Patents Examined by Roy M. Punnoose
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Patent number: 11092533Abstract: The present invention relates to a method for measuring undissolved material in a polymer solution used in the production of electrode slurry using a surface light source. The method for measuring undissolved material in a polymer solution of the present invention comprises: a solution application step of applying a polymer solution on a transparent plate; a light supplying step of supplying light with a light source to the polymer solution applied on the transparent plate; a photographing step of photographing a shape of the light transmitted through the polymer solution applied on the transparent plate; and a measuring step of confirming the number and particle size of the undissolved material in the polymer solution with a photographed image.Type: GrantFiled: July 31, 2019Date of Patent: August 17, 2021Assignee: LG Chem, Ltd.Inventors: Hwi Soo Yang, Ga Hyun Lim, Sang Hoon Choy
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Patent number: 11092540Abstract: An optical device includes a carrier, a light source, a die, a light guiding structure and a reflecting structure. The carrier has a surface. The light source is disposed on the surface and configured to emit a light beam. The die is disposed on the surface and configured to sense the light beam. The light guiding structure is disposed on the surface and configured to guide the light beam. The light guiding structure includes a light receiving surface facing the light source and a light exit surface. The reflecting structure is disposed over the die. The reflecting structure includes a light reflecting surface facing the light exit surface of the light guide structure and is configured to reflect the light beam exiting from the light exit surface to the die. The light reflecting surface and the light exit surface are separated from each other and define a vent hole.Type: GrantFiled: May 11, 2020Date of Patent: August 17, 2021Assignee: ADVANCED SEMICONDUCTOR ENGINEERING, INC.Inventor: Shih-Tien Feng
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Optical test system and method for determining size of gap between two substrates of optical element
Patent number: 11085849Abstract: An optical test method is provided. The optical test method includes emitting light through a gap between two substrates of a tested optical element disposed on a holder to generate a plurality of light beams. The optical test method further includes driving the holder with the tested optical element to move to N positions. The optical test method also includes receiving one of the light beams from the tested optical element in the N positions to generate N first intensity signals. In addition, the optical test method includes determining the size of the gap of the tested optical element according to the N first intensity signals and reference data.Type: GrantFiled: December 16, 2019Date of Patent: August 10, 2021Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTDInventors: Clark Lee, Yi-Chuan Lo, Hsun-Peng Lin, Chih-Ming Hong -
Patent number: 11086015Abstract: A system of generating a three-dimensional (3D) scan of an environment includes multiple 3D scanners including a first 3D scanner at respective first and second positions. The system further includes a controller coupled to the 3D scanners. The first 3D scanner acquires a first set of 3D coordinates, the first set of 3D coordinates having a first portion. The second 3D scanner acquires a second set of 3D coordinates, the second set of 3D coordinates having a second portion. The first portion and the second portion are simultaneously transmitted to the controller by the first 3D scanner and the second 3D scanner respectively, while the first set of 3D coordinates and the second set of 3D coordinates are being acquired. The controller registers the first portion and the second portion to each other while the first set of 3D coordinates and the second set of 3D coordinates are being acquired.Type: GrantFiled: June 23, 2020Date of Patent: August 10, 2021Assignee: FARO TECHNOLOGIES, INC.Inventors: Daniel Pompe, Manuel Caputo, José Gerardo Gómez Méndez, Zia ul Azam, Louis Bergmann, Daniel Flohr, Oliver Zweigle
