Abstract: A method of fabricating a self-aligning magnetic tunnel junction the method includes patterning a lithographic strip on a second magnetic material deposited on a first magnetic material that is disposed on a substrate, forming a top magnetic strip by etching an exposed portion of the second magnetic material, patterning a nanowire and a magnetic reference layer island over the substrate and forming the nanowire and the magnetic reference layer island by etching an exposed portion of the first magnetic layer and an exposed portion of the top magnetic strip, wherein an interface between the magnetic nanowire and the magnetic reference layer island is an magnetic tunnel junction aligned with a width of the nanowire.

Abstract: A method of protecting sensitive components prior to, during or subsequent to advanced die packaging processing includes applying a metal stack layer such as titanium/copper (Ti/Cu) onto the front surface of a die assembly such that the die assembly front surface is covered with the metal stack layer. A layer of titanium/copper/titanium (Ti/Cu/Ti) or a solder alloy is also applied to the back surface of the die assembly such that the back surface of the die assembly is covered with the Ti/Cu/Ti layer or solder alloy. The front surface metal stack layer and the back surface Ti/Cu/Ti layer or solder alloy prevent degradation of die metallization prior to, during or subsequent to the advanced die packaging processing.

Abstract: A method of manufacturing a thin film electronic device includes applying a plastic coating to a rigid carrier substrate using a wet casting process, the plastic coating forming a plastic substrate and include a transparent plastic material doped with a UV absorbing additive. Thin film electronic elements are formed over the plastic substrate, and the rigid carrier substrate is released from the plastic substrate. This method forms transparent substrate materials suitable for a laser release process, through doping of the plastic material of the substrate with a UV absorber. This UV absorber absorbs in the wavelength of the lift-off laser (for example 308-351 nm, or 355 nm) with a very high absorption.

Abstract: By modifying the dielectric liner for a spacer structure so as to exhibit an enhanced diffusion blocking characteristic, for instance by incorporating nitrogen, the out-diffusion of P-dopants, such as boron, into the dielectric material may be significantly reduced. Consequently, transistor performance, especially of P-type transistors, may be significantly enhanced while nevertheless a high degree of compatibility with conventional techniques may be maintained.

Abstract: A method of manufacture of an integrated circuit packaging system includes: providing a package carrier having a dispense port; attaching an integrated circuit to the package carrier and over the dispense port; placing a mold chase over the integrated circuit and on the package carrier, the mold chase having a hole; and forming an encapsulation through the dispense port or the hole, the encapsulation surrounding the integrated circuit including completely filled in a space between the integrated circuit and the package carrier, and in a portion of the hole, the encapsulation having an elevated portion or a removal surface resulting from the elevated portion detached.

Abstract: The method of manufacturing the semiconductor device comprises forming a transistor including a gate electrode and a source/drain diffused layer over a semiconductor substrate, forming a nickel platinum film over the semiconductor substrate, covering the gate electrode and the source/drain diffused layer, making a first thermal processing to react the nickel platinum film with the source/drain diffused layer to form a nickel platinum silicide film, and removing an unreacted part of the nickel platinum film using a chemical liquid of 71° C. or more containing hydrogen peroxide.

Abstract: Electrical testing of metal oxide semiconductor (MOS) high-k capacitor structures is used to evaluate photoresist strip or cleaning chemicals using a combinatorial workflow. The electrical testing can be able to identify the damages on the high-k dielectrics, permitting a selection of photoresist strip chemicals to optimize the process conditions in the fabrication of semiconductor devices. The high productivity combinatorial technique can provide a compatibility evaluation of photoresist strip chemicals with high-k devices.

Abstract: Methods and apparatus for detecting a leak in a gas precharged hydraulic accumulator having an initial gas charge entail activating a hydraulic pump to charge the gas precharged hydraulic accumulator and the hydraulic circuit associated with the gas precharged hydraulic accumulator when the hydraulic circuit and the hydraulic accumulator have a temperature that is substantially equivalent to an ambient temperature, e.g., on a cold start. The hydraulic pressure in the hydraulic circuit is monitored, and when a step in the hydraulic pressure is detected, various quantities are measured and used to determine a volumetric efficiency of the pump for use in later calculations of remaining gas amount.

Abstract: A wire level gauge for indicating the level of wire in a wire storage container and a method for determining the level of wire in a wire storage container using the wire level gauge. The wire level gauge has a level indicator with a magnet which is slidably movable on a measuring bar. The level indicator moves on the measuring bar and follows a leading edge of the wire in the wire storage container as the wire is dispensed from the wire storage container.

Abstract: An apparatus for dissolution experiment of mineral is disclosed. The apparatus for a dissolution experiment of mineral according to the inventive concept includes a main body including frames, a mounting unit including a container whose mouth is open so as to contain an alkaline solution, a first mineral sample and a second mineral sample contacting with each other in the alkaline solution, a cylinder including a plunger that is attached to the main body and movable so as to be inserted in and separated from the container for pressing the first mineral sample toward the second mineral sample included in the container, and a load cell supporting the mounting unit from the below and measuring a pressure applied to the second mineral sample.

