Patents Examined by Roy M. Punnoose
  • Patent number: 12131457
    Abstract: An image processing device (10) according to an aspect of the present invention includes an acquiring section (151) and an estimation section (152). The acquiring section (151) acquires a first image and a second image obtained by capturing randomly stacked workpieces (W1a, W1b). The estimation section (152) generates a matching map of a feature of the first image and a feature of the second image, estimates a position, an orientation and a classification score of each workpiece as a target for each of the first image and the second image, and estimates the position of the workpiece, based on a matching result using the matching map and an estimation result of the position.
    Type: Grant
    Filed: October 29, 2020
    Date of Patent: October 29, 2024
    Assignee: MINEBEA MITSUMI Inc.
    Inventor: Yoshihiro Nakano
  • Patent number: 12118709
    Abstract: A method for identifying a cause of manufacturing defects is provided. The method includes capturing, by an image capture unit, a number N of images from a semiconductor wafer, wherein each of the s umber N of images comprises a number M of geometric features, calculating, by a processing unit, a geometric center for each of the geometric features of the number N of images, calculating, based on the number N of images, a number M of average geometric centers associated with the number M of geometric features, and calculating a shift amount for each geometric feature of the number N of images.
    Type: Grant
    Filed: February 23, 2022
    Date of Patent: October 15, 2024
    Assignee: NANYA TECHNOLOGY CORPORATION
    Inventor: Ken-Huan Ho
  • Patent number: 12115531
    Abstract: A computerized device provides microscopy and electrochemistry tests, performed in dual channels. The device can be brought to the field, for on-site testing with instant results. The dual channels include an imaging channel and a signal channel.
    Type: Grant
    Filed: November 22, 2023
    Date of Patent: October 15, 2024
    Assignee: E.F.A. ENGINEERING FOR ALL LTD.
    Inventor: Yoel Ezra
  • Patent number: 12117344
    Abstract: A method of fabricating a polarization sensor is described. It includes a quarter-wave plate to convert circularly polarized light into linearly polarized light. The quarter-wave plate is realized as a metasurface. The sensor also includes a linear polarizer to analyze the light generated by the quarter wave plate, and a photodetector to receive the analyzed light. The sensor may be combined with other linear polarization sensors to form a sensor capable of complete measurement of the polarization state of incident light.
    Type: Grant
    Filed: May 13, 2022
    Date of Patent: October 15, 2024
    Assignee: ARIZONA BOARD OF REGENTS ON BEHALF OF ARIZONA STATE UNIVERSITY
    Inventors: Yu Yao, Chao Wang, Chu Wang, Jing Bai, Ali Basiri, Xiahui Chen
  • Patent number: 12112834
    Abstract: A system, method for determining blood biomarkers implemented by a processor and memory circuitry (PMC) and a program storage device and computer program product which includes providing near infra-red spectrogram data i of a patient's living tissue; using one or more pre-trained prediction models comprising a selected number of prediction routes, and determining prediction data on a selected group of biomarkers; determining one or more biomarkers associated with a number of groups, and determining an average concentration data of said biomarkers in accordance with output data of a number of prediction routes associated with said number of groups; and generating output data indicative of estimated levels of a selected set of biomarkers for said patient.
    Type: Grant
    Filed: July 25, 2023
    Date of Patent: October 8, 2024
    Assignee: Refana, Inc.
    Inventor: Marcelo Adorni Pereira
  • Patent number: 12105029
    Abstract: An inspection apparatus may include: a structured-light source configured to sequentially radiate a plurality of structured lights having one phase range; a lens configured to adjust, for each of the plurality of structured lights, optical paths of light beams corresponding to phases of the phase range such that a light beam corresponding to one phase of the phase range arrives at each point of a partial region on an object; an image sensor configured to capture a plurality of reflected lights generated by the structured lights being reflected from the partial region; and a processor configured to acquire a light quantity value of the reflected lights; and derive an angle of the surface by deriving phase values of the reflected lights based on the light quantity value for the reflected lights.
