Abstract: A sensor apparatus for detecting an overhang on a load of a carrier device, having a sensor arrangement with at least one transmitter and a receiver and also an electronic unit for control purposes. According to the invention, the sensor arrangement senses two regions of the carrier device with a load during a movement of the carrier device such that evaluation of the geometrical position of the regions in relation to one another is made possible, wherein the first region relates to the carrier device and the second region relates to the load. Furthermore, the electronic unit is designed for generating a signal for each region and linking the signals such that it is possible to ascertain an overhang from this.

Abstract: Methods, storage mediums and systems (MS&S) are provided which successively image an imaging region of an assay analysis system (AAS) as particles are loaded into the imaging region, generate a frequency spectrum of each image via a discrete Fourier transform, integrate a same coordinate portion of each frequency spectrum and terminate the loading of particles upon computing an integral which meets preset criterion. In addition, MS&S are provided which send a signal indicative of whether enough particles are in an imaging region for further processes by an AAS based on the magnitude of integral calculated from an image's frequency spectrum. MM&S are also provided such that the steps of generating a frequency spectrum of each image and integrating a portion of each frequency spectrum are replaced by generating a convolved spatial image with a filter kernel and integrating a same coordinate portion of each convolved spatial image.

Abstract: A surface plasmon resonance sensor includes a substrate, a dielectric film having a nonlinear optical effect on a first surface of the substrate, and a probe fixed to the dielectric film. A plasmon resonance is produced by resonating a surface plasmon generated on the first surface of the substrate with an evanescent wave generated on a second surface of the substrate by incident light radiated to the second surface. The plasmon resonance is detected by measuring a change of a component of light reflected on the second surface of the substrate. The component of the reflected light is caused by the nonlinear optical effect. This surface plasmon resonance sensor has a high measuring sensitivity.

Abstract: A system for through silicon via (TSV) structure measurement comprises a reflectometer, and a computing unit. The reflectometer emits a broadband light beam to at least a TSV structure and receives a reflection spectrum of at least a TSV structure. The computing unit is coupled with the reflectometer and determines the depth of the TSV structure in accordance with the reflection spectrum.

Abstract: Micro cuvette assembly for examining biological samples has a first partial plate with one or more first cuvette surfaces and a second partial plate opposite the first and which also has one or more second cuvette surfaces. In an active position of the assembly, the second cuvette surfaces are arranged parallel and in register with the first cuvette surfaces and are spaced apart from the first cuvette surfaces whereby one or more micro cuvettes are formed. The first and second partial plates also have openings arranged in register with the cuvette surfaces and transparent bodies are provided as the cuvette surfaces. The first and second plates are completely penetrated by these openings and the transparent bodies are manufactured from a different material than the partial plates and span the openings close to a first surface of the partial plates.

Abstract: A fork light barrier (1), provided with at least one first, one second, and one third light sensor (FT1 to FT3), which are arranged along an axis (X), wherein the second light sensor (FT2) lies between the first light sensor (FT1) and the third light sensor (FT3). The fork light barrier is advantageously incorporated into a position determining device and/or method.

Abstract: An apparatus and method for measuring the aim of vehicle headlamps including measuring the light intensity of a light beam emitted by a vehicle headlamp to check the aim of the vehicle headlamp. The apparatus includes a linear photosensitive array having a plurality of individual photo sensors positioned between a plurality of baffles. The array is movably mounted to a frame whereby it can be positioned at predetermined locations to measure light beam intensity and correspondingly determine the beam pattern and aim point of a headlamp.

Abstract: An optical measurement method for high-speed acquisition of integral transformed time domain optical signals is presented. A circuit network is used to generate a modulation signal and a reference signal from a broadband signal such as a pseudo random bit sequence. The integral transformed measurements are obtained by cross correlating the time dependent response to the modulated illumination with the reference signal.

Abstract: An apparatus and method for providing image contrast enhancement is disclosed. A mobile object is equipped with a laser source, polarization filter, and imaging apparatus. The reflection of the laser source output passes through the filter and is received by the imaging apparatus. If the output of the laser source impinges a metallic marker plate located at a pre-determined location, the filter decreases the intensity level of image components not associated with the reflection of the laser source output. The imaging apparatus uses such filtered image components to determine the position and/or orientation of the mobile object.

Abstract: In a method for determining a measured variable of a measured medium, wherein the measured medium is brought in contact with an indicator or an indicator mixture, whose absorption spectrum has a first, and a second, wavelength range, which essentially do not overlap, a first light source is activated for emitting a first light signal with a wavelength from the first wavelength range and a second light source is activated for emitting a second light signal with a wavelength from the second wavelength range.

Abstract: An apparatus and method for detecting an increase in thickness of a strip of material from a desired thickness. The apparatus may comprise a light source, a light detector, an indicator, a first fiber optic cable coupled with the light source, a second fiber optic cable coupled with the light detector, and a housing. The housing may comprise a material slot for passing the strip of material therethrough and fixing optical fibers of the first fiber optic cables to reflect light off of a first and second face of the strip of material into optical fibers of the second fiber optic cable. The amount of light detected by the light detector depends on the proximity of each of the faces of the strip of material to ends of the optical fibers. The thicker the strip of material, the less light received by the light detector, which may actuate the indicator.

