Patents Examined by Raul J Rios Russo
  • Patent number: 11828898
    Abstract: A system for detecting underground utilities in a certain area, comprising one or more transmitters deployed to transmit electromagnetic signals in one or more frequency bands into the ground in a certain area, one or more electromagnetic sensors adapted to capture electromagnetic radiation emitted by one or more underground utilities in the certain area responsive to excitation by the electromagnetic signals transmitted by the transmitter(s), and one or more processors communicatively coupled to the electromagnetic sensor(s) and adapted to detect the underground utility(s) according to the electromagnetic radiation captured by the electromagnetic sensor(s).
    Type: Grant
    Filed: April 30, 2023
    Date of Patent: November 28, 2023
    Assignee: Exodigo Ltd.
    Inventors: Arad Eizen, Yaniv Fichman, Oriel Halvani
  • Patent number: 11831208
    Abstract: A device includes a substrate with an excitation coil configured to generate a magnetic field in reaction to an input signal fed in, and with a pickup coil arrangement configured to generate an output signal in reaction to a magnetic field. The excitation coil includes one or more turns arranged around the pickup coil arrangement in a ring-shaped manner in a plan view of the substrate plane. The device further includes a chip package comprising at least one electrical connection connected to the pickup coil arrangement by means of a signal-carrying conductor. In accordance with the concept described herein, the chip package is positioned on the substrate in such a way that the signal-carrying conductor and the one or more turns of the excitation coil do not overlap in a plan view of the substrate plane.
    Type: Grant
    Filed: April 16, 2021
    Date of Patent: November 28, 2023
    Assignee: Infineon Technologies AG
    Inventor: Udo Ausserlechner
  • Patent number: 11821944
    Abstract: An apparatus for measuring a device current of a device under test (DUT) includes a first circuit including a first terminal for coupling to a first connection terminal of the DUT. The first circuit is configured to supply a first test voltage for the first terminal and to output a first output voltage sensed at the first terminal. The apparatus further includes a second circuit having a second terminal for coupling to a second connection terminal of the DUT. The second circuit is configured to supply a second test voltage for the second terminal and to output a second output voltage sensed at the second terminal. The apparatus further includes a third circuit configured to determine the device current of the DUT based on the first output voltage, the second output voltage, the first test voltage and the second test voltage. The first circuit and the second circuit are identical.
    Type: Grant
    Filed: February 25, 2022
    Date of Patent: November 21, 2023
    Assignee: Infineon Technologies AG
    Inventors: Josef-Paul Schaffer, Joost Adriaan Willemen
  • Patent number: 11821815
    Abstract: An apparatus includes an acquisition means for acquiring displacement quantity in a time-series manner, the displacement quantity being generated at a measurement part of a structure by the weight of a vehicle that travels on the structure, a detection means for detecting the size of the vehicle that passes through the structure and detecting the type of the vehicle from the size, and a control means for controlling the acquisition means on the basis of the detected type of the vehicle.
    Type: Grant
    Filed: March 26, 2019
    Date of Patent: November 21, 2023
    Assignee: NEC CORPORATION
    Inventor: Gaku Nakano
  • Patent number: 11821754
    Abstract: Systems and techniques are described herein. For example, a process can include obtaining first sensor measurement data associated with a and second sensor measurement from one or more sensors. In some cases, the first measurement data can be associated with a first time and the second sensor measurement data can be associated with a second time occurring after the first time. In some aspects, the process includes determining that the first sensor measurement data and the second sensor measurement data satisfy at least one batching condition. In some examples, the process includes, based on determining that the first sensor measurement data and the second sensor measurement data satisfy the at least one batching condition, generating a sensor measurement data batch including the first sensor measurement data, the second sensor measurement data, and at least one target sensor measurement data. Ins examples the process includes outputting the sensor measurement data batch.
