Patents Examined by Mirellys Jagan
  • Patent number: 11237122
    Abstract: The invention discloses a apparatus and a method for rapid measurement of heat capacity of a thin film material. Specifically, the apparatus comprises a control device, a clock synchronizer, a flat peak laser device, a rapid thermometer and a heat capacity output device; the control device and the clock synchronizer are signally connected, and the clock synchronizer is signally connected to the flat peak laser device and the rapid thermometer; In the working state, the control device sends a start signal to the clock synchronizer, and the flat peak laser device and the fast thermometer coordinately cooperate; the flat peak laser device irradiates a laser with a spatially flat peak to the surface of the sample; At the same time, the rapid thermometer captures the surface temperature of the sample at a certain point in time during the heating process of the sample, and inputs the measured data into the heat capacity output device to obtain the desired heat capacity parameter.
    Type: Grant
    Filed: March 26, 2019
    Date of Patent: February 1, 2022
    Assignee: NINGBO GALAXY MATERIALS TECHNOLOGY CO. LTD.
    Inventors: Xiao-dong Xiang, Yuewei Wu, Xiao-ping Wang
  • Patent number: 11237066
    Abstract: A temperature-determining device for determining a temperature (TMED) of a medium via a temperature of a surface includes: an ambient-temperature sensor, arranged in surroundings of the surface, for measuring an ambient temperature (TU); a surface-temperature sensor, lying on the surface, for measuring a mixed temperature (TM) lying between the temperature (TMED) of a medium and the ambient temperature (TU); and an arithmetic-logic unit having an approximation formula electronically stored thereon for calculating an approximation (TMEDN) of a temperature of a medium. The approximation formula is a sum of the mixed temperature (TM) and a product of two factors. The first factor results from a difference between the mixed temperature (TM) and the ambient temperature (TU) and the second factor results from a ratio of a dividend to a quotient. The dividend results from a difference between a calibration temperature (TMEDKAL) of a medium and a calibration mixed temperature (TMKAL).
    Type: Grant
    Filed: October 11, 2018
    Date of Patent: February 1, 2022
    Assignee: ABB SCHWEIZ AG
    Inventor: Tilo Merlin
  • Patent number: 11237065
    Abstract: A temperature sensor having a two-state input current, an element whose temperature is sensed based on a change in voltage across the element induced by the two states of the input current, a charge-to-digital converter, and a capacitor continuously connected between the element and the charge-to-digital converter. The capacitor experiences a charge difference due to the change in voltage across the element induced by the two states of the input current, and the charge-to-digital converter converts the charge difference to a digital value indicative of the temperature of the element. A two-state DC-shifting current having opposite polarity of the two-state input current, a pull-down resistor whose voltage varies with the two-states of the DC-shifting current, and a second capacitor continuously connected between the pull-down resistor and the charge-to-digital converter operate to shift down a DC operating point of the charge-to-voltage converter to increase its dynamic range.
    Type: Grant
    Filed: April 16, 2019
    Date of Patent: February 1, 2022
    Assignee: Cirrus Logic, Inc.
    Inventors: Ramin Zanbaghi, John L. Melanson
  • Patent number: 11237064
    Abstract: A temperature sensor includes a pair of thermocouple wires, a temperature measuring junction formed by joining tip ends of the pair of thermocouple wires together, an outer tube having a tip end provided with a tip end cover in which the temperature measuring junction is held, an insulator insulating the pair of thermocouple wires from the outer tube, and a glass seal filled in a base end of the outer tube to seal the outer tube from inside thereof. The glass seal contains bubbles which are independent of each other.
    Type: Grant
    Filed: July 31, 2020
    Date of Patent: February 1, 2022
    Assignee: DENSO CORPORATION
    Inventors: Motoki Sato, Takahiro Ogura
  • Patent number: 11231330
    Abstract: Temperature probe hubs are disclosed. An example temperature probe hub includes a housing, a drain, and a probe jack. The drain extends through the housing. The probe jack is located within the housing in fluid communication with the drain. The drain is configured to remove fluid from the probe jack.
