Patents Examined by Roy M. Punnoose
  • Patent number: 10281266
    Abstract: An apparatus is described for measuring surface topography of a three-dimensional structure. In many embodiments, the apparatus is configured to focus each of a plurality of light beams to a respective fixed focal position relative to the apparatus. The apparatus measures a characteristic of each of a plurality of returned light beams that are generated by illuminating the three-dimensional structure with the light beams. The characteristic is measured for a plurality of different positions and/or orientations between the apparatus and the three-dimensional structure. Surface topography of the three-dimensional structure is determined based at least in part on the measured characteristic of the returned light beams for the plurality of different positions and/or orientations between the apparatus and the three-dimensional structure.
    Type: Grant
    Filed: February 27, 2018
    Date of Patent: May 7, 2019
    Assignee: Align Technology, Inc.
    Inventors: Erez Lampert, Adi Levin, Tal Verker
  • Patent number: 10281342
    Abstract: Techniques and devices for sensing or measuring electric currents and/or temperature based on photonic sensing is disclosed. An optical current sensor head is located near or at a current-carrying conductor so that a magnetic field associated with the current is present at a Faraday material and the optical detection unit detects the light from the Faraday material to determine a magnitude of the current. An optical temperature sensor head is located near or at a location so that the temperature at a temperature-sensing Faraday material is reflected by the optical polarization rotation which is detected to determine the temperature.
    Type: Grant
    Filed: August 15, 2017
    Date of Patent: May 7, 2019
    Inventor: Xiaotian Steve Yao
  • Patent number: 10274848
    Abstract: An amplitude monitoring system, a focusing and leveling apparatus and a defocus detection method. The method includes: adjusting amplitude of a scanning mirror to a theoretical amplitude value and recording corresponding theoretical output voltage values of a photodetector; adjusting the amplitude of the scanning mirror and sampling real-time amplitude values of the scanning mirror and real-time output voltage values of the photodetector to calculate compensated real-time demodulation results, and recording real-time defocus amounts of a wafer table; subsequent to stepwise displacement of the wafer table, establishing a database based on the compensated real-time demodulation results and the real-time defocus amounts of the wafer table; and in an actual measurement, sampling in real time an actual amplitude value of the scanning mirror and actual output voltage values of the photodetector to calculate a compensated real-time demodulation result and finding an actual defocus amount of the wafer table.
    Type: Grant
    Filed: November 26, 2015
    Date of Patent: April 30, 2019
    Assignee: SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
    Inventor: Yazheng Zhuang
  • Patent number: 10267621
    Abstract: The confocal displacement sensor includes a light source for light projection configured to generate light having a plurality of wavelengths, a plurality of pinholes, an optical member configured to cause an axial chromatic aberration in the plurality of detection lights respectively emitted via the plurality of pinholes and converge the plurality of detection lights toward the measurement object, a spectroscope configured to respectively spectrally disperse, in the detection lights irradiated on the measurement object via the optical member, a plurality of detection lights respectively passed through the plurality of pinholes by being reflected while focusing on the measurement object and generate a plurality of light reception waveforms representing light reception intensities for each wavelength, and a measurement control section configured to statistically process the plurality of light reception waveforms and generate a representative light reception waveform from the plurality of light reception wavefor
    Type: Grant
    Filed: May 17, 2018
    Date of Patent: April 23, 2019
    Assignee: Keyence Corporation
    Inventors: Shoma Kuga, Suketaka Fujimoto, Hideto Takei, Yusuke Suemura, Tomikazu Sakaguchi
  • Patent number: 10267725
    Abstract: Apparatus for measuring surface profiles within passages such as the interiors of pipes, tubing, casing or the like includes an optical scanning system that acquires digital data that directly identifies the surface profiles. A temperature control system facilitates operation in high temperature environments. The optical scanning system may include a camera located between a light source and a conical mirror. Light deflecting elements may guide light from the light source to the conical mirror along a path that reverses direction.
    Type: Grant
    Filed: May 23, 2018
    Date of Patent: April 23, 2019
    Assignee: Evolution Engineering Inc.
