Patents Examined by Richard A. Rosenberger
  • Patent number: 6597457
    Abstract: Calibration is provided for a diffuser panel (30) on board a spacecraft (10) employed in measuring the intensity of sunlight reflected from subjects on the earth. The calibration is accomplished by comparing the intensity of solar radiation reflected from the panel with the intensity of the solar radiation incident directly from the sun. The comparison is obtained by directing both radiation into an integrating sphere (60) through separate ports (62, 64) which are sized to admit substantially equal amounts of power of the reflected and the direct radiations. A detector (76) detects an average value of intensity of the reflected radiation while the direct rays are excluded by a shutter (94). Upon an opening of the shutter and a deflecting of the diffuser panel from the calibrating position, the detector detects the average value of radiation intensity from the direct rays of the sun.
    Type: Grant
    Filed: January 6, 1994
    Date of Patent: July 22, 2003
    Assignee: Goodrich Corporation
    Inventors: Peter R. Silverglate, Richard A. Rockwell, Edward F. Zalewski
  • Patent number: 6594016
    Abstract: The invention relates to a method of spectroscopically determining the concentration of a volatile organic compound in a gas given off by a mammal. According to the invention, the spectroscopic technique applied is photoacoustic spectroscopy and the strength of the acoustic effect is determined by means of a microphone, as being the measure of the concentration of the organic compound.
    Type: Grant
    Filed: September 5, 2000
    Date of Patent: July 15, 2003
    Assignee: Stichting voor de Technische Wetenschappen
    Inventors: Sacco Te Lintel Hekkert, Franciscus Johannes Maria Harren, David Hubert Parker
  • Patent number: 6594017
    Abstract: The invention relates to a device and a method for moving a measuring sensor (2) into and out of a pressurized or flow-through conduit (1) or a pressurized or flow-through vessel. The device according to the invention comprises, in this case, a holding element (3) for holding the measuring sensor (2), a guiding element (4) for guiding the holding element (3) and a volume element (5). The holding element (3) can be moved in such a way that the measuring sensor (2) held by the holding element comes to rest in a position completely in the volume element (5). In this position, the measuring sensor (2) can be removed from the holding element (3). With the aid of the device according to the invention and the method according to the invention, it is possible, in particular, to measure the cleanliness of a conduit system blown out with a fluid, without the blow-out operation being interrupted.
    Type: Grant
    Filed: September 28, 2000
    Date of Patent: July 15, 2003
    Assignee: Alstom
    Inventor: Joachim Menden
  • Patent number: 6590670
    Abstract: A method for measuring the heights of test parts of an object to be measured and a height-measuring apparatus for carrying out the same, comprising the steps of placing an object on an X-Y table , projecting measurement light flux emitted by a light source on the object supported on the X-Y table from above the object with the measurement light flux being focused in a spot beam by an objective lens on the object, receiving the measurement light flux focused in the spot beam on and reflected from the object to be measured to cause a photosensor to detect the condition of focus on the object to be measured of the measurement light flux focused by the objective lens, moving the light source and the objective lens for horizontal scanning movement relative to the X-Y table while the objective leans is reciprocated vertically at a high speed, and determining the height of each of bonding wires on the basis of the vertical position of the objective lens when the measurement light flux is focused on the bonding wire
    Type: Grant
    Filed: March 6, 2000
    Date of Patent: July 8, 2003
    Assignee: Tsukuba Seiko Ltd.
    Inventors: Akiharu Kato, Sadao Fukuda
  • Patent number: 6590662
    Abstract: An object sensor and object sensing method that sense the status of the sensing surface by detecting a dynamic impact of a rain drop, not by comparing the signal with a reference value. An object sensor sensing the status of a sensing surface by detecting a light with a photo detector, which light has been emitted by a photo emission element and reflected on the sensing surface, comprises: a means for generating a time lag signal from the output signal of the photo detector; a means for calculating a differential signal between the output signal of the photo detector and the time lag signal; and a means for judging the status of the sensing surface by detecting the generation of the differential signal.