    Type: Grant
    Filed: November 1, 2023
    Date of Patent: October 1, 2024
    Assignee: KOH YOUNG TECHNOLOGY INC.
    Inventors: Chan Kwon Lee, Moon Young Jeon, Jung Hur, Deok Hwa Hong, Eun Ha Jo
  • Patent number: 12105018
    Abstract: Provided is a method capable of precisely, reproducibly and directly measuring, by an ellipsometry method, optical constants (refractive index n, extinction coefficient ?) of a fluorine-containing organosilicon compound thin film having a homogeneous surface with a small surface roughness and haze value. The method for measuring the optical constants of the thin film of the fluorine-containing organosilicon compound, includes: a step of forming the thin film of the fluorine-containing organosilicon compound on a base material, the thin film having, as surface roughnesses, an arithmetic mean roughness of smaller than 1.0 nm and a root mean square roughness of smaller than 2.0 nm, a haze value of smaller than 0.3 and a film thickness of 3 to 10 nm; and a step of measuring the optical constants of the thin film formed on the base material by the ellipsometry method.
    Type: Grant
    Filed: July 30, 2020
    Date of Patent: October 1, 2024
    Assignee: Shin-Etsu Chemical Co., Ltd.
    Inventor: Takashi Uchida
  • Patent number: 12106465
    Abstract: An image marking method, apparatus and system, which relates to the technical field of image processing. The present disclosure includes, when the working mode of the first client is a first mode, receiving a first marking task assigned by a second client, on the condition that the image marking approach is the first marking approach, according to a neural network model, determining a first marking result corresponding to the first original image; on the condition that the image marking approach is the second marking approach, according to an unsupervised algorithm model, determining a second marking result corresponding to the first original image; on the condition that the image marking approach is the third marking approach, receiving a third marking result inputted by a user into the first original image; and sending a target marking result to the second client.
    Type: Grant
    Filed: March 26, 2021
    Date of Patent: October 1, 2024
    Assignee: BOE Technology Group Co., Ltd.
    Inventors: Yaoping Wang, Meijuan Zhang, Yongzhang Liu, Zhaoyue Li, Dong Chai, Hong Wang
  • Patent number: 12094101
    Abstract: Disclosed are methods and apparatus for inspecting a photolithographic reticle. A plurality of reference far field images are simulated by inputting a plurality of reference near field images into a physics-based model, and the plurality of reference near field images are generated by a trained deep learning model from a test portion of the design database that was used to fabricate a test area of a test reticle. The test area of a test reticle, which was fabricated from the design database, is inspected for defects via a die-to-database process that includes comparing the plurality of reference far field reticle images simulated by the physic-based model to a plurality of test images acquired by the inspection system from the test area of the test reticle.
    Type: Grant
    Filed: November 24, 2021
    Date of Patent: September 17, 2024
    Assignee: KLA-TENCOR CORPORATION
    Inventors: Hawren Fang, Abdurrahman Sezginer, Rui-fang Shi
  • Patent number: 12094102
    Abstract: The purpose of the present invention is to improve accuracy in inspection of an appearance of a mold. The inspection device includes at least one processor for performing an inspection step of inspecting an appearance of a mold using a learned model constructed by machine learning. Input into the learned model includes an inspection image obtained by imaging the appearance of the mold. Output from the learned model is information indicating an inspection result of the appearance of the mold.
    Type: Grant
    Filed: November 4, 2021
    Date of Patent: September 17, 2024
    Assignee: SINTOKOGIO, LTD.