    Type: Grant
    Filed: February 18, 2022
    Date of Patent: November 21, 2023
    Assignee: QUALCOMM Incorporated
    Inventors: Diyan Teng, Junsheng Han, Victor Kulik, Mehul Soman, Rashmi Kulkarni
  • Patent number: 11821948
    Abstract: A measurement system for measuring a device under test is described. The measurement system includes a control and analysis module composed of one or more circuits, a stimulus module composed of one or more circuits, and a measurement interface composed of ,for example, one or more circuits. The stimulus module is configured to generate an electric stimulus signal based on predefined measurement parameters. The measurement system is configured to be connected to a device under test via the measurement interface. The measurement interface is configured to forward the electric stimulus signal from the stimulus module to the device under test. The measurement interface further is configured to forward a response signal from the device under test to the control and analysis module, wherein the response signal corresponds to a response of the device under test to the stimulus signal. The control and analysis module is configured to analyze the response signal, thereby generating a set of analysis data.
    Type: Grant
    Filed: November 13, 2020
    Date of Patent: November 21, 2023
    Assignee: Rohde & Schwarz GmbH & Co. KG
    Inventors: Philipp Weigell, Sascha Kunisch
  • Patent number: 11815472
    Abstract: To shorten a waiting time for a belongings inspection, the present invention provides an inspection system 10 including: an electromagnetic wave transmission/reception unit 11 that irradiates an electromagnetic wave having a wavelength of equal to or more than 30 micrometers and equal to or less than one meter, and receives a reflection wave; a detection unit 12 that performs detection processing, based on a signal of the reflection wave; a decision unit 13 that decides a path in which an inspection target person advances, based on a result of the detection processing; and a guide unit 14 that performs processing of guiding the inspection target person to a decided path.
    Type: Grant
    Filed: March 9, 2022
    Date of Patent: November 14, 2023
    Assignee: NEC CORPORATION
    Inventors: Naoya Nakayama, Masanori Sekido, Shinichi Morimoto, Masayuki Ariyoshi
  • Patent number: 11815531
    Abstract: A current sensor of a detection target current using a shunt resistor includes: a resistance value correction circuit having: a correction resistor; a signal application unit that applies an alternating current signal to a series circuit of the shunt resistor and the correction resistor; a first voltage detection unit that detects the terminal voltage of the shunt resistor; a second voltage detection unit that detects a terminal voltage of the correction resistor; and a correction unit that calculates the resistance value of the shunt resistor based on a first voltage detection value by the first voltage detection unit and a second voltage detection value by the second voltage detection unit, and corrects the resistance value for current detection based on a calculated resistance value of the shunt resistor.
    Type: Grant
    Filed: July 28, 2022
    Date of Patent: November 14, 2023
    Assignees: DENSO CORPORATION, TOYOTA JIDOSHA KABUSHIKI KAISHA, MIRISE Technologies Corporation
    Inventors: Tomohiro Nezuka, Yoshikazu Furuta, Shotaro Wada
  • Patent number: 11806770
    Abstract: Methods, apparatus, systems, and computer-readable media are provided for tracking amounts of wires provided to a winding head during a winding operation of a wire distribution system. The wires can be tracked using one or more wire tracking devices that can be disposed at one or more locations within the wire distribution system. The wire tracking devices can provide information related to the amounts of wires and the types of wires being used to wind about a winding head/form. The information can be used to check for errors during a winding operation and indicate the progress of the winding operation. The information can also be used to update wire-availability data to reflect the amount of wire that has been provided during the winding operation.
    Type: Grant
    Filed: June 23, 2022
    Date of Patent: November 7, 2023
    Assignee: CLARK INNOVATIVE TECHNOLOGIES, LLC
    Inventor: Joseph Timothy Clark
  • Patent number: 11808657
    Abstract: A stress distribution image processing device including: a processing unit configured to: designate a normalization region which includes a portion of stress equal to or larger than a predetermined threshold value in a screen of a stress distribution image of a target object; and normalize pixels in the normalization region based on stress values in the normalization region to obtain a normalized image.
    Type: Grant
    Filed: December 28, 2021
    Date of Patent: November 7, 2023
    Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
    Inventor: Yousuke Irie
  • Patent number: 11808796
    Abstract: A method to evaluate a semiconductor-superconductor heterojunction for use in a qubit register of a topological quantum computer includes (a) measuring one or both of a radio-frequency (RF) junction admittance of the semiconductor-superconductor heterojunction and a sub-RF conductance including a non-local conductance of the semiconductor-superconductor heterojunction, to obtain mapping data and refinement data; (b) finding by analysis of the mapping data one or more regions of a parameter space consistent with an unbroken topological phase of the semiconductor-superconductor heterojunction; and (c) finding by analysis of the refinement data a boundary of the unbroken topological phase in the parameter space and a topological gap of the semiconductor-superconductor heterojunction for at least one of the one or more regions of the parameter space.