    Type: Grant
    Filed: December 26, 2000
    Date of Patent: July 8, 2003
    Assignee: Nippon Sheet Glass Co., Ltd.
    Inventors: Kazuto Kokuryo, Shinji Nagao
  • Patent number: 6583869
    Abstract: Non-contact apparatus for positioning a surface working, testing or inspection device (1) relative to a surface to be worked, tested or inspected (2) at a desired position and orientation relative thereto (3b) including a baseplate (4) locatable at a distance away from the surface (2), means (5) for mounting the surface working, testing or inspection device on the baseplate (4), three or more range finder units (6a, 6b, 6c) removably mounted in spaced array (6d) on the baseplate (4), each of-which three or more range finder units (6a, 6b, 6c) includes a source (7) for impinging a beam (8) of ultra violet, visible light or infra red radiation on the surface (12), a detector (9) for imaging the impinging radiation (12) and for calculating a distance measurement (10a) from a datum location on the respective source (11a) the apparatus also including.
    Type: Grant
    Filed: December 14, 1999
    Date of Patent: June 24, 2003
    Assignee: BAE Systems PLC
    Inventor: Miles Sheridan
  • Patent number: 6583864
    Abstract: A self service terminal (10) including a human iris identification system is described. The iris identification system comprises a camera (30) for recording an image of a human iris via a lens (32), a processor (54) for processing the recorded image, and a plurality of visual indicators (72,74,76 or 82,84,86) associated with the lens (32) for directing a user's eye towards the lens (32) of the camera (30), thereby enabling the camera (30) to record a clear image of the user's eye. A method of directing a user's eye towards a lens (32) of a camera (30) used in a human iris identification system is also described.
    Type: Grant
    Filed: March 31, 2000
    Date of Patent: June 24, 2003
    Assignee: NCR Corporation
    Inventor: Anthony J. Stanners
  • Patent number: 6578961
    Abstract: A massively parallel inspection and imaging system is provided which employs multiple focused beams to illuminate a specimen. Laser light energy passes through a relatively low resolution diffraction grating or digital optical element, which is either one or two dimensional, and concentrates the transmitted energy into multiple discrete directions or orders. The beams split by the diffraction grating pass through a beam expander or telescope and are recombined onto an optical element and diverted toward the specimen. On reflection toward the specimen, the beams diverge again toward a focusing objective. The resultant light thus comprises multiple focused beams, and a relatively large area of the specimen is illuminated simultaneously by these beams. Upon reflection of the light from the sample, light passes back through the focusing objective in multiple beams, and the beams converge toward the optical element and diverge outward in collimated beams.
    Type: Grant
    Filed: March 27, 2001
    Date of Patent: June 17, 2003
    Assignee: KLA-Tencor Corporation
    Inventor: Mehdi Vaez-Iravani
  • Patent number: 6577404
    Abstract: An arrangement and method for measuring surface irregularities of an object comprising at least one source of light arranged to illuminate the object from at least two different positions at a small angle of incidence towards the object, a camera arranged to measure the shadow formation generated by the illumination of the surface microstructure, and an evaluator for determining the surface microstructure from the generated shadow formation by means of signal processing of an input signal from the camera.
    Type: Grant
    Filed: October 9, 2001
    Date of Patent: June 10, 2003
    Assignee: Volvo Personvagnar AB
    Inventors: Erland Max, Peter Larsson
  • Patent number: 6570663
    Abstract: A calibration method and a calibration device for two-point cold calibration are suitable for calibration of any visual measuring system having a width analyzer. In particular, the method and the calibration device are used to calibrate a CCD camera in a visual measuring system used to monitor the diameter of a crystal rod being grown by a crystal growing apparatus using the well-known Czochralski process. The calibration method takes into account non-linear error and avoids the need to actually grow crystals for calibration. The calibration device is specifically designed for quick and accurate set-up.
    Type: Grant
    Filed: July 7, 2000
    Date of Patent: May 27, 2003
    Assignee: Seh America, Inc.
