Abstract: The subject disclosure relates to techniques for detecting an object. A process of the disclosed technology can include steps for receiving three-dimensional (3D) Light Detection and Ranging (LiDAR) data of the object at a first time, generating a first point cloud based on the 3D LiDAR data at the first time, receiving 3D LiDAR data of the object at a second time, generating a second point cloud based on the 3D LiDAR data at the second time, aggregating the first point cloud and the second point cloud to form an aggregated point cloud, and placing a bounding box around the aggregated point cloud. Systems and machine-readable media are also provided.

Abstract: A system for capturing a 3D image of a subject includes a detection device which is structured to capture images of the subject and surrounding environment, a projection device which is structured to provide a source of structured light, and a processing unit in communication with the detection device and the projection device. The processing unit is programmed to: analyze an image of the subject captured by the detection device; modify one or more of: the output of the projection device or the intensity of a source of environmental lighting illuminating the subject based on the analysis of the image; and capture a 3D image of the subject with the detection device and the projection device using the modified one or more of the output of the projection device or the intensity of the source of environmental lighting illuminating the subject.

Abstract: Described herein is a process for correcting an observed color difference between a color at a first gloss and the color at a second gloss different than the first gloss, said process comprising the steps of: (a) determining a first correction caused by a lightness (Y-value) of the color a first gloss; (b) determining a second correction caused by an inclusion of a first surface diffusion in gloss readings; (c) based on the first and second corrections, determining a specular correction caused by a difference in specular reflections from the color at the first gloss and the color at the second gloss; (d) determining tristimulus corrections based on the specular correction; (e) preparing corrected tristimulus values of the color at a second gloss; and (f) producing a paint composition for the color at the second gloss using the corrected tristimulus values.

Abstract: A plasmon resonance (PR) system, instrument, and/or device and configurations thereof for measuring molecular interactions is disclosed. In some embodiments, the PR system, instrument, and/or device is a localized surface plasmon resonance (LSPR) system, instrument, and/or device. In other embodiments, the PR system, instrument, and/or device is a surface plasmon resonance (SPR) system, instrument. The PR system, instrument, and/or device may include, for example, force feedback for reliable flow cell sealing, optical feedback for reliable flow cell sealing, local thermal control of an LSPR chip (e.g., a ring Peltier, a continuous Peltier), dual displacement pumps for constant flow delivery to a microfluidic device, a dual channel LSPR sensor, and any combinations thereof.

Abstract: Provided herein are measurement systems including a micrometer assembly for receiving a length of tubing, the micrometer assembly including a plurality of non-contact optical micrometers disposed around the length of tubing for measuring an outer diameter (OD) at a first plurality of positions along a circumference of the length of tubing. The measurement system may further include a displacement gauge assembly for receiving the length of tubing from the optical micrometer assembly, the displacement gauge assembly including a plurality of non-contact gauges disposed around the length of tubing for measuring a wall thickness at a second plurality of positions along the circumference of the length of tubing. A controller receives the OD measurements and thickness measurements, and determines an inner diameter and a concentricity of the length of glass tubing based on an index of refraction of the length of glass tubing, the OD measurements, and the thickness measurements.

Abstract: There is provided optical power loss measurement method and system for that aims to provide a more productive way to perform optical power loss measurements involving test units typically at different locations. Visual fiber finder light can be used to assist the user at the other end of the optical fiber link under test in identifying where to connect the power meter unit. A visual fiber finder light and test light are combined on a same output port of a light source unit at one end of the optical fiber link under test wherein visual fiber finder light is interleaved with test light in a cyclic sequence so that both are not active at the same time. The optical power meter unit determines a time slot when to measure test light in accordance with the given cyclic sequence.

Abstract: The system includes a modulatable illumination source configured to illuminate a surface of a sample disposed on a sample stage, a detector configured to detect illumination emanating from a surface of the sample, illumination optics configured to direct illumination from the modulatable illumination source to the surface of the sample, collection optics configured to direct illumination from the surface of the sample to the detector, and a modulation control system communicatively coupled to the modulatable illumination source, wherein the modulation control system is configured to modulate a drive current of the modulatable illumination source at a selected modulation frequency suitable for generating illumination having a selected coherence feature length. In addition, the present invention includes the time-sequential interleaving of outputs of multiple light sources to generate periodic pulse trains for use in multi-wavelength time-sequential optical metrology.

Abstract: Sensing systems include a tube defining a Fabry-Perot cavity and an optical fiber including a distal end disposed within the Fabry-Perot cavity and a proximal end. A corrodible material caps the Fabry-Perot cavity. Devices for sensing corrosion of downhole equipment include an optical fiber with a corrodible material disposed over a distal end of the optical fiber. Systems for sensing a condition in equipment include an optical fiber with a fiber Bragg grating proximate a distal end thereof and a mass of sensor material coupled to the distal end of the optical fiber. The mass of sensor material is suspended from above the fiber Bragg grating. Other systems for sensing a condition in a wellbore include an optical fiber and a plurality of fiber Bragg gratings along a length thereof. A plurality of sensor materials are coupled to the optical fiber and surround respective fiber Bragg gratings.

