Patents Examined by Roy M. Punnoose
  • Patent number: 10330464
    Abstract: A contactlessly measuring measuring system having a contactlessly measuring measuring device with a light transmitter portion and a light receiver portion, for determining the position of a tool or for determining the longest cutting edge of a rotating tool, wherein an optical lens arrangement for shaping and focusing a light beam from the light transmitter portion to the light receiver portion is associated with the light transmitter portion and/or the light receiver portion, the optical lens arrangement being accommodated in a lens mount, and the lens mount having an inner and an outer sleeve which in each case is cylindrical, at least in sections, and the lens arrangement is inserted into the inner sleeve, which is at least partially enclosed by the outer sleeve, and the lens mount together with the lens arrangement is accommodated in a wall of the light transmitter portion and/or of the light receiver portion.
    Type: Grant
    Filed: October 23, 2017
    Date of Patent: June 25, 2019
    Assignee: BLUM-NOVOTEST GmbH
    Inventors: Roland Dilger, Norbert Moersch, Gregor Maier
  • Patent number: 10324064
    Abstract: A method and apparatus are disclosed for assessment of a sealed package. Light is emitted from a narrow-band laser source towards said package from outside of said package. An absorption signal of said light scattered in said package is measured, wherein said absorption is caused by said at least one gas when said light is scattered and travels in said sealed package. Measuring is made outside of said package, whereby said assessment is non-intrusive with regard to said package. It is determined if a deviation exists from a predetermined, expected gas composition and/or concentration of said at least one gas within said sealed package based on said measured absorption signal. Thus sealing of said package for said gas is detected.
    Type: Grant
    Filed: November 27, 2017
    Date of Patent: June 18, 2019
    Assignee: GasPorOx AG
    Inventors: Sune Svanberg, Anders Johnsson, Märta Lewander, Annika Olsson
  • Patent number: 10323987
    Abstract: This relates to sensor systems, detectors, imagers, and readout integrated circuits (ROICs) configured to selectively detect one or more frequencies or polarizations of light, capable of operating with a wide dynamic range, or any combination thereof. In some examples, the detector can include one or more light absorbers; the patterns and/or properties of a light absorber can be configured based on the desired measurement wavelength range and/or polarization direction. In some examples, the detector can comprise a plurality of at least partially overlapping light absorbers for enhanced dynamic range detection. In some examples, the detector can be capable of electrostatic tuning for one or more flux levels by varying the response time or sensitivity to account for various flux levels. In some examples, the ROIC can be capable of dynamically adjusting at least one of the frame rate integrating capacitance, and power of the illumination source.
    Type: Grant
    Filed: January 17, 2018
    Date of Patent: June 18, 2019
    Assignee: Apple Inc.
    Inventors: Miikka M. Kangas, Michael J. Bishop, Robert Chen, David I. Simon, Harold L. Sontag, III, George Dee Skidmore
  • Patent number: 10324019
    Abstract: In one aspect, a method of sorting cells in a flow cytometry system is disclosed, which includes illuminating a cell with radiation having at least two optical frequencies shifted from one another by a radiofrequency to elicit fluorescent radiation from the cell, detecting the fluorescent radiation to generate temporal fluorescence data, and processing the temporal fluorescence data to arrive at a sorting decision regarding the cell without generating an image (i.e., a pixel-by-pixel image) of the cell based on the fluorescence data. In some cases, the sorting decision can be made with a latency less than about 100 microseconds. In some embodiments, the above method of sorting cells can have a sub-cellular resolution. In some embodiments, a single radiofrequency shift is employed to separate the optical frequencies while in other such embodiments a plurality of different radiofrequency shifts are employed.
