Patents Examined by Lee E Rodak
-
Patent number: 11561203Abstract: Object analysis comprising measuring a frequency-dependent natural oscillation behavior of the object by dynamically-mechanically exciting the object in a defined frequency range (f) by means of generating a body oscillation by applying a test signal, and detecting a body oscillation generated in the object on account of the exciting.Type: GrantFiled: January 30, 2019Date of Patent: January 24, 2023Assignee: HEXAGON TECHNOLOGY CENTER GMBHInventors: Silvan Meile, Claudio Iseli
-
Patent number: 11561263Abstract: Provided are a method and device for testing an adaptor, and a storage medium. The method is applicable to the device. The method includes the following. A test signal is sent to the adaptor. Detect a first voltage, where the first voltage is outputted in a preset first duration by the adaptor according to the test signal. A working state of the adaptor is determined according to the first voltage.Type: GrantFiled: January 15, 2020Date of Patent: January 24, 2023Assignee: GUANGDONG OPPO MOBILE TELECOMMUNICATIONS CORP., LTD.Inventor: Chen Tian
-
Patent number: 11555685Abstract: A device for detecting a layer thickness of a coated component, particularly a brake disc for a disc brake of a motor vehicle, includes at least one holding device and a guiding device. The holding device has a bearing surface for the component. The guiding device is configured to hold and guide a sensor in order to measure the layer thickness. The sensor is configured to be moved by the guiding device along a vertical axis and pivot about a first axis of rotation that is oriented horizontally. The sensor is further configured to be moved by the guiding device along a horizontal axis.Type: GrantFiled: May 4, 2018Date of Patent: January 17, 2023Assignee: Robert Bosch GmbHInventors: Christoph Maurer, Wolfgang Huschenhoefer, Marian Willeke
-
Patent number: 11557708Abstract: A Josephson voltage standard includes: electrical conductors that receive bias currents and radiofrequency biases; a first Josephson junction array that: includes a first Josephson junction and produces a first voltage reference from the first bias current and the third bias current; a second Josephson junction array in electrical communication with the first Josephson junction array and that: includes a second Josephson junction; receives the second bias current; receives the third bias current; receives the second radiofrequency bias; and produces a second voltage reference from the second bias current and the third bias current; a first voltage reference output tap in electrical communication with the first Josephson junction array and that receives the first voltage reference from the first Josephson junction array such that the first voltage reference is electrically available at the first voltage reference output tap; and a second voltage reference output tap.Type: GrantFiled: April 8, 2020Date of Patent: January 17, 2023Assignee: GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF COMMERCEInventors: Alain Rufenacht, Nathan Edward Flowers-Jacobs, Anna Rose Elizabeth Fox, Samuel Paul Benz, Paul David Dresselhaus
-
Patent number: 11549986Abstract: A voltage detection circuit includes a differential amplification circuit and a microcontroller unit (MCU). The MCU detects a differential voltage output from operational amplifiers of the differential amplification circuit, and calculates an internal resistance value of a battery cell based on the detected differential voltage. At this time, the MCU controls an amplification factor adjustment circuit of the differential amplification circuit based on a maximum voltage representing the highest voltage detectable by the MCU and the differential voltage output from the differential amplification circuit so as to set the amplification factor of the operational amplifiers.Type: GrantFiled: February 5, 2021Date of Patent: January 10, 2023Assignee: YAZAKI CORPORATIONInventors: Jian Wang, Hironao Fujii, Saki Oonishi
-
Patent number: 11549965Abstract: It is herein described a contact probe of a testing head of an apparatus for testing electronic devices comprising a probe body being essentially extended in a longitudinal direction between respective end portions adapted to realize a contact with respective contact pads, at least one end portion having transverse dimensions greater than the probe body and comprising an enlarged portion, projecting only in correspondence of a first side wall of the contact probe. Suitably, the at least one end portion further comprises at least one protrusion projecting from a second side wall, opposite to the first side wall and substantially extending toward the second and opposite wall along a longitudinal axis of the contact probe starting from the enlarged portion.Type: GrantFiled: August 7, 2017Date of Patent: January 10, 2023Assignee: TECHNOPROBE S.P.A.Inventor: Daniele Perego
-
Patent number: 11543454Abstract: Embodiments herein relate to a test probe. The test probe may have a first plurality of beams and a second plurality of beams. An intermediate substrate may be positioned between the first plurality of beams and the second plurality of beams. In embodiments, both the first and second plurality of beams may be angled. Other embodiments may be described or claimed.Type: GrantFiled: September 25, 2018Date of Patent: January 3, 2023Assignee: Intel CorporationInventors: Paul J. Diglio, Pooya Tadayon, Karumbu Meyyappan
-
Patent number: 11543433Abstract: A probe test card includes a substrate, a plurality of test needles, and a fixing layer. The substrate includes a trench formed at a surface of the substrate. Each of the test needles includes a first end positioned in the trench and a second end, opposite to the first end, protruding from the trench. The fixing layer is formed in the trench to fix the test needles to the trench. The fixing layer includes a resin layer having a ceramic powder.Type: GrantFiled: April 24, 2020Date of Patent: January 3, 2023Assignee: SK hynix Inc.Inventors: Gyung Jin Kim, Jae Hyoung Seo
