Patents Examined by Nicole M Ippolito
  • Patent number: 10996393
    Abstract: Disclosed embodiments include an energy directing device having one or more energy relay elements configured to direct energy from one or more energy locations through the device. In an embodiment, surfaces of the one or more energy relay elements may form a singular seamless energy surface where a separation between adjacent energy relay element surfaces is less than a minimum perceptible contour. In disclosed embodiments, energy is produced at energy locations having an active energy surface and a mechanical envelope. In an embodiment, the energy directing device is configured to relay energy from the energy locations through the singular seamless energy surface while minimizing separation between energy locations due to their mechanical envelope. In embodiments, the energy relay elements may comprise energy relays utilizing transverse Anderson localization phenomena.
    Type: Grant
    Filed: November 25, 2019
    Date of Patent: May 4, 2021
    Assignee: Light Field Lab, Inc.
    Inventors: Jonathan Sean Karafin, Brendan Elwood Bevensee
  • Patent number: 10996239
    Abstract: A method of positioning probe tips relative to pads includes: focusing on each of the probe tips in a first image as viewed by a microscope and collecting the coordinates of the corresponding probe tip relative to a first reference point in the first image; focusing on each of the pads in a second image as viewed by the microscope and collecting the coordinates of the corresponding pad relative to a second reference point in the second image, a relative position of the second reference point to the first reference point being predetermined; matching the pads with the probe tips when the quantity of the probe tips and the pads are equal while minimizing a maximum value of the distances calculated between each of the probe tips and the corresponding pad; and moving the probe tips to touch the pads with the maximum value minimized.
    Type: Grant
    Filed: May 12, 2020
    Date of Patent: May 4, 2021
    Inventors: Ingo Berg, Chien-Hung Chen, Frank Fehrmann, Sebastian Giessmann
  • Patent number: 10996238
    Abstract: A driving mechanism relatively displaces a measuring unit and a sample table such that a relative positional relationship between the measuring unit and the sample table is switched between a first positional relationship and a second positional relationship. In the second positional relationship, the sample table is exposed to the outside from within a lower housing. A controller includes a high voltage generation circuit that generates a high voltage to be supplied to a scanner. A first mechanical switch causes a power supply not to supply a voltage to the high voltage generation circuit in the second positional relationship.
    Type: Grant
    Filed: February 11, 2020
    Date of Patent: May 4, 2021
    Assignee: Shimadzu Corporation
    Inventor: Keita Fujino
  • Patent number: 10998158
    Abstract: Variable-focus solenoidal lenses for charged particle beams with integrated emittance filtering are disclosed. The emittance may be controlled via selection of collimating irises. The focal length may be changed by altering the spacing between two permanent ring magnets.
    Type: Grant
    Filed: June 18, 2019
    Date of Patent: May 4, 2021
    Assignee: Triad National Security, LLC
    Inventors: John Lewellen, Kimberley Nichols, Heather Andrews, Ryan Fleming
  • Patent number: 10998175
    Abstract: Disclosed herein is a device for characterizing a biological sample or an airborne sample. According to embodiments of the present disclosure, the device comprises an electrospray source, a mass analyzer, a charge detector, and optionally, an ion guide. The present device is useful in analyzing the particle population in the biological or airborne sample based on the mass to charge (m/z) ratio and the charge (z) of each particle. Also disclosed herein are the methods of making a diagnosis of cancer by use of the present device, and methods of determining the mass distribution of particles in an airborne sample.
    Type: Grant
    Filed: November 17, 2019
    Date of Patent: May 4, 2021
    Inventors: Abdil Ozdemir, Jung-Lee Lin, Chung-Hsuan Chen
  • Patent number: 10998166
    Abstract: A charged-particle beam (CPB) is aligned to a primary axis of a CPB microscope by determining a first beam deflection drive to a beam deflector for directing the CPB passing a reference location displaced from the primary axis. The beam deflector is provided with a second beam deflection drive during the working mode of the CPB microscope to propagate the beam along the primary axis. The second beam deflection drive is determined based on the first beam deflection drive.
    Type: Grant
    Filed: December 12, 2019
    Date of Patent: May 4, 2021
    Assignee: FEI Company
    Inventors: Branislav Straka, Radek Smolka, Lukas Kral, Jan Skalicky
  • Patent number: 10991567
    Abstract: A method of operating a quadrupole device is disclosed that comprises operating the quadrupole device in a first mode of operation, passing ions into the quadrupole device while the quadrupole device is operated in the first mode of operation, and then operating the quadrupole device in a second mode of operation. Operating the quadrupole device in the second mode of operation comprises applying one or more drive voltages to the quadrupole device, and operating the quadrupole device in the first mode of operation comprises applying one or more reduced drive voltages or not applying one or more drive voltages to the quadrupole device.