    Type: Grant
    Filed: November 26, 2019
    Date of Patent: January 25, 2022
    Assignee: WEBER-STEPHEN PRODUCTS LLC
    Inventors: Nikhil Bhogal, Mathias Schmidt, Kevin Glennon, Angela Schilt, Jose Martinez, Nicholas Edward Beyrer
  • Patent number: 11221258
    Abstract: A measuring device for ascertaining the temperature of a roller surface of a roller body is insertable into a recess of the roller body and includes at least first and second temperature sensors, a mounting rod on which the sensors are situated in the axial direction of the mounting rod spaced apart from each another, and, on each side of each respective one of the temperature sensor in the axial direction a respective supporting element arranged on the mounting rod. Between the supporting elements, the mounting rod is flexible such that each of the temperature sensors is able to be pressed onto an inner wall of the recess with a defined contact force.
    Type: Grant
    Filed: August 10, 2017
    Date of Patent: January 11, 2022
    Assignee: Robert Bosch GmbH
    Inventors: Ahmed Garamoun, Hannes Rose, Holger Frank, Peter Kunert, Ronny Ludwig
  • Patent number: 11209324
    Abstract: An apparatus and method for sensing body temperature and wirelessly communicating measured data to at least one electronic device. The device includes a sensor device having a housing base, a housing cover releasably mountable on the housing base, and components for sensing body temperature and wirelessly communicating the measured temperature, including a temperature sensor, a power supply, a microprocessor, and a transmitter and receiver. The electronic device can include an application that communicates with the sensor device and provides a user interface.
    Type: Grant
    Filed: July 15, 2019
    Date of Patent: December 28, 2021
    Assignee: Hubbell Incorporated
    Inventors: Christopher J. Allen, Sr., Shawn Monteith
  • Patent number: 11193901
    Abstract: The object of the invention is to provide a thermal conductivity measuring device that comprises a heat generator arranged in such a way as to come into contact with an object to be measured for thermal conductivity, a heat resistant material arranged in such a way as to come into contact with the heat generator, at least one pair of differential thermocouples for measuring a voltage value caused by the difference in temperature of two points of the heat resistant material, the temperature being generated by allowing heat to flow from the heat generator, and a calculating device for calculating the time rate of change of output voltage of the differential thermocouples and then calculating the thermal conductivity of the object to be measured on the basis of the calculated time rate of change.
    Type: Grant
    Filed: November 29, 2016
    Date of Patent: December 7, 2021
    Assignee: EKO INSTRUMENTS CO., LTD.
    Inventors: Toshikazu Hasegawa, Yukihiro Goto, Isamu Chiba
  • Patent number: 11193902
    Abstract: The disclosure provides a method for measuring the transverse thermal conductivity of a thin film. The method comprises the steps of measuring the longitudinal thermal conductivity of a thin film to be measured by using a 3? method and by taking a second metal strip deposited on the surface of the thin film to be measured as a heating source at first; measuring the temperature rise of the thin film to be measured in the longitudinal direction by using the 3? method, and deducing the thermal power of the thin film to be measured in the longitudinal direction; and finally, calculating the transverse thermal conductivity of the thin film to be measured. By adopting a ‘substrate/thin film to be measured/metal strip’ sample structure, the process difficulty of preparing a suspension structure sample can be effectively avoided.
    Type: Grant
    Filed: September 15, 2017
    Date of Patent: December 7, 2021
    Assignee: WUHAN JOULE YACHT SCIENCE & TECHNOLOGY CO., LTD.
    Inventors: Xiangshui Miao, Hao Tong, Kaizhan Wang, Yuanbing Wang, Lingjun Zhou, Yingrui Cai
  • Patent number: 11187592
    Abstract: A thermocouple arrangement comprising: a first thermocouple including a first thermoelement and a second thermoelement coupled at a first junction, the first junction subject to a first temperature, the second material different from the first material; a second thermocouple including a third thermoelement and a fourth thermoelement coupled to the third thermoelement at a second junction connected to the first thermoelement, the second junction arranged at a second portion subject to a second temperature, the fourth material different from the third material; and a third thermocouple including a fifth thermoelement and a sixth thermoelement coupled to the fifth thermoelement at a third junction connected to the second thermoelement, the third junction arranged at the second portion exposed to the second temperature, the fifth material different from the third material and the fourth material, the sixth material different from the third material, the fourth material, and the fifth material.