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Patent number: 11085872Abstract: A method of hair analysis based on microscope pictures of the hair in polarized light includes a hair conditioning phase performed in a container made of polyethylene or a polymer being in a position lower than polyethylene in the triboelectric series; this is followed by a hair testing phase in which polarized light microscope images of the hair, contacted with a turpentine oil, are taken and further processed using unmixing to obtain information on the amount of analytes present in the hair. Advantageously the present method shows high accuracy even in presence of accidental movements applied to the microscope/sample to be analyzed, such as possibly occurring during daily laboratory practice. Also advantageously, the high accuracy is maintained when different operators are involved in the procedure, being thus substantially unaffected by different ways of manipulating/preparing/photographing the hair sample.Type: GrantFiled: November 21, 2018Date of Patent: August 10, 2021Assignee: I LOVE MY BODY RESEARCH S.R.L.Inventor: Luca Dobetti
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Patent number: 11089292Abstract: A camera metrology apparatus including a base section, a drive section with independent drive axes, and an actuation platform having a camera mount, with a predetermined camera mount interface for a camera, and a camera stimulation source mount, with a predetermined stimulation source mount interface, and being coupled to one of the drive axes to generate relative motion between each interface effecting metrology measurement of the camera, wherein the actuation platform has a selectable configuration between different predetermined platform configurations, each with different predetermined mounting location characteristics changing a predetermined mounting location of the camera mount interface or stimulation source mount interface and effecting a different predetermined metrology measurement characteristic, and the camera mount and the camera stimulation source mount are arranged to define a repeatable relative position between the camera mount interface and stimulation source mount interface in each platforType: GrantFiled: January 25, 2019Date of Patent: August 10, 2021Assignee: Optikos CorporationInventors: John Price, David Imrie
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Patent number: 11060847Abstract: A system is provided with a measurement system having a plurality of light sources, a plurality of light sensors, and a controller coupled to the plurality of light sources and the plurality of light sensors. The controller is configured to monitor one or more parameters between a rotor and a casing at least partially based on an interruption or a transmission of one or more paths of light from the plurality of light sources to the plurality of light sensors.Type: GrantFiled: October 30, 2019Date of Patent: July 13, 2021Assignee: General Electric CompanyInventors: Kurt Kramer Schleif, Andrew David Ellis
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Patent number: 11054358Abstract: A method of detecting porosity at and near a composite surface is disclosed, including projecting polarized light on a surface of a composite component and filtering out light reflected off of the surface. The method further includes imaging light scattered from inhomogeneities in the composite component, and generating a map of absence of composite material near the composite surface based on scatter intensity detected in the imaging step.Type: GrantFiled: February 6, 2020Date of Patent: July 6, 2021Assignee: The Boeing CompanyInventors: Morteza Safai, Gary Ernest Georgeson
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Patent number: 11054244Abstract: A method of measuring a particle density of particles includes emitting, by a laser, a laser beam directed to a mirror, redirecting the laser beam by the mirror with a predetermined periodic movement, and focusing the laser beam to a detection volume by an optical imaging device. The method further includes determining a self mixing interference signal of an optical wave within a laser cavity if the self mixing interference signal is generated by laser light of the laser beam reflected by at least one of the particles and suppressing a false self mixing interference signal for particle detection if the self mixing interference signal is caused by a disturbance in an optical path of the laser beam. The false self mixing signal caused by the disturbance in the optical path of the laser beam is suppressed in a defined range of angles of the mirror during the periodic movement.Type: GrantFiled: November 12, 2019Date of Patent: July 6, 2021Assignee: TRUMPF PHOTONIC COMPONENTS GMBHInventors: Okke Ouweltjes, Johannes Hendrikus Maria Spruit, Alexander Marc van der Lee, Petrus Theodorus Jutte
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Patent number: 11047787Abstract: An optical system for particle detection.Type: GrantFiled: April 29, 2020Date of Patent: June 29, 2021Assignee: Research Triangle InstituteInventors: Anthony Clint Clayton, Howard Jerome Walls, Roger H. Pope
