Abstract: A method and system of system-on-chip design that provides the benefits of reduced design time, a smaller die size, lower power consumption, and reduced costs in chip design and production. The process seeks to remove the worst performance and worst power case scenarios from the design and application phases. This is accomplished by planning the power supply voltage in the design phase along with its tolerance with process corner and temperature combinations. The established plan is then applied with communications between power supply integrated circuits and load system-on-chip.

Abstract: Disclosed are methods, systems, and computer program products for performing grid morphing technique for computing a spreading of objects over an area such that the final locations of the objects are distributed over the area and such that the final locations of the objects are minimally perturbed from their initial starting locations and the density of objects meets certain constraints. The minimization of perturbation, or stability, of the approaches disclosed, is the key feature which is the principal benefit of the techniques disclosed. The methods described herein may be used as part of a tool for placement or floorplanning of logic gates or larger macroblocks for the design of an integrated circuit.

Abstract: Methods and apparatuses for designing multiplexers in one or more integrated circuits are described. One exemplary method includes receiving a representation of a first multiplexer and converting the representation to a partition neutral representation of the first multiplexer and partitioning the partition neutral representation to create a plurality of second multiplexers. Another exemplary method includes decomposing a representation of a first multiplexer into a representation of a plurality of second multiplexers, which are coupled together at a common output without any intervening multiplexers between the second multiplexers and the common output, and partitioning the second multiplexers between portions of at least one integrated circuit.

Abstract: A logic book for a programmable device such as an application-specific integrated circuit (ASIC) achieves improved radiation tolerance by providing notches in an implant well between adjacent transistors and fills the notches with complementary well regions that act as a barrier to charge migration. For example, a row of n-type field effect transistors (NFETs) is located in a Pwell region, while a row of p-type transistors is located in an Nwell region with portions of the Nwell region extending between the NFETs. More complicated embodiments of the present invention include embedded well islands to provide barriers for adjacent transistors in both rows of the book.

Abstract: In one embodiment, the present invention includes an apparatus having core logic formed on a die, input/output (IO) buffers surrounding the core logic, and a moat capacitance surrounding the IO buffers and extending to an edge of the die. Other embodiments are described and claimed.

Abstract: A method and system are disclosed for designing a complex integrated electronic circuit architecture including a plurality of circuit portions integrated into a single chip structure. The method includes providing at least one library of cells with a variable channel length L; creating a layout of an integrated circuit using the cells with an initial channel length L; performing a timing analysis of the integrated circuit to analyze more and less critical paths by evaluating respective path delays; selecting a set of less critical paths to be modified; evaluating the leakage currents of the less critical paths of the selected set; and modifying the variable channel length L of the cells which are involved in the less critical paths of the selected set on the basis of the corresponding evaluated leakage current and the respective path delays, whereby a modified integrated circuit with a reduced circuit leakage current is obtained.

Abstract: A method for connecting a first and second component in a logic device is disclosed. A path is generated between the first and second components with an appropriate amount of delay to satisfy short-path timing constraints that define a minimum delay on the path. A first interconnect line from a plurality of interconnect lines and a second interconnect line to connect with the first interconnect line sub-optimally from a delay minimization perspective are selected in order to satisfy the short-path timing constraints.

Abstract: A method for designing an electronic component includes receiving a device criteria (e.g., a parametric value, procurement value, etc.) from a designer, querying a database for devices corresponding to the device criteria, querying the database for procurement data and/or engineering data associated with the corresponding devices, presenting the devices to the designer based on the procurement data, and receiving input from the designer identifying one of the presented devices as a selected device. In a particular method, the returned devices are sorted based on one or more procurement values (e.g., manufacturer, price, availability, manufacturer status, etc.), and presented to the designer in a ranked list. Objects representative of the selected devices are then entered into a design file, and the objects are associated with the device's engineering and/or procurement data. In a particular embodiment, the objects are associated with the engineering data by embedding the engineering data in the file object.

Abstract: Methods and systems for integrating both models and rules into a verification flow to address both of these issues. Models are employed to perform simulations to provide more accurate verification results. In addition, the lithography simulation results can be used to fine-tune the rules themselves to provide a more realistic check upon circuit designs.

Abstract: Two paths (arrival and required paths) as a target of analysis are united into a single path, and an on-chip random variation component ?r about a plurality of nodes of the single path is calculated. Next, an on-chip variation component ?chip is calculated on the basis of the on-chip random variation component ?r and an on-chip systematic variation component ?s. Subsequently, a delay variation Docv is calculated on the basis of a reference delay Dbase of the entire path and the on-chip variation component ?chip.

Abstract: A three-dimensional mask model of the invention provides a more realistic approximation of the three-dimensional effects of a photolithography mask with sub-wavelength features than a thin-mask model. In one embodiment, the three-dimensional mask model includes a set of filtering kernels in the spatial domain that are configured to be convolved with thin-mask transmission functions to produce a near-field image. In another embodiment, the three-dimensional mask model includes a set of correction factors in the frequency domain that are configured to be multiplied by the Fourier transform of thin-mask transmission functions to produce a near-field image.