Abstract: An actuating device for calibrating torque/angle wrenches encompassing a torque measuring system, includes at least a means for accommodating the torque/angle wrench, a torque actuator for applying a torque to the torque/angle wrench, and a torque sensor for detecting the torque. Provision is made for a rotation angle measuring system for rotating the torque measuring system in such a manner that a rotation of the torque/angle wrench about a rotation angle can be measured in addition to the measuring of a torque in the torque/angle wrench.

Abstract: A method of determining the TOC of a purified water stream is disclosed comprising at least the steps of: passing a supply water stream through a water purification apparatus including an oxidizer to provide a purified water stream, and dispensing at least a portion of the purified water stream; stopping the dispense of the purified water stream and recirculating the purified water stream as a recirculating water stream through at least a portion of the water purification apparatus including the oxidizer to provide a re-oxidized water stream; and measuring the conductivity value of the re-oxidized water stream to determine the TOC of the purified water stream. In this way, a determination of the TOC of the purified water stream of can be provided without requiring a dedicated TOC monitor at the point of dispense of the purified water stream.

Abstract: A temperature measurement system includes a temperature probe including a temperature sensor. The system also includes a reader, and a controller in communication with the temperature sensor and the reader. The system further includes a container housing a plurality of probe covers associated with the temperature probe. The container includes an information feature providing information related to the plurality of probe covers. The reader is configured to read the information and direct a signal to the controller indicative of the information.

Abstract: A paint swatch test device includes a transparent or translucent substrate, such as a sheet of polymeric material, and a plurality of different primer coating patches on the substrate. The patches preferably form a grayscale series of neutral white and gray primer patches having stepwise increments in light reflectance values. The patches can also be provided on an opaque substrate. The color suitability and/or hiding power of a topcoat paint desired to be applied to a surface to be painted can be determined by coating the topcoat paint on at least a portion of a surface of the transparent or translucent substrate, providing a grayscale series of patches between the paint coating and the surface to be painted, and observing the appearance of the paint coating where patches are beneath the coating and where patches are not beneath the coating.

Abstract: MEMS mass-spring-damper systems (including MEMS gyroscopes and accelerometers) using an out-of-plane (or vertical) suspension scheme, wherein the suspensions are normal to the proof mass, are disclosed. Such out-of-plane suspension scheme helps such MEMS mass-spring-damper systems achieve inertial grade performance. Methods of fabricating out-of-plane suspensions in MEMS mass-spring-damper systems (including MEMS gyroscopes and accelerometers) are also disclosed.

Abstract: A method of fabricating a semiconductor device structure begins by forming a layer of oxide material overlying a first gate structure having a first silicon nitride cap and overlying a second gate structure having a second silicon nitride cap. The first gate structure corresponds to a p-type transistor to be fabricated, and the second gate structure corresponds to an n-type transistor to be fabricated. The method continues by performing a tilted ion implantation procedure to implant ions of an impurity species in a channel region of semiconductor material underlying the first gate structure, during which an ion implantation mask protects the second gate structure. Thereafter, the ion implantation mask and the layer of oxide material are removed, and regions of epitaxial semiconductor material are formed corresponding to source and drain regions for the first gate structure. Thereafter, the first silicon nitride cap and the second silicon nitride cap are removed.

Abstract: A method for performing on-board functional diagnostics on a soot sensor of a vehicle and/or for detecting further components in the soot in a motor vehicle having an internal combustion engine. The soot sensor is electrically connected to an evaluation circuit with is permanently installed in the motor vehicle. In order to specify a method for performing functional diagnostics on a soot sensor and/or for detecting further components in the soot, with which method it is possible to detect a faulty soot sensor and/or further components in the soot in a cost-effective way, the evaluation circuit measures the temperature coefficient of the soot sensor and detects the defectiveness of the soot sensor and/or the presence of further components in the soot on the basis of the temperature coefficient of the soot sensor.

Abstract: A connecting element connects a brake pedal to a brake force amplifier of a vehicle brake system. A helical compression spring as a first spring element and a rubbery-elastic reaction disk as a second spring element are disposed between a pedal rod and a piston rod of the connecting element, the spring elements being installed in series due to the arrangement thereof. Due to the higher spring rate of the reaction disk preferably increasing with load, the connecting element has a progressive spring characteristic line. As soon as the pedal rod contacts the reaction disk the helical compression spring and the reaction disk act in parallel and serially such that the progression of the total spring characteristic line further increases.

Abstract: An automated cascade impactor is disclosed and comprises a vertical array of a plurality of impactor stages, and a vertical array of isolation stages, wherein the vertical array of the isolation stages comprises pairs of isolation stages between which impactor plates, removed from respective ones of the impactor stages are effectively sandwiched between each pair of isolation stages. Still further, each compactor stage is likewise sandwiched between and upper and a lower pair of the isolation stages.

Abstract: A retrievable downhole testing tool that is adapted to be temporarily installed in a well is disclosed. The retrievable downhole testing tool comprises a variable choke, a tool control unit adapted to control the variable choke, and at least two measuring sensors adapted to measure physical parameters including pressure. At least one measuring sensor is situated above the variable choke, and at least one measuring sensor is situated below the variable choke. The retrievable downhole testing tool is pre-programmed with a specified test sequence for controlling a downhole flow rate using the variable choke and for executing downhole measurements of physical parameters at specified flow periods. The specified test sequence is adapted according to a pre-defined stability criterion using the tool control unit.