Patents Examined by Nasima Monsur
  • Devices under test
    Patent number: 9778313
    Abstract: A system can include a plurality of device under test (DUT) cells. Each DUT cell can include a DUT and a plurality of switches configured to control a flow of current to the DUT. The system can further include a controller configured to execute a plurality of test to the plurality of DUTs in the plurality of DUT cells. Each of the plurality of tests comprises applying a measurement condition to a given DUT of the plurality of DUTs and concurrently applying a stress condition to the remaining DUTs of the plurality of DUTs, wherein the plurality of tests can provide measurements sufficient to determine a bias thermal instability and a time dependent dielectric breakdown of the given DUT.
    Type: Grant
    Filed: September 8, 2014
    Date of Patent: October 3, 2017
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Min Chen, Vijay Kumar Reddy
  • Multi-stage equalization
    Patent number: 9772378
    Abstract: An example apparatus for interfacing between automatic test equipment (ATE) and a device under test (DUT) includes: multiple stages arranged in sequence between the ATE and the DUT, where each of the multiple stages includes a driver, at least two of the multiple stages each includes a filter, each filter is arranged between two drivers, and each filter is configured to reduce jitter produced by a preceding driver in a signal transmitted between the ATE and the DUT.
    Type: Grant
    Filed: August 28, 2014
    Date of Patent: September 26, 2017
    Assignee: Teradyne, Inc.
    Inventor: Timothy Daniel Lyons
  • Electron radiation monitoring electrode system to prevent gold spitting and resist cross-linking during evaporation
    Patent number: 9768081
    Abstract: An electrode system configured to be positioned within a vacuum chamber of an electron-beam metal evaporation and deposition apparatus including a metal slug from which metal is evaporated during operation of the electron-beam metal evaporation and deposition apparatus. The electrode system includes a substantially ring-shaped electrode formed of a conductive material and a plurality of insulating standoffs configured to support the substantially ring-shaped electrode in the vacuum chamber in a position substantially surrounding the metal slug.
    Type: Grant
    Filed: April 30, 2015
    Date of Patent: September 19, 2017
    Assignee: SKYWORKS SOLUTIONS, INC.
    Inventor: Kezia Cheng
  • Micromechanical component and corresponding test method for a micromechanical component
    Patent number: 9764945
    Abstract: A micromechanical component and a corresponding test method for a micromechanical component are described. The micromechanical component includes at least one first region, which is elastically connected to a second region via a spring device, a resistor element, which is situated in and/or on the spring device and is at least partially interruptible in the event of damage to the spring device, and a detection device, which is electrically connected to the resistor element, for detecting an interruption in the resistor element and for generating a corresponding detection signal.
    Type: Grant
    Filed: August 28, 2014
    Date of Patent: September 19, 2017
    Assignee: ROBERT BOSCH GMBH
    Inventors: Sebastian Reiss, Simon Armbruster, Helmut Grutzeck, Joerg Muchow, Frederic Njikam Njimonzie, Johannes Baader, Rainer Straub, Wolfgang Heinzelmann
  • Position sensor
    Patent number: 9759580
    Abstract: A position sensor includes a target having an electrical conductor having an exterior boundary, a void located at least partially within the conductor, and an opening extending between the exterior boundary of the conductor and the void, wherein the opening interrupts a current path in the conductor around the void.
    Type: Grant
    Filed: August 27, 2015
    Date of Patent: September 12, 2017
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventor: Joyce Mullenix
  • Load drive apparatus and sensor control apparatus
    Patent number: 9752958
    Abstract: A load drive apparatus (1) includes a pulse drive circuit (51) which applies a pulse voltage PS to a resistive load (4); current detection means (S14) for detecting the current flowing to the resistive load (4) through the pulse drive circuit (51); level detection means (S1, S7) for determining whether an output terminal voltage VD of the pulse drive circuit (51) is a high potential level or a low potential level; anomaly detection means (S8, S9, S18) for detecting a wire breakage anomaly, a short-to-power anomaly, and a short-to-ground anomaly based on the level of the output terminal voltage VD detected by the level detection means (S1, S7) and the current detected by the current detection means (S14), when the pulse drive circuit 51 is turned on and off.
