Patents Examined by Rebecca C Bryant
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Patent number: 9983256Abstract: To provide a probing device and a probing method for an electronic device capable of confirming whether or not an electrical inspection has been executed appropriately, with an electrode pad being made in contact with a probe with a predetermined pressure, by utilizing a change in external shapes to be formed on the electrode pad when the probe and the electrode pad are pressed onto each other.Type: GrantFiled: October 16, 2014Date of Patent: May 29, 2018Assignee: Tokyo Seimitsu Co. LTDInventors: Yuichi Ozawa, Yasuhito Iguchi, Tetsuo Yoshida, Junzo Koshio
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Patent number: 9976963Abstract: A microcuvette cartridge for optical measurement of a specimen includes: a substrate having a recess on an upper surface thereof to receive a fluid specimen therein, the substrate having a plurality of cavities therein to receive the fluid specimen transported from the recess, the substrate further defining a plurality of channels communicating with the recess and with the plurality of cavities, respectively, to transport the fluid specimen from the recess to the plurality of cavities, said substrate further having one or more of windows at positions corresponding to the plurality of cavities, the windows being transparent to wavelength of light with which the optical measurement is to be carried out so as to allow the light to interact with the fluid specimen in the cavities; and a transport mechanism to promote and complete flows of the fluid specimen from the recess to the plurality of cavities through the plurality of channels.Type: GrantFiled: December 3, 2013Date of Patent: May 22, 2018Assignee: INTEGRATED PLASMONICS CORPORATIONInventors: Nilesh Dinbandhu Shah, Albert Jerwen Mach
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Patent number: 9964443Abstract: A spectrometer having substantially increased spectral and spatial fields.Type: GrantFiled: June 12, 2015Date of Patent: May 8, 2018Assignee: WAVEFRONT RESEARCH, INC.Inventor: Thomas A. Mitchell
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Patent number: 9958262Abstract: A system for measuring the profile or the refractive index of a transparent object by fringe projection techniques is provided and has an image generating device, an image capture device, and an image processor. The image generating device produces a reference image with a long depth of focus. This reference image is emitted into an inspected transparent object, and is distorted by the refractive index and the profile of the transparent object. The image capture device receives the distorted image. The image processor analyzes the difference between the distorted image and the reference image, so as to identify the profile or the refractive index of the inspected transparent object.Type: GrantFiled: August 24, 2015Date of Patent: May 1, 2018Assignee: NATIONAL SUN YAT-SEN UNIVERSITYInventors: Wei-Hung Su, Chau-Jern Cheng, Guang-Hong Chen
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Patent number: 9927226Abstract: A method and a configuration for the depth-resolved optical detection of a specimen, in which a specimen or a part of the specimen is scanned by means of preferably linear illumination. The illumination of the specimen is periodically structured in the focus in at least one spatial direction. Light coming from the specimen is detected and images of the specimen are generated. At least one optical sectional image and/or one image with enhanced resolution is calculated through the specimen. Images are repeatedly acquired and sectional images are repeatedly blended while changing the orientation of the linear illumination relative to the specimen and/or spatial intervals between lines exposed to detection light from the illuminated specimen region are generated for the line-by-line non-descanned detection on an area detector or a camera and/or, during a scan, light is further deflected upstream of the detector through the line in the direction of the scan of the specimen.Type: GrantFiled: January 2, 2014Date of Patent: March 27, 2018Assignee: Carl Zeiss Microscopy GmbHInventors: Michael Kempe, Ralf Wolleschensky, Michael Schwertner
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Patent number: 9903712Abstract: A measuring station system for calibrating a reference system for vehicle measurement has at least one image recording device, a calibration device having multiple calibration device reference features, and a calibration frame having at least three support points which are designed for accommodating a reference system carrier for the reference system to be calibrated. The calibration frame has at least three calibration frame reference features. The positions of the support points and of the calibration frame reference features in a shared coordinate system are known.Type: GrantFiled: January 12, 2012Date of Patent: February 27, 2018Assignee: Robert Bosch GMBHInventors: Darko Pucnik, Christian Wagmann, Jochen Backes, Sven Hodissen, Volker Uffenkamp
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Patent number: 9897437Abstract: There is provided a profile measuring apparatus, including: an irradiation section configured to irradiate a measurement light to a measurement area of the object; an imaging section configured to obtain an image of the measurement area; a table configured to place the object thereon; a coordinate calculation section configured to calculate a position of the measurement area based on an image detected by a detection section; and a positioning mechanism configured to drive and control a relative position of the imaging section and the table. The positioning mechanism calculates a relative position of the imaging section to the table, based on an information with respect to an edge line direction of a convex portion or an extending direction of a concave portion in the measurement area of the object having a repetitive concave-convex shape, to move at least one of the table and the imaging section.Type: GrantFiled: November 29, 2012Date of Patent: February 20, 2018Assignee: NIKON CORPORATIONInventor: Masaya Yamaguchi
