Patents Examined by Richard A. Rosenberger
  • Patent number: 6628395
    Abstract: A device and method for performing a preliminary test on a neat serum sample contained in a primary collection tube is provided herein. The method includes the steps of positioning of an optical probe near the primary collection tube and monitoring the neat serum sample in the primary collection tube to determine whether an interferant, such as hemolysis, icteris and lipemia are present in the serum sample. From this test, a hemolytic index, an icteric index and a lipemic index can also be established for the neat serum sample. Based upon these serum indices, the neat serum sample can be transferred to a clinical analyzer for additional testing or to waste receptacle because the sample is compromised. Additionally, a volume test can be performed on the serum sample in the primary collection tube so that the serum sample can be properly allocated during subsequent testing.
    Type: Grant
    Filed: March 6, 2002
    Date of Patent: September 30, 2003
    Assignee: Beckman Coulter, Inc.
    Inventors: Yangang Liu, Tung Rung Wang, Ian Nguyen, Shirley Pfeifer, Jack McNeal
  • Patent number: 6628381
    Abstract: Method and apparatus for optical inspection of a patterned article are presented. A region on the article is illuminated with incident light to produce light returned from the illuminated region. An image of the illuminated region is acquired and analyzed for determining the intensity distribution of light components scattered from the pattern of the illuminated region within a certain collection angular field located outside a solid angle of propagation of specularly reflected light. Based on the determined distribution, light components scattered from the illuminated region and propagating with at least one predetermined solid angle segment of the certain collection angle are collected and directed to a dark-field detection unit.
    Type: Grant
    Filed: June 20, 2000
    Date of Patent: September 30, 2003
    Assignee: Applied Materials, Inc.
    Inventors: Amir Komem, Erel Milshtein
  • Patent number: 6628382
    Abstract: Method and apparatus of spectrophotometry or the like on extremely small liquid samples in which a drop is held between two opposing surfaces by surface tension and one surface is controllably moved toward and away from the other. To provide and transmit exciting energy through the drop for measurement, the optical fibers go through a surface and are finished flush with its surface. One of the surfaces can be swung clear of the other for easy cleaning between tests.
    Type: Grant
    Filed: February 15, 2002
    Date of Patent: September 30, 2003
    Inventor: Charles William Robertson
  • Patent number: 6624884
    Abstract: A laser based inspection tool (LIT) for inspecting planar surfaces is described. In a preferred embodiment the LIT can simultaneously inspect both planar surfaces of disks for use in disk drives. In an embodiment of the invention, light reflected from the surface at an angle slightly offset from perpendicular is routed through a telecentric lens to a detector which converts the intensity of the reflected beam into an analog signal. The analog signal is sampled and digitized to generate pixel data. A data acquisition system sequentially stores the pixel data in a buffer. A median filter and derivative analysis can be applied to the pixel data to detect deviations indicating defects. An optional calibration system periodically reflects the scanning beam back to a detector to form a reference signal for use in absolute reflectivity measurements.
    Type: Grant
    Filed: April 28, 1997
    Date of Patent: September 23, 2003
    Assignee: International Business Machines Corporation
    Inventors: Wayne Isami Imaino, Anthony Juliana, Jr., Milton Russell Latta, Charles H. Lee, Wai Cheung Leung, Hal J. Rosen, Steven Meeks, Richard Sonningfeld
  • Patent number: 6621566
    Abstract: An automated optical inspection (AOI) system includes component learning integrated with the inspection of a circuit board. The AOI system includes a component learning area that can be viewed by an imaging system used to inspect the circuit board in an inspection area. The component learning area can correspond to a region proximate the inspection area. The automated optical inspection system receives board inspection and component learn requests and determines opportune times to learn new component characteristics during the board inspection process so as to minimize the impact of the learning process on the overall inspection efficiency.
    Type: Grant
    Filed: October 2, 2000
    Date of Patent: September 16, 2003
    Assignee: Teradyne, Inc.
    Inventors: Eric Aldrich, Richard Pye, Lyle Sherwood, Douglas W. Raymond, John Burnett
  • Patent number: 6618155
    Abstract: Disclosed herein are TV Camera based and other electro-optical sensors and systems, providing affordable methods and apparatus for high speed determination of dimensions and other features of objects. Particular embodiments capable of fast and reliable acquisition of features of moving objects such as boards and wood products are disclosed. Preferred embodiments utilize laser triangulation range detection with at least two cameras viewing the same laser spot or line projected on the object.
    Type: Grant
    Filed: August 17, 2001
    Date of Patent: September 9, 2003
    Assignee: LMI Technologies Inc.
    Inventors: Leonard Metcalfe, Barry Dashner
  • Patent number: 6618156
    Abstract: Light is transmitted through a compressing clamp which clamps the liquid crystal display panel 10, and the spectrum of light is obtained by a spectrometer 141. A cell thickness is detected based on a wavelength or a frequency at which the spectrum has the minimum or maximum value. The obtained cell thickness is compared with a desired value, and a pressure control unit 132 supplies the compressing clamp with a fluid in accordance with the result of the comparison.
