Patents Examined by Michael J Logie
  • Patent number: 7771339
    Abstract: A method for radiotherapy treatment of a target organ in the vicinity of the rectum in an individual comprises withdrawing the rectum in a dorsal direction to increase a distance between the rectum and the target organ, and administering a therapeutical dose of radiation to the target organ while the rectum is in the withdrawn position. In one embodiment, the target organ is the prostate. A system for use in radiotherapy treatment of a target organ in the vicinity of the rectum in an individual comprises a cylindrical rectal rod adapted for insertion into a rectum of the individual, and a support surface operable to support an individual in a lithotomy position to receive a beam of radiation to the target organ. The system may further include a radiation source for administering a beam of radiation to the target organ of an individual.
    Type: Grant
    Filed: May 30, 2007
    Date of Patent: August 10, 2010
    Assignee: AB Mimator
    Inventors: Ulf Isacsson, Kristina Nilsson, Stefan Asplund
  • Patent number: 7767978
    Abstract: An ultraviolet (UV) water treatment device includes a housing with an inlet and an outlet. Water flows into the housing through the inlet, is exposed to the UV light, and the treated water then flows out of the housing through the outlet. The UV light source is inserted into a quartz tube from above so that the UV lamp can be changed without draining the system. A lower access port is provided in the bottom of the housing. The lower access port includes a seat that contains the lower end of the quartz tube, and further allows a user of the system to remove debris from a broken quartz tube quickly and safely.
    Type: Grant
    Filed: February 20, 2007
    Date of Patent: August 3, 2010
    Inventor: William Lim
  • Patent number: 7770231
    Abstract: A method and apparatus are provided that have the capability of rapidly scanning a large sample of arbitrary characteristics under force control feedback so has to obtain a high resolution image. The method includes generating relative scanning movement between a probe of the SPM and a sample to scan the probe through a scan range of at least 4 microns at a rate of at least 30 lines/sec and controlling probe-sample interaction with a force control slew rate of at least 1 mm/sec. A preferred SPM capable of achieving these results has a force controller having a force control bandwidth of at least closed loop bandwidth of at least 10 kHz.
    Type: Grant
    Filed: August 2, 2007
    Date of Patent: August 3, 2010
    Assignee: Veeco Instruments, Inc.
    Inventors: Craig Prater, Chanmin Su, Nghi Phan, Jeffrey M. Markakis, Craig Cusworth, Jian Shi, Johannes H. Kindt, Steven F. Nagle, Wenjun Fan
  • Patent number: 7765606
    Abstract: A scanning probe apparatus for obtaining information of a sample, recording information in the sample, or processing the sample with relative movement between the sample and the apparatus, the apparatus is constituted by a probe; and a scanning stage including a drive element for moving a sample holding table for holding the sample and a movable portion movable in a direction in which an inertial force generated during movement of the sample holding table is cancelled. The scanning stage further includes a memory for storing characteristic information of the scanning stage and is detachably or replaceably mountable to a main assembly of the apparatus.
    Type: Grant
    Filed: January 26, 2007
    Date of Patent: July 27, 2010
    Assignee: Canon Kabushiki Kaisha
    Inventors: Takao Kusaka, Nobuki Yoshimatsu, Susumu Yasuda, Junichi Seki
  • Patent number: 7759873
    Abstract: An identification system for a light radiation source (103) having a control circuit (107) for communicating with an identification circuit (108) associated with the light radiation source, wherein the identification circuit is arranged for storing data relating to the light radiation source. During operation, the control circuit communicates with the identification circuit via a signal path comprising at least a portion of a first electric wire (112) provided for energizing the light radiation source such that it is used as a first transmitting antenna for communicating with the identification circuit. The operation of the light radiation source is controlled in dependence on the data retrieved from the identification circuit. Depending on the result of the identification, operation of the light radiation source can be authorized or prevented, thus blocking the use of an incorrect radiation source for a given application.
    Type: Grant
    Filed: April 20, 2006
    Date of Patent: July 20, 2010
    Assignee: Koninklijke Philips Electronics N.V.
    Inventors: Olaf Mastenbroek, Klaas Jacob Lulofs
  • Patent number: 7759655
    Abstract: A variable duty cycle ion source assembly is coupled to a continuous beam mass spectrometer. The duty cycle can be adjusted based on previous scan data or real time sampling of ion intensities during mass analysis. This provides the ability to dynamically control the total number of ions formed, mass analyzed and detected for each ion mass of interest. A reflection mechanism that provides a variable duty cycle, enables electrons to be reflected through an ion volume multiple times before atoms or molecules are ionized in the ion volume, thereby providing for dynamic control of the ion population.
