Patents Examined by Mark R. Gaworecki
  • Patent number: 11865367
    Abstract: Provided is a setup method which can include: acquiring a position of a reference mark point provided on a noninvasive positioning device in an infrared coordinate system of an infrared positioning system; according to the position of the reference mark point in the infrared coordinate system, a relative position between the reference mark point and an image center point in an electronic scanning image, and a position of an isocenter of a radiotherapy equipment in a patient supporting device PSD coordinate system of the radiotherapy equipment, determining a first offset between the image center point and the isocenter in the PSD coordinate system; and adjusting the first offset to a first target offset by adjusting a position of a patient supporting device in the PSD coordinate system.
    Type: Grant
    Filed: March 18, 2019
    Date of Patent: January 9, 2024
    Assignees: OUR UNITED CORPORATION, SHENZHEN OUR NEW MEDICAL TECHNOLOGIES DEVELOPMENT CO., LTD.
    Inventors: Tianchang Gou, Hao Yan, Jinsheng Li
  • Patent number: 11865365
    Abstract: Disclosed herein are methods for personalized treatment of individual patient tumors. A computer software configured to integrate with a radiation therapy treatment planning system is presented. The computer software is configured to: assign a radiation sensitivity index (RSI) of a subject's tumor based at least in part on expression levels of one or more signature genes in the tumor; calculate a recommended personalized radiation dosage (RxRSI) for the subject based at least in part on a pre-determined genomic adjusted radiation dose (GARD) value and the RSI; and provide, to the radiation therapy treatment planning system, the recommended RxRSI as a radiation therapy dose for a radiation plan.
    Type: Grant
    Filed: December 30, 2022
    Date of Patent: January 9, 2024
    Assignee: CVERGENX, INC.
    Inventors: Jacob G. Scott, Javier Torres-Roca
  • Patent number: 11865369
    Abstract: Disclosed herein are systems and methods for identifying radiation therapy treatment data for patients. A processor accesses a neural network trained based on a first set of data generated from characteristic values of a first set of patients that received treatment at one or more first radiotherapy machines. The processor executes the neural network using a second set of data comprising characteristic values of a second set of patients receiving treatment at one or more second radiotherapy machines. The processor executes a calibration model using an output of the neural network based on the second set of data to output a calibration value. The processor executes the neural network using a set of characteristics of a first patient to output a first confidence score associated with a first treatment attribute. The processor then adjusts the first confidence score according to the calibration value to predict the first treatment attribute.
    Type: Grant
    Filed: February 27, 2023
    Date of Patent: January 9, 2024
    Assignee: Siemens Healthineers International AG
    Inventors: Mikko Hakala, Esa Kuusela, Elena Czeizler, Shahab Basiri
  • Patent number: 11857144
    Abstract: A longitudinal-positioning indicator, improved marking grid, and a method of use. The longitudinal-positioning indicator includes a substrate that has a first side on which a set of longitudinal-positioning guidelines are disposed, the set of longitudinal-positioning guidelines configured to indicate a position along a length of the longitudinal-positioning guidelines based on a cross-section of the longitudinal-positioning indicator taken substantially orthogonally to the set of longitudinal-positioning guidelines. The substrate also has a second side that is at least partially coated with an adhesive.
    Type: Grant
    Filed: March 27, 2023
    Date of Patent: January 2, 2024
    Inventors: Bradley Hammett, Stephanie Hammett
  • Patent number: 11860111
    Abstract: An image reconstruction method, includes: generating differential data indicating a difference between detection data generated by detecting X-ray that passed through a measurement object by irradiating X-rays to the measurement object and estimate data generated by estimating X-rays that are assumed to have been passed through an estimated structure having been generated by estimating a shape of the measurement object; and generating an image using the differential data and the estimated structure.