    Type: Grant
    Filed: September 6, 2017
    Date of Patent: April 27, 2021
    Inventors: David J. Langridge, Martin Raymond Green
  • Patent number: 10991559
    Abstract: The present invention provides a method enabling a quantitative analysis of a polymer by MALDI mass spectrometry, and a method for manufacturing a sample for MALDI mass spectrometry for a quantitative analysis of a polymer. To that end, the methods can increase reproducibility of a MALDI spectrum by making uniform the thickness of a sample affecting the pattern in a polymer MALDI spectrum. The sample according to the present invention is applicable also to a commercial MALDI-TOF instrument, and, thus, can quantitatively analyze a polymer in a more efficient and faster manner.
    Type: Grant
    Filed: September 11, 2018
    Date of Patent: April 27, 2021
    Inventors: Yongjin Bae, Jong Chan Kim, Yeu Young Youn, Young Hee Lim, Hye Sung Cho
  • Patent number: 10989736
    Abstract: A system includes a probe assembly, a camera, and a control system. The probe assembly includes a rigid substrate, a compliant layer provided on the rigid substrate, one or more rigid probes can be arranged on the compliant layer to cover at least a portion of the compliant layer, and a reflective layer can cover the one or more rigid probes and uncovered portions of the compliant layer. The camera is configured to generate image data from the probe assembly. The control system is configured to receive image data from the camera and develop a topographical image of a surface of a sample, based at least in part on the received image data.
    Type: Grant
    Filed: October 27, 2020
    Date of Patent: April 27, 2021
    Inventors: Keith Andrew Brown, Wenhan Cao, Nourin Alsharif
  • Patent number: 10991545
    Abstract: A charged particle buncher includes a series of spaced apart electrodes arranged to generate a shaped electric field. The series includes a first electrode, a last electrode and one or more intermediate electrodes. The charged particle buncher includes a waveform device attached to the electrodes and configured to apply a periodic potential waveform to each electrode independently in a manner so as to form a quasi-electrostatic time varying potential gradient between adjacent electrodes and to cause spatial distribution of charged particles that form a plurality of nodes and antinodes. The nodes have a charged particle density and the antinodes have substantially no charged particle density, and the nodes and the antinodes are formed from a charged particle beam with an energy greater than 500 keV.
    Type: Grant
    Filed: August 5, 2019
    Date of Patent: April 27, 2021
    Assignee: NexGen Semi Holding, Inc.
    Inventors: Mark Joseph Bennahmias, Michael John Zani, Jeffrey Winfield Scott
  • Patent number: 10980911
    Abstract: A flexible ion generator device that includes a dielectric layer having a first end, a second end, a first side, a second side, a top side, and a bottom side, at least one trace positioned on the dielectric layer and having a plurality of emitters engaged to the at least one trace. A plurality of lights disposed on the dielectric layer.
    Type: Grant
    Filed: February 10, 2020
    Date of Patent: April 20, 2021
    Assignee: Global Plasma Solutions, Inc.
    Inventor: Charles Houston Waddell
  • Patent number: 10983142
    Abstract: Methods, devices, and systems for forming atomically precise structures are provided. In some embodiments, the methods, devices, and systems of the present disclosure utilize a scanning tunneling microscope (STM) system to receive a sample having a surface to be patterned. The system positions a conductive tip over a pixel region of the surface. While the conductive tip remains laterally fixed relative to the surface, the system applies a bias voltage between the conductive tip and the surface such that a current between the conductive tip and the surface removes at least one atom from the pixel region. The system stops applying the voltage and current when it senses the removal of the at least one atom. The system then verifies that the at least one atom has been removed from the pixel region.
    Type: Grant
    Filed: October 22, 2019
    Date of Patent: April 20, 2021
    Assignee: ZYVEX LABS, LLC
    Inventors: John Randall, Ehud Fuchs, James H. G. Owen, Joseph Lake
  • Patent number: 10978271
    Abstract: A transmission electron microscopy system for imaging a sample, comprising: a pulse generator for generating an initial electron pulse towards the sample, the initial electron pulse to be propagated through the sample to obtain a transmitted electron pulse; an encoding device for encoding the transmitted electron pulse according to a predefined pattern to obtain an encoded electron pulse; a shearing device for temporally shearing the encoded electron pulse in a given direction to obtain a given electron pulse; a detector for detecting the given electron pulse to obtain a single image of the sample; and a datacube generator for determining a spatiotemporal datacube from the single image using the predefined pattern, and outputting the spatiotemporal datacube.
    Type: Grant
    Filed: November 20, 2019
    Date of Patent: April 13, 2021
    Inventors: Jinyang Liang, Xianglei Liu, Aycan Yurtsever
  • Patent number: 10976344
    Abstract: A scanning tunneling microscopy based potentiometry system and method for the measurements of the local surface electric potential is presented. A voltage compensation circuit based on this potentiometry system and method is developed and employed to maintain a desired tunneling voltage independent of the bias current flow through the film. The application of this potentiometry system and method to the local sensing of the spin Hall effect is outlined herein, along with the experimental results obtained.