Abstract: An optical inspection system for inspecting a patterned sample located in an inspection plane includes an illumination unit defining an illumination path, and a light collection unit defining a collection path, each path having a certain angular orientation with respect to the inspection plane. The illumination unit comprises an illumination mask located in a first spectral plane with respect to the inspection plane and the light collection unit comprises a collection mask located in a second spectral plane with respect to the inspection plane being conjugate to the first spectral plane. Arrangements of features of the first and second patterns are selected in accordance with a diffraction response from said patterned sample along a collection channel defined by the angular orientation of the illumination and collection paths.

Abstract: Relates to a micro cuvette assembly (1), comprising a first partial plate (2) with one or more first cuvette surfaces (3) and a second partial plate (4) which is arrangeable relative to the first partial plate and has at least one or more second cuvette surfaces (5) which, in an active position of the micro cuvette assembly (1), are arranged in register plane-parallel to the first cuvette surfaces (3) and spaced apart by a distance (6), thus forming, in the active position of the micro cuvette assembly (1), one or more micro cuvettes (7) in which a liquid volume (8) applied previously to one of the cuvette surfaces (3,5) is held between these two cuvette surfaces (3,5).

Abstract: A defect inspecting apparatus inspects defects of a sample having a pattern formed on the surface. The defect inspecting apparatus is provided with a stage which has a sample placed thereon and linearly moves and turns; a light source; an illuminating optical system, which selects a discretionary wavelength region from the light source and epi-illuminates the sample surface through a polarizer and an objective lens; a detecting optical system, which obtains a pupil image, by passing through reflection light applied by the illuminating optical system from the surface of the sample through the objective lens and an analyzer which satisfies the cross-nichols conditions with the polarizer; and a detecting section which detects defects of the sample by comparing the obtained pupil image with a previously stored pupil image. Conformity of the pattern on a substrate to be inspected can be judged in a short time.

Abstract: A defect detector for corrugated cardboard flutes comprises an optical projector for projecting to traveling flutes an inspection light having an effective line of which the length is about one pitch of flutes inclined slightly so that a tip of a normal flute is positioned on or slightly under the posterior end of the effective line and simultaneously a slope of an adjacent normal flute is positioned on the anterior end side of the effective line, an optical receiver equipped with a light-receiving element for receiving the inspection light reflected by a flute to output information according to the light-receiving position, and normal or abnormal determining means which determines that the flute height is normal if the light-receiving position detected is within an allowable range Wp.

Abstract: A sensor apparatus for detecting an overhang on a load of a carrier device, having a sensor arrangement with at least one transmitter and a receiver and also an electronic unit for control purposes. According to the invention, the sensor arrangement senses two regions of the carrier device with a load during a movement of the carrier device such that evaluation of the geometrical position of the regions in relation to one another is made possible, wherein the first region relates to the carrier device and the second region relates to the load. Furthermore, the electronic unit is designed for generating a signal for each region and linking the signals such that it is possible to ascertain an overhang from this.

Abstract: To provide a defect inspection apparatus and method adapted to easily assign threshold levels to scattered-light detectors and to appropriately acquire data detected by each scattered-light detector. The apparatus includes a stage device on which to rest a sample; a laser light irradiation device that irradiates the sample on the stage device with inspection light; scattered-light detectors, each of which detects a beam of light, scattered from the sample, and outputs an image signal; a threshold level setter formed so that an associated threshold level for judging whether defects are present is set only for an image signal selected from individual image signals of the scattered-light detectors or from image signals obtained by arithmetic processing based on the image signals, and a threshold level setting circuit that acquires the individual image signals, only if the image signal exceeds the threshold level set in the threshold level setter.

Abstract: A fine particle measuring method of performing optical measurement of fine particles introduced into a plurality of sample fluidic channels provided at predetermined distances on a substrate by scanning light to the sample fluidic channels is disclosed. The method includes: sequentially irradiating the light to at least two or more reference regions provided together with the sample fluidic channels; detecting a change of optical property occurring in the light due to the reference regions; and controlling timing of emission of the light to the sample fluidic channels.

Abstract: A simple matrix method and computer program product for stray-light correction in imaging instruments is provided. The stray-light correction method includes receiving raw signals from an imaging instrument and characterizing the imaging instrument for a set of point spread functions. For high resolution imaging instruments, the raw signals may be compressed to reduce the size of the correction matrix. Based on stray-light distribution functions derived from the point spread functions, a correction matrix is derived. This fast correction is performed by a matrix multiplication to the measured raw signals, and may reduce stray-light errors by more than one order of magnitude. Using the stray-light corrected instrument, significant reductions may be made in overall measurement uncertainties in radiometry, colorimetry, photometry and other applications. Because the PSFs may include other types of undesired responses, the stray-light correction also eliminates other types of errors, e.g.

Abstract: The invention relates to a method (100) for producing color elements of a shade guide. To this end, color values of known color elements (15) of shade guides (10) with similar lightness values, hues and chromata are initially ascertained. In another method step, the color values of each new color element are determined while increasing a color distance (16) between the lightness values, hues and chromata of the previously ascertained color values.