    Type: Grant
    Filed: August 30, 2001
    Date of Patent: September 9, 2003
    Assignee: Seiko Epson Corporation
    Inventor: Masahiro Kuroiwa
  • Patent number: 6614520
    Abstract: Disclosed is a method of inspecting a reticle for defects that occur over time. The invention accomplishes this by generating and storing a “baseline” image of the reticle and then periodically generating a “current” image of the reticle and comparing the current and baseline images. The baseline image is taken at a time when the reticle is known to be acceptable. This may be when the reticle has been “qualified” by an optical test or when a die fabricated by reticle has passed an electrical test. Also disclosed in a method for compacting the baseline image before storage.
    Type: Grant
    Filed: December 18, 1997
    Date of Patent: September 2, 2003
    Assignee: Kla-Tencor Corporation
    Inventors: Noah Bareket, Christian G. Desplat, Lance A. Glasser
  • Patent number: 6614519
    Abstract: An inspection system using laser light directed at an off-axis parabolic mirror which focuses the beam on the surface being inspected and also serves as the collector for scattered and specular light returned from the surface is described. Specular and scattered light returned from the surface onto the parabolic mirror is divided into appropriate fields and directed onto detectors. In the preferred embodiment a polarized laser is used in conjunction with a polarizing beam splitter and a quarter-wave plate to route the reflected beam to a detector while allowing the original beam to be directed through the same optics. The parabolic mirror and selected additional components may be commonly mounted on a translatable stage which is moved along a radius of the disk when the optical inspection is being performed. Other components of the system such as the laser can remain in a fixed position.
    Type: Grant
    Filed: October 25, 2000
    Date of Patent: September 2, 2003
    Assignee: International Business Machines Corporation
    Inventors: Milton Russell Latta, Wai Cheung Leung, Bob C. Robinson, Timothy Carl Strand, Andrew Ching Tam
  • Patent number: 6614539
    Abstract: A bilaterally conjugate telecentric optical system has, sequentially from one conjugate side, a first lens unit in the form of an afocal optical system including sequentially from one conjugate side a first subunit having positive optical power and a second subunit having positive optical power, and having an aperture stop fixed in the optical axis direction at the focal position on the back side of the first subunit; and a second lens unit in the form of an afocal optical system that is movable in the optical axis direction to adjust the focus while maintaining a telecentric state.
    Type: Grant
    Filed: May 2, 2000
    Date of Patent: September 2, 2003
    Assignee: Minolta Co., Ltd.
    Inventor: Yoshie Shimizu
  • Patent number: 6611320
    Abstract: The present invention relates to a method for detecting blood characteristics including hemoglobin in a fluid medium using both transmission and reflection of a light beam which forms a quotient.
    Type: Grant
    Filed: September 7, 2000
    Date of Patent: August 26, 2003
    Assignee: OptoQ AB
    Inventors: Lars-Göran Lindberg, Gunnar Enlund, Magnus Vegfors
  • Patent number: 6611335
    Abstract: A tone burst spectrometer and spectrometry method comprising employing a narrow bandwidth light source, a tone burst modulation waveform generator, synchronization of a lock-in amplifier to a burst frequency of the generator, and one or more of the following: use of a semiconductor laser; setting the tone frequency of the generator to an integer multiple of the burst frequency; using a tone modulation waveform other than a sine wave; setting the tone frequency of the generator to less than a half width at half maximum of a targeted spectral transition; and producing a spectral feature with a high signal to noise ratio while synchronizing the lock-in amplifier to the tone frequency of the generator or an odd harmonic of the tone frequency and wherein the output of the lock-in amplifier is low pass filtered and negative feedback is employed to stabilize the operating wavelength at or near a center wavelength of a spectral feature of the sample.
    Type: Grant
    Filed: August 17, 2000
    Date of Patent: August 26, 2003
    Assignee: Southwest Sciences Incorporated
    Inventor: David Christian Hovde
  • Patent number: 6606153
    Abstract: A light beam is directed towards a surface along a direction normal to the surface. The surface is caused to move so that the beam scans the surface along a spiral path. An ellipsoidal mirror is placed with its axis along the surface normal to collect light scattered by the surface and any anomalies at the surface at collection angles away from the surface normal. In some applications, a lens arrangement with its axis along the surface normal is also used to collect the light scattered by the surface and any anomalies. The light scattered by the mirror and lenses may be directed to the same or different detectors. Preferably light scattered by the surface within a first range of collection angles from the axis is detected by a first detector and light scattered by the surface within a second range of collection angles from the axis is detected by a second detector.
    Type: Grant
    Filed: July 10, 2001
    Date of Patent: August 12, 2003
    Assignee: Kla-Tencor Corporation
    Inventors: Norbert Marxer, Kenneth P. Gross, Hubert Altendorfer, George Kren
  • Patent number: 6606155
    Abstract: A method of determining the presence and quantity of wood treatment substance (pesticides, water repellants, dimension stabilizers and the like) on wood is provided. The wood treatment substance is combined with a fluorescent material and applied to wood. A light beam is impinged on the wood, and reflected light measured by a spectral device. Color saturation level of the reflected light is determined with a microprocessor. From this measurement a quantity of wood treatment substance on the wood can then be determined.
