Patents Examined by Raul J Rios Russo
  • Patent number: 11774486
    Abstract: A method for controlling temperature in a temperature control system. The method includes providing a temperature control system including a controller, a first contactor assembly having a first channel system, a plurality of first contacts, each of the first contacts including a portion that is disposed within the first channel system, and one or more of a first exhaust valve or a first inlet valve, and a second contactor assembly having a second channel system, a plurality of second contacts, each of the second contacts including a portion that is disposed within the second channel system, and one or more of a second exhaust valve or a second inlet valve. The method also includes receiving, by the first contactor assembly, a fluid at a first temperature. The method also includes receiving, by the second contactor assembly, the fluid at the first temperature.
    Type: Grant
    Filed: June 29, 2022
    Date of Patent: October 3, 2023
    Assignee: DELTA DESIGN INC.
    Inventors: Jerry Ihor Tustaniwskyj, Steve Wetzel
  • Patent number: 11770053
    Abstract: A method for determining a voice coil position of a voice coil includes providing a magnetic circuit having a magnetic gap and suspending the voice coil in the magnetic gap, applying a driving signal to the voice coil to produce an electromotive force, providing inductive sensors mechanically coupled to the voice coil, measuring inductive sensor signals based on outputs from the inductive sensors, processing the measured inductive sensor signals by determining at least one inductive sensor signal ratio, and determining a representation of the voice coil position based on the at least one inductive sensor signal ratio. A voice coil system, which can be incorporated in a loudspeaker, is configured to carry out the method.
    Type: Grant
    Filed: December 7, 2020
    Date of Patent: September 26, 2023
    Assignee: TYMPHANY ACOUSTIC TECHNOLOGY LIMITED
    Inventors: Ruben Minoru Tuemp Millyard, George Albert Bullimore
  • Patent number: 11764488
    Abstract: Methods for determining variability in a state of a medium, include monitoring the medium and determining the variability in the state of the medium based on the processing of the response over time based on the response detected at the at least one receive element over time. Monitoring the medium can include generating a transmit signal, transmitting it into the medium using a transmit element, and receiving a signal from the medium at a receive element. The transmit and receive elements can be decoupled from one another. The transmit and receive elements can have differing geometry. The determined variability in the state of the medium can be used to provide notifications and/or take automated actions.
    Type: Grant
    Filed: September 3, 2021
    Date of Patent: September 19, 2023
    Assignee: KNOW LABS, INC.
    Inventors: Phillip Bosua, Dominic Klyve
  • Patent number: 11762035
    Abstract: An abnormality detection method according to one aspect of the present disclosure is a method of detecting an abnormality in an AC signal to be input from an AC power supply. The method includes, where an ideal AC signal is represented as V0 sin ?t (V0: amplitude, co: angular frequency, t: time), calculating an arithmetic value including a value represented by sin2?t+cos2?t and determining that the AC signal is abnormal when the arithmetic value is out of a threshold range.
    Type: Grant
    Filed: May 31, 2022
    Date of Patent: September 19, 2023
    Assignees: Tokyo Electron Limited, AVALDATA CORPORATION
    Inventors: Tomoya Bessho, Shiro Hayashi, Junichi Harada, Akitsugu Noguchi
  • Patent number: 11762039
    Abstract: Electrical installation comprising a monitoring module positioned between a sensor connected to a measurement cable and first and second power supply cables for the sensor. The monitoring module comprises a first transistor comprising a first and a second power electrode and a control electrode, the first and the second power electrodes of the first transistor being electrically connected to the second power supply cable and to the measurement cable, respectively, so that, when the first transistor is in the closed state thereof, a first fault value is generated on the measurement cable. The control electrode of the first transistor is connected to the first power supply cable so that the loss of first potential on the first power supply cable, caused by the interruption thereof, automatically triggers the switching of the first transistor to the closed state thereof.