    Type: Grant
    Filed: March 17, 2017
    Date of Patent: June 18, 2019
    Assignee: BECTON, DICKINSON AND COMPANY
    Inventors: Eric Diebold, Keegan Owsley, Jonathan Lin
  • Patent number: 10323927
    Abstract: A method for calibrating a triangulation sensor including a light emitting unit for emitting measuring light and a light receiving unit. The light emitting unit is arranged with known position and orientation relative to the light receiving unit and the triangulation sensor which is adapted to provide triangulation-based position measurements. A calibration setup which comprises the triangulation sensor and a calibration target providing a defined calibration pattern, and a calibration measurement is performed with reference to the calibration target by means of the triangulation sensor. An image of the calibration target is captured by means of the light receiving unit, and the captured image is processed with deriving a pattern image position with reference to the inner sensor image coordinate system and deriving a light image position with reference to the inner sensor image coordinate system.
    Type: Grant
    Filed: June 22, 2018
    Date of Patent: June 18, 2019
    Assignee: HEXAGON TECHNOLOGY CENTER GMBH
    Inventors: Johan Stigwall, Beat Aebischer, Peter Champ
  • Patent number: 10316641
    Abstract: Apparatus and methods for acquiring strain profiles of an optical conductor of a wireline cable in a wellbore, either while the cable is lowered and/or at intervals during the lowering when the cable is briefly stationary. Changes in the acquired strain profiles are utilized to infer or otherwise determine changes in the disposition of the cable.
    Type: Grant
    Filed: March 20, 2017
    Date of Patent: June 11, 2019
    Assignee: SCHLUMBERGER TECHNOLOGY CORPORATION
    Inventors: Alexis Constantinou, Alireza Farahani
  • Patent number: 10311316
    Abstract: A method, apparatus and computer program, wherein the method comprises: illuminating a portion of skin of a user; detecting light scattered by the illuminated portion of skin and using the detected light to identify locations of biometric features within the illuminated portion of skin; and configuring a light source to selectively illuminate identified locations of biometric features.
    Type: Grant
    Filed: November 11, 2015
    Date of Patent: June 4, 2019
    Assignee: Nokia Technologies Oy
    Inventors: Andrew Matthews, Christopher Bower, Troels Ronnow
  • Patent number: 10310389
    Abstract: Methods and apparatuses for measuring a plurality of structures formed on a substrate are disclosed. In one arrangement, a method includes obtaining data from a first measurement process. The first measurement process including individually measuring each of the plurality of structures to measure a first property of the structure. A second measurement process is used to measure a second property of each of the plurality of structures. The second measurement process includes illuminating each structure with radiation having a radiation property that is individually selected for that structure using the measured first property for the structure.
    Type: Grant
    Filed: March 30, 2018
    Date of Patent: June 4, 2019
    Assignee: ASML Netherlands B.V.
    Inventors: Nitesh Pandey, Jin Lian, Samee Ur Rehman, Martin Jacobus Johan Jak
  • Patent number: 10293448
    Abstract: A tool shape measurement apparatus for imaging a tool is provided with: a camera for imaging the tool disposed at a previously determined imaging position; a shutter disposed on the opposite side of the tool from the camera; an illuminating device for shining light toward the shutter; and a control device for calculating the shape of the tool from an image of the tool. The illuminating device is disposed so that an image in which the tool is darker than the background of the tool is captured due to light reflected at the reflecting surface of the shutter.
    Type: Grant
    Filed: February 13, 2015
    Date of Patent: May 21, 2019
    Assignee: MAKINO MILLING MACHINE CO., LTD.
    Inventors: Tadashi Kasahara, Kenichi Ohata
  • Patent number: 10295332
    Abstract: At least one aspect of the present disclosure directs to a deformation amount measuring method is a method in which a sheet (101) is used that includes a first layer portion (111) having a first pattern (121) that includes a plurality of line drawings extending in a first direction, and a second layer portion (112) overlaid on the first layer portion (111) and having a second pattern (122) that includes a plurality of line drawings extending in a second direction different than the first direction. The method includes the steps of acquiring, from the sheet (101) that has been disposed on a measurement subject, post-deformation image data corresponding to a post-deformation image including a post-deformation moire produced as a result of a post-deformation first pattern (121) and second pattern (122) being overlaid and finding an amount of deformation of the measurement subject on the basis of the post-deformation image data.
