Abstract: In one embodiment, an apparatus (12) that samples a signal obtained or derived from an accelerometer, filters the samples, accumulates the filtered samples, and determines which limb the apparatus is associated with based on a comparison of the filtered accumulated samples and a threshold set.

Abstract: A system for testing a battery cell includes a test fixture configured to enclose the battery cell, a battery cycler configured to alternately charge and discharge the battery cell, an antenna mounted on a surface of the test fixture, the antenna configured to detect an electromagnetic signature of the battery cell and generate a signal indicative of the electromagnetic signature, and a detection module configured to receive the signal and detect characteristics of the battery cell based on the signal.

Abstract: Embodiments of this application disclose a fault point position determining method and apparatus and a photovoltaic system, to correctly and efficiently determine a fault point position when a disconnection fault occurs in a photovoltaic system. The method is applied to a photovoltaic system, the photovoltaic system includes at least one inverter and at least one photovoltaic unit, each photovoltaic unit includes at least one photovoltaic module and one photovoltaic module controller, and the method includes: sending, by an inverter, a first test signal to the at least one photovoltaic unit; obtaining, by the inverter, first test signal characteristic information fed back by the at least one photovoltaic unit; and performing, by the inverter, absolute value or relative value sorting on the at least one piece of first test signal characteristic information, and determining a fault point in the photovoltaic system based on a sorting result.

Abstract: A testing device for an airbag module includes a support structure to which an airbag module containing an airbag can be fastened, the support structure forming a passage which can be penetrated by the airbag, at least one lid movably fastened to the support structure by fastening means between a closing position in which the lid closes the passage and an open position in which the passage is opened, and a closure device that closes the lid in the closing position by applying a closing force to the lid, wherein the lid comprises at least one first force sensor measuring the opening force applied to the lid by the airbag when moved out of the closed position by the airbag.

Abstract: An integrated circuit testing assembly, comprising a slab having a slab axis, and a first electrode and second electrode affixed relative to the slab. The first electrode has a first major axis parallel to the slab axis, is coupled to receive a first voltage for coupling to a first set of pins on an integrated circuit, and includes a first surface area facing the slab axis, wherein the first surface area does not include a surface discontinuity. The second electrode has a second major axis parallel to the slab axis, is coupled to receive a second voltage for coupling to second first set of pins on an integrated circuit, and includes a second surface area facing the slab axis, wherein the second surface area does not include a surface discontinuity.

Abstract: An apparatus for performing thermal testing of a memory device and a method of thermally testing the memory device. The apparatus includes a tester; an interface board disposed over the tester and configured to receive the semiconductor device and connect the semiconductor device to the tester; a shield disposed over the interface board and including a recess; a gas-supplying unit including a conduit extending through the shield and accessible to the recess; a temperature-sensing device disposed within the recess; and a controller configured to control and communicate with the tester, the gas-supplying unit and the temperature-sensing device.

Abstract: There is disclosed an electrical device including a battery, and a battery management system. The battery management system includes a controller in electrical communication with a pressure sensor to monitor the state of health of the battery. The controller applies a method for determining the state of health that uses a non-electrical (mechanical) signal of force measurements combined with incremental capacity analysis to estimate the capacity fading and other health indicators of the battery with better precision than existing methods. The pressure sensor may provide the force measurement signal to the controller, which may determine which incremental capacity curve based on force to use for the particular battery. The controller then executes a program utilizing the data from the pressure sensor and the stored incremental capacity curves based on force to estimate the capacity fading and signal a user with the state of health percentage.

Abstract: A method of recording intracellular action potentials in electrogenic cells through pores in membranes of cells formed by optoporation includes positioning a sample that includes the cells on a multi-electrode array; incubating or perfusing the sample; focusing a laser on the surface of the array electrodes, the surface contacting the sample; applying one or more laser pulses to one or more array electrodes to perform a localized breakdown of the membrane of the cells of the sample; and recording the intracellular action potentials. The surface of the electrodes is porous and has cavities and protrusions at the nanoscale level, and the electric field produced by the laser is localized and amplified to perform the localized breakdown of the membrane of the cells of the sample.

Abstract: A semiconductor test apparatus according to the present disclosure includes: a stage on which a wafer is to be mounted; a pressurizing wall disposed on a surface of a probe card opposing the stage, extending toward the stage, and having an opening; a mark disposed on a lower surface of the pressurizing wall opposing the stage; a probe disposed in the opening; an air tube to force air into the opening; a detector to detect first spacing between a tip of the probe and the mark; and a controller to control second spacing between the wafer and the lower surface of the pressurizing wall based on the first spacing, wherein, when an electrical property of each of chips of the wafer is measured, the second spacing is controlled to be predetermined spacing by the controller, and the air is forced into the opening through the air tube.

Abstract: Methods and systems for compensation of a microelectromechanical system (MEMS) sensor may include associating test temperature values with input test signal values, identifying temperature-input signal pairs, and applying one of the test temperature values and one of the test signal values to the MEMS sensor. Desired output signal values may be determined, with each of the desired output signal values corresponding to one of the applied temperature-input signal pairs. Measured output signal values from the MEMS sensor may be measured, with each of the measured output signal values corresponding to one of the applied temperature-input signal pairs. Compensation terms may be determined based on the plurality of temperature-input signal pairs, the corresponding plurality of measured output signal values, and the corresponding plurality of desired output signal values. Compensation terms may be used to modify a sense signal of the MEMS sensor.