    Type: Grant
    Filed: February 15, 2022
    Date of Patent: November 7, 2023
    Assignee: Microsoft Technology Licensing, LLC
    Inventors: Dmitry Pikulin, Mason L Thomas, Chetan Vasudeo Nayak, Roman Mykolayovych Lutchyn, Bas Nijholt, Bernard Van Heck, Esteban Adrian Martinez, Georg Wolfgang Winkler, Gijsbertus De Lange, John David Watson, Sebastian Heedt, Torsten Karzig
  • Patent number: 11802808
    Abstract: The present disclosure provides an automatic test system for actual stress of a bridge based on DIC technology, where the system includes a camera, a phosphor spraying device, a computer, and a sliding rail; the sliding rail is arranged on both sides of an upper wing of a box-shaped concrete beam; the phosphor spraying device is used to spray phosphor on a web of the box-shaped concrete beam to form speckles of varying light and shade; the camera is slidably connected to the sliding rail through a bracket, and is used to photograph the speckles and transmit a speckle image to the computer; and the computer is used to analyze and process the speckle image taken by the camera and generate a time history diagram of stress.
    Type: Grant
    Filed: June 24, 2020
    Date of Patent: October 31, 2023
    Assignees: JSTI GROUP CO. LTD, NANJING TECH UNIVERSITY
    Inventors: Duo Liu, Jiandong Zhang, Hui Xiong, Xiaonan Feng, Xianqiang Wang, Jun Lu
  • Patent number: 11802843
    Abstract: A method of operating a sensor system for detecting one or more analytes in a target includes preparing for an analyte scan of the target, generating an analyte scan that includes one or more frequencies in a radio or microwave range of the electromagnetic spectrum, and controlling a non-invasive sensor to implement the analyte scan of the target using. One or more of implementing a warm-up preparatory scan and/or detecting for external signal interference and the analyte scan being generated based on the detection for the external signal interference. A sensor system includes a non-invasive sensor and a controller for the non-invasive sensor. A sensor system includes a non-invasive sensor and one or more auxiliary sensors communicatively connected to the non-invasive sensor.
    Type: Grant
    Filed: July 15, 2022
    Date of Patent: October 31, 2023
    Assignee: KNOW LABS, INC.
    Inventor: Phillip Bosua
  • Patent number: 11798157
    Abstract: The present disclosure relates to non-destructive methods for collecting data from three-dimensional objects. Method include directing one or more interrogating beams of light towards a surface of a three-dimensional object, where the three-dimensional object includes one or more underlying surfaces, and one or more materials having excitonic properties are disposed on the surface of the three-dimensional object; capturing, using an imaging device, optic response of the one or more materials having excitonic properties to the one or more interrogation beams; and computing, using the imaging device, a distance between the one or more underlying surfaces and the one or more materials having excitonic properties, where the optic response of the one or more materials having excitonic properties is a function of the distance between the one or more materials having excitonic properties and the one or more underlying surfaces.
    Type: Grant
    Filed: October 9, 2020
    Date of Patent: October 24, 2023
    Assignee: THE REGENTS OF THE UNIVERSITY OF MICHIGAN
    Inventors: Parag Deotare, Zidong Li, Kanak Datta
  • Patent number: 11796421
    Abstract: A monitoring device for monitoring a bearing in an electromagnetic field environment includes a vibration sensor for delivering at least one measurement that includes at least one vibration frequency generated by a bearing, and a processing module that includes a first processing module configured to determine at least one normalized measured value from the at least one vibration frequency, a filtering module configured to compare the normalized measured value to at least one predetermined normalized reference value indicative of electromagnetic phenomena acting on the bearing, and a second processing module configured to process the at least one vibration frequency to determine a bearing defect if the normalized measured value is different from the at least one predetermined normalized reference value.