    Type: Grant
    Filed: May 20, 2020
    Date of Patent: January 2, 2024
    Assignee: NIKON CORPORATION
    Inventor: Atsushi Yamada
  • Patent number: 11862748
    Abstract: A cytometer includes an avalanche photodiode, a switching power supply, a filter, and voltage adjustment circuitry. The switching power supply includes a feedback loop. The filter is electrically connected between the switching power supply and the avalanche photodiode. The voltage adjustment circuitry adjusts a voltage on the feedback loop based at least in part on a voltage measured between the filter and the avalanche photodiode.
    Type: Grant
    Filed: February 1, 2023
    Date of Patent: January 2, 2024
    Assignee: ABS Global, Inc.
    Inventors: Frederick Savage, Glenn J. Szejna, Zheng Xia
  • Patent number: 11852583
    Abstract: An apparatus and a method for correctly measuring a phase of an extreme ultraviolet (EUV) mask and a method of fabricating an EUV mask including the method are described. The apparatus for measuring the phase of the EUV mask includes an EUV light source configured to generate and output EUV light, at least one mirror configured to reflect the EUV light as reflected EUV light incident on an EUV mask to be measured, a mask stage on which the EUV mask is arranged, a detector configured to receive the EUV light reflected from the EUV mask, to obtain a two-dimensional (2D) image, and to measure reflectivity and diffraction efficiency of the EUV mask, and a processor configured to determine a phase of the EUV mask by using the reflectivity and diffraction efficiency of the EUV mask.
    Type: Grant
    Filed: March 7, 2023
    Date of Patent: December 26, 2023
    Inventors: Jongju Park, Raewon Yi, Hakseung Han, Seongsue Kim
  • Patent number: 11844640
    Abstract: Methods for quantitatively separating x-ray images of a subject having three or more component materials into component images using spectral imaging or multiple-energy imaging with 2D radiographic hardware implemented with scatter removal methods. The multiple-energy system may be extended by implementing DRC multiple energy decomposition and K-edge subtraction imaging methods.
    Type: Grant
    Filed: March 3, 2022
    Date of Patent: December 19, 2023
    Assignee: XenseLab LLC
    Inventors: Ying Zhao, YongSheng Chao
  • Patent number: 11846595
    Abstract: A diffraction apparatus and a method for non-destructively testing internal crystal orientation uniformity of a workpiece are provided. The apparatus includes: an X-ray irradiation system for irradiating an X-ray to a measured part of a sample under testing, and an X-ray detection system for simultaneously detecting a plurality of diffracted X-rays formed by diffraction of a plurality of parts of the sample under testing, to measure an X-ray diffraction intensity distribution of the sample under testing, where the detected diffracted X-rays are short-wavelength characteristic X-rays, and the X-ray detection system is an array detection system. By the apparatus and the method, the detection efficiency is greatly improved.
    Type: Grant
    Filed: December 6, 2019
    Date of Patent: December 19, 2023
    Assignee: THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
    Inventors: Lin Zheng, Shitao Dou, Changguang He, Zhengkun Peng, Yong Xiao, Lunwu Zhang, Jin Zhang, Xianhe Feng
  • Patent number: 11841333
    Abstract: A method for detecting a target flaw using a radiographic inspection system includes selecting a plurality of simulated flaws. The method also includes performing a flaw detection simulation on the simulated flaws. The method also includes determining a plurality of output indication parameters for each of the simulated flaws based at least partially upon the flaw detection simulation. The output indication parameters include a contrast-to-noise ratio (CNR), a resolution ratio, a length-to-width (L/W) indication ratio, and a probability parameter. The method also includes determining a contrast-to-noise ratio sensitivity function (CNR SF) based at least partially upon the output indication parameters. The method also includes qualifying the radiographic inspection system to detect the target flaw based at least partially upon the CNR SF.
    Type: Grant
    Filed: March 9, 2022
    Date of Patent: December 12, 2023
    Inventor: Ajay M Koshti
  • Patent number: 11835334
    Abstract: In a shape measuring method a scattering intensity profile for a first electromagnetic wave is acquired for a substrate having a pattern thereon. A first expected scattering intensity profile for a first virtual structure corresponding to a first parameter group of first parameters including an attention parameter is acquired by a first simulation. A first convergence value is calculated for each of the first parameters in a first fitting process based on the scattering intensity profile and the first expected scattering intensity profile. A second expected scattering intensity profile is then acquired for a second virtual structure corresponding to a second parameter group of second parameters, which includes the attention parameter fixed to the first convergence value. A second convergence value for each of the second parameters is then calculated in a second fitting process based on the scattering intensity profile and the second expected scattering intensity profile.