    Inventors: Takehiro Sugino, Takeshi Sonohara
  • Patent number: 12086976
    Abstract: An inspection method includes: a first acquisition step of acquiring information in which information on a color difference with respect to a reference color is assigned to each of a plurality of first divided regions into which an reference image is divided; a second acquisition step of acquiring information in which information on a color difference with respect to the reference color is assigned to each of a plurality of second divided regions into which a captured image is divided; a first comparison step of comparing the information on the color difference of each of the first divided regions with the information on the color difference of each of the corresponding second divided regions; and a second comparison step of comparing the information on the color difference of each of the first divided regions with the information on the color difference of each of the second divided regions in a combination different from the combination in which the comparison is performed in the first comparison step, and
    Type: Grant
    Filed: December 23, 2021
    Date of Patent: September 10, 2024
    Assignee: SEIKO EPSON CORPORATION
    Inventor: Ryohei Kuri
  • Patent number: 12078470
    Abstract: A height measurement device images a target, extracts a contour of the target from a two-dimensional image, sets a circumscribed rectangular area of which each side is parallel to a corresponding side of the visual field of the camera and each side is circumscribed with the extracted contour of the target, and sets an extension area in which each of four sides of the set circumscribed rectangular area is extended outward by a predetermined amount. The height measurement device determines multiple imaging positions such that maximum parallax is obtained within a range where the extension area does not protrude from the visual field of the camera. Then, the height measurement device images the target at each of the determined multiple imaging positions, and estimates a height of the target from parallax of a two-dimensional image of the target imaged at each of the multiple imaging positions.
    Type: Grant
    Filed: September 26, 2019
    Date of Patent: September 3, 2024
    Assignee: FUJI CORPORATION
    Inventors: Takumi Azuma, Nobuo Oishi
  • Patent number: 12078587
    Abstract: In one aspect, a method of sorting cells in a flow cytometry system is disclosed, which includes illuminating a cell with radiation having at least two optical frequencies shifted from one another by a radiofrequency to elicit fluorescent radiation from the cell, detecting the fluorescent radiation to generate temporal fluorescence data, and processing the temporal fluorescence data to arrive at a sorting decision regarding the cell without generating an image (i.e., a pixel-by-pixel image) of the cell based on the fluorescence data. In some cases, the sorting decision can be made with a latency less than about 100 microseconds. In some embodiments, the above method of sorting cells can have a sub-cellular resolution. In some embodiments, a single radiofrequency shift is employed to separate the optical frequencies while in other such embodiments a plurality of different radiofrequency shifts are employed.
    Type: Grant
    Filed: September 27, 2022
    Date of Patent: September 3, 2024
    Assignee: BECTON, DICKINSON AND COMPANY
    Inventors: Eric D. Diebold, Keegan Owsley, Jonathan Lin
  • Patent number: 12066426
    Abstract: A laser suitable for use under field conditions to generate pulsed laser for detecting malaria using transient vapor nanobubbles can include a frequency doubled passively Q-switched microchip laser. The passively Q-switched microchip lasers can include suppression techniques for the unwanted fundamental wavelength in addition to using anti-reflective coatings. The pulsed laser disclosed herein can generate pulses with a high peak power as a result of high energy in conjunction with short pulse duration in the range of hundreds of picoseconds. The high peak power can be enough to generate the photo-thermal transient vapor nanobubbles for malaria detection and/or treatment.
    Type: Grant
    Filed: October 9, 2023
    Date of Patent: August 20, 2024
    Assignee: Masimo Corporation
    Inventors: Dmitri O. Lapotko, Aidas Aleknavicius
  • Patent number: 12067704
    Abstract: A defect characterization method includes: a first scanning image and target defect coordinates in the first scanning image are obtained; a first defect image is obtained according to the target defect coordinates in the first scanning image, the first defect image containing a defect area where a target defect is located and a noise area not containing the target defect; the noise area is marked, Automatic Defect Review (ADR) calculation is performed on the defect area, and a pixel level value of a defect in the defect area is obtained; coordinates of the defect with a maximum pixel level value are obtained, and a second defect image is obtained according to the coordinates of the defect with the maximum pixel level value; and the defect with the maximum pixel level value is classified according to the second defect image.
    Type: Grant
    Filed: October 21, 2021
    Date of Patent: August 20, 2024
    Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.