    Type: Grant
    Filed: May 3, 2018
    Date of Patent: November 30, 2021
    Assignee: VITESCO TECHNOLOGIES GMBH
    Inventor: Tomás̆ Gajdarus
  • Patent number: 11187593
    Abstract: A Proportional-To-Absolute-Temperature (PTAT) current source is used for high-resolution temperature measurement. The PTAT current source is coupled to a capacitor for a fixed amount of time so as to charge the capacitor to a voltage which is proportional to the current applied to the capacitor, and thus proportional to the temperature. The voltage on the capacitor is measured, and a temperature is calculated or determined from the measured voltage.
    Type: Grant
    Filed: October 31, 2018
    Date of Patent: November 30, 2021
    Assignee: Microchip Technology Incorporated
    Inventor: James E. Bartling
  • Patent number: 11185469
    Abstract: One embodiment provides an apparatus, comprising: a first flexible substrate with a plurality of slits and at least one sensor, wherein the slits are arranged around a center of the first flexible substrate, wherein the sensor is arranged between a pair of the slits, and wherein when an object is inserted into an orifice created by the slits, the sensor is configured to maintain contact with the object, thereby allowing a measurement of a characteristic of the object over a predetermined period of time.
    Type: Grant
    Filed: December 26, 2018
    Date of Patent: November 30, 2021
    Assignee: Palo Alto Research Center Incorporated
    Inventor: Shiveesh Fotedar
  • Patent number: 11181426
    Abstract: A temperature sensor includes a current source to produce a first bias current and a second bias current, a plurality of diodes, and temperature estimation circuitry. The plurality of diodes includes at least a first diode to receive the first bias current and a second diode to receive the second bias current. The temperature estimate circuitry measures a first voltage bias across the first diode resulting from the first bias current and a second voltage bias across the second diode resulting from the second bias current, and estimates a temperature of an environment of the temperature sensor based at least in part on the first voltage bias and the second voltage bias. The temperature sensor further includes error detection circuitry to measure at least one of the first or second bias currents and determine an amount of error in the temperature estimate based at least in part on the measurement.
    Type: Grant
    Filed: February 5, 2019
    Date of Patent: November 23, 2021
    Assignee: Xilinx, Inc.
    Inventors: Edward Cullen, Umanath R. Kamath, John K. Jennings, Diarmuid Collins, Ionut C. Cical
  • Patent number: 11175190
    Abstract: The present disclosure relates to a device for determining a temperature of a liquid. The device comprises a first temperature sensor and a reference element. The reference element is composed of a material in which a phase transformation occurs at a predetermined temperature within a temperature range relevant for operation of the device. The material remains in the solid phase. Arranged on the reference element are a first and a second electrode electrically insulated from one another. The device includes a first connection line for contacting the first electrode, and a second connection line for contacting the second electrode. The device further includes a third connection line composed of a material different from the material of the first or the second connection line. The third connection line forms with the first or the second connection line the first temperature sensor in the form of a first thermocouple.
    Type: Grant
    Filed: October 30, 2017
    Date of Patent: November 16, 2021
    Assignee: Endress+Hauser Wetzer GmbH+Co. KG
    Inventors: Michael Korn, Alfred Umkehrer
  • Patent number: 11175251
    Abstract: A product performance test method and system are provided. The product performance test method includes: at least testing a specific heat capacity C of a heat storage material of a sample, a heat transfer coefficient K, an energy efficiency ratio E of a refrigeration system, and a mass m of the heat storage material contained in the sample to detect a performance level of the sample. The method provided tests four key factors: the specific heat capacity C of the heat storage material of a product, the heat transfer coefficient K, the energy efficiency ratio E of the refrigeration system, and the mass m of the heat storage material in a box.
