Abstract: A method, computer-readable medium and apparatus for creating a platform-specific logic design from an input design are disclosed. For example, a method includes receiving an input design and an identification of a target device. The method next determines an unconnected external interface of the input design and detects an unconnected external interface of the target device. The method then generates an updated design from the input design. The updated design includes the input design and further includes a connection between the unconnected external interface of the input design and the unconnected external interface of the target device.

Abstract: The present disclosure relates to a computer-implemented method for electronic design simulation. The method may include providing, using at least one computing device, an electronic design and associating, using the at least one computing device, one or more identifiers with each constraint solver call utilized in a simulation of the electronic design. The method may further include automatically generating, using the at least one computing device, a coverage model for one of more constraints associated with the electronic design, the coverage model being based upon, at least in part, the one or more identifiers.

Abstract: The technological fabrication of the integrated circuit includes a fabrication of the integrated circuit in a reduced technological version of a native technology including at least a first dimensional compensation applied to the reduced channel length and to the reduced channel width of each transistor originating from a transistor, referred to as a “minimum transistor”, designed in the native technology and having in this native technology an initial channel length equal to a minimum length for the native technology and an initial channel width equal to a minimum width for the native technology. The fabrication obtains a transistor having a channel length equal, to a given precision, to the initial channel length and a channel width equal, to a given precision, to the initial channel width.

Abstract: A tool for rewriting hardware design hardware design language (HDL) code is arranged for receiving HDL code (2) expressing a hardware design of a digital circuit. The tool comprises means (4) for generating a representation (6) of the syntax of the received HDL code, the representation containing a plurality of nodes. The tool further comprises means (3) for determining modifications to the representation of the syntax whereby at least one node is added to or removed from the representation and computation means (9) for generating a modified version (10) of the received HDL code using the received HDL code and modifications to the received HDL code, the modifications determined from the modified representation of the syntax.

Abstract: A standard cell library is disclosed. The standard cell library contains cells wherein at least one transistor in at least one cell is annotated for gate length biasing. Gate length biasing includes the modification of the gate length, so as to change the speed or power consumption of the modified gate length. The standard cell library is one used in the manufacturing of semiconductor devices (e.g., that result as semiconductor chips), by way of fabricating features defined on one or more layouts of geometric shapes. The annotations serve to identify which ones of the transistor gate features are to be modified before using the geometric shapes for manufacturing the semiconductor device.

Abstract: One or more techniques or systems for determining double patterning technology (DPT) layout routing compliance are provided herein. For example, a layout routing component of a system is configured to assign a pin loop value to a pin loop. In some embodiments, the pin loop value is assigned based on a mask assignment of a pin of the pin loop. In some embodiments, the pin loop value is assigned based on a number of nodes associated with the pin loop. DPT compliance or a DPT violation is determined for the pin loop based on the pin loop value. In this manner, odd loop detection associated with DPT layout routing is provided because a DPT violation results in generation of an additional instance of a net, for example. Detecting an odd loop allows a design to be redesigned before fabrication, where the odd loop would present undesired issues.

Abstract: A method for optimizing masks used for forming conductive features and a method for creating the mask features on an IC device are disclosed. An exemplary embodiment includes receiving a design database including a plurality of conductive features. First and second features suitable for joining are identified from the plurality of conductive features. A joined feature corresponding to the first and the second features is characterized. A cut shape configured to separate the first and second features from the joined feature is also characterized. The joined feature is categorized into a first conductive mask, the cut shape is categorized into a cut mask, and a third feature is categorized into a second conductive mask. The categorized shapes and features of the first conductive mask, the second conductive mask, and the cut mask are provided for manufacturing a mask set corresponding to the categorized shapes and features.

Abstract: A method of reducing current leakage in unused circuits performed during semiconductor fabrication and a semiconductor device or integrated circuit thereby formed. The method involves modifying a characteristic of at least one idle circuit that is unused in a product variant, to inhibit the circuit and reduce current leakage therefrom upon powering as well as during operation. The method can substantially increase the Vt (threshold voltage) of all transistors of a given type, such as all N-type transistors or all P-type transistors. The method is also suitable for controlling other transistor parameters, such as transistor channel length, as well as other active elements, such as N-type resistors or P-type resistors, in unused circuits which affect leakage current as well as for other unused circuits, such as a high Vt circuit, a standard Vt circuit, a low Vt circuit, and an SRAM cell Vt circuit.

Abstract: A method of estimating capacitive cell load of cells in an integrated circuit (IC) design uses first maximum capacitive load values CMAX—LIB in calculating risk of electromigration failure in cells of the IC design. CMAX—LIB is saved for a cell whose risk of electromigration failure is acceptable. For a failed cell, a revised maximum capacitive load value CMAX—2 is reduced as the ratio of an actual current IACTUAL—1 relative to the electromigration current limit ILIMIT in the weakest element of the cell. A revised actual current IACTUAL—2 is obtained as a function of transition times with CMAX—2. CMAX—2 is saved for the cell if IACTUAL—2 is less than ILIMIT. Otherwise the steps of calculating CMAX—2 and IACTUAL—2 are re-iterated. CMAX—2 is reduced relative to CMAX—LIB for the first iteration and is further reduced relative to its previous value CMAX—2 for subsequent iterations.