    Type: Grant
    Filed: March 1, 2022
    Date of Patent: October 24, 2023
    Assignee: AKTIEBOLAGET SKF
    Inventors: Elizabertus Maljaars, Alireza Azarfar, Kareem Gouda, Lambert Karel van Vugt, Cornelis Harm Taal
  • Patent number: 11786852
    Abstract: The present invention relates to a method for predicting physical properties of an amorphous porous material which may predict an acoustic physical property value and an absorption coefficient from parameters of an amorphous porous material, and may estimate the acoustic characteristics with the amorphous porous material which is an amorphous specimen even without separately producing a formalized specimen such as a cylindrical specimen or a flat specimen. Further, the method for predicting physical properties of the amorphous porous material may estimate the acoustic physical properties through the analysis of a three-dimensional pore connection structure, which is a microstructure of an amorphous specimen, even without acoustic impedance, thereby estimating the acoustic physical properties which accurately reflect the characteristics of the actual specimen.
    Type: Grant
    Filed: August 11, 2020
    Date of Patent: October 17, 2023
    Assignees: Hyundai Motor Company, Kia Motors Corporation, Seoul National University R&DB Foundation
    Inventors: Jung Wook Lee, Seong Je Kim, Hyeong Rae Lee, Yeon June Kang, Sung Soo Yang
  • Patent number: 11782083
    Abstract: A relay pogo contact first charged device model test head apparatus for relay-based contact first field induced charged device model testing has a ground plane of conductive material, a coaxial connector whose outer conductor electrically connects to the ground plane, a current-sensing element with one terminal electrically connects to the ground plane and the other terminal electrically connects to the center conductor of the coaxial connector, a switch where the first terminal electrically connects to a center conductor of the coaxial connector, and a probe with one end electrically connected to a second terminal of the switch and the other end exposed to contact external objects.
    Type: Grant
    Filed: April 22, 2022
    Date of Patent: October 10, 2023
    Inventors: Wei Huang, David Pommerenke, Huiping Yang, Matthew Drallmeier
  • Patent number: 11774523
    Abstract: Transistor devices are provided. In some example implementations, a magnetic field sensor chip is fitted on a load electrode of a transistor chip. In other example implementations, two magnetic field sensors are arranged on a load electrode of a transistor chip in such a way that they measure different effective magnetic fields in the event of current flow through the transistor chip.
    Type: Grant
    Filed: January 24, 2022
    Date of Patent: October 3, 2023
    Assignee: Infineon Technologies AG
    Inventor: Stephan Leisenheimer
  • Patent number: 11774311
    Abstract: A testbench system is disclosed. The system includes a network interface; a memory storage; a transducer; and one or more processors. The one or more processors are configured to operate in a first phase and: perform calibration of the transducer and generate calibration data; generate a unique identification (CTS-ID) for the transducer based on the calibration data; mark the transducer with the CTS-ID; and provide the CTS-ID and the calibration data to the network interface for transmission to a database.
    Type: Grant
    Filed: May 3, 2021
    Date of Patent: October 3, 2023
    Assignee: ContiTech USA, Inc.
    Inventors: Cameron Banga, Jeremy Jay Lidgett, Michael Wilder, Jaroslaw Zakrzewski
  • Patent number: 11774524
    Abstract: A magnetic sensor includes an angle sensor including first magnetoresistive elements and producing an output based on an angle between a direction of an external magnetic field and a reference direction, and a magnetic field strength sensor including second magnetoresistive elements and producing an output based on a strength of the external magnetic field. The angle sensor and the magnetic field strength sensor have a same or substantially a same direction of normal to a reference surface for sensor formation. The magnetic field strength sensor has different output characteristics in accordance with the angle between the direction of the external magnetic field and the reference direction. Based on the angle between the direction of the external magnetic field and the reference direction detected by the angle sensor and the output from the magnetic field strength sensor, the strength of the external magnetic field is determined.
    Type: Grant
    Filed: September 9, 2021
    Date of Patent: October 3, 2023
    Assignee: MURATA MANUFACTURING CO., LTD.
    Inventor: Masashi Kubota