Abstract: The present disclosure includes systems and methods for testing bundles of fiber optic fibers, such as fiber optic trunk cables, for correct polarity of connections at each end of the bundle of fibers while preventing the fiber optic fibers from contacting any other components during testing. The systems include a processor, a plurality of signal generators interfaced with a plurality of signal generator ports, a sensor interfaced with a sensor input port, a first selector switch, and a display, the processor operable to stimulate the plurality of signal generators one at a time in a first sequence to produce a signal, the first sequence based on a position of the first selector switch, the processor further operable to cause the display to display an output of the sensor.

Abstract: In gas analyzing apparatuses, interference noises should be reduced. A gas analyzing apparatus for analyzing component included in measuring object gas, including: a light emitting unit to irradiate laser light to the measuring object gas; a light receiving unit to receive the laser light having passed through the measuring object gas; an actuating unit to change an optical path length of the laser light by moving at least one optical element that is arranged in a light path where the laser light is passing; and a calculating unit to calculate concentration of the measuring object gas, based on signals detected by the light receiving unit in two states where the optical element is at different positions by n/2 times the wavelength of the laser light (where, n is integer) is provided.

Abstract: A sampling gate comprising a first frequency input coupled to a first frequency path from a broadband photodiode. The sampling gate also includes a positive bias input coupled to a positive offset portion of a second frequency path from the broadband photodiode. The sampling gate also includes a negative bias input coupled to a negative offset portion of the second frequency path from the broadband photodiode. The sampling gate combines a first frequency signal from the first frequency path and a second frequency signal from the second frequency path to create a combined broadband frequency signal from the broadband photodiode.

Abstract: Methods and systems disclosed herein can measure thin film stacks, such as film on grating and bandgap on grating in semiconductors. For example, the thin film stack may be a 1D film stack, a 2D film on grating, or a 3D film on grating. One or more effective medium dispersion models are created for the film stack. Each effective medium dispersion model can substitute for one or more layers. A thickness of one or more layers can be determined using the effective medium dispersion based scatterometry model. In an instance, three effective medium dispersion based scatterometry models are developed and used to determine thickness of three layers in a film stack.

Abstract: In one example, a structure for surface enhanced Raman spectroscopy includes a cluster of metal nanoparticles in a hole.

Abstract: The invention relates to a system for recording and representing measurement points (M1, M2, . . . ) on a body surface, with a pair of smart glasses and a position measurement device. The pair of smart glasses has a head-up display and records one or two coordinates of each measurement point by means of a position sensor unit of the smart glasses, or, provided that one or two coordinates of a measurement point of the smart glasses is or are already known, represents graphically the position of the measurement point on the body surface in accordance with the known coordinate(s) by means of the head-up display. The position measurement device has a laser light source and an optical detector, which can be positioned at the respective measurement point on the body surface and includes a sensor surface for recording impingement points of the laser light of the laser light source.

Abstract: For three-dimensional topography measurement of a surface of an object patterned illumination is projected on the surface through an objective. A relative movement between the object and the objective is carried out, and plural images of the surface are recorded through the objective by a detector. The direction of the relative movement includes an oblique angle with an optical axis of the objective. Height information for a given position on the surface is derived from a variation of the intensity recorded from the respective position. Also, patterned illumination and uniform illumination may be projected alternatingly on the surface, while images of the surface are recorded during a relative movement of the object and the objective along an optical axis of the objective. Uniform illumination is used for obtaining height information for specular structures on the surface, patterned illumination is used for obtaining height information on other parts of the surface.

