Patents Examined by Son T Le
  • Patent number: 11521872
    Abstract: Embodiments disclosed herein include a method of calibrating a processing chamber. In an embodiment, the method comprises placing a sensor wafer onto a support surface in the processing chamber, wherein a process kit displaceable in the Z-direction is positioned around the support surface. In an embodiment, the method further comprises measuring a first gap distance between the sensor wafer and the process kit with a sensor on an edge surface of the sensor wafer. In an embodiment, the method further comprises displacing the process kit in the Z-direction. In an embodiment, the method further comprises measuring an additional gap distance between the sensor wafer and the process kit.
    Type: Grant
    Filed: August 20, 2019
    Date of Patent: December 6, 2022
    Assignee: Applied Materials, Inc.
    Inventors: Charles G. Potter, Eli Mor, Sergio Lopez Carbajal
  • Patent number: 11519965
    Abstract: A testing device including a main housing, and a probe housing, wherein the probe housing is rotatably coupled to the main housing. The testing device further includes a first test probe and a second test probe. The first test probe may be configured to be inserted into an alternating-current receptacle. The second test probe is coupled to the probe housing. The second test probe may be configured to be inserted into a universal serial bus receptacle.
    Type: Grant
    Filed: April 12, 2021
    Date of Patent: December 6, 2022
    Assignee: Milwaukee Electric Tool Corporation
    Inventors: Benjamin Oliver Ryan Cabot, Gareth Mueckl
  • Patent number: 11519955
    Abstract: In an embodiment, a method for testing a functional integrity of a transistor component, the method includes causing a first change of a charge state of an internal capacitance between control terminals of the transistor component; determining a capacitance value of the internal capacitance based on the first change of the charge state; causing a second change of the charge state of the internal capacitance; and evaluating a resistance value of an internal resistance between the control terminals based on the determined capacitance value and the second change of the charge state.
    Type: Grant
    Filed: February 12, 2021
    Date of Patent: December 6, 2022
    Assignee: Infineon Technologies AG
    Inventor: Alfons Graf
  • Patent number: 11519878
    Abstract: A system includes a scanner body, a sensor package, a magnet, an actuator mechanism, and a retention mechanism. The sensor package includes a ferromagnetic strip and a flexible coil configured to at least one of transmit and detect a guided wave. The magnet is for applying a biasing magnetic field to the ferromagnetic strip. The actuator mechanism is configured to provide a mechanical pressure coupling between the magnetostrictive strip and a structure, and the retention mechanism is configured to counteract a force applied by the actuator mechanism. A processor is in communication with the sensor package and is configured to record guided wave signals detected by the flexible sensor coil, record scanner body location data provided by a position encoder, and generate two-dimensional image data of an anomaly in the structure based on the guided wave signals and location data. Methods of use and operation also are disclosed.
    Type: Grant
    Filed: March 2, 2021
    Date of Patent: December 6, 2022
    Assignee: FBS, Inc.
    Inventors: Cody J. Borigo, Steven E. Owens, Russell Love
  • Patent number: 11512941
    Abstract: An analysis apparatus includes an acquisition part that acquires a plurality of interference images based on lights having a plurality of different wavelengths from an interference measurement apparatus, a removing part that outputs an interference component by removing a non-interference component included in an interference signal for each pixel in the plurality of the interference images, a conversion part that generates an analysis signal by performing a Hilbert transformation on the interference component, and a calculation part that calculates a distance between a reference surface and a surface of an object to be measured by specifying a phase gradient of a wavelength of light radiated onto the reference surface and the surface of the object to be measured on the basis of the interference component and the analysis signal.
    Type: Grant
    Filed: September 25, 2020
    Date of Patent: November 29, 2022
    Inventor: Shimpei Matsuura
  • Patent number: 11515116
    Abstract: This disclosure describes techniques implemented at least in part by a fuse-monitoring device to detect when a fuse cutout in an electric power system opens to disconnect a device and/or a load from a power line, and provides an indication of a location of the opened fuse cutout to a utility provider. The fuse-monitoring device may be attached to a fuse holder of the fuse cutout, and may include a movement sensor that detects when the fuse holder swings open due to its fuse melting, or blowing. The fuse-monitoring device may send a notification to the utility provider indicating that the fuse holder has swung open. The fuse-monitoring device may include a GPS sensor to determine the location of the fuse cutout, and may also notify the utility provider of the location of the fuse cutout so a line crew can quickly locate the fuse cutout that requires maintenance.
    Type: Grant
    Filed: October 18, 2018
    Date of Patent: November 29, 2022
    Assignee: Avista Corporation
    Inventors: Erik Jon Lee, Curtis Allen Kirkeby, Matthew Russell Michael
  • Patent number: 11506530
    Abstract: Disclosed is a method for diagnosis of a two-conductor field instrument and a corresponding two-conductor field instrument. In a normal operating mode, an input voltage is provided and an output current is output.
