizing a magnetostrictive resonator sensor is also disclosed.Type: GrantFiled: January 18, 2022Date of Patent: January 14, 2025Assignee: National Technology & Engineering Solutions of Sandia, LLCInventors: Sigifredo Gonzalez, Jack David Flicker, Todd Monson, Eric Langlois, Nicholas Sonny Gurule, Olga Lavrova
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Patent number: 12196700Abstract: A measuring method according to an exemplary embodiment includes acquiring a temperature by a temperature sensor at a first time, and acquiring a first parameter that sets an admittance of a phase adjustment circuit. The measuring method includes acquiring a second parameter corresponding to the temperature acquired at the first time. The second parameter is generated based on a second parameter group that is pre-stored. The measuring method includes acquiring a correction parameter group by correcting a second parameter group to correspond to the first parameter based on the first parameter and the second parameter.Type: GrantFiled: February 16, 2023Date of Patent: January 14, 2025Assignee: Tokyo Electron LimitedInventor: Takayuki Hatanaka
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Patent number: 12196614Abstract: Disclosed are methods and devices for calibration in the field of optical sensors, e.g. characterizing and calibrating an optical sensor chip. In order to address complexity of sensor data with high accuracy the optical sensor, e.g. an optical sensor is not provided as an already calibrated unit. Rather, sensor response data may be recorded in a defined or standardized environment, e.g. at a production line, and with high precision. This high standard sensor response data can be obtained on a per device basis and, thus, is referenced with an unambiguous chip identification number, chip ID. The sensor data is complemented with a dedicated calibration algorithm which can be tailor-made to fit the optical sensor or the optical sensor chip. In order to retrieve the sensor response data and the calibration algorithm both can be made available by means of the chip ID, for example.Type: GrantFiled: October 30, 2019Date of Patent: January 14, 2025Assignee: AMS SENSORS GERMANY GMBHInventors: Gunter Siess, Julius Komma, Thomas Höppler, Thomas Nimz, Mahmoud Jazayerifar
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Patent number: 12196794Abstract: A measuring device includes a first measuring port connected to an optical interface which can be connected to an optical input or output of a device under test (DUT). The device includes a second measuring port which can be connected to a radio frequency (RF) input or output of the DUT. The optical interface is connected to the optical input of the DUT and the second measuring port is connected to the RF output of the DUT. The first measuring port generates an analog measuring signal and provides it to the optical interface. The optical interface generates an optical measuring signal based on the analog measuring signal and provides it to the optical input of the DUT. The second measuring port receives an analog measuring signal generated by the DUT based on the optical measuring signal. The processor determines S-parameters of the DUT based on the two analog measuring signals.Type: GrantFiled: March 14, 2023Date of Patent: January 14, 2025Assignee: Rohde & Schwarz GmbH & Co. KGInventors: Steffen Heuel, Steffen Neidhardt, Thilo Bednorz
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Patent number: 12196798Abstract: A monitoring circuit (2) for an interlock system (1), said interlock system comprising a first monitoring line (3), a second monitoring line (4), and at least one line bridge (5), by means of which the monitoring lines (3, 4) are electrically conductively connected in a closed state of the interlock system (1), said monitoring circuit comprising a signal generation device (11) which is configured for generating a monitoring signal for the first monitoring line (3) which alternates between a first monitoring voltage and a second monitoring voltage and which is referenced to a reference potential, and a signal evaluation device (17) by means of which a voltage profile (43, 48 to 51) which is referenced to the reference potential is detectable on the second monitoring line (4), wherein the signal evaluation device (17) is configured for determining a fault on one of the monitoring lines (3, 4) which is caused by a fault voltage referenced to the reference potential, and/or a fault in the monitoring circuit (2) bType: GrantFiled: November 22, 2019Date of Patent: January 14, 2025Assignee: Valeo Siemens eAutomotive Germany GmbHInventor: Rainer Edelhauser
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Patent number: 12188959Abstract: Speed and acceleration calculation and measuring methods and devices based on a regularization algorithm are disclosed. Speed and acceleration are calculated using the following steps: (1) acquiring position data or displacement data; and (2) using the position data or displacement data to calculate the speed and the acceleration with a disclosed regularization method. The disclosed methods and systems avoid the issue of noise amplification that arises when speed and acceleration are measured by existing speed and acceleration devices at high sampling rates. Noise amplification is prevented by first expressing the relationship between position data or displacement data and speed or acceleration into a typical Volterra integral equation of the first kind, and then using the disclosed regularization method to calculate speed and acceleration, thus suppressing noise amplification and accurately extracting speed and acceleration signal values.Type: GrantFiled: January 12, 2022Date of Patent: January 7, 2025Inventor: Peiliang Xu
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Patent number: 12188767Abstract: A system includes a displacement-type capacitive sensor probe and at least one processor and at least one memory. The at least one memory stores instructions that, when executed by the at least one processor, cause the at least one processor to calibrate the sensor probe to a known dielectric constant of a first material, send an instruction to the sensor probe to measure a capacitive response of a composite article comprising the first material and a second material, receive the measured capacitive response from the calibrated sensor probe, determine, based on the measured capacitive response, an equivalent thickness of the first material in the composite article, and determine a percentage of the first material in the composite article based on the equivalent thickness of the first material and a thickness of the composite article.Type: GrantFiled: March 22, 2024Date of Patent: January 7, 2025Assignee: CONTINUUS MATERIALS INTELLECTUAL PROPERTY, LLCInventors: Victoria L. Wan, Jack G. Winterowd, Richard Schnarre