    Inventor: Ning Huang
  • Patent number: 12066331
    Abstract: There is provided a polarization analysis apparatus that adjusts an angle of incidence or a numerical aperture by using an aperture. The apparatus includes: a first aperture that transmits a lighting beam reflected from a sample on a substrate; a second aperture that transmits a lighting beam having passed through the first aperture; and a detector that detects a lighting beam having passed through the second aperture and selects an angle of incidence of the lighting beam and numerical apertures of the first aperture and the second aperture.
    Type: Grant
    Filed: July 28, 2023
    Date of Patent: August 20, 2024
    Assignee: AUROS TECHNOLOGY, INC.
    Inventors: Mi Ta Park, Jae Jun Lee
  • Patent number: 12055381
    Abstract: A strain gauge device employs a reflective base adapted to reflect a divergent optical signal, and a glass tube attached to the reflective base for optical communication therewith, the glass tube having a working length into which an optical fiber is inserted. The optical fiber is configured for transporting an optic signal indicative of the detected strain. The optic fiber has an outside diameter slightly smaller than an inside diameter of the glass tube for providing a slight tolerance. A distal end is disposed in slidable communication with an interior of the glass tube and accommodated by the tolerance, and a sensing circuit at the proximate end receives an optical signal indicative of strain or displacement. A resilient buffer layer made of soft silicone is disposed outside the glass tube to allow for large deformation measurements and reduce the distortion of the deformation by the introduction of the sensor.
    Type: Grant
    Filed: February 10, 2022
    Date of Patent: August 6, 2024
    Assignee: Worcester Polytechnic Institute
    Inventors: Yuxiang Liu, Hamed Jafarishad, Mucheng Li
  • Patent number: 12031866
    Abstract: A colorimeter includes: a colorimetric section that performs colorimetry; a first wireless communicating section that performs first wireless communication according to a first wireless communication standard; a second wireless communicating section that performs second wireless communication according to a second wireless communication standard; and a processor that controls the first wireless communicating section and the second wireless communicating section. The processor transmits colorimetric data acquired by the colorimetry in the first colorimetric mode by the first wireless communication when colorimetry in a first colorimetric mode is performed. The processor also transmits colorimetric data acquired by the colorimetry in the second colorimetric mode by the second wireless communication when colorimetry in a second colorimetric mode is performed.
    Type: Grant
    Filed: March 28, 2022
    Date of Patent: July 9, 2024
    Assignee: Seiko Epson Corporation
    Inventors: Keiichi Morimoto, Hiroyuki Ouchi
  • Patent number: 12024993
    Abstract: A system and method for detecting defects in a tubular structure installed in a wellbore extending into a subterranean formation. An input image of the tubular structure contains input data indicative of a characteristic of the tubular structure. A background image is determined based on the input image. The background image contains background data indicative of the characteristic of the tubular structure associated with manufacturing of the tubular structure. A defect image is determined based on a difference between the input image and the background image. The defect image contains defect data indicative of the characteristic of the tubular structure associated with defects in the tubular structure.
    Type: Grant
    Filed: December 1, 2021
    Date of Patent: July 2, 2024
    Assignee: SCHLUMBERGER TECHNOLOGY CORPORATION
    Inventors: Salma Benslimane, Josselin Kherroubi, Jean-Luc Le Calvez, Ram Sunder Kalyanraman, Mikhail Lemarenko, Thomas Berard, Kamaljeet Singh
  • Patent number: 12019009
    Abstract: A measurement method, a measurement device, and a measurement program for acquiring information related to lipid particles contained in a measurement sample prepared without using a fluorescent dye are provided. The problem is resolved by the measurement method for measuring the number of particles in a measurement sample prepared without using a fluorescent dye, the method including obtaining information related to lipid particles contained in the measurement sample based on a plurality of characteristic values regarding light scattering in each particle obtained by a flow cytometer from the individual particles contained in the measurement sample.
    Type: Grant
    Filed: August 27, 2021
    Date of Patent: June 25, 2024
    Assignee: SYSMEX CORPORATION
    Inventors: Yuji Masuda, Konobu Kimura