    Type: Grant
    Filed: May 10, 2019
    Date of Patent: November 22, 2022
    Assignee: Endress+Hauser SE+Co. KG
    Inventors: Dietmar Frühauf, Armin Wernet
  • Patent number: 11506692
    Abstract: A test verification circuit is described herein for verifying proper operation of a tested circuit, such as a voltage hazard warning circuit, using an N-channel MOSFET configured for switching ON and OFF the test verification circuit during a power outage, and a voltage source that provides an input voltage to the N-channel MOSFET from a conserved power supply. The N-channel MOSFET provides temporary power from a conserved power supply to the test verification circuit upon activation by a user during a power outage, and the test verification circuit determines whether the tested circuit has been de-energized, remains energized, or there remains inadequate power to complete the test.
    Type: Grant
    Filed: September 17, 2020
    Date of Patent: November 22, 2022
    Assignee: Automatic Timing & Controls, Inc.
    Inventor: Roger Clarke
  • Patent number: 11506633
    Abstract: A defect inspection system includes a storage. The defect inspection system also includes a corrosion enhancing defect manager that obtains a circuit card including a trace that is to be encapsulated by a protective layer adapted to reduce corrosion of the trace; applies a voltage potential to the trace while the circuit card is disposed in a visual indicator bath; obtains an image of the trace while the voltage potential is applied; makes a determination, based on the image, that a visual indicator generated by the visual indicator bath is included in the image; and based on the determination: identifies a portion of the trace corresponding to the visual indicator; and applies encapsulant to the portion of the trace.
    Type: Grant
    Filed: July 24, 2020
    Date of Patent: November 22, 2022
    Assignee: Dell Products L.P.
    Inventors: Steven Embleton, Jon Taylor Fitch
  • Patent number: 11497447
    Abstract: Systems and methods for monitoring the condition of electrodes used in biological signal measurement are provided. One method includes applying a first test signal having a first frequency to at least one of a plurality of electrodes and applying a second test signal having a second frequency to at least one of the plurality of electrodes. Both frequencies are below a frequency range associated with the biological signal. The method further includes capturing the biological signal while applying the plurality of test signals and generating an output signal that includes both the measured biological signal and the plurality of test signals. The method further includes retrieving an output amplitude for each of the plurality of test signals from the output signal and calculating an estimated impedance for each of the plurality of electrodes based on the retrieved output amplitudes of the plurality of test signals.
    Type: Grant
    Filed: May 10, 2021
    Date of Patent: November 15, 2022
    Assignee: Welch Allyn, Inc.
    Inventor: David W. Mortara
  • Patent number: 11493566
    Abstract: An electric current imaging system, device, and method includes an array of vector magnetometers that senses one or more magnetic fields in three directions produced by a flow of electric current. Such a system (and devices and methods thereof) can further include a display that displays a visual reconstruction of the original electric current that produced the magnetic field(s). The disclosed embodiments image electric current flow (both magnitude and direction) without the need for rastering or relative motion between the sensors and the conductor/device being viewed. Such embodiments can be scaled to fit both large and small applications by using discreet devices or manufacturing a single, miniaturized array with MEMS technologies.
    Type: Grant
    Filed: September 6, 2017
    Date of Patent: November 8, 2022
    Inventor: Shelby Lacouture
  • Patent number: 11495399
    Abstract: This invention presents a new packaging technique that allows for the use of a wider range of isolating materials for inductive conductivity sensors, thereby significantly reducing the cost of producing the sensors, improving their precision and accuracy, and increasing their sensitivity.
    Type: Grant
    Filed: February 20, 2018
    Date of Patent: November 8, 2022
    Assignee: R-WATER LLC
    Inventor: Javad Rezanezhad Gatabi
  • Patent number: 11479198
    Abstract: A duplex squib module is provided. The duplex squib module may include a first squib, a second squib, a first active blocking circuit, and a second active blocking circuit: The first active blocking circuit being in series with the first squib. The first active blocking circuit having a transistor in series with a first diode to block current in a first direction. The second active blocking circuit being in series with the second squib. The second active blocking circuit having a transistor in series with a first diode to block current in a second direction opposite of the first direction.
    Type: Grant
    Filed: October 25, 2018
    Date of Patent: October 25, 2022
    Assignee: VEONEER US, LLC
    Inventors: Vincent Colarossi, David Eiswerth
  • Patent number: 11467202
    Abstract: The disclosure provides an electronic device and a diagnosis method of a light-emitting device. The light-emitting device includes at least one region, and each region of the at least one region has a plurality of light-emitting units. The diagnosis method includes the following steps. A plurality of light-emitting units of one of the at least one region are illuminated by a current. A voltage value corresponding to the current is compared with a first standard voltage value corresponding to a first standard current corresponding to the one of the at least one region. Whether the one of the at least one region is abnormal is determined according to a result of comparing the voltage value with the first standard voltage value. Therefore, the diagnosis method of the disclosure may effectively diagnose whether the at least one region of the light-emitting device is abnormal.