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Patent number: 11047088Abstract: A method of and device for testing and a scale for evaluating a textile for use in an article of clothing constructed of the textile. The method comprises positioning a textile sample within a path of a generated beam of light and measuring the amount of photons absorbed when the light is transmitted through the sample. The amount of light transmitted through the sample is compared to a standardized scale for evaluating the amount of coverage provided by the sample for the textiles fitness for use in the article of clothing. The articles of clothing may be articles of swimwear, athletic wear, or athleisure wear.Type: GrantFiled: November 11, 2019Date of Patent: June 29, 2021Assignee: Target Brands, Inc.Inventors: Rajneet Kaur Chahal, Stacy Lee Abel, Terrence Joseph Hornsby, Audra Hunter
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Patent number: 11041814Abstract: Embodiments of systems and methods for measuring a geometric attribute of a hole structure in a semiconductor chip are disclosed. In an example, an optical spectrum signal corresponding to the hole structure in the semiconductor chip is received. The optical spectrum signal is characterized by one or more optical features. The geometric attribute of the hole structure is determined based, at least in part, on the optical features using a model. The model is trained from a plurality of training samples each including a pair of an optical spectrum signal and a labeled reference signal both corresponding to a same hole structure.Type: GrantFiled: April 30, 2020Date of Patent: June 22, 2021Assignee: YANGTZE MEMORY TECHNOLOGIES CO., LTD.Inventors: Le Wang, Yuanxiang Zou, Jun Zhang, Wei Zhang, Yi Zhou
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Patent number: 11037390Abstract: A valuable medium handling apparatus configured to handle a plurality of types of valuable media. The valuable medium handling apparatus includes an inlet configured to deposit the plurality of types of valuable media, a setting unit configured to set the types of the valuable media being handled by the apparatus as a first type or a second type, a determination unit configured to determine whether a type of each of the valuable media deposited in the inlet is the first type or the second type based on the setting result of the setting unit and determine whether the valuable medium determined as the first type is a genuine medium or a counterfeit medium, and a plurality of stackers configured to stack the valuable medium of the type determined by the determination unit, the plurality of stackers including a first stacker and a second stacker.Type: GrantFiled: September 13, 2019Date of Patent: June 15, 2021Assignee: GLORY LTD.Inventor: Yasuhiro Matsumoto
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Patent number: 11035779Abstract: A particle container includes a measurement section in which a measurement region is formed and the measurement section measurably accommodates multiple particles in the measurement region. The measurement section is configured to change a width of the measurement region in the measuring direction of measuring the particles.Type: GrantFiled: December 12, 2019Date of Patent: June 15, 2021Assignee: Canon Kabushiki KaishaInventor: Hisafumi Ebisawa
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Patent number: 11035778Abstract: A particle analyzer, comprising a source of a substantially nondiffracting light beam; a flow path configured to produce in a flowcell a ribbon-like core stream having a specific cross-sectional aspect ratio; the flowcell being configured to expose a segment of the core stream to the light beam; a detector configured to receive a signal resulting from an interaction of a particle in the core stream with the light beam; a first sorting actuator connected with the flowcell, downstream of the exposed segment of core stream; a plurality of sorting channels in fluid connection with the flow path and downstream of the first actuator; the actuator having multiple actuation states, each state configured to direct at least one part of the core stream to a corresponding channel; a second sorting actuator connected with the flowcell, opposite the first actuator, and operable in coordination with the first actuator.Type: GrantFiled: May 18, 2020Date of Patent: June 15, 2021Assignee: Kinetic River Corp.Inventor: Giacomo Vacca