Abstract: A state estimation method for an energy storage device includes: acquiring, by a first method, a first probability distribution that expresses the state of the energy storage device 61 in the form of a probability distribution; acquiring, by a second method, a second probability distribution that expresses the state of the energy storage device in the form of a probability distribution; and estimating the state of the energy storage device on the basis of the first probability distribution and the second probability distribution.

Abstract: Parameter settings and operational data are received from machines for a current predefined time interval. For each machine, a corresponding health metric value is calculated based on the received operational data and machine health data, and stored in association with the received corresponding parameter settings. Associated unknown health metric values are estimated for machines associated with combinations of parameter settings different from the received parameter settings having at least one of the combinations of parameter settings with an associated previously determined health metric value, and at least one other of the combinations of parameter settings with the associated unknown health metric value, based on the corresponding calculated health metric value and the corresponding previously determined health metric value.

Abstract: A multi-mode microwave waveguide blade sensing system includes a transceiver, a waveguide, and a probe sensor. The transceiver generates a microwave energy signal having a first waveguide mode and a different second waveguide mode. The waveguide includes a first end that receives the microwave energy signal. The probe sensor includes a proximate end that receives the microwave energy signal from the transceiver and a distal end including an aperture that outputs the microwave energy signal. The probe sensor directs the microwave energy signal at a first direction based on the first waveguide mode and a different second direction different based on the second waveguide mode. The probe sensor receives different levels of reflected microwave energy based at least in part on a location at which the at least one microwave energy signal is reflected from the machine.

Abstract: A probe card is configured to perform a circuit test on a wafer to realize a reduction in size and pitch of probe insertion holes. The probe card includes a first plate, a second plate coupled to a lower portion of the first plate, an upper guide plate provided on an upper surface of the first plate, a lower guide plate provided on a lower surface of the second plate, and a reinforcing plate coupled to at least a surface of each of the upper and lower guide plates. At least one of the upper and lower guide plates is made of an anodic oxide film material, and as viewed from above, the upper and lower guide plates and the reinforcing plate are configured to have smaller areas than the first and second plates, so that upper and lower surfaces of the first and second plates are exposed.

Abstract: A current-sensing system includes a conductor for carrying a first electrical current generating a first magnetic field. A device, spaced from the conductor by a clearance, includes a semiconductor integrated circuit die in a package. The semiconductor integrated circuit die includes at least one elongated bar of a first ferromagnetic material magnetized by the first magnetic field; a sensor comprising a first coil wrapped around the at least one elongated bar to sense the bar's magnetization; and an electronic driver creating a second electrical current flowing through a second coil wrapped around the at least one elongated bar generating a second magnetic field to compensate the at least one bar's magnetization. The package has a first outer surface free of device terminals. A discrete plate of a second ferromagnetic material is positioned in the clearance and is conformal with the first outer surface of the package.

Abstract: A measuring device for wave energy conversion performance of a comb-typed permeable breakwater with arcuate walls is provided. The measuring device includes four parts: the comb-type permeable breakwater with arcuate walls, a wave height measuring instrument and pressure sensor fixing and adjusting apparatus, a wave height measuring instrument data collecting and processing apparatus and a pressure sensor data collecting and processing apparatus. The comb-typed permeable breakwater includes combined arc-shaped caissons, partition plates, a back plate, a fixing bottom plate and fixing screws. The wave height measuring instrument data collecting and processing apparatus processes data collected by a wave height measuring instrument and outputs for display. The pressure sensor data collecting and processing apparatus analyzes data collected by a pressure sensor and outputs for display. The measuring device has a stable structure, convenient operation and high experimental accuracy.

Abstract: The application provides a method, apparatus, device and medium for detecting an internal short-circuit fault of a battery cell. The method includes obtaining electrical signal values for each of m battery cells of a battery pack, when it is in a preset condition including that a current detection is an nth detection; performing following steps for a target battery cell: calculating a first parameter of the target battery cell using the electrical signal values of the target battery cell, which characterizes a degree of fluctuation of the electrical signal values; calculating a second parameter that characterizes a degree of dispersion between the first parameter of the target battery cell and first parameters of other battery cells; and determining that an internal short-circuit fault occurs in the target battery cell, under a condition that the second parameter is greater than a threshold.

Abstract: One embodiment provides a method, including: detecting, using a sensor of an information handling device, a change in a magnetic field associated with the information handling device; determining, using a processor, whether the change in the magnetic field corresponds to a known command; and performing, responsive to determining that the change in the magnetic field corresponds to the known command, a function dictated by the known command. Other aspects are described and claimed.

Abstract: A work machine can include a frame; a spray system couple to the frame and including a spray bar having a plurality of nozzles; a pressure sensor to detect a pressure of a liquid within the spray bar; and a controller to determine whether the detected pressure of the liquid within the spray bar has exceeded a pre-determined pressure threshold.

Abstract: A fault detection circuit includes a short circuit comparison circuit which has a first input connected to the source of the second NFET, a second input, and an output. The circuit includes an over-current comparison circuit which has a first input connected to the source of the second NFET, a second input, and an output. The circuit includes a voltage divider circuit which has a first terminal connected to first input of the short circuit comparison circuit, a second terminal connected to the first input of the over-current comparison circuit, and a third terminal connected to a ground terminal. The circuit includes a delay circuit which has an input connected to the output of the over-current comparison circuit and has an output.