Patents Examined by Son T Le
  • Patent number: 11114843
    Abstract: The invention provides a method and system for protection in response to a fault in a mixed line. The mixed line comprises two or more sections, with a first substation at a first end and a second substation at a second end. Every two consecutive sections of the mixed line are separated at a junction. The method is performed by an IED, and comprises obtaining one or more measurements of current at the first end, and one or more measurements of current at the second end. The method also comprises identifying a section of the two or more sections having the fault, by estimating a value of current for each junction and comparing the estimated value with the one or more measurements of current. In addition, the method comprises controlling a switching device based on the section identified with the fault.
    Type: Grant
    Filed: October 5, 2016
    Date of Patent: September 7, 2021
    Assignee: ABB POWER GRIDS SWITZERLAND AG
    Inventors: Obbalareddi Demudu Naidu, Vinay Kariwala
  • Patent number: 11105833
    Abstract: Current sensors and associated measurement systems. A current sensor includes: an insulating substrate provided with a central opening; a Rogowski winding surrounding the central opening and including a first coil and a second coil which are superposed and electrically connected in series, the first coil and the second coil being wound around the substrate along a first contour line and a second contour line, respectively, each contour line defining, in the plane of the substrate, a contour in the shape of a quadrilateral centred on the central opening; wherein a length of the contour in the shape of a quadrilateral defined by the first contour line is greater than a length of the quadrilateral defined by the second contour line and a width thereof is smaller than a width of the quadrilateral defined by the second contour line.
    Type: Grant
    Filed: May 13, 2020
    Date of Patent: August 31, 2021
    Assignee: Schneider Electric Industries SAS
    Inventors: Loïc Rondot, Lionel Urankar
  • Patent number: 11099035
    Abstract: A scanning unit for an angle-measuring device for scanning an angular scale, so that a relative angular position between the scanning unit and the angular scale about an axis of rotation can be determined, includes a substrate having a first surface, a detector configured to generate signals which are dependent on the angular position, evaluation electronics including electronic components surrounded by a potting compound, and an electrical interface configured to create a connection from the evaluation electronics to subsequent electronics. The detector, electronic components and electrical interface are disposed on the first surface of the substrate. The electronic components and the electrical interface are disposed further away from the axis of rotation than the detector. The potting compound is disposed on the first surface of the substrate circumferentially around the axis of rotation.
    Type: Grant
    Filed: February 27, 2020
    Date of Patent: August 24, 2021
    Assignee: DR. JOHANNES HEIDENHAIN GMBH
    Inventor: Peter Eder
  • Patent number: 11099225
    Abstract: A method for determining an output voltage of a transistor, the transistor comprising an input electrode, a first output electrode and a second output electrode, the potential of the first output electrode being higher than the potential of the second output electrode the output voltage being the difference in potential between the first output electrode and the second output electrode. The method includes a step for measuring the evolution over time of a control voltage of the transistor, the control voltage being the difference in potential between the input electrode and the second output electrode, and determining the output voltage from the measured control voltage.
    Type: Grant
    Filed: May 31, 2018
    Date of Patent: August 24, 2021
    Assignee: Alstom Transport Technologies
    Inventors: Vincent Escrouzailles, Michel Piton
  • Patent number: 11099243
    Abstract: Magnetic load cells that measure force and/or torque are constructed from magnets and one or more arrays of magnetic field sensors. The magnetic field sensors are structured in a tight array where the array is attached to a first portion of a frame. The magnets are operated in pairs polarized in opposition to one-another. In particular, pairs of concentric magnets create sharp field boundaries. The magnets are attached to a second portion of the frame with the magnets separated from the array of field sensors by a small gap. The second portion of the frame is free to displace or rotate in relation to the first portion of the frame when a force or torque is applied to it. The displacement results in a measurable differential change in magnetic field reported by the array that can be sampled and processed to relate to the applied force or torque.