    Type: Grant
    Filed: September 12, 2016
    Date of Patent: May 21, 2019
    Assignee: 3M INNOVATIVE PROPERTIES COMPANY
    Inventor: Tasuku Nakayama
  • Patent number: 10295451
    Abstract: A device for extracting at least one object characteristic of an object (106) is presented, the device comprising: a light sensor (101) for recording a hologram of an object and a processing unit (102) coupled to the light sensor and configured for extracting at least one object characteristic from the hologram; wherein the processing unit is configured for extracting the at least one object characteristic from a section of the hologram without reconstructing an image representation of the object. Further, a device (200) for sorting an object (106), a method for identifying an object and a method for sorting objects is presented.
    Type: Grant
    Filed: June 28, 2016
    Date of Patent: May 21, 2019
    Assignees: IMEC VZW, UNIVERSITEIT GENT
    Inventors: Bendix Schneider, Peter Bienstman, Joni Dambre, Geert Vanmeerbeeck, Liesbet Lagae
  • Patent number: 10295521
    Abstract: A method for determining property values of fuels may include using spectral data collected from one or more other fuels or fuel components. The method may include construction of spectral data representative of a fuel by weighting spectral data for another fuel and spectral data for one or more fuel components.
    Type: Grant
    Filed: June 16, 2017
    Date of Patent: May 21, 2019
    Assignee: TESORO REFINING & MARKETING LLC
    Inventor: Daniel C. Mertens
  • Patent number: 10288600
    Abstract: Analyte content in a cell free portion of a body fluid, such as blood, is optically determined without centrifugation or other preliminary steps for separating the cell free portion from the body fluid. A channel is configured for containing a flowing sample of the body fluid along an optical boundary. The channel is configured so that a cell free layer of the fluid naturally forms along the boundary of the channel which coincides with the optical boundary. A light source is directed onto the optical boundary at an angle selected to generate total reflection from the boundary and to generate an evanescent field across the boundary in the cell free layer of fluid. A light detector is configured to detect absorption of the light in the evanescent field. The light source and light detector are matched to the wavelength range of an absorption peak of the analyte being detected.
    Type: Grant
    Filed: May 15, 2017
    Date of Patent: May 14, 2019
    Assignee: Instrumentation Laboratory Company
    Inventors: Ethan Schonbrun, Gert Blankenstein, Josef Kerimo, Hansong Zeng
  • Patent number: 10283366
    Abstract: A laser system includes a nonlinear optical (NLO) crystal, wherein the NLO crystal is annealed within a selected temperature range. The NLO crystal is passivated with at least one of hydrogen, deuterium, a hydrogen-containing compound or a deuterium-containing compound to a selected passivation level. The system further includes at least one light source, wherein at least one light source is configured to generate light of a selected wavelength and at least one light source is configured to transmit light through the NLO crystal. The system further includes a crystal housing unit configured to house the NLO crystal.
    Type: Grant
    Filed: October 3, 2016
    Date of Patent: May 7, 2019
    Assignee: KLA-Tencor Corporation
    Inventors: Yung-Ho Chuang, Vladimir Dribinski
  • Patent number: 10281579
    Abstract: A method for operating a confocal white light sensor on a coordinate measuring machine including a sensor carrier configured to couple a coordinate measurement sensor that is movable in a straight movement direction relative to a base of the coordinate measuring machine is provided. A confocal white light sensor is coupled to the sensor carrier and oriented in the straight movement direction toward a reference body. The sensor carrier and the reference body are moved relative to one another in the straight movement direction, and a measurement signal representing a distance between the confocal white light sensor and the reference body is generated at different movement positions. Information relating to a relationship between measurement signals of the confocal white light sensor and an actual distance of the white light sensor to a measurement object is obtained and a measurement value of the object distance is generated.