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Patent number: 9885695Abstract: In order to be able to prevent analysis accuracy from being reduced by a backward flow of sample gas from dead volume in a cleaning mechanism into a cell at the time of analysis, a gas analysis device has an analysis part that analyzes the sample gas introduced into the cell, gas ports that are arranged toward predetermined regions of gas contact surfaces in the cell, and a piping mechanism that connects the gas ports to a predetermined purge gas source, and blows purge gas from the gas ports toward the predetermined regions at the time of purging. The gas analysis device also has a switching part that switches a connecting destination of the piping mechanism from the purge gas source to a predetermined suction part, and at the time of introducing or analyzing the sample gas, connects the gas ports to the suction source.Type: GrantFiled: February 9, 2012Date of Patent: February 6, 2018Assignee: Horiba, Ltd.Inventors: Shigeru Nakatani, Kenji Hara, Montajir Rahman, Masahiro Nakane
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Patent number: 9880279Abstract: A method and device for object detection are disclosed. In one aspect, a method comprises transmitting a plurality of signals into a region; measuring a noise level during a noise measurement time interval corresponding to each respective one of the plurality of transmitted signals; generating a threshold signal dependent on the noise level; and comparing a first plurality of signals received by a sensor, each of the received signals corresponding to a respective one of the plurality of the transmitted signals, with the respective threshold signal. In another aspect, a device comprising components adapted to carry out the steps of object detection is disclosed. In one example, a thresholding circuit is adapted to generate a threshold signal have a level corresponding to substantially a peak-to-peak level of the measured noise level.Type: GrantFiled: January 9, 2014Date of Patent: January 30, 2018Assignee: BANNER ENGINEERING CORPORATIONInventor: John Alyn Stecker
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Patent number: 9846026Abstract: A light-emitting table suitable for use in metrology includes a plurality of light sources and a field to be illuminated. Light-emitting centers of the light sources represent starting points of light source axes which perpendicularly intersect the field to be illuminated. The light-emitting centers of the light sources on one side and the field to be illuminated on the other side delimit an intermediate space in the interior of the light-emitting table. Located between the light source axes within the intermediate space are curved and mirrored surfaces, the focal points or caustics (K) of which are located within the intermediate space between the curved and mirrored surfaces and the field to be illuminated. A coordinate measuring machine for capturing the coordinates of a workpiece includes at least one optical sensor and a light-emitting table for illuminating the workpiece during measurement of the coordinates of the workpiece using the sensor.Type: GrantFiled: September 27, 2016Date of Patent: December 19, 2017Assignee: Carl Zeiss Industrielle Messtechnik GmbHInventor: Nils Haverkamp
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Patent number: 9816805Abstract: Method of predicting a distribution of light in an illumination pupil of an illumination system includes identifying component(s) of the illumination system the adjustment of which affects this distribution and simulating the distribution based on a point spread function defined in part by the identified components. The point spread function has functional relationship with configurable setting of the illumination settings.Type: GrantFiled: June 11, 2014Date of Patent: November 14, 2017Assignee: NIKON CORPORATIONInventors: Daniel Gene Smith, Eric Peter Goodwin
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Patent number: 9778193Abstract: An apparatus to provide a label-free or native particle analysis comprises a light generating system producing first light pulses at a first wavelength and second light pulses at a second wavelength; and a flow cell coupled to the light generating system to convey particles for analysis. The light generating system is configured to chirp at least one of the first light pulses and the second light pulses to analyze the particles.Type: GrantFiled: August 15, 2014Date of Patent: October 3, 2017Assignee: Kinetic River Corp.Inventor: Giacomo Vacca
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Patent number: 9751181Abstract: A distance measurement holder is attached to the main shaft of a machine tool. A laser beam emitted from a holder main body is reflected by a reflection mirror section fixed to a tapered sleeve, and reflected by a measurement target, and then received by a light receiving section provided in the holder main body. The tapered sleeve is fit into the main shaft and supported to be rotatable relative to the holder main body. The distance measurement holder is shaped such that the angle of a side surface of the reflection mirror section changes in accordance with the rotation angle of the main shaft. The distance measurement holder thus configured determines the distance between the main shaft and the measurement target to determine whether or not a jig, a workpiece, the main shaft, and a cutting tool interfere with each other in the range of a rapid positioning motion specified in an NC program.Type: GrantFiled: June 10, 2014Date of Patent: September 5, 2017Assignee: FANUC CORPORATIONInventor: Yasuyuki Yamamoto