    Inventors: John Howard Keightley, Adriano Goncalves Cunha
  • Patent number: 10260952
    Abstract: A Faraday rotation device includes a light source configured to transmit a light beam; a first rotation stage polarizer configured to forward the light beam from the light source at a predetermined reference polarization angle; a quartz cell configured to receive the light beam from the first rotation stage polarizer at the predetermined reference polarization angle; one or more stacked ring permanent magnets coaxially fitted around the quartz cell; a stepper motor configured to adjust a rotational motion of a second rotation stage polarizer connected to the stepper motor, wherein the second rotation stage polarizer is configured to change a polarization angle of the light beam received from the quartz cell; a light detector; and an electronic circuit board configured to record a change in angle between the predetermined reference polarization angle and the changed polarization angle.
    Type: Grant
    Filed: October 4, 2018
    Date of Patent: April 16, 2019
    Assignee: King Fahd University of Petroleum and Minerals
    Inventors: Watheq Al-Basheer, Sohaib Abdelazem
  • Patent number: 10261027
    Abstract: Proposed is an inspection device that is provided with: an illuminating optical unit that irradiates a discretionary region of a sample with light; a control unit that gives instructions to the illuminating optical unit; and at least one detection unit that detects light transmitted from the sample. The illuminating optical unit includes a light source unit that generates light, and an electrooptic element unit to which the light generated by the light source unit is inputted, and on the basis of the instructions given from the control unit, the electrooptic element unit adjusts the light to be in a desired polarization state, said light having been generated by the light source unit, and irradiates the sample with the light.
    Type: Grant
    Filed: May 26, 2015
    Date of Patent: April 16, 2019
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yoshio Kimoto, Akira Hamamatsu
  • Patent number: 10261024
    Abstract: A visual inspection device is an inspection device using an image obtained by shooting an inspection surface of an object to be inspected with a camera disposed so as to face the inspection surface. The object to be inspected is a rolling bearing and the inspection surface is a surface included in an outer ring of the rolling bearing. A lighting device emits light from a light source as diffused light to the inspection surface in a direction different from a direction in which the camera shoots the inspection surface, and the camera shoots the inspection surface irradiated with the diffused light.
    Type: Grant
    Filed: April 27, 2017
    Date of Patent: April 16, 2019
    Assignee: JTEKT CORPORATION
    Inventor: Jiro Umehara
  • Patent number: 10260988
    Abstract: The present disclosure illustrates a non-contact measurement device for a radius of curvature and a thickness of a lens and a measurement method thereof. The non-contact measurement device utilizes a non-contact probe to integrate a motor, an optical scale and an electronic control module, so as to achieve measurement for the radius of curvature and the thickness of the lens. The present disclosure adopts astigmatism to achieve fast and precise focusing. To overcome the spherical aberration problem, thickness measurement can be implemented by the non-contact measurement device through a formula calculation and utilization of a correction plate, wherein single one probe is used for the measurement herein. For the thicker lens, the non-contact measurement device can be extended to use dual probes, so as to detect the top and bottom sides of the lens.
    Type: Grant
    Filed: June 13, 2018
    Date of Patent: April 16, 2019
    Assignee: NATIONAL APPLIED RESEARCH LABORATORIES
    Inventors: Wei-Yao Hsu, Wei-Jei Peng, Zong-Ru Yu, Jung-Hsin Wang, Po-Jui Chen, Cheng-Fang Ho, Chi-Hung Huang, Chun-Cheng Chen, Hua-Lin Chen, Yi-Hao Lin, Ming-Fu Chen
  • Patent number: 10260959
    Abstract: The present invention discloses a multi-lightpath and multi-angle measurement apparatus, including an electrically controlled rotary table, electronically controlled translation tables, a laser transmitting/receiving end face, laser couplers, a multipath data acquisition card, a laser controller, a translation controller, an etalon, a laser, detectors, and a computer. The measurement apparatus uses an all-fiber coupling structure, and two ends of the laser transmitting/receiving end face are respectively fixed on two electronically controlled translation tables. Therefore, a maximum area measured by the apparatus is 350 mm×350 mm, and an adjustable minimum translation distance is 1 mm. Bottoms of the translation tables are fixed on the electrically controlled rotary table. Featuring an ingenious design and a compact structure, the whole apparatus is easy to disassemble and easy to operate.