    Type: Grant
    Filed: February 21, 2020
    Date of Patent: September 19, 2023
    Assignee: CROUZET AUTOMATISMES
    Inventors: Hervé Carton, Thomas Stemmelen, Loic Clémenson
  • Patent number: 11761946
    Abstract: A device for measuring fluid parameters may be modular or integrally formed. The device is positioned on a machine that includes one or more fluids to be monitored, and the device includes a (1) controller, (2) spacer that connects to a power source and that may include one or more connectors to connect to remote sensors, and (3) an optional manifold through which the fluid may pass. The manifold could include fluid sensors and/or be connectable to a sample bottle for the purpose of taking fluid samples.
    Type: Grant
    Filed: January 27, 2021
    Date of Patent: September 19, 2023
    Assignee: LogiLube, LLC
    Inventors: William J. Gillette, Keith Dirks
  • Patent number: 11763912
    Abstract: A power verification circuit is provided. The power verification circuit includes a current source, a resistive random access memory (RRAM) cell and a Zener diode. The current source is coupled to a power terminal. The RRAM cell is coupled between the current source and a ground terminal. The Zener diode has an anode coupled to the RRAM cell and a cathode coupled to the power terminal. The impedance of the RRAM cell is determined by the power voltage applied to the power terminal.
    Type: Grant
    Filed: April 8, 2021
    Date of Patent: September 19, 2023
    Assignee: NUVOTON TECHNOLOGY CORPORATION
    Inventor: Liang-Chuan Lee
  • Patent number: 11754637
    Abstract: An apparatus for testing components for use in a power system includes at least one power amplifier circuit configured to be coupled to the component and a control circuit configured to operate the power amplifier circuit responsive to at least one state of a component emulator for the component included in a system emulator for the power system. The component emulator may include at least one power electronics converter circuit and the control circuit may be configured to control at least one of a voltage and a current of the at least one power amplifier circuit responsive to at least one of a voltage and a current of the at least one power electronics converter circuit. The control circuit may be further configured to control the component emulator responsive to at least one state of the at least one power amplifier circuit.
    Type: Grant
    Filed: March 10, 2021
    Date of Patent: September 12, 2023
    Assignee: University of Tennessee Research Foundation
    Inventors: Fei Wang, Jingxin Wang, Yiwei Ma
  • Patent number: 11754435
    Abstract: The invention relates to a method (1) for monitoring a rotating machine (100) of an aircraft, wherein a measurement signal is acquired from the rotating machine. According to the invention, instantaneous frequencies (fK(t)) of sinusoidal components of the measurement signal are estimated, and, using a computing module (12), a plurality of successive iterations are carried out in each of which: complex envelopes of the components are updated (C1), parameters of a model of a noise of the signal are updated (C21) on the basis of the envelopes, whether the model has converged from the preceding iteration to the present iteration is tested (C4), with a view to: o if not, carrying out a new iteration, o if so, performing a computation (D) of the complex envelopes on the basis of the iterations that have been carried out.
    Type: Grant
    Filed: November 3, 2020
    Date of Patent: September 12, 2023
    Assignee: SAFRAN
    Inventors: Yosra Marnissi, Dany Abboud, Mohammed El Badaoui
  • Patent number: 11749648
    Abstract: A circuit structure for testing through silicon vias (TSVs) in a 3D IC, including a TSV area with multiple TSVs formed therein, and a switch circuit with multiple column lines and row lines forming an addressable test array, wherein two ends of each TSV are connected respectively with a column line and a row line. The switch circuit applies test voltage signals through one of the row lines to the TSVs in the same row and receives current signals flowing through the TSVs in the row from the columns lines, or the switch circuit applies test voltage signals through one of the column lines to the TSVs in the same column and receives current signals flowing through the TSVs in the column from the row lines.
    Type: Grant
    Filed: July 13, 2021
    Date of Patent: September 5, 2023
    Assignee: Powerchip Semiconductor Manufacturing Corporation
    Inventors: Shou-Zen Chang, Chun-Lin Lu, Chun-Cheng Chen
  • Patent number: 11747362
    Abstract: In a method for determining vibrations generated by a device, first vibration measurements are received from a first accelerometer coupled to the device, the first vibration measurements comprising a first device vibration contribution and a first environmental vibration contribution, wherein the device is located within an environment comprising a plurality of devices capable of generating vibrations. Second vibration measurements are received from a second accelerometer located within the environment and not connected to the device, the second vibration measurements comprising a second device vibration contribution and a second environmental vibration contribution. The first vibration measurements and the second vibration measurements are compared. Based on the comparing, the first device vibration contribution is estimated.
