Abstract: Technologies for providing a semiconductor device, which can comprise a fully depleted semiconductor on insulator transistor and a method for forming the same are described. Various embodiments disclose a buried dielectric layer coupled to a semiconductor layer, and a back-gate stack is coupled to the buried dielectric layer, the back-gate stack comprising a back-gate conductor layer, a ferroelectric material layer coupled to the back-gate conductor layer, and a back-gate contact layer coupled to the ferroelectric material layer. A gate insulator can be coupled to the semiconductor layer, and a gate can be coupled to the gate insulator; the semiconductor layer can comprise a source, a drain and a channel region between the source and the drain. The negative capacitance property of the ferroelectric insulator provides back biasing of the fully depleted semiconductor on insulator transistor, including if using a relatively thick buried dielectric layer and a normal operating voltage.

Abstract: The present application discloses an array substrate and a method for fabricating the same, and a liquid crystal display panel. A transparent electrode and a second passivation layer are disposed between a planarization layer and a pixel electrode, the transparent electrode is disposed between the planarization layer and the second passivation layer, the pixel electrode and the transparent electrode are insulated and disposed in stack by the second passivation layer sandwiched therebetween, and forms a storage capacitor of the array substrate.

Abstract: A display device, array substrate and manufacturing method thereof are provided. The array substrate includes an active area and a non-active area, and the active area includes a plurality of scan lines and a plurality of data lines intersecting with the plurality of scan lines, and a plurality of pixel units formed by the intersecting plurality of scan lines and plurality of data lines; the non-active area includes a driving circuit providing scan signals to the scan lines, and the driving circuit is located along an extension direction of the data lines so as to reduce area size of the non-active area along an extension direction of the scan lines to achieve narrowing border size. As such, the ultra-narrow border for display device is achieved.

Abstract: An image pickup device according to an embodiment includes a substrate on which a plurality of pixel circuits are disposed, a semiconductor layer disposed on the substrate, a first electrode disposed on the semiconductor layer, and a second electrode disposed between the semiconductor layer and the substrate. A continuous portion of the semiconductor layer includes a light receiving region disposed between the first electrode and the second electrode and a charge hold region different from the light receiving region.

Abstract: A semiconductor structure with low resistance conduction paths and methods of manufacture are disclosed. The method includes forming at least one low resistance conduction path on a wafer, and forming an electroplated seed layer in direct contact with the low resistance conduction path.

Abstract: A multi-layer semiconductor device includes at least a first semiconductor structure and a second semiconductor structure, each having first and second opposing surfaces. The second semiconductor structure includes a first section and a second section, the second section including a device layer and an insulating layer. The second semiconductor structure also includes one or more conductive structures and one or more interconnect pads. Select ones of the interconnect pads are electrically coupled to select ones of the conductive structures. The multi-layer semiconductor device additionally includes one or more interconnect structures disposed between and coupled to select portions of second surfaces of each of the first and second semiconductor structures. A corresponding method for fabricating a multi-layer semiconductor device is also provided.

Abstract: A semiconductor device fabrication method includes forming first and second spaced apart base regions and source regions in a substrate with a portion of a drift region therebetween. The method further includes forming at least a first trench extending laterally through the base region, the drift region and the source region, the first trench extending vertically partially through the source region. The method also includes forming a first oxide layer over the trenched upper surface, and forming a polysilicon layer over the first oxide layer. The polysilicon layer is patterned to form the gate conductor, and a drain contact is formed on a bottom surface of the semiconductor substrate.

Abstract: Display devices are disclosed herein. In one embodiment, the display device includes a plastic substrate comprising a display area and a non-display area, and a data pad portion disposed on one side of the non-display area, with a flexible circuit board bonded thereto, the display area including a plurality of subpixels positioned on the display area, each subpixel including an organic light-emitting diode that includes an organic layer, wherein the organic layer extends continuously from one side of the display area to the other side of the display area and is arranged in a plurality of lines that are spaced apart from one another and disposed parallel to the data pad portion.

Abstract: A semiconductor device includes a drift structure formed in a semiconductor body. The drift structure forms a first pn junction with a body zone of a transistor cell. A gate structure extends from a first surface of the semiconductor body into the drift structure. A heat sink structure extends from the first surface into the drift structure. A thermal conductivity of the heat sink structure is greater than a thermal conductivity of the gate structure and/or a thermal capacity of the heat sink structure is greater than a thermal capacity of the gate structure.

Abstract: A module assembly includes an adapter substrate with at least one cavity and a surface mounted die mounted on a top surface of the adapter substrate. The first cavity extends through the adapter substrate and has at least one first side wall. A first metallization layer is provided within the cavity. A first recessed die is attached to the first metallization layer and mounted within the cavity such that the first recessed die is at least partially recessed into the first cavity and surrounded by a gap filler that resides between side portions of the first recessed die and the at least one first side wall. The top surface of the gap filler is flush with the top surface of the adapter substrate and a top surface of the first recessed die.