Abstract: A logic book for a programmable device such as an application-specific integrated circuit (ASIC) achieves improved radiation tolerance by providing transistors of the same doping type in different well regions that are physically isolated by intervening well regions with complementary doping. For example, n-type field effect transistors (NFETs) may be located in two outer rows of the book with separate Pwell regions, while p-type transistors are located in two inner rows of the book sharing a common Nwell region. Since the NFETs in separate wells are physically isolated from each other, a circuit structure which uses two NFETs in the two outer rows is much less likely to suffer multiple upsets from a single radiation strike. More complicated embodiments of the present invention include additional transistor rows in the stack with isolated Nwells and Pwells.

Abstract: A generation apparatus of writing error verification data for a pattern writing apparatus includes a data extraction part configured to extract, from layout data including a figure pattern to be written, part of the layout data required for an operation of a function having a writing error occurred after starting writing by the pattern writing apparatus which performs writing on a target workpiece based on the layout data, and a verification data generation part configured to perform a merge process based on extracted part of the layout data, and to generate writing error verification data, for which the merge process has been performed, for verifying the writing error of the pattern writing apparatus.

Abstract: One embodiment of the present invention provides a system that automatically generates an input sequence for a circuit design using mutant-based verification. During operation, the system receives a description of the circuit design. Next, the system determines a target value for a control signal in the description and a mutant value for the control signal. The system then determines if an input sequence exists for the circuit design that stimulates the control signal to the target value and causes the effects of the target value and the effects of the mutant value to reach an observation point in the circuit such that the effects of the target value and the effects of the mutant value differ at the observation point. If such an input sequence exists, the system then simulates operation of the circuit design using the input sequence. During simulation, the system generates two sets of signal outputs for the circuit design.

Abstract: The present application is directed to a method of selectively positioning sub-resolution assist features (SRAF) in a photomask pattern for an interconnect. The method comprises determining if a first interconnect pattern option will result in improved circuit performance compared with a second interconnect pattern option, where the first option is designed to be formed with SRAF and the second option is designed to be formed without SRAF. If it is determined that the first option will result in improved circuit performance, the first pattern option is selected as a target pattern and one or more SRAF patterns are positioned to facilitate patterning of the first pattern option. If it is not determined that the first option will result in improved performance, the second pattern option is selected as a target pattern.

Abstract: Statistical timing analysis methods for circuits are described which compensate for circuit elements having correlated timing delays with a high degree of computational efficiency. An quadratic timing model is used to represent each delay element along a circuit path, wherein each element's delay has a first-order relationship to local variations and a second-order relationship to global variations. Propagation of the modeled delays through the circuit is efficiently done via straightforward ADD operations where an input propagates through another element in a circuit path, and via a MAX operation (or an approximation thereof) where two or more inputs merge at an intersection. The inputs to the MAX operator can be tested for gaussianity, and can be processed by the MAX operation (or its approximation) if they are substantially gaussian. Otherwise, they may be stored in a tuple for processing at later points along the circuit path.

Abstract: A method for modeling a circuit includes receiving a netlist that defines a plurality of connections between a plurality of circuit elements and identifying a subset of the connections. The method also includes routing the identified connections with a first group of wires having a first wire width and routing at least a portion of the remaining connections with a second wire width. The second wire width is smaller than the first wire width. The method further includes replacing the first group of wires with a third group of wires having the second wire width.

Abstract: Disclosed are methods, systems, and computer program products for computing an exact minimal automaton to act as an intermediate assertion in assume-guarantee reasoning. In one embodiment, the computing an exact minimal automaton is performed by using a sampling approach and a Boolean satisfiability. The methods described herein may be used as part of a tool for formal verification.

Abstract: A mask, a method for creating a mask, and a method for irradiating a substrate through use of the mask. Creating the mask establishes the mask by designing the mask, forming the mask, or both designing and forming the mask. Creating the mask includes receiving a specified target transmittance (TS) of the substrate with respect to radiation propagated from a radiation source and transmitted through the mask with spatial selectivity in accordance with a spatially varying transmissivity (TM) of the mask with respect to the radiation. The mask is disposed between the radiation source and the substrate. The mask includes transparent portions and reflective portions distributed within the transparent portions. The first radiation after having passed through the mask is transmitted into the substrate in accordance with a spatially varying reflectance (R) of the substrate such that TM*(1?R) is about equal to TS.

Abstract: A method of determining buffer insertion locations in an integrated circuit design establishes candidate locations for inserting buffers into a net, and selects buffer insertion locations from among the candidates based on slew constraints. The selection of buffer insertion locations preferably optimizes slack and buffer cost while keeping slew from any buffered node to any sink less than a required slew rate. The slew analysis computes an output slew SL(v) of a given buffer b inserted at a node v as SL(v)=RS(b)·C(v)+KS(b), where C(v) is the downstream capacitance at v, RS(b) is the slew resistance of buffer b, and KS(b) is the intrinsic slew of buffer b. The delay through a given buffer may also be computed based on signal polarity. However, the invention still preferably uses worst-case slew resistance and intrinsic slew in considering the slew constraints.