Abstract: An ion implanter. The ion implanter may include a beamline, the beamline defining an inner wall, surrounding a cavity, the cavity arranged to conduct an ion beam. The ion implanter may also include a low emission insert, disposed on the inner wall, and further comprising a 12C layer, the 12C layer having an outer surface, facing the cavity.

Abstract: The present invention relates to a deflection scanning device with a multi-phase winding and a deflection scanning system. The deflection scanning device is of an axisymmetric structure, and comprises a ferromagnetic frame and a deflection scanning winding, wherein the inner side of the ferromagnetic frame is longitudinally provided with 2aw wire slots equally distributed along the circumference; and the deflection scanning winding comprises a w-phase winding, wherein the axis of the each phase winding is symmetrically distributed. The deflection scanning system comprises a deflection scanning device, a drive power supply unit and, a central, control unit. The deflection scanning device of the present invention can improve the uniformity of the magnetic induction intensity in the charged particle beam channel, and then reduce the defocusing effect and improve the scanning accuracy.

Abstract: Synchronized ion modification systems and techniques are described. An ion modifier can be used to modify a portion of ions that enter a drift chamber via a gate that controls entry of the ions to the drift chamber. A controller that is communicatively coupled to the ion modifier is configured to control the ion modifier to select a portion of the ion to be modified. In embodiments, the controller selects the portion based on a detector's previous response to other ions that are formed from a sample from which the ions were formed. The other ions, for example, correspond to ions that are associated with a peak in previous operation of a spectrometer.

Abstract: When a liquid surface is detected based on a detection signal from a photodetector during the approaching operation, a photodetector movement processor moves the photodetector to a position where reflected light from a cantilever is incident with the cantilever being in liquid. When the reflected light from the cantilever is incident on the photodetector during the approaching operation continued after the movement of the photodetector by the photodetector movement processor, an optical axis adjustment processor adjusts an optical axis of the reflected light incident on the photodetector. When a surface of a solid sample is detected based on a detection signal from the photodetector during the approaching operation continued after the adjustment of the optical axis by the optical axis adjustment processor, an approaching processor stops the approaching operation.

Abstract: Systems and methods for implementing charged particle flooding in a charged particle beam apparatus are disclosed. According to certain embodiments, a charged particle beam system includes a charged particle source and a controller which controls the charged particle beam system to emit a charged particle beam in a first mode where the beam is defocused and a second mode where the beam is focused on a surface of a sample.

Abstract: The present invention relates to a transmission electron microscope (TEM) micro-grid and a method for preparing the TEM micro-grid. The TEM micro-grid comprises a porous silicon nitride substrate and a graphene layer located on a surface of the porous silicon nitride substrate. The porous silicon nitride substrate comprises a plurality of through holes. The graphene layer covers the plurality of through holes. The method for preparing the TEM micro-grid provided in the present disclosure uses a carbon nanotube film structure to transfer a graphene layer to a surface of a porous silicon nitride substrate.

Abstract: The present invention relates to the technical field of ionizing a gaseous substance, in particular the ionizing or ionization of a gaseous substance in preparation for its analysis. A device is intended to make a discharge gas and a test substance ionizable in a flow-through mode without essentially destroying or fragmenting the sample substance. In order to avoid a high expenditure in terms of construction and equipment, the device is intended to be usable under ambient conditions and to ensure a high sensitivity in a possible analysis of an ionized substance. To this end, an ionizing device is used for flow-through ionization of a discharge gas and of a sample substance at an absolute pressure of more than 40 kPa in the ionizing device during ionization. The ionizing device comprises an inlet, an outlet, a first electrode, a dielectric element and a second electrode.

Abstract: The present disclosure relates to Superfluid QUantum Interference Devices (SQUIDs) that measure phase differences existing in quasi-particles or matter-wave systems, and the related techniques for their use at room-temperatures. These Bose-Einstein Condensation interferometry techniques include quantum scale metrology devices such as quasi-particle based linear accelerometers, gyroscopes, and Inertial Measurement Units that incorporate such interferometers. In the presence of additive white Gaussian noise, estimates are made for the Bias Instability, Angle Random Walk, and Velocity Random Walk of the device for purposes of quantum inertial sensing. Moreover, this disclosure relates to SQUIDs based on charged quasi-particles that can, in turn, be used to construct quantum computing elements such as quantum transistors, and quasi-particle circuits at room-temperatures. These quasi-particle circuits can be used to build analogs of electronic circuit elements, and offer an alternative to traditional electronics.

Abstract: Methods and systems for correcting aberrations in atom probe tomography are described. A specimen function associated with a plurality of lattice positions of ions of a specimen in a holder is generated using a transmission electron microscope. An image function associated with x- and y-coordinates and time of flight information for a plurality of ions of the specimen in the holder is generated using a delay line detector mounted on the transmission electron microscope. A transfer function based on the specimen function and the image function is generated. The transfer function comprises information relating to ion trajectory aberrations. An Atom Probe Tomography (APT) image of the specimen is generated based on the specimen function, the image function, and the transfer function. The APT image is adjusted to correct for the ion trajectory aberrations.

Abstract: An EUV source for generating a beam of EUV radiation, has a droplet generator with a nozzle assembly to emit droplets of fuel from a nozzle towards a plasma formation location. The nozzle assembly receives the fuel from a reservoir. The nozzle assembly has a pump chamber receiving the fuel from the reservoir and an actuator to vibrate a membrane that forms a wall of the pump chamber. The wall is oriented perpendicularly to a direction wherein the nozzle emits the fuel. The nozzle assembly has first and second nozzle filters non-adjacently arranged in series in a path of the fuel from the pump chamber to the nozzle.

