Patents Examined by Mary Catherine Baran
  • Patent number: 6714883
    Abstract: A system and method for use in signal measurement systems that acquire and store signal data in accordance with a trigger specification. The present invention stores and displays operator-generated annotations with each trigger branch of a trigger specification. The annotations, referred to herein as trigger branch comments, can provide meaningful information about, for example, the trigger branch condition, occurrence specification or resulting action, as well as any other aspect of the trigger specification. The branch comments are stored with the associated trigger branch as part of the instrument configuration, and are automatically restored when the configuration data is loaded into the instrument, and printed with the associated trigger branch. The display of the trigger branch comments for each trigger branch may be controlled individually or collectively to enable the operator to configure the display of the trigger specification as needed.
    Type: Grant
    Filed: August 21, 2000
    Date of Patent: March 30, 2004
    Assignee: Agilent Technologies, Inc.
    Inventor: Mason Bradfield Samuels
  • Patent number: 6711519
    Abstract: A method for the testing of electronic components, proposing an optimization of a duration for the tests of this method, includes the step of choosing an earliest possible measurement date (Dm) with respect to an initial testing date (Do). According to this method, this earliest possible measurement date is chosen by considering statistical images (IS) obtained on a population of components (P1, P2) and by comparing these statistical images with one another by means of a criterion. This criterion takes into account a mean and a range of the responses given by the test population during iterations of a same test with different measurement dates.
    Type: Grant
    Filed: July 25, 2001
    Date of Patent: March 23, 2004
    Assignee: Bealach no bo Finne teo/TA Galaxy
    Inventor: Philippe Lejeune
  • Patent number: 6711511
    Abstract: An apparatus analyzing electromagnetic waves radiated from an appliance using a net pattern of the appliance and having a coordinates data extracting unit extracting, from net pattern information, coordinates data defining the coordinates of each of terminal points of a plurality of segments constituting the net pattern; and a smoothing unit for dividing the net pattern, based on the extracted coordinates data, into plural object sections, each of a length not greater than a predetermined maximum length, and smoothing the net pattern for each object section, by replacing plural segments in each object section with a single, or a plurality of, straight lines smaller in number than the number of the segments. The electromagnetic field intensity of the electromagnetic waves is calculated on the basis of coordinates data for which smoothing is completed.
    Type: Grant
    Filed: March 20, 2001
    Date of Patent: March 23, 2004
    Assignee: Fujitsu Limited
    Inventors: Kenji Nagase, Shinichi Ohtsu
  • Patent number: 6708127
    Abstract: A method and apparatus are disclosed for simulating planar waveguides having a rectangular cross-section using a beam propagation method and design tool based on the FFT-BPM. Constraining the beam propagation method to planar waveguides having rectangular cross-sections significantly reduces the computational complexity and increases accuracy. The beam propagation method can be performed entirely in the angular spectrum domain. The constrained shape of the waveguide allows the structure to be accurately specified by its width and center-to-center arm spacing, thereby avoiding transverse spatial quantization.
    Type: Grant
    Filed: March 15, 2001
    Date of Patent: March 16, 2004
    Assignee: Lucent Technologies Inc.
    Inventor: Christopher Richard Doerr
  • Patent number: 6701256
    Abstract: A remote emissions sensing system and method for sensing exhaust emissions from motor vehicles is provided where the system determines the opacity of an exhaust plume. The system comprises a radiation source that emits radiation which is passed through the exhaust plume of a motor vehicle to one or more detectors arranged to receive the radiation. Multiple wavelength opacity measuring embodiments and monochromatic wavelength opacity measuring embodiments are disclosed.
    Type: Grant
    Filed: March 11, 2002
    Date of Patent: March 2, 2004
    Assignee: Environmental Systems Products Holdings Inc.
    Inventors: Donald H. Stedman, Gary A. Bishop, Gary Full
  • Patent number: 6691071
    Abstract: A method of synchronizing enablement of a common clock for a main and a second processor in an electronic device having a low-power mode includes a first step of completing a communication activity by the main processor. A next step includes monitoring a clock enable signal from the second processor. A next step includes comparing the timing of the second processor with the known timing of the main processor if the second processor does not have the clock enabled in the monitoring step. A next step includes calculating the the timing needed to synchronize the clock enablement by the second processor to that of the main processor. A next step includes powering up and powering down the second processor under control by the main processor to synchronize the periodic timing of the second processor to that of the main processor.