Abstract: A behavioral synthesis method according to the present invention includes generating a scheduled CDFG based on behavioral description information, generating a lifetime for each variable based on the scheduled CDFG, selecting m variables whose lifetimes do not overlap on a time axis, allocating a first register to a first variable having a first bit width and bits of the first bit width within another variable, allocating a second register to bits other than the bits of the first bit width within another variable, and outputting circuit information of a synthesized circuit including the first and second registers.

Abstract: Techniques for generating timing constraints for an integrated circuit including a clock tree network are described. The techniques may be associated with a clock tree synthesis tool that receives a design of the integrated circuit and generates a clock tree network including a plurality of clocked components of the integrated circuit. The constraints may be generated as a function of the duration of propagation of a data signal from a transmitting clocked component coupled to a receiving clocked component.

Abstract: Methods determine temperature and voltage relationships for integrated circuit library elements to produce a continuous temperature-voltage function. Some of the library elements can be used or combined to form an integrated circuit design. Further, the performance characteristics for integrated circuit chips produced according to the integrated circuit design can be defined, such performance characteristics include an operating temperature range, etc. The continuous temperature-voltage function is applied to the performance characteristics to determine a plurality of temperature/voltage combinations for the integrated circuit chips. Each of the temperature/voltage combinations comprises an operating voltage for each operating temperature within the operating temperature range of the integrated circuit chips. Next, the integrated circuit chips are produced according to the integrated circuit design. The temperature/voltage combinations are recorded in memory of the integrated circuit chips.

Abstract: Disclosed herein are methods and devices used for the physical design validation of integrated circuits. One method used for the physical design validation of integrated circuits includes comparing the original circuit netlist of an integrated circuit and the layout data of the integrated circuit and assigning labels to the input and output terminals of the components in the integrated circuit based on the results of the comparison.

Abstract: Described herein is a method for obtaining a preferred layout for a lithographic process, the method comprising: identifying an initial layout including a plurality of features; and reconfiguring the features until a termination condition is satisfied, thereby obtaining the preferred layout; wherein the reconfiguring comprises evaluating a cost function that measures how a lithographic metric is affected by a set of changes to the features for a plurality of lithographic process conditions, and expanding the cost function into a series of terms at least some of which are functions of characteristics of the features.

Abstract: A system and methods are disclosed for inferring higher level descriptions of circuit connectivity from register transfer level (RTL) netlists in order to provide more understandable and manageable design descriptions for complex System-on-Chip (SOC) designs. In particular, rule-based interface matching is automatically performed by analyzing actual port names on instances of functional elements and blocks to form signal groupings that comprise a higher-level abstracted description. An example syntax is provided for defining rules that are used to define how various analysis are performed. Data describing standard interfaces on common Intellectual Property (IP) blocks is optionally made available to facilitate interface matching. Also, a facility is included to allow user-guided mapping on instantiated interfaces with respect to actual port names in an RTL-level design.

Abstract: A system and method for automatically modifying a first layout of a circuit. The first layout may describe a plurality of layers used in a fabrication process to manufacture the circuit. When performed, the fabrication process may result in a vertical electrical connection between two of the layers. However, the vertical electrical connection may not be directly specified by the first layout. The system and method may operate to apply a set of rules to the first layout to automatically generate a modified layout directly specifying a vertical electrical connection between the two layers. The set of rules may be based on knowledge of the fabrication process, and may be designed to modify the geometry of the first layout to more closely model the real geometry of the circuit that will result from the fabrication process. The modified layout may enable an electromagnetic (EM) simulation of the circuit to be accurately performed.

Abstract: A target integrated circuit layout having a plurality of design rules having minimum rules and standard rules used in the target integrated circuit layout is provided. First and second design rule checks are performed, where respective first and second sets of violations of the plurality of design rules and each design rule associated with the first and second sets of violations are recorded. An analysis is performed on the first and second sets of violations, each design rule associated with the first and second sets of violations, and a frequency of usage of each of the plurality of design rules, and a rule usage rate is determined having a number of minimum rules used overall and a number of overall violations of the design rules. An interactive rule database is formed having statistics associated with the rule usage rate for subsequent implementation in an integrated circuit.

Abstract: Disclosed is a method, system, and computer program product for performing predictions for an electronic design. Embodiments of the invention allow the ability to efficiently update the model predictions at a later time once previously incomplete blocks are completed. Predictions can be efficiently updated after block designs are updated (e.g. after correcting problems detected from model predictions).

Abstract: Described herein is a method of processing a pattern layout for a lithographic process, the method comprising: identifying a feature from a plurality of features of the layout, the feature violating a pattern layout requirement; and reconfiguring the feature, wherein the reconfigured feature still violates the pattern layout requirement, the reconfiguring including evaluating a cost function that measures a lithographic metric affected by a change to the feature and a parameter characteristic of relaxation of the pattern layout requirement.

Abstract: Place-and-route (P&R) includes maintaining a set of local arrival time information and local required time information associated with a circuit layout; determining a candidate fix on a critical path in the circuit layout; statistically determining, using one or more computer processors, a set of one or more adjusted local slacks associated with a region affected by the candidate fix; and in the event that the set of one or more adjusted local slacks indicates that the candidate fix results in a timing improvement, accepting the candidate fix.