Abstract: Discussed is a display device and a fabricating method thereof according to an embodiment, in which an organic-inorganic composite film is patterned without a mask by using an anti-film layer, and a residual anti-film layer protects a pad portion. The display device comprises a lower substrate; pixels arranged on a display area of the lower substrate; pads arranged on a non-display area of the lower substrate; an encapsulation layer arranged on the pixels; and an anti-film layer arranged on the pads as a molecular layer having a thickness of a single molecule. Also, the fabricating method of the display device comprises the steps of forming pads on a non-display area of a lower substrate and forming pixels on a display area; and forming an anti-film layer on the pixels as a molecular layer having a thickness of a single molecule.

Abstract: An optoelectronic device includes a semiconductor stack, including a first semiconductor layer, an active layer formed on the first semiconductor layer, and a second semiconductor layer; a first metal layer formed on a top surface of the second semiconductor layer; a second metal layer formed on a top surface of the first semiconductor layer; an insulative layer formed on the top surface of the first semiconductor layer and the top surface of the second semiconductor layer; wherein a space between a sidewall of the first metal layer and a sidewall of the semiconductor stack is less than 3 ?m.

Abstract: An embodiment of a device includes a package body having a first sidewall, a top surface, and a bottom surface, and multiple pads that are exposed at the first sidewall and that are electrically coupled to one or more electrical components embedded within the package body. The device also includes a package surface conductor coupled to the first sidewall. The package surface conductor extends between and electrically couples the multiple pads, and the package surface conductor is formed from a first surface layer and a second surface layer formed on the first surface layer. The first surface layer directly contacts the multiple pads and the first sidewall and is formed from one or more electrically conductive first materials, and the second surface layer is formed from one or more second materials that are significantly more resistive to materials that can be used to remove the first materials.

Abstract: Some embodiments include a memory cell having first, second and third transistors, with the second and third transistors being vertically displaced relative to one another. The memory cell has a semiconductor pillar extending along the second and third transistors, with the semiconductor pillar containing channel regions and source/drain regions of the second and third transistors. A capacitor may be electrically coupled between a source/drain region of the first transistor and a gate of the second transistor.

Abstract: Methods of forming a field-effect transistor and structures for a field-effect transistor. A gate structure is formed that overlaps with a channel region beneath a top surface of a semiconductor fin. The semiconductor fin is etched with an anisotropic etching process to form a cavity having a sidewall with a planar section extending vertically toward the top surface of the semiconductor fin and adjacent to the channel region in the semiconductor fin. The semiconductor fin is then etched with an isotropic etching process that widens the cavity at the top surface while preserving verticality of the planar section.

Abstract: A structure includes a die substrate; a passivation layer on the die substrate; first and second interconnect structures on the passivation layer; and a barrier on the passivation layer, at least one of the first or second interconnect structures, or a combination thereof. The first and second interconnect structures comprise first and second via portions through the passivation layer to first and second conductive features of the die substrate, respectively. The first and second interconnect structures further comprise first and second pads, respectively, and first and second transition elements on a surface of the passivation layer between the first and second via portion and the first and second pad, respectively. The barrier is disposed between the first pad and the second pad. The barrier does not fully encircle at least one of the first pad or the second pad.

Abstract: A semiconductor device includes a drift layer formed of a first conductive type semiconductor material, a MOSFET part including a p-type base layer provided on a front surface of the drift layer, a first n-type buffer layer provided on a reverse side of the drift layer, and a second n-type buffer layer provided on a reverse side of the first n-type buffer layer and having a high impurity concentration. The first n-type buffer layer has a higher impurity concentration than the drift layer and has a total amount of electrically active impurities per unit area of 1.0×1012 cm?2 or less.

Abstract: Integrated chips include a first device and a second device. The first device includes a stack of vertically arranged sheets of a first channel material, a source and drain region having a first dopant type, and a first work function metal layer formed from a first work function metal. The second device includes a stack of vertically arranged sheets of a second channel material, a source and drain region having a second dopant type, and a second work function metal layer formed from a second work function metal.

Abstract: Some embodiments include a magnetic tunnel junction device having a first magnetic electrode, a second magnetic electrode, and a tunnel insulator material between the first and second magnetic electrodes. A tungsten-containing material is directly against one of the magnetic electrodes. In some embodiments the tungsten-containing material may be in a first crystalline lattice arrangement, and the directly adjacent magnetic electrode may be in a second crystalline lattice arrangement different from said first crystalline lattice arrangement. In some embodiments the tungsten-containing material, the first magnetic electrode, the tunnel insulator material and the second magnetic electrode all comprise a common crystalline lattice arrangement.

Abstract: High voltage drain-extended metal-oxide-semiconductor (DEMOS) bipolar switches for electrical overstress protection are provided. In certain configurations herein, an electrical overstress switch embodiment for providing electrical overstress protection, such as electrostatic discharge/electrical overstress (ESD/EOS) protection includes both a DEMOS device and an embedded bipolar device. The switch is implemented to achieve the advantages provided by the combined conduction of DEMOS and bipolar devices. For example, the DEMOS device provides surface conduction at the gate region for relatively fast switch device turn on and low voltage overshoot, while the bipolar device provides high current conduction during stress condition and a high holding voltage characteristics to prevent latch-up in mission critical integrated circuit applications.