Abstract: An x-ray shield for improved vacuum conductivity is disclosed herein. An example x-ray shield includes at least one elongate member formed from high atomic weight material shaped into a twist with at least 180° of twist.

Abstract: A fluid sterilization module includes an inner cylinder forming a processing flow path, a case portion in which the inner cylinder is accommodated, a member provided between an outer circumferential surface of the inner cylinder and an inner circumferential surface the case portion, a first chamber located in a region on a side of one end portion of the inner cylinder with respect to the member, in a gap between the inner cylinder and the case portion, a second chamber located in a region on a side of the other end portion of the inner cylinder with respect to the member, and a light emitting element provided in at least one of the one end portion and the other end portion of the inner cylinder, and configured to emit ultraviolet light to the object passing through the processing flow path.

Abstract: UV hard-surface disinfection system that is able to disinfect the hard surfaces in a room, while minimizing missed areas due to shadows by providing multiple UV light towers that can be placed in several areas of a room such that shadowed areas are eliminated and that can be transported by a cart that is low to the ground such that the towers may be loaded and unloaded easily by a single operator. The system is able to be controlled remotely, such that during activation of the system, no operator is present, and to automatically cut power to all towers in the event that a person enters the room.

Abstract: A liquid cell for in situ atomic force microscopy (AFM) measurement of a sample during filtration is provided. The liquid cell includes a cantilever probe; a cantilever holder to position the probe near a surface of a sample (e.g., a filtration membrane); a liquid cell housing provided to hold the sample and comprising an opening at the top; an upper part; a lower part; an internal cavity to contain a fluid; a fluid inlet passage located in the upper part; a first fluid outlet passage located in the upper part; and a second fluid outlet passage located in the lower part. A method of in situ atomic force microscopy (AFM) measurement of a sample during filtration in a liquid by using the liquid cell described herein is also provided.

Abstract: A sample introduction system for a spectrometer comprises a desolvation region that receives or generates sample ions from a solvent matrix and removes at least some of the solvent matrix from the sample ions. A separation chamber downstream of the desolvation region has a separation chamber inlet communicating with the desolvation region, for receiving the desolvated sample ions along with non-ionised solvent and solvent ion vapours. The separation chamber has electrodes for generating an electric field within the separation chamber, defining a first flow path for sample ions between the separation chamber inlet and a separation chamber outlet. Unwanted solvent ions and non-ionised solvent vapours are directed away from the separation chamber outlet. The sample introduction system has a reaction chamber with an inlet communicating with the separation chamber outlet, for receiving the sample ions from the separation chamber and for decomposing the received ions into smaller products.

Abstract: An air duct sterilization system, and a device and method for producing the air duct sterilization system. The system includes a plurality of ultraviolet light-emitting diodes (UV LEDs), arranged in a UV LED strip within an air duct, configured to destroy airborne biological contaminants in the air duct. The device includes wheel assemblies and an applicator assembly. During installation of the UV LED strip, the wheel assemblies contact a lower surface and an upper surface of an interior of the air duct, thereby enabling the device to roll along the interior of the air duct. The UV LED strip is applied to the upper surface of the interior of the air duct using the applicator assembly, with minimal effort needed from an individual performing the installation. After installation, the UV LEDs are illuminated as needed to destroy airborne biological contaminants, thereby sterilizing the air duct and air therein.

Abstract: A method of mass spectrometry is disclosed comprising selecting a modification of interest that may modify the mass to charge ratios of precursor ions of interest when said precursor ions are subjected to a fragmentation or reaction condition for producing product ions. The method then filters the product ions (or product ion data) such that only a subset of the product ions are transmitted and detected (or a subset of the data remains) and so as to exclude product ions (or product ion data) that could not have possibly resulted from the modification of interest. This significantly simplifies the product ion data, enabling the product ions to be identified or compared to precursor ion spectra more efficiently.

Abstract: A portable system 1 for analyzing gaseous flows that vary over time is described, the system comprising a sampling chamber 18, a gas sampling module 7, an ion filtering module 8 and an ion detecting module 9. The gas sampling module 7 is configured to adjust an input gaseous flow Fi of gas particles from the sampling chamber 18, ionize said gas particles and to emit the produced ions, so as to generate an ion flow I. The ion filtering module 8 is configured to controllably select at least one type of ion present in the ion flow I and to generate a corresponding at least one homogeneous ion beam I?, having an intensity representative of the concentration of the corresponding gas particle in the gaseous composition to be analyzed. The ion detecting module 9 is configured to measure the intensity of the at least one ion beam I?.

Abstract: Apparatus include a reflector positioned adjacent to a sample location that is situated to receive a charged particle beam (CPB) along a CPB axis from a CPB focusing assembly so that the reflector is situated to receive light emitted from a sample at the sample location based on a CPB-sample interaction or a photon-sample interaction and to direct the light to a photodetector, and a steering electrode situated adjacent to the reflector so as to direct secondary charged particles emitted from the sample based on the CPB-sample interaction away from the reflector and CPB axis. Methods and systems are also disclosed.

Abstract: An ion implantation system may include an ion source to generate an ion beam, a substrate stage disposed downstream of the ion source; and a deceleration stage including a component to deflect the ion beam, where the deceleration stage is disposed between the ion source and substrate stage. The ion implantation system may further include a hydrogen source to provide hydrogen gas to the deceleration stage, wherein energetic neutrals generated from the ion beam are not scattered to the substrate stage.