-
Patent number: 11543281Abstract: A fluid level sensing system comprises a sensor float assembly, a sensor control module comprising a sensor processor, and a sensor cable. An accelerometer arranged within the float chamber in a fixed orientation relative to a float axis. The accelerometer is capable of determining movement in at least first and second reference axes. The sensor cable is operatively connected between the float processor and the sensor processor. Movement of the float enclosure relative to the reference point is limited. The accelerometer generates and transfers to the float processor first and second sets of data representative of movement along the first and second reference axes. The float processor generates and transfers to the sensor processor pitch data associated with the float enclosure based on the first and second sets of data. The sensor processor generates a status signal and/or a control signal based on the pitch data.Type: GrantFiled: October 15, 2019Date of Patent: January 3, 2023Inventors: Brian E. Lipscomb, William Carl Garrison
-
Patent number: 11543373Abstract: A method and a calorimeter system for reducing error in a measured sample heat flow rate due to interpan heat exchange are described. The method includes sensing a heat flow rate to or from a sample container placed on a sample calorimeter unit in a single sample differential scanning calorimeter sensor and sensing a reference heat flow rate to or from a reference container placed on a reference calorimeter unit of the single sample differential scanning calorimeter sensor. The temperature of the sample container and the temperature of the reference container are also sensed. An interpan heat exchange between the sample container and the reference container is determined. A sample heat flow rate having reduced error is determined based on the sensed heat flow rate from the sample container and the determined interpan heat exchange rate.Type: GrantFiled: November 24, 2020Date of Patent: January 3, 2023Assignee: TA INSTRUMENTS-WATERS LLCInventor: Robert L. Danley
-
Patent number: 11519993Abstract: A system and method for phase and gain calibration of a current sensor system. The system comprises a microcontroller configured to execute software in an energy measurement component and a calibration computer having a calibration application. The energy measurement component receives first and second digital signals representing current and voltage signals, respectively, received from a test source, and calculates active power and a power factor, and provides those values to the calibration computer. The power factor is converted to a converted phase angle. Based on the information received from the energy measurement component, the calibration application calculates parameters used to update components within the microcontroller to maximize the accuracy of the current sensor system.Type: GrantFiled: July 25, 2019Date of Patent: December 6, 2022Assignee: TEXAS INSTRUMENTS INCORPORATEDInventors: Erick Macias, James Daniel Evans, Kripasagar Kay Venkat
-
Patent number: 11519873Abstract: The present invention relates to a method of calibrating a humidity sensor device, comprising the steps determining a first dew point and a first relative humidity at a first temperature in an environment by the humidity sensor device using a first calibration offset; subsequently heating the humidity sensor device, in particular, by self-heating, thereby heating the environment to a second temperature higher than the first temperature; subsequently determining a second dew point at the second temperature by the humidity sensor device; subsequently determining whether the determined second dew point differs from the determined first dew point by more than a predetermined difference; and subsequently changing the first calibration offset of the humidity sensor device by a predetermined value to obtain a second calibration offset, if it is determined that the determined second dew point differs from the determined first dew point by more than the predetermined difference.Type: GrantFiled: November 7, 2019Date of Patent: December 6, 2022Assignee: MEAS FRANCE SASInventor: Denis Bez
-
Patent number: 11513640Abstract: A position indicator includes a housing and a first electrode and a second electrode disposed on a side of one end of the housing and a signal generating circuit which, in operation, generates a signal supplied to at least the first electrode. A capacitive interaction between the first electrode and a sensor of a position detecting device formed through supply of the signal to the first electrode. The second electrode surrounds the first electrode and the first electrode is partially exposed from the second electrode in an axial direction of the housing. The position indicator includes a signal transmission control circuit that is coupled to the second electrode and that, in operation, controls the second electrode to change the capacitive interaction between the first electrode and the sensor formed through supply of the signal from the signal generating circuit to the first electrode.Type: GrantFiled: April 22, 2020Date of Patent: November 29, 2022Assignee: Wacom Co., Ltd.Inventor: Yuji Katsurahira
-