    Type: Grant
    Filed: May 13, 2002
    Date of Patent: February 10, 2004
    Assignee: Motorola, Inc.
    Inventors: John S. Kerr, Bokchain Koh, Arthur C. Leyh
  • Patent number: 6687650
    Abstract: An indoor environment design system 10 is composed of a target communication quality input section 12 for inputting a target communication quality of radio communication in a room, a signal propagation property calculation section 14 for calculating a delay spread in the room for implementation of the target communication quality, a signal propagation property conversion section 16 for converting the delay spread in the room thus calculated, to a delay spread in a laboratory, and an indoor environment design section 18 for designing an environment in the room for radio communication, based on the delay spread in the laboratory thus converted and on a relation between delay spreads in the laboratory and environments in the laboratory for implementation of the delay spreads in the laboratory, which is preliminarily obtained experimentally.
    Type: Grant
    Filed: June 5, 2001
    Date of Patent: February 3, 2004
    Assignee: Nitto Boseki Co., Ltd.
    Inventors: Hideyuki Hatanaka, Masato Ohtsubo, Sadaaki Arikawa
  • Patent number: 6684180
    Abstract: An apparatus, system and method for reporting field replaceable unit (FRU) replacements to a user are provided. The apparatus, system and method identify a FRU Replacement Order for an identified system error and then determines which of the FRUs in the FRU Replacement Order have already been replaced within a predetermined period of time from the current time. Those FRUs identified as having already been replaced are then flagged. The FRU Replacement Order is then output to the user with the flagged FRUs being output in a different manner than the other FRUs in the FRU Replacement Order.
    Type: Grant
    Filed: March 8, 2001
    Date of Patent: January 27, 2004
    Assignee: International Business Machines Corporation
    Inventors: Mark S. Edwards, Margaret E. Gretta, Arthur J. Tysor
  • Patent number: 6671645
    Abstract: A method for in-service RAM testing in computer systems and networks having a virtual memory. The method involves identifying a number n of physical memory units pi, i=1 . . . n, in the RAM and a number n−1 of virtual memory units vj, j=1 . . . n−1, in the virtual memory, performing a one-to-one mapping to map the physical memory units pi to virtual memory units vj such that a physical memory unit px is left unmapped, and then testing data in the unmapped physical memory unit px by destructive or non-destructive tests. After the test data from another physical memory unit py is copied to physical memory unit px and a one-to-one re-mapping of physical memory units pi to virtual memory units vj is performed such that physical memory unit py is left unmapped. The data in physical memory unit py is then tested and the steps of copying, one-to-one re-mapping and testing can be repeated until all physical memory units pi are tested.
    Type: Grant
    Filed: September 28, 2001
    Date of Patent: December 30, 2003
    Assignee: Ciena Corporation
    Inventor: Kenneth Mark Maxham
  • Patent number: 6671634
    Abstract: Reliability assessment of a power system having an integrated component is provided by retrieving individual component failure rates associated with individual components of the integrated component. A failure time is modeled based on the individual component failure rates associated with individual components of the integrated component. Individual component maintenance times are retrieved associated with individual components of the integrated component. A maintenance time is modeled based on the individual component maintenance times associated with individual components of the integrated component. A reliability assessment is determined based on the interconnectivity of components of the power system, the modeled maintenance times, and the modeled failure times.
    Type: Grant
    Filed: July 27, 2001
    Date of Patent: December 30, 2003
    Assignee: ABB Research Ltd.
    Inventors: Krassimir G. Koutlev, Richard E. Brown, Le Tang, Antonio C. Carvalho, Marta Lacorte, Hans-Erik Olovsson, Giuliano Guerra, Andre Osterholt, Carl-Ejnar Sölver
  • Patent number: 6662142
    Abstract: The system for providing information on quality and reliability according to the present invention includes: a first information communication terminal for outputting, as information on a side of a maker producing an optical semiconductor device, information gathered at a first time regarding a characteristic of the device; a second information communication terminal for outputting, as information on a side of a user using the device, information gathered at a second time regarding the characteristic of the device; and an information processing apparatus that (1) computes a rate of change in the characteristic of the device from the first time to the second time on the basis of the information outputted from the first and second information terminals, and (2) outputs a signal representing an abnormality to at least one of the first and second information terminals when the computed rate of change is out of a predetermined numerical range.