    Type: Grant
    Filed: July 31, 2000
    Date of Patent: August 12, 2003
    Assignee: Kopcoat, Inc.
    Inventors: Alan S. Ross, Hans A. Ward
  • Patent number: 6603554
    Abstract: An apparatus and method determines light transmission through a window. The window may be a single-pane or a double-pane window, and may or may not have coatings on its interior/exterior surfaces. Light transmission through the window can be measured based on power levels of light incident on the window and light reflected from the window. Such measurements can be performed for a wireless optical telecommunication system, in situations where it may be difficult or impossible to access both sides of a window to place or retrieve measurement equipment.
    Type: Grant
    Filed: December 22, 2000
    Date of Patent: August 5, 2003
    Assignee: Terabeam Corporation
    Inventors: Eric C. Eisenberg, Shaun C. Hampton, Jeffrey C. Adams, David P. Bajorins
  • Patent number: 6603555
    Abstract: A gas detecting apparatus includes a gas cell, a laser source, a light diffuser and a photodetector. The gas cell has a gas inlet hole for letting the target gas come inside and a gas discharge hole for discharging the target gas, and retains a target gas to be detected. The laser source emits coherent light into the gas cell in order to detect a concentration of the target gas. The light diffuser is disposed in the optical path of the coherent light output from the laser source to diffuse the coherent light, thereby eliminating coherence of the coherent light. The photodetector receives light diffused by the light diffuser.
    Type: Grant
    Filed: January 6, 2000
    Date of Patent: August 5, 2003
    Assignee: Anritsu Corporation
    Inventors: Masaya Nanami, Toshiyuki Suzuki, Takeshi Tsukamoto
  • Patent number: 6600566
    Abstract: The present invention provides a rough surface scattering method and solver for efficiently computing electromagnetic scattered fields resulting from an incident wave (12) being reflected from a surface slowly varying on the scale of the wavelength (10). The wavelength claimed approach to high-frequency scattering is based on the use of expansions of high order in parameter &lgr;, wavelength of the incident radiation. The resulting high-order expansion approach expands substantially on the range of applicability over low order methods, and can be used in some of the most challenging cases arising in applications. The surface current (14) induced by the incident wave (12) is represented as a high-order high-frequency expansion (20). The surface current ansatz is substituted into the surface current integral equation (22), wherein a surface current series expansion is formed (24) having, a high frequency order.
    Type: Grant
    Filed: September 29, 2000
    Date of Patent: July 29, 2003
    Assignee: Northrop Grumman Corporation
    Inventors: Maria Z. Caponi, Alain Sei, Oscar P. Bruno
  • Patent number: 6597438
    Abstract: A portable or wearable cytometer that can be used at remote locations, such as in the field or at home. The flow cytometer of the present invention may help improve the healthcare of many weak, sick or elderly people by providing early detection of infection. By detecting the infection early, the infection may be more readily treatable. In military applications, the portable cytometer of the present invention may help save lives by providing early detection of infection due to biological agents.
    Type: Grant
    Filed: August 2, 2000
    Date of Patent: July 22, 2003
    Assignee: Honeywell International Inc.
    Inventors: Cleopatra Cabuz, J. David Zook, James Allen Cox, Thomas Raymond Ohnstein, Ulrich Bonne, Eugen Loan Cabuz, Ernest Allen Satren, Aravind Padmanabhan, Teresa M. Marta
  • Patent number: 6597448
    Abstract: A system and method of inspecting a foreign particle or a defect on a sample are provided. Such a method comprises irradiating light to an object to be inspected; detecting reflected light or scattered light from the object to be inspected irradiated with the light; detecting a signal of the foreign particle or the defect from the detected signal; providing information related to a size of the foreign particle or the defect from the signal of the detected foreign particle or the defect; and outputting information on a display screen a distribution of the size of the foreign particle or defect with information indicating a cause of the distribution of the foreign particle or defect.
    Type: Grant
    Filed: August 23, 2000
    Date of Patent: July 22, 2003
    Assignees: Hitachi, Ltd., Hitachi Electronics Engineering Co., Ltd.
    Inventors: Hidetoshi Nishiyama, Minori Noguchi, Yoshimasa Ohshima, Tetsuya Watanabe, Hisato Nakamura, Takahiro Jingu, Yuko Inoue, Keiichi Saiki, Kenji Watanabe
  • Patent number: 6597464
    Abstract: The testing of a cutting-edge geometry of a tool takes place during time intervals that comprise time instants at which it is to be expected that a region, to be tested, of the tool enters a measuring beam. At time instants at which the tool does not enter the measuring beam, no measurements are performed, which increases the reliability of the test and avoids spurious measurements. For this purpose, a measuring system is used that preferably comprises programmable units in order to use the invention flexibly for various machine tools and tools without changing the construction of the measuring system.
    Type: Grant
    Filed: April 17, 2002
    Date of Patent: July 22, 2003
    Assignee: Blum-Novotest GmbH
    Inventors: Heribert Bucher, Bruno Riedter