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Patent number: 12188956Abstract: One embodiment provides a system for analyzing a motion of a complex system. During operation, the system obtains movement data associated with the motion over a time interval and computes, over the time interval, a distribution of energy associated with the motion based on the obtained movement data. The system further identifies energy peaks based on the distribution of the energy over the time interval, computes an energy-occurrence-frequency distribution based on the identified energy peaks over a predetermined energy range, and generates a motion-analysis result for the complex system based on the computed energy-occurrence-frequency distribution.Type: GrantFiled: October 3, 2019Date of Patent: January 7, 2025Assignee: Surge Motion Inc.Inventors: Jeffrey Tai Kin Cheung, Derek T. Cheung, Vicky L. Cheung, Gary N. Jin
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Patent number: 12181341Abstract: Described herein is a computer-implemented method for providing a match metric for matching and adjusting color of a target coating and at least one sample coating, the method including at least the steps of: obtaining, via at least one communications interface, spectral curve(s) of the target coating and spectral curves of the sample coating determined at at least one gloss geometry; producing normalized first derivative values of the normalized spectral curves of the target coating and of the sample coating; producing difference values between the normalized first derivative values of the target coating and of the sample coating; producing a first match metric for the target coating and the sample coating based at least on the difference values produced for the at least one gloss geometry; and producing the match metric based on the first match metric. Also described herein is a respective system.Type: GrantFiled: August 1, 2020Date of Patent: December 31, 2024Assignee: BASF COATINGS GMBHInventor: Guido Bischoff
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Patent number: 12181625Abstract: A system and techniques for detecting near-subsurface voids in the earth use a controlled source electromagnetic transmitter and a plurality of controlled source electromagnetic receivers. Signals received by the plurality of controlled source electromagnetic receivers corresponding to signals generated by the controlled source electromagnetic transmitter are analyzed. Bi-static doublets detected in the received signals are used to identify the location of the near-subsurface voids.Type: GrantFiled: July 1, 2022Date of Patent: December 31, 2024Assignee: ESG SOLUTIONS GROUP, INC.Inventor: Trevor Keith Charles Pugh
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Patent number: 12174054Abstract: A fluid level sensing system comprises a sensor float assembly, a sensor control module comprising a sensor processor, and a sensor cable. An accelerometer arranged within the float chamber in a fixed orientation relative to a float axis. The accelerometer is capable of determining movement in at least first and second reference axes. The sensor cable is operatively connected between the float processor and the sensor processor. Movement of the float enclosure relative to the reference point is limited. The accelerometer generates and transfers to the float processor first and second sets of data representative of movement along the first and second reference axes. The float processor generates and transfers to the sensor processor pitch data associated with the float enclosure based on the first and second sets of data. The sensor processor generates a status signal and/or a control signal based on the pitch data.Type: GrantFiled: December 29, 2022Date of Patent: December 24, 2024Inventors: Brian E. Lipscomb, William Carl Garrison
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Patent number: 12169161Abstract: A sensor unit includes an orientation sensor, an electronic processor coupled to the orientation sensor, and memory coupled to the electronic processor and storing support structure configuration data and instructions. The instructions, when executed by the electronic processor, cause the sensor unit to monitor a position of a conductor support structure associated with the sensor unit based on data from the orientation sensor and generate an alert message responsive to determining that the position violates a position threshold. The position threshold is generated based on the support structure configuration data.Type: GrantFiled: December 28, 2022Date of Patent: December 17, 2024Assignee: Hubbell IncorporatedInventor: Michael Lee Kelley
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Patent number: 12163974Abstract: A system for tamper detection of a motion detector. The system includes an electronic controller configured to receive orientation data from an accelerometer of the motion detector. The electronic controller is also configured to filter the orientation data of the accelerometer of the motion detector. The electronic controller is further configured to determine an orientation of the motion detector using the filtered orientation data. The electronic controller is also configured to identify a tamper condition of the motion detector based on the orientation of the motion detector. The electronic controller is further configured to activate an alarm device of the motion detector based on the tamper condition.Type: GrantFiled: January 26, 2022Date of Patent: December 10, 2024Assignee: Robert Bosch GmbHInventor: Othmane Bennis
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Patent number: 12166340Abstract: A method for detecting faults in a low voltage three-phase network including: checking if any of three phases of the three-phase network satisfies first conditions for a predetermined duration of time; if at least two phases satisfy the first conditions, detecting an inter-phase fault by checking if the current level in at least two phases exceed a threshold and if the corresponding current flows are in the same direction; if only one of the three phases satisfies the first conditions, for the phase which has satisfied the first conditions, checking if a second condition is satisfied and, in a positive case, detecting a mono-phase fault.Type: GrantFiled: November 23, 2021Date of Patent: December 10, 2024Assignee: Schneider Electric Industries SASInventors: David Corbet, Philippe Alibert, Thi Thu Ha Pham