    Inventors: Leo N. Altukoff, Mike W. Mayer, Barton V. White
  • Patent number: 6570650
    Abstract: Disclosed are methods and apparatus for designing an optical spectrum of an illumination light beam within an optical inspection system. A set of conditions for inspecting a film on a sample by directing an illumination light beam at the sample is determined. At least a portion of the illumination light beam is reflected off the sample and used to generate an image of at least a portion of the film on the sample. A plurality of peak wavelength values are determined for the optical spectrum of the illumination light beam so as to control color variation in the image of the film portion. The determination of the peak wavelengths is based on the determined set of conditions and a selected thickness range of the film. In one specific embodiment, the color variation is reduced, while in another embodiment the color variation is increased to enhance pattern contrast. An apparatus which implements the designed optical spectrum is also disclosed.
    Type: Grant
    Filed: September 7, 2001
    Date of Patent: May 27, 2003
    Assignee: KLA-Tenor Corporation
    Inventors: Yu Guan, Hong Fu, Steven R. Lange
  • Patent number: 6570651
    Abstract: The invention relates to a method of determining the optical quality of and detecting faults in flat glass (2) and other transparent materials, especially in float glass, wherein a video camera (1) is arranged to monitor an illuminating device (3) either through the glass (2) or by observing the reflection thereof, the focus being on the glass (2) and the sheet, respectively, and the video camera (1) generates signals in dependence on the quality of the glass (2) and these signals are evaluated, wherein use is made of at least one illuminating device (3), comprising a pattern (4) of adjacent partial portions (5a,5b) alternately different at least in color and/or in intensity, an observation spot of the video camera (1) picks up the pattern (4), two video signals U1,U2 are assigned to the signal of the pattern (4), and a change of the intensity of the video signals U1,U2 is used for evaluating the quality of the glass (2) and the sheet, respectively.
    Type: Grant
    Filed: September 25, 2000
    Date of Patent: May 27, 2003
    Assignee: Lasor AG
    Inventors: Wolfgang Haubold, Josef Droste, Edmund Paneff
  • Patent number: 6570657
    Abstract: Surface plasmon resonance spectroscopy device includes an optical prism with a sample cell associated therewith and at least two sample detection areas that are provided with a thin metal coating selected for implementation of the SPR method and which contains, at least partially, surface-immobilized areas. Light is conducted via an optic fiber, collimated by a collimator with an aperture to a base surface of the prism, applied to an entrance of the optical prism. A multi adaptable diaphragm is provided between the collimator and the entrance surface. The diaphragm defines a path to the prism in a chronologically successive manner. Switching states are allocated to spectra corresponding to the switching states, whereby the spectra are obtained by detecting the light that leaves the prism through another collimator connected to another optic fiber applied to a polychromator wherein spectrally decomposed light is detected and evaluated by an evaluation and control unit.
    Type: Grant
    Filed: July 20, 2000
    Date of Patent: May 27, 2003
    Assignees: Institut Fuer Physikalische Hochtechnolgolie e.V., ANALYTIK Jena GmbH Analysenmessgeraete und Laboreinrichtungen
    Inventors: Lutz Hoppe, Peter Pfeifer, Günter Schwotzer
  • Patent number: 6563586
    Abstract: This invention is an apparatus for imaging metrology, which in particular embodiments may be integrated with a processor station such that a metrology station is apart from but coupled to a process station. The metrology station is provided with a first imaging camera with a first field of view containing the measurement region. Alternate embodiments include a second imaging camera with a second field of view. Preferred embodiments comprise a broadband ultraviolet light source, although other embodiments may have a visible or near infrared light source of broad or narrow optical bandwidth. Embodiments including a broad bandwidth source typically include a spectrograph, or an imaging spectrograph. Particular embodiments may include curved, reflective optics or a measurement region wetted by a liquid. In a typical embodiment, the metrology station and the measurement region are configured to have 4 degrees of freedom of movement relative to each other.
    Type: Grant
    Filed: July 10, 2000
    Date of Patent: May 13, 2003
    Assignee: Therma-Wave, Inc.