    Type: Grant
    Filed: July 11, 2006
    Date of Patent: July 20, 2010
    Assignee: Thermo Finnigan LLC
    Inventor: Edward B. McCauley
  • Patent number: 7755034
    Abstract: A quadrupole ion trap includes a switch 3 for switching a trapping voltage between discrete voltage levels VH, VL. This creates a digital trapping field for trapping precursor ions and product ions in a trapping region of the ion trap. A gating voltage is applied to a gate electrode 12 to control injection of source electrons into the ion trap. Application of the gating voltage is synchronised with the switching so that electrons are injected into the trapping region while the trapping voltage is at a selected one of the voltage levels and can reach the trapping region with a kinetic energy suitable for electron capture dissociation to take place.
    Type: Grant
    Filed: February 23, 2005
    Date of Patent: July 13, 2010
    Assignee: Shimadzu Research Laboratory (Europe) Limited
    Inventor: Li Ding
  • Patent number: 7750292
    Abstract: A portable mass spectrometer system is described. The system includes a mass spectrometer device incorporated within an evacuated chamber. The chamber includes a permeable membrane located between the mass spectrometer device and an entrance port to the chamber. Located between the membrane and the entrance port is a valve. The valve is provided in an normally closed state and has an open state, such that, in use, the adoption of the open state allows the flow of the sample into the chamber through the membrane and into contact with the spectrometer device.
    Type: Grant
    Filed: January 13, 2005
    Date of Patent: July 6, 2010
    Assignee: Microsaic Systems Limited
    Inventor: Alan Finlay
  • Patent number: 7741620
    Abstract: The invention discloses a multibeam modulator which generates a plurality of individual beams from a particle beam. The particle beam illuminates the multibeam modulator at least partially over its surface. The multibeam modulator comprises a plurality of aperture groups composed of aperture row groups. The totality of all aperture rows defines a matrix of m×n cells, where m cells form a row, and k openings are formed in each row. The density of openings within a row is inhomogeneously distributed.
    Type: Grant
    Filed: October 25, 2005
    Date of Patent: June 22, 2010
    Assignee: Vistec Electron Beam GmbH
    Inventors: Hans-Joachim Doering, Joachim Heinitz
  • Patent number: 7741602
    Abstract: A phase contrast electron microscope has an objective (8) with a back focal plane (10), a first diffraction lens (11), which images the back focal plane (10) of the objective (8) magnified into a diffraction intermediate image plane, a second diffraction lens (15) whose principal plane is mounted in the proximity of the diffraction intermediate image plane and a phase-shifting element (16) which is mounted in or in the proximity of the diffraction intermediate image plane. Also, a phase contrast electron microscope has an objective (8) having a back focal plane (10), a first diffraction lens (11), a first phase-shifting element and a second phase-shifting element which is mounted in or in the proximity of the diffraction intermediate image plane. The first diffraction lens (11) images the back focal plane of the objective magnified into a diffraction intermediate image plane and the first phase-shifting element is mounted in the back focal plane (10) of the objective (8).
    Type: Grant
    Filed: March 13, 2007
    Date of Patent: June 22, 2010
    Assignee: Carl Zeiss NTS GmbH
    Inventors: Gerd Benner, Marko Matijevic
  • Patent number: 7728308
    Abstract: A beam blanking unit (1) comprises first and second blanking plates (2, 3) mounted to a support plate (15). A stopper (4) is mechanically and electrically connected to the first blanking plate (2).
    Type: Grant
    Filed: May 13, 2005
    Date of Patent: June 1, 2010
    Assignee: Nanobeam Limited
    Inventor: Tao Zhang
  • Patent number: 7723681
    Abstract: For the purpose of repeatedly observing the bottom of a contact hole with a high aspect ratio, the potential of an electrostatic charge in each of a pattern to be observed and a vicinity of a range to be observed is stabilized by pre-charging a range on which to irradiate a beam of electrons while changing the range on a step-by-step basis.
    Type: Grant
    Filed: October 12, 2007
    Date of Patent: May 25, 2010
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yuki Ojima, Satoru Iwama, Akira Ikegami
  • Patent number: 7718958
    Abstract: A mass spectroscopic reaction-monitoring method including: forcing charge-laden liquid drops to move along a traveling path; exposing to a laser beam a region to be formed of a liquid sample surface, the laser beam having an irradiation energy sufficient to cause analytes present behind the liquid sample surface to be desorbed to fly along a flying path; introducing to the region at successive points of time a liquid sample containing one reactant that undergoes an ongoing chemical reaction as a first analyte to form one product as a second analyte; and positioning the liquid sample surface relative to the laser beam at each point of time such that the flying path intersects the traveling path for enabling occlusion of at least one of the first and second analytes in at least one charge-laden liquid drop to thereby form at least a corresponding one of first and second ionized analytes.
    Type: Grant
    Filed: October 29, 2007
    Date of Patent: May 18, 2010
    Assignee: National Sun Yat-Sen University
    Inventors: Jentaie Shiea, Cheng-Hui Yuan, Jhih-Yuan Jheng
  • Patent number: 7718962
    Abstract: The present invention is directed to a defect imaging device that has an energy beam that is directed at a device under test. The energy beam creates positrons deep within the material of the device under test. When the positrons combine with electrons in the material they produce a pair of annihilation photons. The annihilation photons are detected. The Doppler broadening of the annihilation photons is used to determine if a defect is present in the material. Three dimensional images of the device under test are created by directing the energy beam at different portions of the device under test.