Abstract: To bring color, described by Lab values only, back into the spectral domain the invention discloses a method for automatically generating reflectance spectrum values from tristimulus values using a computer system administrating a database with data matrices of reflectance spectra of different colors differentiated by at least the process parameters print technology, substrate and print order of inks, wherein a) given tristimulus values of a color are classified with regard to the process parameters, b) in the database the data matrices of reflectance spectra of the respective color with the most matching process parameters are identified and c) the identified data matrix is used to define the reflectance spectrum values for the respective color.

Abstract: Methods and systems for monitoring etch or deposition processes using image-based in-situ process monitoring techniques include illuminating a measurement area on a sample disposed in a process chamber. The measurement area is illuminated using an input beam generated remote from the process chamber and transmitted to a first viewing window of the process chamber by a first optical fiber. Portions of the first input beam reflected from the measurement area are transmitted from the first viewing window to an imaging sensor by a second optical fiber. A sequence of images is obtained at the imaging sensor, and a change in reflectance of pixels within each of the images is determined. The etch or deposition process is monitored based on the change in reflectance.

Abstract: An apparatuses relating generally to a test wafer, processing chambers, and method relating generally to monitoring or calibrating a processing chamber, are described. In one such an apparatus for a test wafer, there is a platform. An optical fiber with Fiber Bragg Grating sensors is located over the platform. A layer of material is located over the platform and over the optical fiber.

Abstract: An optical module with a reduced size but improved imaging includes a light source, a first lens, at least two first reflectors, at least two second reflectors, and a diffracting optical element. The first reflectors and the second reflectors are both inside the first lens and alternately arranged along an optical path of emitted light, which changes and lengthens its transmission path for face recognition focusing or similar purposes. An electronic device using the optical module is also provided.

Abstract: An airborne or liquid particle sensor with a number of advanced features is disclosed. The sensor includes an output channel generating an electrical signal for a particle passing through the sensor, where the electrical signal includes information related to the pulse. The information is processed by the sensor to determine a value that indicates a more accurate particle mass for a sample period than the average mass.

Abstract: An airborne or liquid particle sensor with a number of advanced features is disclosed. The sensor includes an output channel generating an electrical signal for a particle passing through the sensor, where the electrical signal includes information related to the pulse. The information is processed by the sensor to determine a value that indicates a more accurate particle mass for a sample period than the average mass.

Abstract: A method for expressing multiple types of numerical information using the features of SERS-active nanostructures is disclosed. The method includes: associating a SERS signal with numerical information; applying, to one or more positions a, b, d on a physical object e, nanotags including an aggregate of noble metal nanoparticles with an average diameter of 100 nm or less and a Raman-active chemical substance; irradiating the applied nanotag with a laser; reading the SERS signal generated by the irradiation; and acquiring the numerical information from the read SERS signal on the basis of the association. The nanotags derive from one or more types of nanotag ink A, B, D (FIG. 1). The substance is present on the surface of or in the vicinity of the aggregate and generates SERS.

Abstract: An airborne or liquid particle sensor with a number of advanced features is disclosed. The sensor includes an output channel generating an electrical signal for a particle passing through the sensor, where the electrical signal includes information related to the pulse. The information is processed by the sensor to determine a value that indicates a more accurate particle mass for a sample period than the average mass.

Abstract: A metrology apparatus for and a method of determining a characteristic of interest relating to at least one structure on a substrate. The metrology apparatus comprises a sensor and an optical system. The sensor is for detecting characteristics of radiation impinging on the sensor. The optical system comprises an illumination path and a detection path. The optical system is configured to illuminate the at least one structure with radiation received from a source via the illumination path. The optical system is configured to receive radiation scattered by the at least one structure and to transmit the received radiation to the sensor via the detection path.

Abstract: A device for detection of surface defects on a terminal surface of an optical fiber. The device includes a digital microscope configured to capture an image of a terminal surface; and a mechanism for analyzing the image configured to detect surface defects present on the terminal surface, the analysis mechanism integrating a “U-Net”-type neural network having had its training phase carried out via an enhancer. The enhancer is configured to create training images, intended to train the neural network, based on reference images. The training images are obtained from the reference images by only applying flips, rotations and/or luminosity, contrast, or shade variations to the reference images.

Abstract: An instrument and method for analyzing a gas leak. The instrument can obtain a time series of spectra from a scene. The instrument can compare spectra from different times to determine a property of a gas cloud within the scene. The instrument can estimate the column density of the gas cloud at one or more locations within the scene. The instrument can estimate the total quantity of gas in the cloud. The instrument can estimate the amount of gas which has left the field of view of the instrument. The instrument can also estimate the amount of gas in the cloud which has dropped below the sensitivity limit of the instrument.

Abstract: The imaging camera includes the high-sensitivity pixel with the spectral sensitivity characteristic having high sensitivity to a light of the wavelength to be irradiated to the solder (target), and the low-sensitivity pixel with the spectral sensitivity characteristic having low sensitivity to this light. This allows the pattern light reflected in the high-reflection area of the surface of the solder to be converted to an appropriate pixel value using the low-sensitivity pixel, while allowing the pattern light reflected in the low-reflection area of the surface of the solder to be converted to an appropriate pixel value using the high-sensitivity pixel. Namely, both the pattern lights reflected in the high-reflection area and the low-sensitivity pixel can be converted to appropriate pixel values. In this way, even if the solder has both the high-reflection area and the low-sensitivity pixel, acquisition of accurate pixel values is allowed for both of these areas.