    Type: Grant
    Filed: March 15, 2018
    Date of Patent: May 7, 2019
    Assignee: Carl Zeiss Industrielle Messtechnik GmbH
    Inventors: Rudolf Kern, Jochen Burger, Kurt Brenner
  • Patent number: 10281266
    Abstract: An apparatus is described for measuring surface topography of a three-dimensional structure. In many embodiments, the apparatus is configured to focus each of a plurality of light beams to a respective fixed focal position relative to the apparatus. The apparatus measures a characteristic of each of a plurality of returned light beams that are generated by illuminating the three-dimensional structure with the light beams. The characteristic is measured for a plurality of different positions and/or orientations between the apparatus and the three-dimensional structure. Surface topography of the three-dimensional structure is determined based at least in part on the measured characteristic of the returned light beams for the plurality of different positions and/or orientations between the apparatus and the three-dimensional structure.
    Type: Grant
    Filed: February 27, 2018
    Date of Patent: May 7, 2019
    Assignee: Align Technology, Inc.
    Inventors: Erez Lampert, Adi Levin, Tal Verker
  • Patent number: 10281342
    Abstract: Techniques and devices for sensing or measuring electric currents and/or temperature based on photonic sensing is disclosed. An optical current sensor head is located near or at a current-carrying conductor so that a magnetic field associated with the current is present at a Faraday material and the optical detection unit detects the light from the Faraday material to determine a magnitude of the current. An optical temperature sensor head is located near or at a location so that the temperature at a temperature-sensing Faraday material is reflected by the optical polarization rotation which is detected to determine the temperature.
    Type: Grant
    Filed: August 15, 2017
    Date of Patent: May 7, 2019
    Inventor: Xiaotian Steve Yao
  • Patent number: 10274848
    Abstract: An amplitude monitoring system, a focusing and leveling apparatus and a defocus detection method. The method includes: adjusting amplitude of a scanning mirror to a theoretical amplitude value and recording corresponding theoretical output voltage values of a photodetector; adjusting the amplitude of the scanning mirror and sampling real-time amplitude values of the scanning mirror and real-time output voltage values of the photodetector to calculate compensated real-time demodulation results, and recording real-time defocus amounts of a wafer table; subsequent to stepwise displacement of the wafer table, establishing a database based on the compensated real-time demodulation results and the real-time defocus amounts of the wafer table; and in an actual measurement, sampling in real time an actual amplitude value of the scanning mirror and actual output voltage values of the photodetector to calculate a compensated real-time demodulation result and finding an actual defocus amount of the wafer table.
    Type: Grant
    Filed: November 26, 2015
    Date of Patent: April 30, 2019
    Assignee: SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
    Inventor: Yazheng Zhuang
  • Patent number: 10267621
    Abstract: The confocal displacement sensor includes a light source for light projection configured to generate light having a plurality of wavelengths, a plurality of pinholes, an optical member configured to cause an axial chromatic aberration in the plurality of detection lights respectively emitted via the plurality of pinholes and converge the plurality of detection lights toward the measurement object, a spectroscope configured to respectively spectrally disperse, in the detection lights irradiated on the measurement object via the optical member, a plurality of detection lights respectively passed through the plurality of pinholes by being reflected while focusing on the measurement object and generate a plurality of light reception waveforms representing light reception intensities for each wavelength, and a measurement control section configured to statistically process the plurality of light reception waveforms and generate a representative light reception waveform from the plurality of light reception wavefor
    Type: Grant
    Filed: May 17, 2018
    Date of Patent: April 23, 2019
    Assignee: Keyence Corporation
    Inventors: Shoma Kuga, Suketaka Fujimoto, Hideto Takei, Yusuke Suemura, Tomikazu Sakaguchi
  • Patent number: 10267725
    Abstract: Apparatus for measuring surface profiles within passages such as the interiors of pipes, tubing, casing or the like includes an optical scanning system that acquires digital data that directly identifies the surface profiles. A temperature control system facilitates operation in high temperature environments. The optical scanning system may include a camera located between a light source and a conical mirror. Light deflecting elements may guide light from the light source to the conical mirror along a path that reverses direction.
    Type: Grant
    Filed: May 23, 2018
    Date of Patent: April 23, 2019
    Assignee: Evolution Engineering Inc.
    Inventors: John Howard Keightley, Adriano Goncalves Cunha