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Patent number: 11029245Abstract: A flow cell device including a spherical optical element is disclosed. The spherical lens can be sealed to the body of the flow cell device in a manner that provides external optical access to a fluid in an analysis region of a flow path through the flow cell device. The seal can be provided by an elastomer, a polymer, or a deformable metal. The disposition of the spherical lens to the flow path enables in situ optical analysis of the fluid. An optical analysis device can be removably connected to the flow cell device to provide the optical analysis. In some embodiments the optical analysis device is a portable Raman spectrometer. The flow cell device can provide a supplementary interrogation interface, and/or an on board sensor device(s) to enable multivariate analysis and/or advanced triggering.Type: GrantFiled: June 26, 2020Date of Patent: June 8, 2021Assignee: MarqMetrix, Inc.Inventors: Giora Proskurowski, Brian James Marquardt
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Patent number: 11029256Abstract: Provided is an apparatus for measuring a wafer. The apparatus may include a chuck disposed on a stage and a plate connected with the stage, a horizontal frame configured to support a wafer, and a vertical frame connecting the plate and the horizontal frame. The apparatus may further include first to third adsorption portions connected with the horizontal frame and configured to adsorb the wafer, a support bar penetrating through the chuck and extending in a first direction and a beam irradiator connected to the support bar and disposed between the plate and the horizontal frame. The beam irradiator may be configured to irradiate a beam on the wafer. The apparatus may further include a detector on an opposite side of the horizontal frame from the beam irradiator and configured to receive the beam after it has penetrated through the wafer.Type: GrantFiled: April 13, 2020Date of Patent: June 8, 2021Assignee: SAMSUNG ELECTRONICS CO., LTD.Inventors: Tae-Heung Ahn, Racine Nassau, Su Hwan Park, Ki Wan Seo, Nam Il Koo, In Keun Baek, Jong Min Yoon, Ik Seon Jeon
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Patent number: 11022519Abstract: A system for aiming a headlamp of a vehicle includes a displaceable aiming surface and an imaging system. The imaging system includes a translatable aim box carrying at least one headlamp imager oriented to capture images of a single headlamp and/or one or more vehicle features adjacent to the single headlamp. At least one fixed imager is oriented to capture one or more images of the displaceable aiming surface. The translatable aim box may be configured to translate between the single headlamp and another headlamp. One or more computing devices are configured to perform methods for headlamp aim correction using the described system. Methods for headlamp aim correction are described.Type: GrantFiled: October 25, 2019Date of Patent: June 1, 2021Assignee: Ford Global Technologies, LLCInventors: Albert Ekladyous, Diane Marie LaHaie, Ghassan E. Mady, Simon Howard Curwood, Kelley Maria Adams-Campos, Hardyal Singh, Jeffrey Paul Spencer
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Patent number: 11022549Abstract: An optical fiber inspecting device is disclosed. The optical fiber inspecting device includes a first light-emitting unit that irradiates an optical fiber with a first light beam, the optical fiber including a glass fiber and a coating resin and moving in an axial direction, and a first light-receiving unit that receives scattered light resulting from the first light beam scattered in the optical fiber, and converts the scattered light to an electrical signal. An optical axis of the first light-receiving unit passes through an irradiation position where the first light beam strikes the optical fiber, and the first light beam and the optical axis of the first light-receiving unit diagonally intersect each other, thereby preventing the first light beam from directly entering the first light-receiving unit.Type: GrantFiled: December 23, 2019Date of Patent: June 1, 2021Assignee: SUMITOMO ELECTRIC INDUSTRIES, LTD.Inventors: Hiroshi Kohda, Kumiko Tachibana, Takashi Fujii
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Patent number: 11022428Abstract: A growth rate detection apparatus has a reflectometer to measure reflectivity of a thin film by receiving reflected light of light irradiated with the thin film, a growth rate candidate calculator to calculate a first growth rate and a second growth rate which are candidates for a growth rate of the thin film based on a temporal variation period of the reflectivity and a refractive index of the thin film in a case where the reflectometer irradiates the thin film with light of a first wavelength and to calculate a third growth rate and a fourth growth rate which are candidates for the growth rate of the thin film based on the temporal variation period and the refractive index in a case where the reflectometer irradiates the thin film with light of a second wavelength, and a growth rate selector to select a common growth rate.Type: GrantFiled: February 18, 2020Date of Patent: June 1, 2021Assignee: NuFlare Technology, Inc.Inventor: Yasushi Iyechika