Patent number: 11493536Abstract: A probe head includes upper and lower die units, and a linear probe inserted therethrough and thereby defined with tail, body and head portions. A first bottom surface of the upper die unit and a second top surface of the lower die unit face each other, thereby defining an inner space wherein the body portion is located and includes a plurality of sections each having front width larger than or equal to back width, including a narrowest section whose upper and lower ends have a distance from the first bottom surface and the second top surface respectively. The head and tail portions are offset from each other along two horizontal axes and the body portion is thereby curved. The present invention is favorable in dynamic behavior control of the linear probe which is easy in manufacturing, lower in cost and has more variety in material.Type: GrantFiled: May 25, 2021Date of Patent: November 8, 2022Assignee: MPI CORPORATIONInventors: Tzu-Yang Chen, Chin-Yi Lin, Chen-Rui Wu, Sheng-Yu Lin, Ming-Ta Hsu, Chia-Ju Wei
-
Patent number: 11493370Abstract: A method for calibrating a device is described. The device accesses magnetometer data of a magnetometer sensor in the device, and accelerometer data of an accelerometer sensor in the device. The device determines a first position and a second position of the device based on the magnetometer data and the accelerometer data. The device determines a first magnetic vector based on the magnetometer data at the first position of the device, and a second magnetic vector based on the magnetometer data at the second position of the device. The device then assigns the first magnetic vector to the first position of the device, and the second magnetic vector to the second position of the device.Type: GrantFiled: February 15, 2019Date of Patent: November 8, 2022Assignee: Nortek Security & Control LLCInventors: Sivakumar Kathan, Dustin Mitchell, Stephen McClure
-
Patent number: 11480422Abstract: A method for estimating an angular deviation between a reference axis of a magnetic object and a magnetic axis co-linear to a magnetic moment of the magnetic object, including: a) positioning the magnetic object facing at least one magnetometer; b) rotating the magnetic object about the reference axis; c) measuring, during the rotating, the magnetic field, using the magnetomenter; and d) estimating the angular deviation from the magnetic field measurements.Type: GrantFiled: July 10, 2017Date of Patent: October 25, 2022Assignee: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVESInventors: Saifeddine Aloui, Franck Vial
-
Patent number: 11474128Abstract: A metal probe structure and a method for fabricating the same are provided. The metal probe structure includes a multi-layer substrate, a first flexible dielectric layer, a second flexible dielectric layer, and a plurality of first metal components. The first flexible dielectric layer is disposed over the multi-layer substrate and has a conductive layer formed thereover. The second flexible dielectric layer is disposed over the first flexible dielectric layer to cover the conductive layer. The plurality of first metal components is disposed over the conductive layer and partially in the second flexible dielectric layer to serve as a metal probe.Type: GrantFiled: January 21, 2020Date of Patent: October 18, 2022Assignee: PRINCO CORP.Inventors: Yi-Lin Chu, Hung-sheng Ku
-
Patent number: 11474162Abstract: A method and apparatus for electrical line testing. The method and apparatus provides audio, visual and/or electronic information to indicate electricity is flowing or not flowing through an electrical circuit controlled by a remote circuit breaker. The method and system help identify which electrical sockets are controlled by which remote circuit breakers. The method and apparatus is used over short distances in a residential home or over long distances in a commercial building such as a warehouse or factory. The method and apparatus is also used via a cloud communications network and with smart speakers. The method and apparatus is used with or without an external network devices such as a smartphone, electronic tablet, wearable device, etc.Type: GrantFiled: May 11, 2021Date of Patent: October 18, 2022Inventor: Jeff R. Magno
-
Patent number: 11460518Abstract: Disclosed is a method for analyzing a blind zone of a magnetic detection method that can provide a complete distribution map of the detection blind zone within the entire zone of the magnetic target. The method comprises the first step of establishing a complete magnetic detection model to obtain calculated position and magnetic moment of a magnetic target that is detected by a magnetic gradiometer. The second step involves establishing a direction-attitude-sphere model to represent the entire zone of the magnetic target. The third step involves expanding the direction-attitude-sphere to a planar map layered by latitude and calculating success detection rates within the planar expansion map. Finally, the distribution map of the magnetic detection blind zone in the entire zone is visually presented in the planar expansion map and a complete distribution rule of the entire detection blind zone is thus obtained.Type: GrantFiled: April 14, 2020Date of Patent: October 4, 2022Assignee: Harbin Institute of TechnologyInventors: Donghua Pan, Shengxin Lin, Yinxi Jin, Liyi Li
-
Patent number: 11460428Abstract: A humidity detecting device includes a semiconductor substrate including at least one impurity diffusion layer, a heating unit formed by the at least one impurity diffusion layer, and a humidity detecting unit. The humidity detecting unit includes a plurality of insulating films laminated on the semiconductor substrate, a lower electrode disposed over the heating unit via a first insulating film among the insulating films, a humidity sensitive film disposed on a second insulating film among the insulating films, so as to cover the lower electrode, and an upper electrode disposed on the humidity sensitive film.Type: GrantFiled: August 9, 2019Date of Patent: October 4, 2022Assignee: MINEBEA MITSUMI Inc.Inventor: Taketomo Nakane