    Type: Grant
    Filed: February 28, 2022
    Date of Patent: December 5, 2023
    Assignee: Kioxia Corporation
    Inventor: Kazuki Hagihara
  • Patent number: 11835456
    Abstract: A substance identification device, a substance identification method and a substance identification program that can identify substances with high accuracy by means of light are provided. A substance identification device 10 includes a setting unit 11 that sets an irradiation condition of excitation light, an irradiation unit 12 that irradiates an object 100 with the excitation light under the irradiation condition, a measurement unit 13 that measures emission data for delayed fluorescence or phosphorescence of the object 100 which occurs in response to the irradiation with the excitation light, and an identification unit 15 that identifies a substance constituting the object based on the emission data and emission data for delayed fluorescence or phosphorescence which are measured when a plurality of substances are each irradiated with the excitation light under the irradiation condition.
    Type: Grant
    Filed: September 18, 2019
    Date of Patent: December 5, 2023
    Assignee: The University of Tokyo
    Inventors: Tomohiko Hayakawa, Masatoshi Ishikawa, Norimasa Kishi, Haruka Ikeda
  • Patent number: 11821856
    Abstract: A device for examining a sample by X-radiation having a radiation generation system for generating primary radiation, a first goniometer arm on which the radiation generation system is mounted and which is pivotable about a goniometer axis, a detection system configured to detect secondary radiation emanating from the sample, a second goniometer arm on which the detection system is mounted and which is pivotable about the goniometer axis, and an evacuable sample chamber within which the sample is arrangeable in a sample region encompassing a portion of the goniometer axis, the sample chamber being delimited by a sample chamber wall which has a transmission region which is transmissive to the primary radiation and is vacuum-tight, in order to allow the primary radiation to penetrate into the sample chamber and to impinge on the sample region at different angles of incidence.
    Type: Grant
    Filed: May 25, 2022
    Date of Patent: November 21, 2023
    Assignee: Anton Paar GmbH
    Inventors: Josef Gautsch, Helmut Gartler
  • Patent number: 11821855
    Abstract: A sample holder capable of quickly and precisely performing single-crystal X-ray structure analysis by quickly and easily soaking a sample in a crystalline sponge, and also a sample holder unit and a soaking method therefor are provided. There are provided a sample holder used in a single-crystal X-ray structure analysis apparatus is provided, the sample holder comprising a base part attached to a goniometer in the single-crystal X-ray structure analysis apparatus; a sample holding part formed in the base part to hold the porous complex crystal capable of soaking the sample in a plurality of fine pores formed therein; and a sample introduction structure formed in the base part and introducing the sample to be soaked in the porous complex.
    Type: Grant
    Filed: November 21, 2019
    Date of Patent: November 21, 2023
    Assignee: Rigaku Corporation
    Inventor: Takashi Sato
  • Patent number: 11822027
    Abstract: A neutron position detector according to an embodiment includes a tubular enclosure used as a cathode, an anode located at an axial center inside the enclosure, and a gas that includes a 3He gas and an additive gas and is sealed inside the enclosure. The additive gas includes nitrogen as a quenching gas, and argon as a gas that reduces the ranges of reaction products as neutron and 3He gas.
    Type: Grant
    Filed: October 3, 2022
    Date of Patent: November 21, 2023
    Assignee: CANON ELECTRON TUBES & DEVICES CO., LTD.