    Type: Grant
    Filed: December 20, 2021
    Date of Patent: September 5, 2023
    Inventors: Ardalan Heshmati, Mahdi Heydari, Jibran Ahmed
  • Patent number: 11740282
    Abstract: An apparatus includes an input probe configured to be placed on a first cluster of u-bumps disposed on a semiconductor die, output probes configured to be respectively placed on multiple clusters of u-bumps disposed on the semiconductor die, the multiple clusters being separately connected to the first cluster. The apparatus further includes a space transformer and printed circuit board (PCB) portion including a current source configured to supply a current to the input probe placed on the first cluster, resistors having a same resistance and being connected to ground, and tester channels at which voltages are respectively measured, the tester channels being respectively connected to ends of the output probes respectively placed on the multiple clusters and being respectively connected to the resistors. The apparatus further includes a processor configured to determine whether the input probe is properly aligned with the first cluster, based on the measured voltages.
    Type: Grant
    Filed: March 31, 2022
    Date of Patent: August 29, 2023
    Assignee: INTEL CORPORATION
    Inventors: Jagat Shakya, Joseph Parks, Jr., Ethan Caughey, Ashwin Ashok, Prasanna Thiyagasundaram
  • Patent number: 11733288
    Abstract: In some examples, a method of operating a circuit may comprise performing a circuit function under normal conditions, performing the circuit function under aggravated conditions, predicting a potential future problem with the circuit function under the normal conditions based on an output of the circuit function under the aggravated conditions, and outputting a predictive alert based on predicting the potential future problem.
    Type: Grant
    Filed: December 1, 2021
    Date of Patent: August 22, 2023
    Assignee: Infineon Technologies AG
    Inventors: Bernhard Gstoettenbauer, Georg Georgakos, Dirk Hammerschmidt, Veit Kleeberger, Ludwig Rossmeier, Rafael Zalman, Thomas Zettler
  • Patent number: 11733125
    Abstract: An automatic sensitivity adjusting analog ultrasonic sensor includes an ultrasonic transducer, and a front end adjustable gain amplifier that amplifies the received ultrasonic signal from the transducer. A processor generates a carrier signal and a heterodyning circuit combines the carrier signal and the amplified ultrasonic signal to form a modulated signal spectrum from which an audio spectrum signal is generated. The processor further monitors the amplitude level of the audio spectrum signal and executes an auto sensitivity adjustment algorithm that automatically adjusts the sensitivity (the gain) of the analog front end amplifier down if the amplitude is above a preset upper threshold or up if the amplitude is below a present lower threshold. The processor may also further monitors the amplitude level of the ultrasonic signal level directly from the front end adjustable gain amplifier and execute the auto sensitivity adjustment algorithm as required.
    Type: Grant
    Filed: November 18, 2021
    Date of Patent: August 22, 2023
    Assignee: U.E. SYSTEMS, INC.
    Inventors: William Bishop, Gary Mohr
  • Patent number: 11733062
    Abstract: A magnetic measuring apparatus includes at least one magnetic sensor, a coil, a driving circuit configured to supply a current to the coil, a conductor electrically connecting the coil and the driving circuit, and a computing device which estimates relative positions of the magnetic sensor and the coil based on a magnetic field generated by the current supplied to the coil and detected by the magnetic sensor. The magnetic sensor has a magnetic detection sensitivity in a particular direction, and the particular direction of the magnetic sensor and a current vector of the current flowing through the conductor are parallel.
    Type: Grant
    Filed: January 28, 2022
    Date of Patent: August 22, 2023
    Assignee: Ricoh Company, Ltd.