    Type: Grant
    Filed: November 28, 2001
    Date of Patent: December 9, 2003
    Assignee: Canon Kabushiki Kaisha
    Inventor: Shigemitsu Shiba
  • Patent number: 6662141
    Abstract: A Traffic Safety prediction Computer Program (TRAF-SAFE) and sub-models for predicting the number of accidents, injuries and fatalities expected annually at an intersection or series of intersections based on the particular intersection and roadway features. A finite analysis approach to an intersection is used to break the intersection into discrete elements such as lanes, turnbays, stop control signals, and traffic flow rates. The total annual expected accidents can then be calculated as a summation of the interrelation of the individual elements. A Poisson's distribution is used to statistically estimate the likelihood of the individual vehicles occurring within a discrete time frame being investigated. The conflict probabilities between various permutations of the traffic flow is then calculated and summed to determine the number of conflicts for the intersection or roadway.
    Type: Grant
    Filed: August 27, 2001
    Date of Patent: December 9, 2003
    Inventor: Alan R. Kaub
  • Patent number: 6654700
    Abstract: A reference clock is inputted into a target IC from a reference clock generator, and an output signal whose frequency is minutely deviated is converted into binary digital output data by a digitizer to be stored in an area A of memory. A computing unit generates digital data having the same period as a reference clock to store the digital data in an area B of the memory. Ternary numeric data is obtained by subtracting data in the area B from data in the area A of the memory to be stored in an area C of the memory. Data in the area C is added to the numeric data every fixed time and is stored in an area D of the memory. An amplitude of a waveform of this data is proportional to the deviation amount of a frequency, and, a period thereof corresponds to one period of deviation amount of a frequency. It is possible to easily implement a test for a deviation amount and a period of a frequency by obtaining the relation between the amplitude and deviation amount beforehand.
    Type: Grant
    Filed: October 24, 2001
    Date of Patent: November 25, 2003
    Assignee: Canon Kabushiki Kaisha
    Inventor: Kazuya Takahashi
  • Patent number: 6651032
    Abstract: Programming a reference voltage in a reference cell of a charge-based memory to a level that will maximize the predicted operational life of the memory, based on the application-specific predicted usage profile of the memory and the effects of that usage profile on the leakage curves of the various memory states. The different states of a memory cell may have different leakage rates, based on operational and environmental considerations, causing the cell to fail prematurely in one state, while having significant remaining life in the other state(s). The operational life of the memory can be increased by adjusting the reference threshold voltage so that the faster-leaking sate will last longer before failure occurs. Maximum operational life can be achieved by setting the reference voltage to maximize the predicted time-to-failure of the state with the shortest predicted time-to-failure.
    Type: Grant
    Filed: March 15, 2001
    Date of Patent: November 18, 2003
    Assignee: Intel Corporation
    Inventors: Jeffrey J. Peterson, David M. Dixon, Dow Ping D. Wong
  • Patent number: 6651034
    Abstract: An analysis scheduler for scheduling the automatic processing of performance data through a plurality of analysis tools is disclosed. Performance data provided to some of the tools by the analysis scheduler may be specified to be within a predetermined (but variable) look-back period. The analysis tools identify faults and anomalous conditions and also create repair recommendations, and automatically create problem cases when conditions warrant, or update existing problem cases with additional data, all under control of the analysis scheduler. The problem cases are reviewed by a human user and then forwarded to the railroad for implementation.