Abstract: A particle-measuring apparatus (1) has an optical particle sensor (2, 3, 5, 6). By means of the optical particle sensor (2, 3, 5, 6) a particle mass concentration in an aerosol volume can be detected. Furthermore, the particle-measuring apparatus (1) has a measurement chamber (7), in which the aerosol volume to be examined with regard to the particle mass concentration by means of the optical particle sensor (2, 3, 5, 6) can be received, and a conveying device (11), by means of which the aerosol can be introduced into the measurement chamber (7). In order to prevent the particle-measuring apparatus (1) from being adversely affected during operation as a result of dirt or particle deposits, it is proposed that the delivery rate of the conveying device (11) of the particle-measuring apparatus (1) is adjustable.

Abstract: An improved method for integrating curve peaks as compared to techniques such as the trapezoidal rule wherein integration parameters are at fixed x-axis positions. Integration parameters are instead specified relative to a peak center, which allows the peak to shift over time due to hardware changes, temperature fluctuation, pressure changes, etc., while maintaining integration parameters at optimal locations for that peak. As such, the present disclosure finds particular utility in spectroscopy wherein, in the case of Raman spectroscopy, for example, specific wavenumber shift locations may drift over time, leading to inaccurate results based upon absolute integration parameters.

Abstract: The invention relates to an optical sensor system, which is designed to interact with a mobile computer device, which has at least one light source and at least one camera, wherein the sensor system has at least one incoupling interface for coupling light from the light source of the computer device into the sensor system and at least one outcoupling interface for coupling light from the sensor system out to the camera of the computer device, wherein the sensor system has at least one optical light-guiding path, by means of which the outcoupling interface is optically connected to the incoupling interface, wherein at least one sensor designed to modify the light guided by the light-guiding path according to a physical quantity influencing the sensor system from outside is arranged in the light-guiding path, wherein at least one sensor designed to modify the light guided by the light-guiding path according to an influencing quantity influencing the sensor system from outside is arranged in the light-guiding pa

Abstract: An automated tablet tooling inspection system (100) for inspecting defects in tablet tooling's including upper punch, lower punch and die. The system (100) comprising of a base plate (101), a punch holder (102), a punch stopper (103), a die holder (104), a LM rail and carriage assembly (105), a LED Micrometer (107) to measure parameters of said tablet tooling, a Laser sensor or con focal sensor (108) to measure parameters of said tablet tooling and a control unit. The automated tooling inspection and system (100) reduces the inspection time of said tablet tooling by minimizing manual intervention; wherein said manual intervention is reduced by eliminating the requirement of changing configuration of said system (100) when a different type of tablet tooling is inspected such as TSM/Euro, B, D, BD, BB and BBS and the like.

Abstract: A fluid analyzer includes a substrate, a quantum cascade laser formed on a surface of the substrate and including a first light-emitting surface and a second light-emitting surface facing each other in a predetermined direction parallel to the surface, a quantum cascade detector formed on the surface and including the same layer structure as the quantum cascade laser and a light incident surface facing the second light-emitting surface in the predetermined direction, and an optical element disposed on an optical path of light emitted from the first light-emitting surface across an inspection region in which a fluid to be analyzed is to be disposed and reflecting the light to feed the light back to the first light-emitting surface.

Abstract: An optical detection system includes a sample portion accommodating a sample, a wave source emitting waves to the sample portion, an optical portion provided on a path of an output wave output from the sample portion, and comprising a first spatial light modulator that modulates part of the output wave to a first wave and a second spatial light modulator that modulates part of the output wave to a second wave, a lens portion focusing the first wave and the second wave output from the optical portion, and a detection portion detecting a focused wave that is focused by the lens portion, in which the first spatial light modulator and the second spatial light modulator modulate the output wave such that the first wave and the second wave have destructive interference with respect to the sample under an already known condition.

Abstract: A diagnosis apparatus includes a fiber optic sensor, a collection processor, and a self-diagnosis processor. The fiber optic sensor is configured to be disposed over a target. The collection processor is configured to perform a collection process that collects measurement data related to the target obtained by the fiber optic sensor. The self-diagnosis processor is configured to perform a self-diagnosis process before the collection processor starts the collection process. The self-diagnosis process obtains an output value related to calibration of the fiber optic sensor, causes the collection processor to start the collection process when the output value falls within a proper range, and outputs an error when the output value falls outside the proper range.