    Inventors: Kazuya Ishizawa, Noriyuki Hikida
  • Patent number: 11815477
    Abstract: A method of non-destructive detection of surface and near surface abnormalities in a metallic product. The method comprises positioning a sample having a surface under a source of an incident radiation. The surface of the sample is then irradiated with the incident radiation from the source. A scattered radiation is detected and a radiation pattern from the detected scattered radiation is produced. Said radiation pattern is then analysed and the output indicative of the scattered radiation from the sample is produced. Said produced output is then compared with a threshold value, the threshold value indicative of a maximum acceptable detected surface abnormality. Finally, the presence of a surface abnormality is identified when the output exceeds the threshold value.
    Type: Grant
    Filed: March 25, 2020
    Date of Patent: November 14, 2023
    Assignee: THE UNIVERSITY OF SHEFFIELD
    Inventors: Matthew Brown, Peter Lawrence Crawforth, Bradley Peter Wynne, Hassan Ghadbeigi
  • Patent number: 11813107
    Abstract: A radiation reduction system that includes control logic for controlling an imaging device that is configured to provide an image of a subject during a medical procedure using electromagnetic radiation. The control logic automatically determines operating settings useful to generate one or more medically useful images of the subject while significantly reducing the overall radiation exposure to the subject and/or nearby personnel. The settings are determined based on factors such as age, body type, gender, and the like. The control logic may be in the imaging device, in a nearby computer such as a table or smart phone in communication with the imaging device, or in a remote server communicating with the imaging device directly, or via another computer.
    Type: Grant
    Filed: January 29, 2021
    Date of Patent: November 14, 2023
    Assignee: RADuxtion, LLC
    Inventors: Phillip R. Kingma, Letrisha Weber
  • Patent number: 11817522
    Abstract: A photodetector comprising a doped semiconductor photoabsorber, a barrier layer in contact with the photo absorber layer on one side, and at least one doped semiconductor contact area on the opposite side of the barrier layer. The barrier has a valence band energy substantially equal to the valence band energy of the photo absorber, and a thickness and a conductance band gap sufficient to allow tunneling of minority carriers, and block the flow of thermalized majority carriers from the photo absorber to the contact area. A P-doped or N-doped semiconductor may be utilized. The photoabsorber layer may extend past the one or more individual sections of the contact areas in the direction across the photo-detector.
    Type: Grant
    Filed: August 28, 2022
    Date of Patent: November 14, 2023
    Inventor: Shimon Maimon
  • Patent number: 11815349
    Abstract: In one embodiment, an automatic high-speed X-ray system may generate a high-resolution X-ray image of an inspected sample at a direction substantially orthogonal to a plane of the inspected sample. The system may determine a first cross-sectional shape of a first portion of a first element of interest in the inspected sample based on grayscale values of the X-ray image associated with the first element of interest. The system may determine a second cross-sectional shape of a second portion of the first element of interest in the inspected sample. The second cross-sectional shape may be determined based on the grayscale values of the X-ray image associated with the first element of interest. The system may determine one or more first metrological parameters associated with the first element of interest in the inspected sample based a comparison of the first cross-sectional shape and the second cross-sectional shape.
    Type: Grant
    Filed: August 4, 2021
    Date of Patent: November 14, 2023
    Assignee: Bruker Nano, Inc.
    Inventors: Brennan Lovelace Peterson, Hak Chuah Sim, Andrew George Reid, Nabil Farah Dawahre Olivieri
  • Patent number: 11817210
    Abstract: Disclosed herein are radiotherapy methods and systems that can display a workflow-oriented graphical user interface(s). In an embodiment, a method comprises retrieving, by a server, information from a radiotherapy file associated with a patient, the information comprising an alignment data of at least a treatment region of the patient; presenting, by the server, for display on a graphical user interface, an image corresponding to the patient positioned on a couch of a radiotherapy machine, the image comprising an overlay on a surface of the patient in the treatment region; and presenting, by the server, for display, a visually distinct revised overlay for at least a portion of the surface of the patient in the treatment region that matches, within a predetermined margin of error, the alignment data.
    Type: Grant
    Filed: December 30, 2020
    Date of Patent: November 14, 2023
    Assignee: VARIAN MEDICAL SYSTEMS, INC.
    Inventors: Filip Vojan, Brian Spatola