Abstract: The invention provides a process for checking the bonding of the cellular core of a honeycomb to a skin, said process comprising the steps of: using a light source to illuminate a so-called illuminated zone on the free surface of the honeycomb so as to illuminate the interior of the cells opening out into said illuminated zone, and detecting the emergent light exiting the cells in a so-called observed zone. The minimum distance between said illuminated zone and said observed zone is denoted E and defines a direction D, the distance E being at least equal to the width L1 of the cell mouths measured in the direction D, so as to make it impossible for the illuminated zone and the observed zone to be simultaneously above the mouth of one and the same cell. The invention also provides an instrument for implementing the process.

Abstract: A device for checking sheet packaging, whereby all the defects of packaged articles or sheets are easily and highly accurately detected based on the density or color distribution of reflection and transmission images. Defects such as deformation, discoloration, foreign matters and contamination of an article (16) packaged with a sheet and the sheet are detected by forming a density distribution code image or color code distribution image or by executing inter-image calculation based on a reflection image, a transmission image, or density or color images thereof. The upper and lower light sources are simultaneously turned on to separately form a reflection image and a transmission image from the input image in order to enhance the checking efficiency. Furthermore, a reflector (17) is disposed under a packaging sheet to enhance image contrast and to improve checking efficiency and stability. Optimum conditions for the kind and position of the reflector are clarified.

Abstract: In a pattern projection measurement grating, each cycle of the total amplitude of a sine wave is divided into eight sections, and each of thus divided sections is divided into white regions W and black regions B according to the ratio between the area S of the sine wave and the area So of a rectangular wave having the same amplitude as the sine wave in this section, so as to constitute a black and white binary pattern. Thus obtained pseudo sine wave density distribution is a density pattern close to the sine wave.

Abstract: There is provided a sheet thickness and swell measurement method and apparatus to calibrate a characteristic map of a reference plane with accuracy and on demand, and to provide a simpler construction of means for creating the characteristic map of the reference plane and means for calibrating the characteristic map. Measurement heads 2 are moved to the width direction of sheet 9, and the thickness of the sheet is measured by the sheet thickness measurement sensors 3 installed in the measurement heads 2. The measured values of the sheet thickness are calibrated by a characteristic map MP of the moving mechanism 4 of the measurement head 2 with respect to the sheet width direction, which has been created in advance. Highly directional electromagnetic waves emitting means is arranged on one side of the main frame 1 for emitting highly directional electromagnetic waves 5a, such as light or beam, which define a reference plane for creating the characteristic map.

Abstract: The invention relates to a set-up of measuring instruments for the parallel readout of SPR sensors. The aim of the invention is to provide a measuring arrangement for the parallel readout of a plurality of SPR sensors, wherein the readout process should be terminated within an integration period of less than 30 minutes. To this end, a wavelength-selective component (5) and an optical imaging system (L2, L3) are arranged downstream of a light source (3).

Abstract: An optical scanning inspection method projects a contrasting patterned image onto a specular mirror-like surface reflecting the contrasting patterned image to a camera that traverses through a range while scanning and recording the reflection that reveals defects and flaws on the specular surface. The defects cause distortion of the reflected pattern to enhance recognition and recording of the defects and flaws. The method is well suited for inspecting large solar cell arrays at a standoff distance.

Abstract: A method and apparatus are disclosed for evaluating relatively small periodic structures formed on semiconductor samples. In this approach, a light source generates a probe beam which is directed to the sample. In one preferred embodiment, an incoherent light source is used. A lens is used to focus the probe beam on the sample in a manner so that rays within the probe beam create a spread of angles of incidence. The size of the probe beam spot on the sample is larger than the spacing between the features of the periodic structure so some of the light is scattered from the structure. A detector is provided for monitoring the reflected and scattered light. The detector includes multiple detector elements arranged so that multiple output signals are generated simultaneously and correspond to multiple angles of incidence. The output signals are supplied to a processor which analyzes the signals according to a scattering model which permits evaluation of the geometry of the periodic structure.

Abstract: A 2D displacement sensor is used to measure displacement in three dimensions. For example, the sensor can be used in conjunction with a pulse-modulated or frequency-modulated laser beam to measure displacement caused by deformation of an antenna on which the sensor is mounted.

Abstract: Optical circuits, in optical waveguide structures, are provided by making grating elements in patterns defined by perturbations of the refractive index of the waveguide material. An optical waveguide including ultraviolet (UV) photosensitive material is carried by a substrate to provide a waveguide assembly. The assembly is overlaid with a first mask being nontransparent to ultraviolet light and having a transparent aperture which defines an area of the optical waveguide for formation of an optical circuit. The first mask also includes registration targets. A grating mask with ports for passing ultraviolet light is removably clamped in a space registered relationship over the first mask, to provide a process assembly which is vibration tolerant. Exposing the grating mask to an ultraviolet radiation source, such as a UV lamp, forms the desired perturbations to affect the grating elements. The grating mask is removed and is reusable.

Abstract: A height measuring apparatus characterized by having an illumination optical system for illuminating the surface of an object, a pair of imaging optical systems having optical axis arranged symmetrical with respect to the optical axis of all light beam reflected by the object and designed to converging a part of the light beam along the optical axes, a pair of light-detecting optical systems arranged in a converging plane of the imaging optical systems and designed to detect light spots which change in position in accordance with the height of the object, and height calculator for generating spot-position signals from the light-intensity signals supplied from the light-detecting optical systems and calculating the height of the surface of the object from the spot-position signals.