    Type: Grant
    Filed: November 2, 2018
    Date of Patent: August 24, 2021
    Inventors: Samuel E. Calisch, Neil A. Gershenfeld
  • Patent number: 11096628
    Abstract: A heart rate detection method includes: acquiring a plurality of time-domain heart rate detection data; if the time-domain heart rate detection data includes a weak interference signal, extracting a first feature point from the time-domain heart rate detection data, and collecting statistics on feature data of the first feature point to determine time-domain heart rate detection data used in calculating heart rate; if the time-domain heart rate detection data includes a strong interference signal, transforming the time-domain heart rate detection data to a frequency domain to obtain a plurality of frequency-domain heart rate detection data, extracting a second feature point from the frequency-domain heart rate detection data, and collecting statistics on feature data of the second feature point to determine frequency-domain heart rate detection data used in calculating heart rate; and calculating the heart rate based on the time-domain or the frequency-domain heart rate detection data.
    Type: Grant
    Filed: October 19, 2018
    Date of Patent: August 24, 2021
    Assignee: SHENZHEN GOODIX TECHNOLOGY CO., LTD.
    Inventors: Xinshan Wang, Guoliang Li, Ke Yang, Duan Zeng
  • Patent number: 11101473
    Abstract: Systems and methods relate to measuring ammonium bisulfide concentration in a fluid sample. The system includes an electrolytic conductivity cell, a temperature sensor and an analyzer. Logic of the analyzer determines the ammonium bisulfide concentration based on signals received from the conductivity cell and the temperature sensor that are coupled to monitor the fluid.
    Type: Grant
    Filed: March 14, 2013
    Date of Patent: August 24, 2021
    Assignee: Phillips 66 Company
    Inventors: Charles John Lord, III, John Stephen Newland
  • Patent number: 11092561
    Abstract: The invention comprises a method and an analysing system for determining a quality of a hydrocarbon fluid. In an example, the electrical resistivity of the fluid is determined by means of a sensor device. The electrical resistivity is determined over time under predetermined conditions, and a change in the electrical resistivity is monitored over time. A change in fluid visocity may also be determined and monitored over time. The analysing system provides information about an absolute value of a difference of a total base number and a total acid number based on the monitored resistivity change that relates to the quality of the fluid for providing an indication of the remaining useful life of the fluid. In an example, the information about the fluid may correlate to oxidation and/or nitration of the fluid when a change in fluid visocity is below a predetermined threshold.
    Type: Grant
    Filed: May 7, 2019
    Date of Patent: August 17, 2021
    Assignee: MEAS FRANCE SAS
    Inventors: Fabien Gayrard, Francois-Xavier Villemin
  • Patent number: 11092991
    Abstract: A voltage generator circuitry includes first to third bipolar transistors having commonly-connected base electrodes, first and second current mirror circuitries, first and second differential amplifiers; a first resistor; and a current-voltage conversion circuitry. The first current mirror circuitry supplies currents to the first to third bipolar transistors and to the current-voltage conversion circuitry. The second current mirror circuitry supplies currents to the first to third bipolar transistors, and s to the current-voltage conversion circuitry. The first and second differential amplifiers control the first and second current mirror. The current-voltage conversion circuitry converts a sum current of the first and second currents into an output voltage.
    Type: Grant
    Filed: January 22, 2018
    Date of Patent: August 17, 2021
    Assignee: Synaptics Japan GK
    Inventor: Yasuhiko Sone
  • Patent number: 11092571
    Abstract: System and method for characterizing material condition. The system includes a sensor, impedance instrument and processing unit to collect measurements and assess material properties. A model of the system may be used to enable accurate measurements of multiple material properties. A cylindrical model for an electromagnetic field sensor is disclosed for modeling substantially cylindrically symmetric material systems. Sensor designs and data processing approaches are provided to focus the sensitivity of the sensor to localize material conditions. Improved calibration methods are shown. Sizing algorithms are provided to estimate the size of defects such as cracks and corrosion. Corrective measures are provided where the actual material configuration differs from the data processing assumptions. Methods are provided for use of the system to characterize material condition, and detailed illustration is given for corrosion, stress, weld, heat treat, and mechanical damage assessment.
    Type: Grant
    Filed: June 6, 2019
    Date of Patent: August 17, 2021
    Assignee: JENTEK Sensors, Inc.