    Type: Grant
    Filed: December 6, 2019
    Date of Patent: April 13, 2021
    Assignees: University of Maryland, College Park, Government of the United States of America as Represented by the Director, National Security Agency
    Inventors: Ting Xie, Michael Dreyer, Isaak D. Mayergoyz, Robert E. Butera, Charles S. Krafft
  • Patent number: 10976283
    Abstract: Methods and apparatuses for ion peak compression and increasing resolution of ions are disclosed. Packets of ions are introduced into a device. A first electric field is applied for dispersing the ion packets temporally or spatially according to their mobilities. A second intermittent traveling wave is applied for regrouping or merging the dispersed ion packets into a lesser number of trapping regions with narrower peaks. The ions packets are compressed into the narrower peak regions by varying a duty cycle of the intermittent traveling wave.
    Type: Grant
    Filed: November 4, 2019
    Date of Patent: April 13, 2021
    Assignee: Battelle Memorial Institute
    Inventors: Yehia M. Ibrahim, Sandilya Garimella, Richard D. Smith
  • Patent number: 10969404
    Abstract: A method of scanning a feature with a probe, the probe comprising a cantilever mount, a cantilever extending from the cantilever mount to a free end, and a probe tip carried by the free end of the cantilever. An orientation of the probe is measured relative to a reference surface to generate a probe orientation measurement. The reference surface defines a reference surface axis which is normal to the reference surface and the probe tip has a reference tilt angle relative to the reference surface axis. A shape of the cantilever is changed in accordance with the probe orientation measurement so that the probe tip moves relative to the cantilever mount and the reference tilt angle decreases from a first reference tilt angle to a second reference tilt angle. A sample surface is scanned with the probe, wherein the sample surface defines a sample surface axis which is normal to the sample surface and the probe tip has a scanning tilt angle relative to the sample surface axis.
    Type: Grant
    Filed: April 6, 2018
    Date of Patent: April 6, 2021
    Inventor: Andrew Humphris
  • Patent number: 10966501
    Abstract: A nail lamp for curing UV-curable nail gel uses light emitting diodes (LEDs) that emit ultraviolet light and are relatively lower power. The nail lamp is powered from an exterior power source, such as a wall socket, or by a rechargeable battery pack. A battery compartment of the nail lamp holds the battery pack, which is removable without disassembling the nail lamp. The nail lamp is easily transportable to different locations and can be used even when a wall socket is unavailable. A curing time of the nail lamp is user-selectable. The nail lamp can also include detection sensors to detect a person's hand or foot in a treatment chamber and automatically turn on or off the LEDs.
    Type: Grant
    Filed: November 19, 2019
    Date of Patent: April 6, 2021
    Assignee: LeChat
    Inventor: Newton Luu
  • Patent number: 10971347
    Abstract: In order to provide a charged particle beam apparatus capable of stably detecting secondary particles and electromagnetic waves even for a non-conductive sample under high vacuum environment and enabling excellent observation and analysis, the charged particle beam apparatus includes a charged particle gun (12), scanning deflectors (17 and 18) configured to scan a charged particle beam (20) emitted from the charged particle gun (12) onto a sample (21), detectors (40 and 41) configured to detect a scanning control voltage input from an outside into the scanning deflectors, an arithmetic unit (42) configured to calculate, based on the detected scanning control voltage, irradiation pixel coordinates for the charged particle beam; and an irradiation controller (45) configured to control irradiation of the sample with the charged particle beam according to the irradiation pixel coordinates.
    Type: Grant
    Filed: June 23, 2016
    Date of Patent: April 6, 2021
    Inventors: Mitsuhiro Nakamura, Hironori Itabashi, Hirofumi Satou, Tsutomu Saito, Masahiro Sasajima, Natsuki Tsuno, Yohei Nakamura
  • Patent number: 10971339
    Abstract: An ion source includes a plasma chamber, and a suppression electrode disposed downstream of the plasma chamber, and is operable to irradiate the suppression electrode with an ion beam produced from a cleaning gas to clean the suppression electrode. Prior to cleaning, the ion source moves the suppression electrode or the plasma chamber in a first direction to increase a distance between the plasma chamber and the suppression electrode.
    Type: Grant
    Filed: February 11, 2020
    Date of Patent: April 6, 2021
    Inventors: Masakazu Adachi, Yuya Hirai, Tomoya Taniguchi
  • Patent number: 10971345
    Abstract: A mass spectrometer includes: a chamber; a support that, in a state in which, in a sample support body that includes a substrate in which a plurality of through-holes open in first and second surfaces are formed and a conductive layer that is at least provided on the first surface, the second surface thereof is in contact with a sample, supports the sample and the sample support body; a laser beam irradiation part that irradiates the first surface with a laser beam; a voltage application part that applies a voltage to the conductive layer; an ion detection part that, detects the ionized components of the sample in a space inside the chamber; a first light irradiation part that irradiates the sample with a first light from a side of the substrate; and an imaging part that obtains a reflected light image of the sample by the first light.
    Type: Grant
    Filed: July 31, 2018
    Date of Patent: April 6, 2021
    Inventors: Masahiro Kotani, Takayuki Ohmura