Abstract: An OTDR system utilizes a laser source that is turned “on” and kept powered until its light reaches the end of the fiber span being measured (i.e., until the fiber span is fully illuminated). At any point in time after the fiber is fully illuminated, the laser source can be turned “off”. The return (reflected and backscattered) signal is directed into a photodetector of the OTDR, and is measured from the point in time when the fiber span starts to be illuminated. The measurements are made by sampling the return signal at predetermined time intervals—defined as the sampling rate. The created power samples are then subjected to post-processing in the form of a differentiation operation to create a conventional OTDR trace from the collected data.

Abstract: A method includes receiving one or more images of three or more die of a wafer, determining a median intensity value of a set of pixel intensity values acquired from a same location on each of the three or more die, determining a difference intensity value for the set of pixel intensity values by comparing the median intensity value of the set of pixel intensity values to each pixel intensity value, grouping the pixel intensity values into an intensity bin based on the median intensity value of the set of pixel intensity values, generating an initial noise boundary based on a selected difference intensity value in the intensity bin, generating a final noise boundary by adjusting the initial noise boundary, generating a detection boundary by applying a threshold to the final noise boundary, and classifying one or more pixel intensity values outside the detection boundary as a defect.

Abstract: Disclosed are methods and apparatus for detecting defects or reviewing defects in a semiconductor sample. The system has a brightfield (BF) module for directing a BF illumination beam onto a sample and detecting an output beam reflected from the sample in response to the BF illumination beam. The system has a modulated optical reflectance (MOR) module for directing a pump and probe beam to the sample and detecting a MOR output beam from the probe spot in response to the pump beam and the probe beam. The system includes a processor for analyzing the BF output beam from a plurality of BF spots to detect defects on a surface or near the surface of the sample and analyzing the MOR output beam from a plurality of probe spots to detect defects that are below the surface of the sample.

Abstract: An arithmetic device includes an imaging section adapted to take an image of the measurement object, a relative phase calculation section adapted to calculate a relative phase, and a projection control section adapted to perform a first pattern projection and a second pattern projection, and the relative phase calculation section adapted to obtain a grayscale image of a measurement object on which light is projected due to the first pattern projection and a grayscale image of the measurement object on which light is projected due to the second pattern projection from the imaging section to calculate the relative phase using the grayscale images obtained.

Abstract: A spectrophotometer is provided, which comprises a receiving part diffusing an incident light, a first broadband filter group, and a detector detecting the light having passed through the first broadband filter group, in order to easily select and detect a plurality of lights having specific wavelengths, wherein the first broadband filter group comprises a first broadband filter arranged to have a first angle with respect to an incident direction of light to enable the incident light to pass through a first wavelength band, a second broadband filter arranged to have a second angle, which is different from the first angle, with respect to an incident direction of light to enable the light having passed through the first broadband filter to pass through a second wavelength band, and a first path compensation means for adjusting a path of the light having passed through the second broadband filter to be identical to a path of the light having passed through the first broadband filter, wherein the first broadband

Abstract: Provided are methods and systems for identification and analysis of materials and molecular structures. An apparatus for identification and analysis of materials and molecular structures may include a laser. The laser may, in turn, include an amplified spontaneous emission-suppressed single-frequency laser excitation source. The apparatus may further comprise a plurality of filters. The plurality of filters may include reflective volume holographic grating blocking filters. The apparatus may also comprise an optical unit and an optical spectrometer. The optical unit may be configured to deliver excitation energy to a sample substance and capture Raman signal scattering from the sample substance. The optical spectrometer may be disposed in a path of the Raman signal and configured to measure a spectrum of the Raman signal and generate a detection signal. Finally, the apparatus may comprise a processing unit configured to analyze the spectrum.