    Type: Grant
    Filed: April 21, 2018
    Date of Patent: April 16, 2019
    Assignee: Space Engineering University
    Inventors: Yanji Hong, Junling Song, Guangyu Wang, Wei Rao
  • Patent number: 10260951
    Abstract: A Faraday rotation device includes a light source configured to transmit a light beam; a first rotation stage polarizer configured to forward the light beam from the light source at a predetermined reference polarization angle; a quartz cell configured to receive the light beam from the first rotation stage polarizer at the predetermined reference polarization angle; one or more stacked ring permanent magnets coaxially fitted around the quartz cell; a stepper motor configured to adjust a rotational motion of a second rotation stage polarizer connected to the stepper motor, wherein the second rotation stage polarizer is configured to change a polarization angle of the light beam received from the quartz cell; a light detector; and an electronic circuit board configured to record a change in angle between the predetermined reference polarization angle and the changed polarization angle.
    Type: Grant
    Filed: October 4, 2018
    Date of Patent: April 16, 2019
    Assignee: King Fahd University of Petroleum and Minerals
    Inventors: Watheq Al-Basheer, Sohaib Abdelazem
  • Patent number: 10260869
    Abstract: A system for determining surface topography of a three-dimensional structure is provided. The system can include an illumination unit configured to output a two-dimensional array of light beams each comprising a plurality of wavelengths. An optical assembly can focus the plurality of wavelengths of each light beam to a plurality of focal lengths so as to simultaneously illuminate the structure over a two-dimensional field of view. A detector and a processor are used to generate data representative of the surface topography of the three-dimensional structure based on the measured characteristics of the light reflected from the structure.
    Type: Grant
    Filed: August 3, 2017
    Date of Patent: April 16, 2019
    Assignee: Align Technology, Inc.
    Inventors: Yossef Atiya, Tal Verker
  • Patent number: 10254235
    Abstract: A defect inspecting method and apparatus for inspecting a surface state including a defect on a wafer surface, in which a polarization state of a laser beam irradiated onto the wafer surface is connected into a specified polarization state, the converted laser beam having the specified polarization state is inserted onto the wafer surface, and a scattering light occurring from an irradiated region where the laser beam having the specified polarization state is irradiated, is separated into a first scattering light occurring due to a defect on the wafer and a second scattering light occurring due to a surface roughness on the wafer. An optical element for optical path division separates the first and second scattering lights approximately at the same time.
    Type: Grant
    Filed: November 8, 2017
    Date of Patent: April 9, 2019
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Toshiyuki Nakao, Shigenobu Maruyama, Akira Hamamatsu, Yuta Urano
  • Patent number: 10247663
    Abstract: A method and device for linearizing an optical sensor in a dialysis apparatus. The method includes introducing a sensor to the dialysate-side drain line, determining the linear range of the optical sensor, backwards extrapolating the data from the linear range and correcting the data from the non-linear range.
    Type: Grant
    Filed: May 7, 2018
    Date of Patent: April 2, 2019
    Assignee: B. Braun Avitum AG
    Inventors: Waldemar Janik, Jens Duru
  • Patent number: 10247668
    Abstract: A system is provided for observing objects on a substrate which includes a light source that emits polarized light rectilinearly along a first direction, a holder that receives said substrate having a surface and includes objects, wherein at least one of the holder or the substrate are translucent or opaque, a detector that collects the backscattered light from the interaction between the light emitting by the light source and the objects, a polarization splitter and a quarter-wave plate wherein the polarization splitter and the quarter-wave plate are arranged so that the polarization splitter directs light towards the substrate through the quarter-wave plate, and wherein the light forms a beam and the system modifies the size of the beam. The system thus allows one to observe objects on a non-transparent substrate.