    Inventors: Scott A Denenberg, Yanko K Sheiretov, Neil J Goldfine, Don Straney
  • Patent number: 11079411
    Abstract: An electromechanical component and an electromechanical component arrangement for proving the existence of a potential difference which consists of a first electrode, a second electrode and a proving structure. The proving structure is configured to be deflected in the event of there being a potential difference. In addition, an electromechanical component is configured to generate a useful effect. A method implements operation of an electromechanical component for proving the existence of a potential difference, other methods implement operation for performing a functional test on the electromechanical component.
    Type: Grant
    Filed: October 12, 2018
    Date of Patent: August 3, 2021
    Assignee: FRAUNHOFER-GESELLSCHAFT ZUR FÖRDERUNG DER ANGEWANDTEN FORSCHUNG E.V.
    Inventors: Linus Elsäber, Matthias Schulze, Martin Friedrichs, Christoph Hohle, Detlef Kunze
  • Patent number: 11079406
    Abstract: A die probe including a probe tip operably connected to a first surface of a thin film; a metal trace, wherein a first portion of the metal trace is operably connected to a second surface of the thin film, the second surface of the thin film opposite the first surface of the thin film; and an upper space transformer, wherein a second portion of the metal trace is operably connected to the upper space transformer, wherein a pressurized liquid and/or gas is configured to expand a space between the second surface of the thin film and the upper space transformer.
    Type: Grant
    Filed: August 31, 2016
    Date of Patent: August 3, 2021
    Assignee: International Business Machines Corporation
    Inventor: Eugene R. Atwood
  • Patent number: 11079444
    Abstract: An insulation detector for highly accurately detecting or measuring, with a simple configuration, insulation resistance of a load or an apparatus to a ground or a housing and connected to an electric apparatus including one or both of an intra-apparatus capacitor and a battery, the insulation detector including an intra-insulation detector capacitor, a voltage detecting unit that detects a voltage of the intra-insulation detector capacitor, and a current-path forming switch for connecting the ground or the housing, the intra-apparatus capacitor, and the intra-insulation detector capacitor in series and forming a current path including insulation resistance of the electric apparatus. The insulation detector measures the insulation resistance by measuring a time constant of a change in the voltage of the intra-insulation detector capacitor.
    Type: Grant
    Filed: August 7, 2018
    Date of Patent: August 3, 2021
    Assignee: Mitsubishi Electric Corporation
    Inventors: Taichiro Tamida, Masayuki Uematsu, Akira Tanabe, Yoshitomo Hayashi, Yoji Tsutsumishita, Kosuke Tsujikawa
  • Patent number: 11079254
    Abstract: A device is provided. The device includes one or more of a radially-wound coil, a hall-effect sensor, a power source, and a control circuit. The radially-wound coil is configured to produce a first magnetic field in response to a periodic current applied to the coil. The hall-effect sensor includes a sensor output that indicates proximity of a magnet to the hall-effect sensor. The magnet provides a second magnetic field and the sensor output indicates proximity in response to a combination of a strength of the first magnetic field and a strength of the second magnetic field exceeds a trip level. The coil is in fixed proximity to the hall-effect sensor, and the current is configured to control a polarity of the first magnetic field to detect the magnet. The power source is coupled to the hall-effect sensor, and is configured to provide power that alternates between on and off voltages to the hall-effect sensor.
    Type: Grant
    Filed: December 23, 2019
    Date of Patent: August 3, 2021
    Inventor: Christopher James Hahn
  • Patent number: 11079429
    Abstract: An ATE testing system (900, 1000) for millimetre wave (mmW) packaged integrated circuits (820) includes: at least one packaged integrated circuit (820); a radio frequency, RF, socket (700) configured to receive the at least one packaged integrated circuit (820) and facilitate routing RF signals thereto via at least one input connector and at least one output connector; and at least one interface configured to couple a tester to at least one packaged integrated circuit (820). The RF socket (700) includes a mmW absorber (1010) located adjacent the at least one output connector of the RF socket (700).
    Type: Grant
    Filed: February 26, 2018
    Date of Patent: August 3, 2021
    Assignee: NXP B.V.
