Abstract: The motion of an electromechanical device such as a relay may be analyzed through the use of the present system. A bundle of fiber optic filaments are located with one end adjacent the movable object which is to be sensed or analyzed. This movable object may, for example, be the armature of an electromagnet. With regard to the fiber optic probe, half of the fiber optic elements may be provided with input illumination and the other half of the bundle may be connected to transmit reflected light from the moving armature to a remotely located light-sensitive element such as an opto-transistor. An oscilloscope is provided to monitor the response of the electromagnet to applied signals. An actuating circuit is connected not only to apply energizing current to the electromagnet, but also to trigger the sweep of the oscilloscope.

Abstract: The invention relates to a high-pressure sodium vapor discharge lamp comprising a discharge tube containing sodium and xenon.In accordance with the invention the inside diameter of the discharge tube is below 5 mm and greater than 1 mm. In addition the xenon pressure is relatively high in the operating condition of the lamp which -- together with a pressure of the sodium in a given range -- can result in a high luminous efficacy of the lamp.

Abstract: In an ion implantation apparatus, a beam defining member such as the acceleration plate is constructed such that the member is maintained at a temperature above the condensation point of the vapor emanating from the source of charged particles, thereby preventing the vapor from condensing on the member and providing a self-cleaning effect.

Abstract: Two monitor circuits, each having a light emitting diode, are connected to the inputs and outputs of an SCR current control circuit on a brushless a-c generator. The current control circuit and the attached monitoring circuits are mounted on a rotating shaft and information regarding the operation of the rotating current control circuit is obtained by observing the light patterns generated by the light emitting diodes.

Abstract: An evacuated chamber contains a source of primary ions, a charge-exchange box, the inlet of which is supplied by the primary ion source and delivers at the outlet a primary molecular or atomic beam which is at least partially neutralized, a target of the material to be ionized which intercepts the emergent primary beam from the charge-exchange box and which is of such geometry that the primary beam undergoes multiple reflections from the target, the target being placed within a chamber which is brought to a potential opposite to that of the polarity of the ions produced.

Abstract: A probe for developing a visual indication of the electrical state of a selected point in a digital circuit under test. The probe is provided with two clips for attaching to the power supply and the ground of the circuit to be tested. The operator then holds a sharp tip of the probe at the selected point at which the electrical condition of the circuit is to be tested. Two light emitting diodes visible on the probe body display which one of the six possible circuit conditions exist at the selected point, such as open circuit, positive-going pulse, negative steady-state and so forth. The circuit utilizes integrated circuit NOR and inverting buffer components. Pulses as short as ten nanoseconds may be detected. The probe may be used with any voltage range of the various logic circuit families.

Abstract: A complex test structure for integrated, semiconductor circuits in which the impurity regions of the test device are elongated, preferably in serpentine fashion. The elongated impurity regions emulate corresponding regions in regular integrated circuit devices. Additional regions are provided, each in elongated form, which, when impressed with appropriate voltages or currents, provide indications of defect levels and product yield in the regular devices. Advantageously, the serpentine test structure is fabricated on the same wafer and with the same process steps as the regular integrated circuit chips. In one embodiment, a plurality of such monitors are provided adjacent each other in the same test site. Regions in one monitor are selectively connected to regions in another monitor and to external contact pads by contact stations disposed between each monitor.

Abstract: A device and method for nonresonantly Raman shifting broad band uv excimer laser radiation, which enhances preselected Stokes signals by varying the pressure of the Raman scattering medium, the focal interaction length of the incident radiation within the Raman scattering medium and its power density level. Gaseous molecular H.sub.2, D.sub.2, CH.sub.4 (methane), HD and mixes thereof, and liquid N.sub.2 are used as the Raman scattering medium to frequency shift the outputs of high power KrF and ArF lasers. A cable fed discharge with an unstable resonant cavity configuration is utilized to produce the output laser power levels required for operation.

Abstract: The invention relates to high pressure sodium vapor discharge lamp comprising a discharge tube and an outer bulb enveloping this tube, a glow starter being disposed in the space between that discharge tube and the outer bulb.In accordance with the invention the glow starter is resiliently clamped between the two rigid electric conductors which supply the discharge tube with current.

Abstract: In the ion gauge system disclosed herein, the ion current obtained from an ion gauge tube is directly converted to a signal having a frequency proportional to the ion current so that a digital measurement of vacuum may be obtained. The ion current charges an integrating capacitor which is periodically discharged after reaching a preselected threshold. Preferably, the threshold is adjusted in proportion to the ion gauge emission current so that automatic compensation for variation in the emission current is obtained, the output frequency being proportional to the ratio of the ion current to the emission current. The variable frequency output signal generated by the integration and discharge process is counted by a scaling circuit which automatically changes the timing interval to provide the desired number of significant figures while incrementing the exponent value in a scientific notation display in keeping with the active time base.