    Type: Grant
    Filed: July 31, 2000
    Date of Patent: November 18, 2003
    Assignee: General Electric Company
    Inventors: Eric H. Hedlund, Nicholas Edward Roddy, David Richard Gibson, Richard G. Bliley, James E. Pander, Ashish Puri, Thomas E. O'Camb, John Howard Lovelace, II, Steven Loncher
  • Patent number: 6633834
    Abstract: A network management node monitors network attributes of a network. The network management node is connected to network devices through the network and receives data values associated with measured network attributes from said network devices. The data values are stored in the network management node and a baseline value and rearm baseline value for a network attribute are calculated from a plurality of the received data values measured during a first period of time (e.g., a first time bucket). These data values are compared to the baseline value, and an alarm is generated in response to at least one of these data values exceeding the baseline value. The alarm is reset if at least one subsequently measured data value is below the rearm baseline value. The baseline value and rearm baseline value are recalculated from received data values measured during subsequent time buckets. Data values measured during the subsequent time buckets are compared to corresponding baseline and rearm baseline values.
    Type: Grant
    Filed: August 29, 2001
    Date of Patent: October 14, 2003
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Jeffrey Richard Conrad, Gary E. Mayle
  • Patent number: 6631340
    Abstract: A semiconductor test system for testing semiconductor devices has a plurality of different tester modules and an algorithmic pattern generator (ALPG) for generating an algorithmic pattern specific to an intended memory, thereby achieving a low cost and application specific memory test system. The semiconductor test system includes two or more tester modules whose performances are different from one another, an ALPG module for generating an algorithmic pattern which is specific to the memory, a test system main frame to accommodate a combination of the tester modules and the ALPG module, a test fixture for electrically connecting the tester modules and a device under test, a performance board provided on the test fixture for mounting the device under test, and a host computer for controlling an overall operation of the test system by communicating with the tester modules through a tester bus.
    Type: Grant
    Filed: October 15, 2001
    Date of Patent: October 7, 2003
    Assignee: Advantest Corp.
    Inventors: Shigeru Sugamori, Koji Takahashi, Hiroaki Yamoto
  • Patent number: 6629057
    Abstract: The present invention provides improved systems and methods for verifying accurate test performance of monitoring systems, particularly for point-of-care service. Such monitoring systems typically include a test element containing the test reagent(s), and an electronic analyzer device. A blood or other patient sample is applied to the test element, which is introduced to the analyzer. As the reaction proceeds, the analyzer stores the data and outputs the testing result. Accuracy in the result is dependent upon proper functioning of both the test element and the analyzer. The systems of the present invention provide indicators to evaluate the integrity of the test elements and a verification device to evaluate the performance of the analyzer. Such systems may be provided as kits with instructions for use.
    Type: Grant
    Filed: November 5, 1999
    Date of Patent: September 30, 2003
    Assignee: Beckman Coulter, Inc.
    Inventors: Stephen E. Zweig, Thomas D. Downey, Benjamin J. Spink, Benjamin G. Meyer
  • Patent number: 6625554
    Abstract: The present invention provides a magnetic field measuring method and system for determining the magnetic field of an integrated circuit (IC) inside the IC package, including the pre-packaged IC. In one embodiment, induced voltages due only to the magnetic field are determined at measurement heights on the order of the line spacings in an integrated circuit. A magnetic probe is used; the probe has a loop of wire parallel to the current, for measuring the induced voltage of the horizontal component of the magnetic field. The induced voltage due to the electric field is removed by using a calculation including the difference of two measurements. The magnetic field distribution for the integrated circuit may be determined by using the above procedure on a grid like pattern above the IC.
    Type: Grant
    Filed: June 22, 2001
    Date of Patent: September 23, 2003
    Assignee: Hitachi, Ltd.
    Inventors: Takashi Suga, Kouichi Uesaka, Satoshi Nakamura, Yoshihiko Hayashi
  • Patent number: 6611794
    Abstract: An apparatus for signal amplitude restoration has a received signal input and a scaled received signal output. An amplitude correction factor generator has an estimated signal-to-noise power ratio input and a received signal input. A variable gain amplifier uses the correction factor generator output to control its gain, and amplifies or attenuates the received signal input to provide the scaled received signal output. An average SNR estimator uses the amplifier output as its input, and provides an output connected to the estimated signal-to-noise power ratio input. The apparatus processes received signals in an iterative fashion, such that at least one of the outputs is stored for use as a feedback input during later iterations.
    Type: Grant
    Filed: August 9, 2000
    Date of Patent: August 26, 2003
    Assignee: Southwest Research Institute
    Inventor: Arthur Fleming-Dahl