    Inventor: Kazuma Goto
  • Patent number: 11726121
    Abstract: An automated resonant waveguide cavity system for determining one or complex permittivity measurements of a sample is provided. The automated resonant waveguide cavity system includes a resonant cavity, a waveguide coupled to the resonant cavity, a programmable network analyzer (PNA) coupled to the waveguide, and a computing device. The computing device includes a memory storing processor executable code for a determination engine and a processor executing the processor executable code to cause the determination engine to obtain data from the PNA. The data is respective to the sample within the resonant cavity. The determination engine further integrates a plurality of analytical and modeling functions in determining the complex permittivity values of the sample from the data.
    Type: Grant
    Filed: December 1, 2021
    Date of Patent: August 15, 2023
    Inventors: Duane Karns, James Weatherall, Jeffrey Barber, Barry Smith
  • Patent number: 11725631
    Abstract: A method for testing a rotor blade component of a rotor blade for a wind power installation, comprising: dividing a rotor blade component of a rotor blade for a wind power installation into two, three or more rotor blade component segments, forming cutouts in a connection interface at a connection end of one of the rotor blade component segments. A rotor blade component segment of a rotor blade for a wind power installation, the rotor blade component segment comprising a connection end which has been formed by dividing a rotor blade component of a rotor blade for a wind power installation into two, three or more rotor blade component segments, a connection interface at the connection end of the rotor blade component segment, and cutouts which are formed in the connection interface and serve for connection of the rotor blade component segment to a test stand.
    Type: Grant
    Filed: September 21, 2021
    Date of Patent: August 15, 2023
    Assignee: Wobben Properties GmbH
    Inventors: Falko Bürkner, Anna Schwabe
  • Patent number: 11719739
    Abstract: A method for testing a lifetime of a surface state carrier of a semiconductor, including the following steps, 1) a narrow pulse light source is used to emit a light pulse, and coupled to an interior of a near-field optical probe, and the near-field optical probe produces a photon-generated carrier on a surface of a semiconductor material under test through excitation. 2) The excited photon-generated carrier is concentrated on the surface of the semiconductor material, and recombination is conducted continuously with a surface state as a recombination center. 3) A change in a lattice constant is produced due to an electronic volume effect, a stress wave is produced, and a signal of the stress wave is detected in a high-frequency broadband ultrasonic testing mode. 4) Fitting calculation is conducted on the signal of the stress wave to obtain the lifetime of the surface state carrier ?c.
    Type: Grant
    Filed: July 6, 2020
    Date of Patent: August 8, 2023
    Assignee: TONGJI UNIVERSITY
    Inventors: Qian Cheng, Weiya Xie, Ya Gao, Yiming Chen, Yingna Chen, Mengjiao Zhang, Haonan Zhang, Shiying Wu
  • Patent number: 11719733
    Abstract: A non-transitory computer-readable storage medium storing a n EMI calculation program that causes at least one computer to execute a process, the process includes inputting circuit information of a first circuit to a machine learning model; acquiring an EMI value at a certain frequency of the first circuit; selecting, based on an impedance characteristic of the first circuit and the EMI value at the certain frequency, first EMI information from a plurality of pieces of EMI information in each of which an impedance characteristic of each of a plurality of circuits is associated with EMI values at a plurality of frequencies of each of the plurality of circuits; and acquiring an EMI value at another frequency different from the certain frequency of the first circuit based on the EMI value at the certain frequency and the first EMI information.
    Type: Grant
    Filed: February 22, 2022
    Date of Patent: August 8, 2023
    Assignee: FUJITSU LIMITED
    Inventors: Shohei Yamane, Yoichi Kochibe, Hiroaki Yamada, Takashi Yamazaki, Takashi Kobayashi, Masatoshi Ogawa
  • Patent number: 11721599
    Abstract: The invention provides a semiconductor testkey pattern, the semiconductor testkey pattern includes a high density device region and a plurality of resistor pairs surrounding the high density device region, wherein each resistor pair includes two mutually symmetrical resistor patterns.
    Type: Grant
    Filed: March 30, 2021
    Date of Patent: August 8, 2023
    Assignee: United Semiconductor (Xiamen) Co., Ltd.
    Inventors: Linshan Yuan, Guang Yang, Jinjian Ouyang, Jiawei Lyu, Chin-Chun Huang, Wen Yi Tan