    Type: Grant
    Filed: December 16, 2015
    Date of Patent: April 2, 2019
    Assignee: COMMISSARIAT À L'ÉNERGIE ATOMIQUE ET AUX ÉNERGIES ALTERNATIVES
    Inventors: Valentin Genuer, Pierre Marcoux, Emmanuelle Schultz
  • Patent number: 10247641
    Abstract: An automated tread registration system includes a sensing system configured to provide at least one surface model of a first object. The surface model of the first object has at least one pattern with at least one groove and at least one protrusion. The automated tread registration system also includes a user system executing processing software reading data corresponding to the at least one surface model of the first object. The surface model corresponds to a current condition of the first object. The processing software executed by the user system may analyze the at least one surface model of the first object and provide at least one indicative metric based on the analysis of the surface model. The indicative metric may be camber wear, toe wear, heel toe wear, overinflation, underinflation, and/or the like.
    Type: Grant
    Filed: March 6, 2017
    Date of Patent: April 2, 2019
    Assignee: Tireaudit.com, Inc.
    Inventors: Jack Marshall Zoken, Alper Yilmaz
  • Patent number: 10241043
    Abstract: A micro object detection apparatus includes an optical system. The first optical system includes a first reflection region, a second reflection region, and a light reception element. The first reflection region has an ellipsoidal shape, and reflects scattered light scattered when irradiation light hits a particle to direct the scattered light to the light reception element, by utilizing two focal point positions of the ellipsoidal shape. The second reflection region reflects scattered light coming from the particle to direct the scattered light to the first reflection region, so that the scattered light is directed to the light reception element by utilizing the ellipsoidal shape of the first reflection region. The light flux diameter of the scattered light reflected by the second reflection region is larger than the particle, at the position of the particle at which the scattered light is generated.
    Type: Grant
    Filed: December 8, 2016
    Date of Patent: March 26, 2019
    Assignee: MITSUBISHI ELECTRIC CORPORATION
    Inventor: Kenya Nakai
  • Patent number: 10234276
    Abstract: Methods and systems for efficient and accurate inspection of tubular goods are disclosed. Inner and outer diameter measurements of a tubular good along the entire length are obtained using laser or other light measurement systems. Discrete sections of a tubular good can be identified. For each section, at least one measurement of an outer diameter of an outside surface of the discrete section, and at least one measurement of an inner diameter of an inside surface of the discrete section are obtained. In addition, a geometric center coordinate for each discrete section of the tubular good is obtained. The measurements defining the outside surface, inside surface, and geometric center in association with the longitudinal position of each discrete section are recorded.
    Type: Grant
    Filed: June 22, 2018
    Date of Patent: March 19, 2019
    Assignee: U. S. STEEL TUBULAR PRODUCTS, INC.
    Inventor: Peter W. Moore
  • Patent number: 10228551
    Abstract: A chromatic confocal measuring device includes a light source, which emits light of a plurality of wavelengths, and a first beam splitter, via which the light from the light source into an imaging optical unit having chromatic aberration on. Light reflected from the measurement object is imaged by the imaging optical unit and the first beam splitter onto a first confocal detection stop arrangement, such that the first confocal detection stop arrangement functions as a confocal aperture. Light incident through the first detection stop arrangement is detected and evaluated by a first detection device. The measuring device has a first slit stop, which functions as a confocal aperture of the measuring device. The measuring device additionally includes a second detection device and a second beam splitter, wherein the second beam splitter splits the light reflected from the measurement object into a first and a second partial beam, which image the same spatial region of the measurement object.
    Type: Grant
    Filed: August 7, 2018
    Date of Patent: March 12, 2019
    Assignee: PRECITEC OPTRONIK GMBH
    Inventors: Christoph Dietz, Martin Schönleber, Jean-Francois Pichot
  • Patent number: 10228323
    Abstract: A photo-acoustic polarimetric remote sensing apparatus includes a telescope that directs visible light photons from an object. A polarizing beam splitter is in optical alignment with the telescope. The polarizing beam splitter has first and second pathways corresponding to first and second polarization states, respectively. The first and second pathways are substantially perpendicular. A first photodetector is in optical alignment with the first pathway, and a second photodetector is in optical alignment with the second pathway. At least one processor is in communication with the first and second photodetectors. The at least one processor generates a signal corresponding to a degree of linear polarization of the photons over time, and the signal is indicative of an acoustic signature of the object.
    Type: Grant
    Filed: March 14, 2018
    Date of Patent: March 12, 2019
    Inventors: Michael Hart, Zachary Watson