Abstract: A thermal probe and method for generating a thermal map (M) of a sample interface (1). A scanning thermal microscope (100) is provided having at least one or more probe tips (11,12). The probe tips (11,12) are scanned at a near-field distance (D1) over the sample interface (1). Heat flux data (H) is recorded as a function of a relative position (X,Y) of the probe tip (11) over the sample interface (1). The thermal map (M) is calculated from the recorded heat flux data (H) based on a spatially resolved heat flux profile (P) of the probe tip (11) at the sample interface (1). The heat flux profile (P) has a local maximum at a lateral distance (R) across the sample interface (1) with respect to an apex (11a) of the probe tip (11).

Abstract: Provided is a sample plate for mass spectrometric analysis, which comprises a substrate and a metal thin film formed on the substrate. The metal thin film contains Ag, Al or Cu as the main component and further contains a specific additive element MAg, MAl or MCu depending on the element as the main component, in a ratio (MAg/Ag) of the total number of atoms of the additive element MAg to the number of atoms of Ag of from 0.001 to 0.5, a ratio (MAl/Al) of the total number of atoms of the additive element MAl to the number of atoms of Al of from 0.001 to 0.5, or a ratio (MCu/Cu) of the total number of atoms of the additive element MCu to the number of atoms of Cu of from 0.001 to 0.5.

Abstract: An installation for sterilizing articles by radiation, the installation having a radiation-generator device and an article support device disposed facing the radiation-generator device. Devices for moving the articles in front of the radiation-generator device are provided. The article support device comprises devices for varying the orientation of the articles when the articles move in front of the radiation-generator device.

Abstract: An ion source is disclosed that alternates between ionizing analytes in a sample by electrospray ionization and impact ionization.

Abstract: The IMS apparatus and methods described in this invention involve setting the ion detector at the highest potential of the drift tube and setting the ionization source at ground or near ground potential. The methods allow significantly simple sample introduction without the limitation of the high potential (voltage) concern of the front end sample delivery. The invention also describes bringing samples directly into the ion mobility drift tube. The invention further describes using single syringe for sample introduction via an electrospray ionization method.

Abstract: An ion guide comprises a first ion guide portion that forms a first ion guiding path and a second ion guide portion that forms a second ion guiding path. A first device applies a plurality of different first voltages or potentials to the electrodes of the first ion guide portion in order to generate an electric field that directs ions from the first ion guiding path of the first ion guide portion into the second ion guiding path of the second ion guide portion. The use of plural different first voltages can provide a controlled transfer of ions from the first ion guiding path into the second ion guiding path.

Abstract: A scanning probe microscopy system for mapping nanostructures on a surface of a sample is described. The nanostructures include at least one face having a slope with a slope angle that exceeds a threshold. The system includes a metrology frame, a sample support structure, a sensor head including a probe which includes a cantilever and a probe tip, and an actuator for scanning the probe tip relative to the substrate surface. For sensing the nanostructures, the probe tip is arranged under a fixed offset angle with respect to the sensor head such as to be angled relative to the sample surface. The system further includes a sensor head carrier for receiving the sensor head, the sensor head carrier and the sensor head being provided with a mutually cooperating mounting structure for forming a kinematic mount having at least three contact points for detachable mounting of the sensor head on the sensor head carrier.

Abstract: Reflectron-electromagnetostatic cells for use in mass spectrometers are provided herein that cause ion packets to pass through the cell a plurality of times during fragmentation.

Abstract: A time of flight (“TOF”) mass spectrometer including an ion source, a detector, and a tilt correction device. The ion source is configured to produce ions having a plurality of m/z values. The detector detects ions produced by the ion source. The tilt correction device is located along a portion of a reference ion flight path extending from the ion source to a planar surface of the detector and includes tilt correction electrodes configured to generate at least one dipole electric field across the reference ion flight path. The at least one dipole electric field is configured to tilt an isochronous plane of ions produced by the ion source so as to correct a previous angular misalignment between the isochronous plane and the planar surface of the detector.

Abstract: A photonic probe for atomic force microscopy includes: a cantilever including: a tip; a wing in mechanical communication with the tip; an extension interposed between the tip and the wing to synchronously communicate motion of the tip with the wing; an optical resonator disposed proximate to the cantilever and that: receives input light; and produces output light, such that: the cantilever is spaced by a gap distance from the optical resonator, wherein the gap distance varies as the cantilever moves relative to the optical resonator, and the output light differs from the input light in response to movement of the cantilever relative to the optical resonator; an optical waveguide in optical communication with the optical resonator and that: provides the input light to the optical resonator; and receives the output light from the optical resonator.

Abstract: One embodiment of the present disclosure provides an ion mobility spectrometry (IMS) device for performing chemical analysis. The IMS device includes a first set of electrodes arranged linearly in a first direction and separated by a first set of gaps. The IMS device includes a second set of electrodes positioned directly opposing the first set of electrodes to match the first set of electrodes on a one-to-one basis, wherein the second set of electrodes are separated by a second set of gaps. The IMS device includes a drift region between the first set of electrodes and the second set of electrodes, wherein charged particles enter at a first end of the drift region and traverse the drift region along the first direction. The IMS device additionally includes a detector positioned at a second end of the drift region and configured to receive charged particles exiting the drift region.