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Patent number: 9746426Abstract: An optical inspection system in accordance with the disclosure can be configured to simultaneously capture illumination reflected in multiple directions from the surface of a substrate, thereby overcoming inaccurate or incomplete characterization of substrate surface aspects as a result of reflected intensity variations that can arise when illumination is captured only from a single direction. Such a system includes a set of illuminators and an image capture device configured to simultaneously capture at least two beams of illumination that are reflected off the surface. The at least two beams of illumination that are simultaneously captured by the image capture device have different angular separations between their reflected paths of travel. The set of illuminators can include a set of thin line illuminators positioned and configured to supply one or more beams of thin line illumination incident to the surface.Type: GrantFiled: July 13, 2011Date of Patent: August 29, 2017Inventor: Ajharali Amanullah
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Patent number: 9726871Abstract: Detection system comprising an examination region, a one-piece optical element including a focusing portion to concentrate light received from the examination region and a guiding portion to homogenize light received from the focusing portion, and a detector configured to detect homogenized light received from the guiding portion.Type: GrantFiled: January 31, 2014Date of Patent: August 8, 2017Assignee: Bio-Rad Laboratories, Inc.Inventors: Denis Pristinski, David P. Stumbo
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Patent number: 9719917Abstract: The present invention discloses a flow cell optical detection system comprising a light source, a flow cell and a light detector, wherein the light detector is arranged in a separate detector unit that is arranged to be releasably attached to a detector interface, the detector interface being in optical communication with the light source and comprises optical connectors for optically connecting the flow cell and the detector unit in the light path from the light source, and wherein the flow cell is an interchangeable unit arranged to be held in position by the detector unit when attached to the detector interface.Type: GrantFiled: November 23, 2009Date of Patent: August 1, 2017Assignee: GE Healthcare Bio-Sciences ABInventors: Hakan Frojdh, Mikael Hornqvist, Stig Tormod, Patrik Akerstrom
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Patent number: 9719919Abstract: An exemplary method for measuring a refractive index of a substance being measured through an optical window, includes arranging the optical window in contact with the substance being measured, directing light to the interface of the optical window and substance being measured, where part of the light is absorbed by the substance being measured and part of it is reflected from the substance being measured to form an image, in which the location of the boundary of light and dark areas expresses a critical angle of the total reflection dependent on the refractive index of the substance being measured, and examining the formed image. Light is directed on a first structure and to desired angles on an interface between the optical window and substance being measured. Light reflected from the interface of the optical window and substance being measured is directed on a second structure.Type: GrantFiled: January 23, 2014Date of Patent: August 1, 2017Assignee: JANESKO OYInventor: Ville Voipio
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Patent number: 9719855Abstract: Methods, storage mediums and systems (MS&S) are provided which successively image an imaging region of an assay analysis system (AAS) as particles are loaded into the imaging region, generate a frequency spectrum of each image via a discrete Fourier transform, integrate a same coordinate portion of each frequency spectrum and terminate the loading of particles upon computing an integral which meets preset criterion. In addition, MS&S are provided which send a signal indicative of whether enough particles are in an imaging region for further processes by an AAS based on the magnitude of integral calculated from an image's frequency spectrum. MM&S are also provided such that the steps of generating a frequency spectrum of each image and integrating a portion of each frequency spectrum are replaced by generating a convolved spatial image with a filter kernel and integrating a same coordinate portion of each convolved spatial image.Type: GrantFiled: May 1, 2014Date of Patent: August 1, 2017Assignee: Luminex CorporationInventor: Nicolas Arab
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Patent number: 9718146Abstract: A method calibrates a laser processing machine by commanding a scan head to direct a laser beam to a desired position, then senses an actual position of the laser beam directly using a position sensitive detector (PSD) after the scan head is positioned. A relative position between the scan head and PSD is altered using one or more linear actuators. A position feedback loop is closed around the linear actuators so that the relative position of the laser beam on the PSD is reduced to zero. The actual position of the laser spot is then measured indirectly by encoders attached to linear axes of the laser processing machine. The actual position is stored in a memory. An error is determined as a difference between the desired position and the actual position. Compensation coefficients are determined from the error and stored for later use during operation of the laser processing machine.Type: GrantFiled: June 3, 2013Date of Patent: August 1, 2017Assignee: Mitsubishi Electric Research Laboratories, Inc.Inventors: Abraham M Goldsmith, Scott A Bortoff, Vijay Shilpiekandula, Alan Sullivan, William S Yerazunis, John C Barnwell, III
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Patent number: 9719921Abstract: A solid body for adjusting, calibrating and/or function checking of a turbidity sensor, which works with electromagnetic waves, especially light, of at least a first wavelength, and wherein the solid body is transparent at least for the light of the first wavelength, characterized in that at least a first region is provided in the solid body, where at least incident light of the first wavelength is scattered. The scattered light is a measure for turbidity.Type: GrantFiled: May 29, 2013Date of Patent: August 1, 2017Assignee: Endress+Hauser Conducta GmbH+Co. KGInventors: Andreas Muller, Matthias Grossmann, Thilo Kratschmer