    Type: Grant
    Filed: May 29, 2007
    Date of Patent: May 18, 2010
    Assignee: Idaho State University and the Board of Educa
    Inventors: Alan W. Hunt, J. Frank Harmon, Douglas P. Wells
  • Patent number: 7709817
    Abstract: A method of tuning an ion beam in an ion implanter relative to, e.g., ion beam current, energy, size and shape, includes retrieving a set of parameters associated with operation of the ion implanter, at least some of which are stored in a dynamic database, configuring the ion implanter according to the retrieved set of parameters, to thereby provide an ion beam, optimizing the ion beam by varying one or more of the parameters, and updating the parameters stored in the dynamic database which changed during optimization.
    Type: Grant
    Filed: June 4, 2007
    Date of Patent: May 4, 2010
    Assignee: Applied Materials, Inc.
    Inventors: Christopher Burgess, Martin Keane
  • Patent number: 7709788
    Abstract: An explosive and narcotics detection system using an ion mobility spectrometer detects the presence of vapor or trace particles of target chemicals. The calibration of the spectrometer depends in part on the stability of a calibrant chemical that may be periodically injected together with sample gas into the ionization region of the spectrometer. The calibrant chemical produces a signal with a drift time that is known relative to target chemicals and may be used to calibrate the expected target chemical drift times. A new calibrant chemical, 5-nitrovanillin, is disclosed for this purpose.
    Type: Grant
    Filed: December 31, 2007
    Date of Patent: May 4, 2010
    Assignee: Implant Sciences Corporation
    Inventors: Edward Geraghty, Vladimir Kekukh, Stephen N. Bunker
  • Patent number: 7690047
    Abstract: A scanning probe apparatus for obtaining information of a sample, recording information in the sample, or processing the sample with relative movement between the sample and the apparatus, the apparatus is constituted by a probe; and a scanning stage including a drive element for moving a sample holding table for holding the sample and a movable portion movable in a direction in which an inertial force generated during movement of the sample holding table is cancelled. The scanning stage further includes a drive circuit for driving the scanning stage and is detachably or replaceably mountable to a main assembly of the apparatus.
    Type: Grant
    Filed: January 26, 2007
    Date of Patent: March 30, 2010
    Assignee: Canon Kabushiki Kaisha
    Inventors: Susumu Yasuda, Junichi Seki, Takao Kusaka, Nobuki Yoshimatsu
  • Patent number: 7683348
    Abstract: A Faraday cup structure for use with a processing tool. The cup structure has a conductive strike plate coupled to a circuit for monitoring ions striking the strike plate to obtain an indication of the ion beam current. The electrically conductive strike plate is fronted by a mask for dividing an ion beam intercepting cross section into regions or segments. The mask including walls extending to the strike plate for impeding ions reaching the sensor and particles dislodged from the sensor from entering into the evacuated region of the processing tool.
    Type: Grant
    Filed: October 11, 2006
    Date of Patent: March 23, 2010
    Assignee: Axcelis Technologies, Inc.
    Inventors: W Davis Lee, Neil K Colvin
  • Patent number: 7679071
    Abstract: An example electron beam drawing apparatus includes an electron beam emitting unit which emits an electron beam, a rotary stage which rotatably supports a turntable for retaining a drawing object, and a sample stage which is supported by the turntable in a range including a rotating center of the turntable to retain an adjustment sample. A rotationally symmetrical pattern such as a concentric pattern and a radial pattern can be drawn in the drawing object by irradiating the drawing object with the electron beam during rotation of the turntable. Before the pattern is actually drawn in the drawing object, beam adjustment and rotating center adjustment are performed using an adjustment sample. The adjustment sample is retained by the sample stage, and the sample stage is supported by the turntable in the range including the rotating center of the turntable.
    Type: Grant
    Filed: June 21, 2005
    Date of Patent: March 16, 2010
    Assignee: Pioneer Corporation
    Inventor: Hiroaki Kitahara
  • Patent number: 7675046
    Abstract: An apparatus includes a conductive structure and an insulated conductor disposed proximate an exterior portion of the conductive structure to modify an electric field about the conductive structure. The insulated conductor has an insulator with a dielectric strength greater than 75 kilovolts (kV)/inch disposed about a conductor. An ion implanter is also provided. The ion implanter includes an ion source configured to provide an ion beam, a terminal structure defining a cavity, the ion source at least partially disposed within the cavity, and an insulated conductor. The insulated conductor is disposed proximate an exterior portion of the terminal structure to modify an electric field about the terminal structure. The insulated conductor has an insulator with a dielectric strength greater than 75 kV/inch disposed about a conductor.
    Type: Grant
    Filed: September 27, 2006
    Date of Patent: March 9, 2010
    Assignee: Varian Semiconductor Equipment Associates, Inc
    Inventors: Kasegn D. Tekletsadik, Russell J. Low