    Inventors: Fred E. Stanke, Clinton B. Carlisle, Hung Pham, Edric Tong, Douglas E. Ruth, James M. Cahill, Michael Weber, Elliot Burke
  • Patent number: 6559939
    Abstract: Disclosed are apparatus and associated methods for determining haze for various materials. More particularly, an efficient, high throughput screening methodology for the determination of haze of a plurality of materials is provided whereby contrast reduction characteristics of materials are utilized to determine haze. When utilized with a plurality of materials displayed in an array on a carrier, the present invention provides a substantive increase in the rate of discovery of haze characteristics of materials.
    Type: Grant
    Filed: April 27, 2001
    Date of Patent: May 6, 2003
    Assignee: Avery Dennison Corporation
    Inventor: Dennis L. Saunders
  • Patent number: 6555804
    Abstract: The invention relates to a method and device for detecting objects (3) on a windshield (2). The method comprises the following steps: Placing an optical sensor array (4) on the inner side of a section of the windshield (2), said array having a plurality of individual pixels and being focused on the outer side (7) of the windshield (2); determining the local frequency spectrum S(f) of the intensity fluctuations of pixels of the sensor array (4), said pixels being combined in one or more blocks, and afterwards; evaluating the local frequency spectrum, whereby the detected local frequency spectrum S(f) is compared to one or more reference frequency distributions, and whereby a control signal for triggering one or more actuators is generated when the determined local frequency spectrum S(f) sufficiently conforms to a reference frequency distribution. The device comprises a detecting unit (4) connected to a data processing unit (5).
    Type: Grant
    Filed: July 18, 2000
    Date of Patent: April 29, 2003
    Assignee: Leopold Kostal GmbH & Co. KG
    Inventor: Frank Blasing
  • Patent number: 6556298
    Abstract: A method is presented for non-destructive testing of the state of a surface that may have cracks in it by observing waves emitted by a dye applied to the surface and present in the cracks in response to an incident excitation beam of wavelength appropriate to the dye. The incident excitation beam is an ultraviolet light. The beam is made of rectilinear polarized waves. Waves emitted by the dye are observed through a rotatable polarized wave analyzer. The analyzer is rotated first to eliminate from observation the wave due to the residual dye on the surface and thereafter to determine the depths of the cracks.
    Type: Grant
    Filed: September 29, 2000
    Date of Patent: April 29, 2003
    Assignee: Holores, Inc.
    Inventor: Pierre-Marie Pailliotet
  • Patent number: 6552792
    Abstract: A wavelength modulated photoacoustic spectrometry system and method comprising: generating light from a light source; passing the light through a sample area; sampling sound produced by the light passing through the sample area with an acoustic detector; and controlling wavelength of the light with a wavelength controller, wherein the wavelength controller modulates the wavelength according to a waveform comprising square components.
    Type: Grant
    Filed: October 13, 2000
    Date of Patent: April 22, 2003
    Assignee: Southwest Sciences Incorporated
    Inventors: Jeffrey S. Pilgrim, David S. Bomse
  • Patent number: 6552783
    Abstract: An optical system for use in an inspection system is described. The optical system includes an imaging system which may be provided as a multi-spectral band pass image recording system and a lighting system which includes at least one coaxial light and at least one side light to provide spectral discrimination and to provide contrast between a first surface made from a first material and a second surface made from a second different material.
    Type: Grant
    Filed: June 28, 2000
    Date of Patent: April 22, 2003
    Assignee: Teradyne, Inc.
    Inventors: Peter E. Schmidt, Pamela R. Lipson, John C. Bowman
  • Patent number: 6552810
    Abstract: An optical position measuring system for determining the relative position of a first object which can be moved with respect to a second object along a measuring direction includes at least one periodic measuring graduation, which is connected to the first object and a scanning unit which is connected with the second object. The scanning unit includes a light source emitting beams of light, at least one scanning graduation and a detector arrangement in a detector plane.
    Type: Grant
    Filed: February 2, 2000
    Date of Patent: April 22, 2003
    Assignee: Dr. Johannes Hiedenhein GmbH
    Inventors: Michael Hermann, Walter Huber, Wolfgang Holzapfel, Volker Höfer