    Inventors: Abdellatif Zanati, Holger Mahnke
  • Patent number: 11078047
    Abstract: Methods and devices detect a deterioration state of a load bearing capacity in an elevator suspension member arrangement having several suspension members, such as belts, including electrically conductive cords incorporated into an elastomer material. Deterioration is determined by applying alternating electric voltages to the cords included in legs of a circuitry. Phase shifts between the alternating voltages, for example by determining sum voltages and/or differential voltages, provide valuable information about a condition of the belt. A fixation arrangement of the suspension member arrangement is adapted to enable or simplify the proposed measurements. Furthermore, counting a number of performed bending cycles provides further information to be taken into account for determining the current deterioration state of the belts.
    Type: Grant
    Filed: July 28, 2016
    Date of Patent: August 3, 2021
    Assignee: INVENTIO AG
    Inventors: Vincent Robibero, Kurt Heinz, Urs Lindegger, Philippe Henneau
  • Patent number: 11079426
    Abstract: A test jig for testing electrical characteristics of a semiconductor product includes a conductive ground block for supporting the semiconductor product thereon; a substrate provided on the ground block, and having a first and a second substrate electrodes formed on the substrate for the respective electrodes to be in contact with leads of the semiconductor; and lead pressers for pressing the leads against the first and the second substrate electrodes, respectively, so that electrical connection is established between the respective leads and the first and the second substrate electrodes in testing the semiconductor product.
    Type: Grant
    Filed: March 1, 2019
    Date of Patent: August 3, 2021
    Assignee: Mitsubishi Electric Corporation
    Inventor: Daisuke Ikeda
  • Patent number: 11073589
    Abstract: An inspection device has an attachment part for attaching a probe card in an inspection operation but attaching a diagnosis substrate in a self-diagnosis operation. During the inspection operation, a tester of the inspection device applies electrical signals to devices formed on a substrate through the probe card and multiple connectors of a connection member to inspect electrical characteristics of the devices During the self-diagnosis operation, a diagnosis substrate is attached to the attachment part of the inspection device instead of the probe card and a stabilization process is performed for stabilizing a contact between the diagnosis substrate and the connectors of the connection member after the diagnosis substrate is attached. The diagnosis of the multiple connectors is performed after the stabilization process.
    Type: Grant
    Filed: February 7, 2018
    Date of Patent: July 27, 2021
    Assignee: TOKYO ELECTRON LIMITED
    Inventor: Masanori Ueda
  • Patent number: 11067525
    Abstract: An electrical conductivity meter comprises a measurement tube formed of an electrical insulation material and through which a fluid of a measurement target flows, a first electrode formed on an outer peripheral surface of the measurement tube, a second electrode connected to a common potential and in contact with the fluid, a resistor in which one end is connected to the first electrode, a voltage detecting portion that detects voltages of a signal generated in the first electrode due to an input of an AC signal to the other end of the resistor, and an electrical conductivity calculating portion that calculates an electrical conductivity of the fluid based on an amplitude of the voltages detected by the voltage detection circuit.
    Type: Grant
    Filed: February 26, 2018
    Date of Patent: July 20, 2021
    Assignee: AZBIL CORPORATION
    Inventor: Osamu Momose
  • Patent number: 11060990
    Abstract: A semiconductor measurement device includes an electrode provided in a semiconductor sample, and a probe contactable with the semiconductor sample. A driver moves a contact position of the probe with respect to the semiconductor sample. A power supply applies electric power between the probe and the electrode. A measurement operation portion measures a current flowing via the semiconductor sample between the probe and the electrode as a voltage applied between the probe and the electrode is changed, the measurement operation portion measuring the current flowing for each of plural measurement points of a surface of the semiconductor sample while causing the probe to scan the measurement points, or while sequentially bringing the probe into contact with the measurement points. A display displays a relationship between the voltage and the current measured at each of the measurement points.
    Type: Grant
    Filed: August 27, 2018
    Date of Patent: July 13, 2021
    Assignee: TOSHIBA MEMORY CORPORATION
    Inventors: Jun Hirota, Tsukasa Nakai, Masako Kobayashi, Kazunori Harada