    Type: Grant
    Filed: September 9, 2014
    Date of Patent: September 5, 2017
    Assignee: NGK SPARK PLUG CO., LTD.
    Inventors: Katsunori Yazawa, Yoshinori Inoue
  • Detection of electrical arcs in photovoltaic equipment
    Patent number: 9746528
    Abstract: A method for detecting a series arc in a photovoltaic device, operating in direct current mode, including N (N=1 or N>1) photovoltaic modules, connected to a charging device having a capacitive behavior for the modules, the method including: a) detecting, across n of the N modules (1?n?N), time evolution of voltage; b) identifying a voltage variation between a first zone of stable voltage and a second zone of stable voltage for a duration of at least 5 ?s, which immediately follows the voltage variation; and c) determining whether the voltage variation is between a value Vmin higher than or equal to 0.2 V and a value Vmax lower than or equal to 20 V, with rise time of the variation between a duration Tmin higher than or equal to 0.5 ?s and a duration Tmax lower than or equal to 5 ?s.
    Type: Grant
    Filed: July 4, 2012
    Date of Patent: August 29, 2017
    Assignee: Commissariat à l'énergie atomique et aux énergies alternatives
    Inventors: Nicolas Chaintreuil, Vincent Chauve
  • Hybrid current sensor assembly
    Patent number: 9746499
    Abstract: A hybrid current sensor assembly has a conductor, Hall core, Hall sensor, shunt terminal, and a microprocessor. The conductor has a first terminating end and a second terminating end. The Hall core generates a magnetic field from current flow in the conductor. The Hall sensor measures potential difference between first terminating end and the second terminating end of the conductor based on the magnetic field applied to the Hall core. The shunt terminal is positioned on a central portion of the conductor. The microprocessor is connected to the shunt terminal to measure the current flow in the conductor.
    Type: Grant
    Filed: April 28, 2015
    Date of Patent: August 29, 2017
    Assignee: Tyco Electronics AMP Korea Ltd
    Inventors: Hong Il Chae, You Sik Choi, Shin Wook Kang, Young Woon Kim
  • Touch screen sensor integrated circuit, a method of operating the same, and a system including the same
    Patent number: 9727183
    Abstract: A method of operating a touch screen sensor integrated circuit includes: receiving a plurality of current signals through a plurality of pins, wherein each current signal is generated according to mutual capacitance in response to a modulation signal; sensing the current signals and generating a plurality of sensed current signals corresponding to each of the current signals; and generating a plurality of subtracted current signals, wherein each subtracted current signal is generated by performing a subtraction on sensed current signals corresponding to a pair of the pins.
    Type: Grant
    Filed: September 4, 2014
    Date of Patent: August 8, 2017
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: San Ho Byun, Jun Chul Park, Ki Duk Kim, Yoon Kyung Choi
  • Sensor for detecting a position of a transducer magnet
    Patent number: 9726520
    Abstract: A sensor for detecting a position of a transducer magnet in a movement direction, including: —a coil carrier extending in the movement direction, —a first coil extending in the movement direction that is wound onto the coil carrier and—a second and a third coil oriented according to the first coil, which are wound onto the coil carrier such that the second and third coils accordingly form a first and second transformer with the first coil, the transformation ratio of which is dependent on the position of the transducer magnet, —wherein at least the second coil or the third coil is arranged between the coil carrier and the first coil.