Abstract: A voltmeter for selectively indicating the polarity and magnitude of a peak value of voltage. The voltmeter comprises an ammeter, a diode bridge including positive and negative terminals and first and second probe terminals, a capacitor connected to the positive and negative terminals, and variable resistance switching means connected in series between one of the positive and negative terminals and the ammeter for selectively coupling the ammeter across the positive and negative terminals. Filter switching means are provided for selectively coupling the probe terminals to a single polarity of the voltage whereby the voltmeter affords charging of the capacitor so that the magnitude of the positive voltage differential between the positive and negative terminals is substantially equal to the magnitude of the peak value of the single polarity of voltage coupled to the probe terminals.

Abstract: In testing transistor devices, measurements of the collector-emitter leakage current of the devices with the base open (i.e., I.sub.CEO) generally require long measuring intervals. This is due to the necessity of charging the Miller Capacitance of the device under test prior to taking the measurement. While the Miller Capacitance is charging, a small base current flows which makes an accurate reading of the I.sub.CEO very difficult. To shorten these measurement times, a voltage is applied to the base of the device to increase the charging rate of the Miller Capacitance. After a predetermined time, the voltage is disconnected thereby opening the base of the transistor device. The I.sub.CEO reading is then taken at the emitter of the device after it has stabilized to an approximate level of I.sub.CEO. As an alternative to the application of a voltage to the base, a feedback circuit is connected between the emitter and the base of the test device to provide an automatically adjusted driving current to the base.

Abstract: A metal halide arc discharge lamp has an elongated outer envelope within which is disposed an arched arc tube, the position of the arc tube being transverse to the axis of the envelope.

Abstract: A single proximity probe coil driven by a high frequency source excites eddy currents at the periphery of a conducting disc having one or more stair - stepped perturbations and detects the changing radial levels or distances of the perturbations as the disc rotates. The detected signal is processed to yield output signals representing shaft speed and direction of rotation.

Abstract: A merged AND/OR array PLA is disclosed wherein the merger is accomplished by forming the gates of the FET devices in the AND array by means of an upper conductor layer and the gates of the FET devices in the OR array, which are connected to the drain of the devices in the AND array, by means of lower level conductor layer, so that the devices are contiguous. The PLA structure uses a polysilicon layer for interconnection between AND array FET drains and OR array FET gates, with the AND array FETs or OR array FETs being intermixed in a single array. The OR array outputs are oriented vertically, alternating between the AND product terms and ground diffusions. All PLA outputs are oriented vertically within the same array.

Abstract: Disclosed is an apparatus for providing non-destructive isolation voltage testing of circuit elements which includes a controllable full wave rectifier in series with the primary winding of a high voltage transformer, the secondary winding of which is connected to the circuit element under test. A current detector is responsive to a predetermined threshold current in the tested circuit element for providing a signal to control the rectifier to open-circuit the transformer primary winding prior to destructive breakdown of the tested circuit element. Opto-electronic elements are utilized in the rectifier to provide for the virtually instantaneous open-circuiting of the high voltage transformer primary winding.

Abstract: A D.C. motor comprises a permanent-magnet stator including a flux-return structure and at least one permanent-magnet stator magnet mounted on the flux-return structure and also an armature mounted for rotation within the stator and having a circumferential succession of armature teeth. The rotary speed of the armature during operation of the D.C. motor is ascertained indirectly by sensing the variations in the stray flux of the motor at the exterior of the flux-return structure.

Abstract: A wideband synchronously pumped parametric amplifier is described that features minimum time delay along with wide bandwidth, a low noise figure and cost for advantageous use in receivers designed to receive television signals from a satellite through a relatively small antenna, the amplifier obtaining maximum bandwidth by the use of two diodes in parallel and two double-tuned circuits, where the diode capacities are large enough to swamp parasitic and coupling capacitances.

Abstract: The disclosure describes improved apparatus for driving a load, such as a meter, in proportion to a source voltage produced by a signal generator. The apparatus includes a non-differential gain stage for generating an amplified voltage between a gain stage output and one of the generator outputs. The non-differential gain stage is followed by a differential stage which generates a rereferenced voltage between the differential stage output and one of the load terminals. The rereferenced voltage is proportional to the amplified voltage and is substantially independent of any offset voltage between the one generator output and the one load terminal. By coupling the rereferenced voltage to the load, the load voltage is made proportional to the source voltage irrespective of changes in the offset voltage between the one generator output and the one load terminal. The load may include a meter and an amplifying stage for ranging and zeroing the meter.

Abstract: A support houses a plurality of probes for guided movement relative to a printed circuit board unit under test fixedly mounted adjacent the support. Each probe is operatively associated with independent, pneumatically operated, piston and cylinder drive means for moving individual probes selected according to a predetermined program from a first retracted position to a second extended position. In the extended position only a continuous conductive path through the piston and cylinder is formed between the unit under test and an electrical interface for transmitting electronic signals therebetween. Several varieties of probes are provided for low and high frequency applications.