    Type: Grant
    Filed: August 31, 2020
    Date of Patent: October 11, 2022
    Assignee: Innolux Corporation
    Inventors: Yu-Ming Huang, Yi-Cheng Chang, Chia-Huan Huang
  • Patent number: 11467205
    Abstract: A substrate testing apparatus configured to perform a hot electron analysis (HEA) test for analyzing a stand-by failure in a substrate includes a heating chuck having a first surface configured to support the substrate and a second surface opposite to the first surface. The heating chuck is configured to heat the substrate and has an aperture passing through the first surface and the second surface. A substrate moving device moves the substrate on the heating chuck in a lateral direction. A camera is under the heating chuck and photographs the substrate, which is exposed by the heating chuck aperture.
    Type: Grant
    Filed: June 3, 2021
    Date of Patent: October 11, 2022
    Inventors: Kyoonwoo Kim, Jaehun Lee, Taejun Park, Sanghun Lim, Seokyung Kim, Junnyeon Jeong
  • Patent number: 11460497
    Abstract: A device analysis apparatus is a device analysis apparatus for determining a quality of a power semiconductor device, including an application unit that applies a voltage signal to the power semiconductor device, a light detection unit that detects light from the power semiconductor device at a plurality of detection positions and outputs detection signals based on detection results, and a determination unit that determines the quality of the power semiconductor device based on temporal changes of the detection signals.
    Type: Grant
    Filed: April 18, 2018
    Date of Patent: October 4, 2022
    Inventors: Toru Matsumoto, Koichi Endo, Tomonori Nakamura, Kazushige Koshikawa
  • Patent number: 11460485
    Abstract: Improved electrically conductive guide plates for vertical probe arrays are provided by patterning a thin metal layer disposed on an insulating substrate. Holes passing through the guide plate for guiding probes can be electrically connected or isolated from each other in any pattern according to the deposition of the metal. Such structures can include several distinct ground and/or voltage planes. Furthermore, passive electrical components can be included in the guide plate, by patterning of the deposited metal and/or by integration of passive electrical components with the deposited metal traces.
    Type: Grant
    Filed: October 18, 2018
    Date of Patent: October 4, 2022
    Assignee: FormFactor, Inc.
    Inventors: Jason William Cosman, Benjamin N. Eldridge, Eric Hill, John Ebner, Edin Sijercic
  • Patent number: 11454678
    Abstract: An electrical plug for testing an electrical mains socket is provided. The plug comprises a pin for engagement with a pin receptor of the mains socket. The pin comprises first and second electrical contacts, each comprising a surface portion to engage with a different respective region of the receptor. The first and second contacts are electrically isolated from one another at the pin. An electrical testing system and a method of testing an electrical mains socket is provided. The testing system comprises the electrical plug and a first circuit connected to the contacts and configured to measure an electrical resistance therebetween. The method includes providing the electrical plug and measuring an electrical resistance between the electrical contacts. A further method is provided for testing an electrical mains plug comprising a pin, by providing an electrical socket with a pin receptor having first and second regions electrically isolated from one another.
    Type: Grant
    Filed: December 16, 2020
    Date of Patent: September 27, 2022
    Assignee: Megger Instruments Ltd
    Inventors: Stanislaw Zurek, Mark Hadley, Jeffrey Jones
  • Patent number: 11448495
    Abstract: A wire gauge measuring device comprises a main body, an arm extending from the main body such that a gap is defined between the arm and the main body, a plurality of switches, and indicator means. The gap has a plurality of differently sized gap portions arranged in decreasing size from a distal end to a proximal of the arm. Each switch is aligned with a corresponding one of the gap portions. The indicator means is adapted to provide an indication to a user based on which of the plurality of switches is depressed. The gap portion sizes are selected such that each gap portion is adapted to (1) receive a corresponding differently sized electrical wire, (2) prevent the corresponding differently sized electrical wire from moving into a smaller sized gap portion, and (3) position the differently sized electrical wire to depress the corresponding switch.
    Type: Grant
    Filed: May 17, 2021
    Date of Patent: September 20, 2022
    Inventor: Norman Dean Combs
  • Patent number: 11448528
    Abstract: Aspects of this disclosure relate to a resettable closed-loop multi-turn magnetic sensor. In one aspect, the sensor includes a nanowire forming a plurality of loops, a plurality of domain orientation sensors configured to detect locations of a pair of domain walls within the nanowire, and an initialization circuit configured to inject the pair of domain walls into the nanowire. The nanowire forms a closed-loop via a bridge crossing connecting two of the loops.
    Type: Grant
    Filed: June 2, 2020
    Date of Patent: September 20, 2022
    Assignee: Analog Devices International Unlimited Company
    Inventor: Gavin Patrick Cosgrave