    Type: Grant
    Filed: February 24, 2014
    Date of Patent: August 8, 2017
    Assignee: Continental Teves AG & Co. oHG
    Inventor: Heinrich Acker
  • Systems and methods for offset reduction in sensor devices and systems
    Patent number: 9720050
    Abstract: Embodiments relate to systems and methods for reducing errors in sensor devices and systems. In embodiments, the sensor devices comprise magnetic field sensor devices, such as ordinary or vertical Hall sensor devices, and the error to be reduced is a residual offset error, though in other embodiments other sensor devices can be used and/or other types of errors can be targeted for reduction or elimination. In one embodiment, at least two such sensor devices not electrically coupled with one another are sequentially operated in a spinning current-type mode such that an individual output signal from each of the at least two sensor devices is obtained. A total output signal can then be calculated, such as by averaging or otherwise combining the individual output signals from each sensor device.
    Type: Grant
    Filed: October 19, 2015
    Date of Patent: August 1, 2017
    Assignee: Infineon Technologies AG
    Inventor: Udo Ausserlechner
  • Integrated circuit device, electronic device and method for frequency detection
    Patent number: 9722648
    Abstract: An integrated circuit comprises a frequency detector. The frequency detector comprises a timer state machine unit operably couplable to a timer and arranged to receive an incoming carrier signal; determine whether the incoming carrier signal comprises a valid frequency; generate a valid carrier indication when the incoming carrier signal is determined as having a valid frequency; and adjust the timer between at least a first timing mode of operation and a second timing mode of operation of the frequency detector in response to the determination.
    Type: Grant
    Filed: March 1, 2011
    Date of Patent: August 1, 2017
    Assignee: NXP USA, Inc.
    Inventors: Philippe Freitas, Olivier Doare, Valerie Escarpit, Christophe Landez, Xavier Lhuillier
  • Testing a layer positioned over a capacitive sensing device
    Patent number: 9689825
    Abstract: A system for testing a first layer disposed over a capacitive sensing device includes a test probe having a substantially flat conductive test surface, a device under test (DUT) disposed over the capacitive sensing device, and a power supply operatively connected to the test probe. The DUT can include the first layer and one or more additional layers. The substantially flat conductive test surface is positioned over a surface of the DUT and applies power to the DUT. The capacitance between the test probe and at least one capacitive sensing element in the capacitive sensing device is then measured.
    Type: Grant
    Filed: September 9, 2014
    Date of Patent: June 27, 2017
    Assignee: Apple Inc.
    Inventors: Richard W. Lim, Benjamin B. Lyon, Srdjan D. Sobajic, Giovanni Gozzini, Peter G. Panagas
  • Transmission line pulse and very fast transmission line pulse reflection control
    Patent number: 9684029
    Abstract: An approach for transmission line pulse and very fast transmission line pulse reflection control is provided. The approach includes using a power splitter to split an incident pulse into two identical pulses with one going to a device under test (DUT) through a delivery cable and the other going down an open ended delay cable. The structure of the power splitter, along with having the delivery cable and the open ended delay cable with the same signal propagation time and pulse transmission characteristics enable the canceling of pulse reflections from the DUT.
    Type: Grant
    Filed: October 6, 2014
    Date of Patent: June 20, 2017
    Assignees: International Business Machines Corporation, Grund Technical Solutions
    Inventors: Shunhua T. Chang, Robert J. Gauthier, Jr., Evan Grund
  • Piezoelectric or electret sensing device
    Patent number: 9678144
    Abstract: A piezoelectric and/or electret sensing device includes a piezoelectric and/or electret transducer for producing a measurement current in response to mechanical stimulus, and a control and evaluation circuit connected to the transducer. The control and evaluation circuit includes a transimpedance amplifier having a first and a second input, the transducer being operatively connected between the first input and a reference node, and an electrical waveform generator for generating an electrical waveform, the electrical waveform generator being operatively connected between the second input and the reference node.
    Type: Grant
    Filed: October 16, 2013
    Date of Patent: June 13, 2017
    Assignee: IEE International Electronics & Engineering S.A.