Abstract: Reflectance of a p-Si film crystallized by laser annealing is measured, a wave length dependency of the reflectance is found, and a first order rate of change is calculated to determine a minimum value near a wave length of 500 nm. The value is to be an inherent optical value under the laser power and relates to a grain size measured by Secco etching or the like. A number of correspondence between the optical value and the grain size are recorded and linearly plotted. By calculating the optical value from the reflectance in the p-Si film at in-line, the grain size is correspondingly determined. Thus, the semiconductor film can be in-line monitored, thereby improving a yield and saving a cost in producing a semiconductor device.

Abstract: A surface plasmon resonance sensor apparatus includes a common substrate, a surface emitting laser, such as a VCSEL, arranged on the common substrate, a sensor array, such as CCD array, arranged on the common substrate, a light-transmitting medium provided above the common substrate, and a metal thin film formed on the light-transmitting medium to cause surface plasmon resonance due to light which is emitted from the surface emitting laser, transmitted through the light-transmitting medium and impinging on the metal thin film. The surface emitting laser, metal thin film and sensor array are positioned such that a change in an intensity of light reflected by the metal thin film caused by the surface plasmon resonance can be measured by the sensor array.

Abstract: A method of inspecting a transparent container for refractive defects includes positioning a light source in spaced relationship with respect to a detector which is operatively associated with a processor for receiving electrical signals from the detectors responsive to light passing through the container being received by the detector. The method includes positioning a grid filter having a plurality of alternating dark and light bands adjacent the light source so as to provide a multiple intensity gradient to the container. The container is positioned between the light source and the detector with the grid filter serving to provide adjacent alternate light and dark bands of light impinging on the container. Refractive defects will cause a distortion of the intensity gradient which will be received by the detector. In a preferred embodiment, a plurality of light and dark bands are generally horizontally oriented and produces a generally triangular wave having a constant absolute slope.

Abstract: A position detecting system for producing relative positional information related to first and second objects, is wherein the system includes a light projecting device for projecting light toward the first and second objects disposed opposed to each other and having physical optic elements, the light projecting device being capable of projecting lights of different wavelengths, a light detecting device for detecting light emitted from the light projecting device and being influenced by both of the physical optic elements of the first and second objects, wherein relative positional information related to the first and second objects is produced on the basis of the detection by the light detecting device, and a spacing setting device for changing the spacing between the first and second objects in accordance with a wavelength of light to be projected by the light projecting device.

Abstract: A metallic (or semiconductor) layer (or layers) is used with either a prism or a grating so as to provide a surface plasmon wave under total reflection conditions of an incident light of predetermined wavelength outside the visible spectrum. The metal layer is selected with a refractive index as small as possible and an extinction coefficient as large as possible within the wavelength of interest and is covered with a solid dielectric layer characterized by predetermined optical parameters. This layer may contain one or several layers of different materials and plays the role of a light waveguide that generates waveguide modes coupled to surface plasmons, resulting in a new set of resonances excited by both p- and s-polarized excitation light and characterized by much narrower spectra than produced by conventional SPR. In a particular embodiment of the invention, the dielectric layer may be designed to serve both as a waveguide and at the same time as an electrode.

Abstract: A surface plasmon sensor contains a dielectric material forming a prism or the like, and a metal film formed on a face of the dielectric material. A sample to be analyzed is dropped on the metal film and the face of the dielectric material. A light beam is incident on the metal film at a plurality of incident angles. Light detectors detect reflected light corresponding to the plurality of incident angles to measure a total reflection break angle and a critical angle or a Brewster's angle (polarizing angle). An accurate value of the total reflection break angle is obtained based on a difference between the measured total reflection break angle and the measured critical angle or Brewster's angle.

Abstract: A method of measuring a crystal section shape of a crystal being pulled from a crystal melt while rotating, including taking an image of the base of the crystal in horizontal and vertical directions with a two-dimensional camera set at an upper oblique position over the crystal; setting at least two horizontal light measuring lines in the image taken by the two-dimensional camera, being arranged in parallel in the vertical direction; detecting pairs of intersection points, at which a fusion ring intersects the two horizontal light measuring lines; transforming a position of each of the intersection points into a position of a point located on a line passing through a crystal center; determining diameters of the crystal based on the transformed positions and on time lags between two intersection points of each of the pairs of intersection points.

Abstract: This light scattering technique for size measurement is based on the fact that an illuminated particle (inclusion) serves as a secondary radiation source in a manner which is related to its size. This technique allows for detection of inclusions in the interior of a transparent sheet. When illuminated with a beam of monochromatic light such as a laser beam as the primary light source, the angular distribution of the scattered intensity originated from the inclusion in the micron to submicron range, is a function of intensity, wavelength and index of refraction. The primary beam of light passes through the sheet on a straight line path parallel to a horizontal axis. A detector positioned at an angle to the horizontal axis detects the secondary scattered light.

Abstract: A single gloss sensor which can perform both DIN gloss measurement and DIN high gloss measurement, using the same hardware, and with minimal delay between the two measurements. The gloss sensor functions by directing light beams from a source to two different positions, either concurrently, or sequentially, between a position which measures gloss (75.degree) and a position which measures high gloss (45.degree). The gloss sensor also provides a reference light beam for correction of errors caused by the window glass, such as by dirt buildup.

Abstract: The disclosure of this invention relates to calorimeters and a process for operating a colorimeter. The colorimeter of the disclosure is controlled by a microprocessor which evaluates a predetermined radiation absorption curve for each sample. This is to be contrasted with the prior art wherein the test on a given sample evaluates only radiation absorption concentration points which are evaluated by the microprocessor. The colorimeter gives more accurate readings as a result of the fact that an absorption curve and its parameters are evaluated for each sample. The calorimeter uses multiple LEDs as a radiation source. The microprocessor further controls other functions of the colorimeter. A separate microprocessor may be used to control these other functions. The calorimeter and process of this invention are also useful in the analysis of samples for turbidity.