Abstract: An ion trap device is provided as well as a method of manufacturing the ion trap device including a substrate, central DC electrode, RF electrode, side electrode and an insulating layer. Disposed over the substrate, the central DC electrode includes DC connector pad and DC rail connected thereto. The RF electrode includes RF rail adjacent to the DC rail and RF pad connected to RF rail. The side electrode has RF electrode disposed between thereof and the central DC electrode. The insulating layer supports one of the central DC electrode, RF electrode and side electrode, on a top surface of the substrate. The insulating layer includes first insulating layer and second insulating layer disposed over the first insulating layer, and the second insulating layer includes an overhang protruding with respect to the first insulating layer in a width direction of the ion trap device.

Abstract: Two complementary approaches to the science of IMS technology, IMS and differential IMS (DIMS), are combined into a single instrument to provide improvements in interference rejection without sacrificing detection sensitivity. The technology is applicable to, inter alia, the analysis of trace quantities of toxic or otherwise dangerous organic chemical materials. The approach improves both sensitivity and specificity (interference rejection) of field detection instrumentation.

Abstract: According to an embodiment, X-ray CT apparatus includes X-ray generator includes X-ray tube, high-voltage generator, detector, controller and circuitry. High-voltage generator generates tube voltage to be applied to X-ray tube. Detector detects X-rays irradiated from X-ray tube and transmitted through a subject. Controller controls high-voltage generator to scan the subject with first radiation dose and with second radiation dose lower than first radiation dose. Circuitry generates first image based on projection data acquired by scan at first radiation dose, generates second image based on projection data acquired by scan at second radiation dose, and displays first image and second image in common window.

Abstract: An ion trap device is disclosed with a method of manufacturing thereof including a substrate, first and second RF electrode rails, first and second DC electrodes on either upper or lower side of substrate, and a laser penetration passage connected to ion trapping zone from outer side of the first or second side of substrate. The substrate includes ion trapping zone in space defined by first and second sides of substrate separated by a distance with reference to width direction of ion trap device. The first and second RF electrode rails are arranged in parallel longitudinally of ion trap device. The first RF electrode is arranged on upper side of first side, the second DC electrode is arranged on lower side of first side, the first DC electrode is arranged on upper side of second side, and the second RF electrode rail is arranged on lower side of second side.

Abstract: A high-voltage power source for applying high voltage to a nozzle of an ESI ion source includes a charge release assistant section including switch circuits and other elements for forcing electric charges accumulated at output terminals to be discharged in a polarity-switching operation, whereby the positive/negative switching of the polarity of the output voltage can be quickly performed. For example, when the voltage applied to the nozzle needs to be changed from V1 to V2 (where V1 and V2 are positive, and V1>V2), a voltage control section operates a positive voltage generation section and negative voltage generation section so as to temporarily provide a negative output voltage. After a predetermined period of time, the voltage control section operates the positive voltage generation section and negative voltage generation section so as to provide voltage V2.

Abstract: There is provided an objective lens capable of reducing the effects of magnetic fields on a sample. The objective lens includes a first lens and a second lens. The lenses are arranged so that the component of the magnetic field of the first lens lying along the optical axis and the component of the magnetic field of the second lens lying along the optical axis cancel out each other at a sample placement surface. The first and second lenses each include an inner polepiece and an outer polepiece. The inner polepieces have front end portions, respectively. The outer polepieces have front end portions, respectively, which jut out toward the optical axis. The distances of the front end portions of the outer polepieces, respectively, from the sample placement surface are less than the distances of the front end portions of the inner polepieces, respectively, from the sample placement surface.

Abstract: The invention generally relates to methods of analyzing crude oil. In certain embodiments, methods of the invention involve obtaining a crude oil sample, and subjecting the crude oil sample to mass spectrometry analysis. In certain embodiments, the method is performed without any sample pre-purification steps.

Abstract: The present invention relates to a method for measuring porosity of a rock according to the present invention including: (a) capturing a first image by using SEM with respect to a rock sample; (b) determining a first area of a portion determined to be a heavy mineral in the first image; (c) immersing the rock sample in an aqueous solution in which a gadolinium compound is dissolved in that the aqueous solution flows into pores and the gadolinium compound is deposited in pores inside the rock sample; (d) capturing a second image by using SEM with respect to the rock sample; and (e) determining a second area of a portion determined as a heavy mineral and a pore in the second image, and then subtracting the first area from the second area to determine an area of pores in the rock sample.

Abstract: A method of static gas mass spectrometry is provided. The method includes the steps of: introducing a sample gas comprising two or more isotopes to be analyzed into a static vacuum mass spectrometer at a time, t0; operating an electron impact ionization source of the mass spectrometer with a first electron energy below the ionization potential of the sample gas for a first period of time that is following t0 until a time t1; and operating the electron impact ionization source with a second electron energy at least as high as the ionization potential of the sample gas for a second period of time that is after time t1. The first time period from t0 to t1 is a period corresponding to a period taken for the isotopes of the sample gas to equilibrate in the mass spectrometer. A constant ion source temperature is preferably maintained. Also provided is a static gas mass spectrometer.