    Inventor: Laurent Lamesch
  • Noise detection circuit and semiconductor system using the same
    Patent number: 9671446
    Abstract: A noise detection circuit may include a divider configured to receive a clock signal and a clock bar signal, divide the clock signal and the clock bar signal, and generate a first divided signal and a second divided signal. The noise detection circuit may also include a noise detection reference block configured to reflect a power supply voltage level variation on the first divided signal and the second divided signal, and generate a first reference signal and a second reference signal, and a duty sensing circuit configured to generate first duty information and second duty information of the clock signal in response to the first reference signal and the second reference signal. The noise detection circuit may also include a detection circuit configured to generate a noise detection signal in response to the first duty information and the second duty information.
    Type: Grant
    Filed: June 20, 2014
    Date of Patent: June 6, 2017
    Assignee: SK hynix Inc.
    Inventor: Tae Wook Kang
  • Test apparatus and plasma processing apparatus
    Patent number: 9673027
    Abstract: A test apparatus for efficiently and accurately testing a high frequency voltage dependency of an impedance of a test object without damaging the test object. The test apparatus includes a high frequency power source unit, a reference waveform generator, a matching device, an oscilloscope, a control panel, and a main control unit. The test apparatus may boost a high frequency pulse output at a relatively low power from the high frequency power source unit to a voltage required for a high frequency withstand voltage test to be applied to a test object in a state where impedance matching is performed between the high frequency power source unit and the test by the matching device, that is, under a tuned state. Whether the waveform of the voltage applied to the test object is a defined waveform may be concisely monitored and observed by the oscilloscope.
    Type: Grant
    Filed: January 22, 2014
    Date of Patent: June 6, 2017
    Assignee: TOKYO ELECTRON LIMITED
    Inventors: Takashi Yamamoto, Junichi Shimada
  • High speed hybrid active load pull
    Patent number: 9664718
    Abstract: A high speed tuning and measuring algorithm is used for production level testing on-wafer a large number of chips. It applies to a hybrid active injection load pull test system. Using a pre-calibration of the passive tuner and the amplitude and phase settings of the active power injection signal and employing fast harmonic receiver VNA the test system is capable of executing frequency and time domain load pull measurement sets including more than 50 impedance points in a total of 1 second for quantities such as delivered input and output power, PAE, power gain and other. Overall test time, including device hoping and biasing on the automatic probe station is less than 1.5 seconds. This enables production level load pull operations.
    Type: Grant
    Filed: August 27, 2015
    Date of Patent: May 30, 2017
    Inventor: Christos Tsironis
  • Systems and methods for resistivity measurement at multiple angles of rotation
    Patent number: 9651704
    Abstract: Systems and methods are provided to obtain multiple resistivity measurements using a resistivity tool eccentered and rotating in a wellbore, which may be used to ascertain information relating to a drilling fluid in the wellbore. One such system includes a resistivity tool and data processing circuitry. The resistivity tool may become eccentered in a wellbore filled with drilling mud at least when the wellbore is at least partially deviated. The resistivity tool may also rotate within the wellbore and to obtain at least two resistivity measurements at different corresponding angles of rotation within the wellbore. The data processing circuitry may determine a mud phase angle by comparing the resistivity measurements obtained by the resistivity tool.
    Type: Grant
    Filed: December 16, 2013
    Date of Patent: May 16, 2017
    Assignee: SCHLUMBERGER TECHNOLOGY CORPORATION
    Inventor: Richard Bloemenkamp
  • Systems and methods for determining strand position in a post-tensioned tendon
    Patent number: 9651357
    Abstract: In one embodiment, systems and methods for determining the positions of strands in a post-tensioned tendon involve positioning a magnet in close proximity to the outer surface of a tendon, moving the magnet around the periphery of the tendon, and measuring the force of attraction between the magnet and strands within the tendon at multiple angular positions of the tendon.
    Type: Grant
    Filed: February 7, 2014
    Date of Patent: May 16, 2017
    Assignee: University of South Florida
    Inventor: Alberto A. Sagüés