    Type: Grant
    Filed: March 25, 2019
    Date of Patent: November 16, 2021
    Assignee: CQC INTIME TESTING TECHNOLOGY CO., LTD
    Inventors: Zonghui Yang, Conglin Huang, Jie Wang
  • Patent number: 11169102
    Abstract: A measurement device ascertains the thermal conductivity of a fluid. The device has a fluid volume holding the fluid, a controller, and a sensor module disposed in the fluid volume. The sensor module has a supporting body and a plurality of sensor wires that extend freely between in each case two contact positions of the supporting body. One of the sensor wires serves as a heat source and is able to be energized for this purpose by the controller. The controller is set up to capture, via at least two of the sensor wires that serve as temperature sensors and are arranged at different distances from the heat source, temperature measurement values that depend on the temperature at the respective temperature sensor, and to ascertain the thermal conductivity in dependence on the temperature measurement values.
    Type: Grant
    Filed: August 29, 2019
    Date of Patent: November 9, 2021
    Assignee: Diehl Metering GmbH
    Inventors: Ulf Hammerschmidt, Andreas Benkert, Christoph Sosna, Karl Herrmann
  • Patent number: 11169103
    Abstract: A thermal gas sensor for measuring the thermal diffusivity and/or the thermal conductivity of a gas or gas mixture includes a substrate. In the surface of the substrate a trench is formed, as well as at least two conductor structures arranged at a distance from one another on the surface of the substrate. The conductor structures respectively each contain at least two contact sections and a web section connected to the contact sections, the web sections of the conductor structures crossing over the trench at a distance from one another. At least one slot is formed between at least two contact sections of different conductor structures in at least one region of the surface of the substrate.
    Type: Grant
    Filed: October 16, 2019
    Date of Patent: November 9, 2021
    Assignee: Diehl Metering GmbH
    Inventors: Ulf Hammerschmidt, Andreas Benkert, Christoph Sosna, Karl Herrmann
  • Patent number: 11169033
    Abstract: Methods, systems and devices of the present disclosure involve techniques for cancelling base resistance error otherwise present in remote temperature sensors such as remote diode temperature sensors. In one or more embodiments, measurement logic configured to determine a temperature of or near a remote temperature sensor may be configured to determine an error cancelling coefficient and to calculate a temperature value, at least in part, responsive to the error cancelling coefficient. In some cases, error cancelling coefficients may be determined using one or more calibration techniques.
    Type: Grant
    Filed: August 20, 2018
    Date of Patent: November 9, 2021
    Assignee: Microchip Technology Incorporated
    Inventors: Hyunsoo Yeom, Cheng Xu
  • Patent number: 11162845
    Abstract: Apparatuses and methods for measuring substrate temperature are provided. In one or more embodiments, an apparatus for estimating a temperature is provided and includes a plurality of electromagnetic radiation sources positioned to emit electromagnetic radiation toward a reflection plane, and a plurality of electromagnetic radiation detectors. Each electromagnetic radiation detector is positioned to sample the electromagnetic radiation emitted by a corresponding electromagnetic radiation source of the plurality of electromagnetic radiation sources. The apparatus also includes a pyrometer positioned to receive electromagnetic radiation emitted by plurality of electromagnetic radiation sources and reflected from a substrate disposed at a reflection plane and electromagnetic radiation emitted by the substrate. The apparatus includes a processor configured to estimate a temperature of the substrate based on the electromagnetic radiation emitted by the substrate.
    Type: Grant
    Filed: April 11, 2019
    Date of Patent: November 2, 2021
    Assignee: APPLIED MATERIALS, INC.
    Inventor: Joseph M. Ranish
  • Patent number: 11156507
    Abstract: Disclosed is a method for detecting a value which represents the temperature of a vibrating element of an ultrasonic transducer. The ultrasonic transducer has a resonant frequency (fr). The method comprises the steps of operating the ultrasonic transducer with an electric measuring signal at a measuring frequency (fm) which is above the resonant frequency, and of detecting the absolute value of the complex impedance of the ultrasonic transducer at this measuring frequency (fm) and, building thereon, ascertaining the desired value, which is to represent the temperature of a vibrating element of an ultrasonic transducer, as a function of the detected absolute value of the complex impedance of the ultrasonic transducer at this measuring frequency (fm).
    Type: Grant
    Filed: February 1, 2019
    Date of Patent: October 26, 2021
    Assignee: ELMOS SEMICONDUCTOR SE
    Inventor: Egbert Spiegel