Abstract: The disclosure relates to a method for detecting single molecule. The method includes: providing a carrier; detection disposing a single molecule sample on the carrier, and detecting the single molecule sample with a detector. The carrier includes a substrate and a metal layer on the substrate, wherein the substrate includes a base and a patterned bulge located on a surface of the base, the patterned bulge includes a number of strip-shaped bulges intersected with each other to form a net and define a number of holes, and the metal layer is located on the patterned bulge. The method is more accurate because the carrier has a relative higher SERS and can enhance the Raman scattering.

Abstract: The disclosure relates to a carrier for single molecule detection. The carrier includes a substrate and a metal layer on the substrate, wherein the substrate includes a base and a patterned bulge located on a surface of the base, the patterned bulge includes a number of strip-shaped bulges intersected with each other to form a net and define a number of holes, and the metal layer is located on the patterned bulge. The carrier for single molecule detection has a relative higher SERS and can enhance the Raman scattering.

Abstract: An embodiment of a method and system for inspecting clear and printed contact lenses is provided. A contact lens is inspected by illuminating the contact lens using bright-field illumination and low-angle dark-field illumination simultaneously, when the contact lens is disposed in a cavity between a male mold and a female mold. Further, the light emerging from the contact lens is received by an imaging optical system, and a camera uses the light received by the imaging optical system to capture an image of the contact lens. Further, a data processing system is configured to identify dark defects in the image that are in a first portion of a dynamic range of brightness, and to identify bright defects in the image that are in a second portion of the dynamic range of brightness.

Abstract: A device for determining alignment errors of structures which are present on, or which have been applied to a substrate, comprising a substrate holder for accommodating the substrate with the structures and detection means for detecting X-Y positions of first markings on the substrate and/or second markings on the structures by moving the substrate or the detection means in a first coordinate system, wherein in a second coordinate system which is independent of the first coordinate system X?-Y? structure positions for the structures are given whose respective distance from the X-Y positions of the first markings and/or second markings can be determined by the device.

Abstract: Reflectometer, spectrophotometer, ellipsometer, and polarimeter systems having a supercontinuum laser source of coherent electromagnetic radiation over a range of about 400-about 2500 nm, a stage for supporting a sample and a detector of electromagnetic radiation, wherein the supercontinuum source provides a coherent beam of electromagnetic radiation which interacts with a sample, and the detector system comprises functional combinations of gratings and/or combination dichroic beam splitter-prisms, which themselves can be optimized as regards wavelength dispersion characteristics, directs wavelengths in various ranges to various detectors that are well suited to detect them.

Abstract: Disclosed are methods and apparatus for optimizing a mode of an inspection tool. A first image or signal for each of a plurality of first apertures of the inspection tool is obtained, and each first image or signal pertains to a defect area. For each of a plurality of combinations of the first apertures and their first images or signals, a composite image or signal is obtained. Each composite image or signal is analyzed to determine an optimum one of the combinations of the first apertures based on a defect detection characteristic of each composite image. In one aspect, determining an optimum one of the combinations of the first apertures includes selecting a set of one or more individual apertures that result in the highest signal to noise ratio for the defect area, and the method includes setting the optimum combination of the first apertures on the inspection tool and inspecting a sample using such optimum combination of the first apertures.

Abstract: A drift-adjusted interferometer and optical trap are disclosed that employ two reference beams with an optical property that allows them to be separated from the two trapping beams. The reference and trapping beams are combined collinearly and optically inverted so that each reference beam overlays with the opposite trapping beam. Each pair of beams is then focused on a microsphere and the resulting four back-focal plane interferometry signals are monitored such that the relative motion between a given trapping beam with its overlaid reference beam provides a direct measurement of the physical drift occurring due to mechanical drift of the differential path components.

Abstract: A multi-modal imaging and optical property measurement device that is integrated into an interferometer. Data acquired by the multiple imaging modalities in parallel include measurements of single-scattered, multiple-scattered, and diffuse light that enable characterization of different ranges within different depth regions in the sample. The system includes different interferometer configurations and different imaging modalities, and has a signal-processing unit that associates and co-registers interferometric, multi-spectral, and polarization sensitive measurements to derive and analyze optical properties of a sample and enhance an image display of the sample.

Abstract: A hand-held measurement device for appearance analyzes includes a measurement array which comprises a number of illumination means for applying illumination light to a measurement field in at least three illumination directions and a number of pick-up means for capturing the measurement light in at least one observation direction. The illumination directions and the observation directions lie in a common system plane. At least one pick-up means is embodied to spectrally gauge the measurement light in a locally integral way, and at least one imaging pick-up means is embodied to gauge the measurement light in terms of color in a locally resolved way. The spectral pick-up means and the locally resolving pick-up means are arranged such that they receive the measurement light reflected by the measurement field under the same observation conditions and in particular from the same observation direction.

Abstract: A Time Domain Optical Coherence Tomography system using a modulation scheme multiplexes the scanning range of the delay line into different spectral bands. Such a modulation scheme may allow for power consumption reduction compared with a single delay line element since the same modulation pattern is being used for several channels. In an example, the optical coherence tomography system may include a plurality of stages, each stage having a group delay element. The distinct group delays may be introduced to scan a sample with distinct electrical frequency bands at distinct axial scanning depth ranges.

Abstract: A method and device for non-contact detection of a thin medium (5) is disclosed. The device comprises a light source (1), an optical splitter (2), a reference plane (3), a linearly arrayed photoelectric detector (6), a signal processing module (4) and the thin medium (5).

Abstract: An arrangement for the spectrometric measurement of products, such as cereals, oleaginous products, or derived products, includes a mechanism for selective adjustment of the position of a light beam in vertical and horizontal planes, and a selective adjustment device for ensuring that rays of the light beam are parallel.

Abstract: Systems and methods for measuring the angular position of a laser beam emitter using only distance measurements. What is physically measured is a feature that is affixed to the laser beam emitter and moves with it. Respective distances which are respective functions of the azimuth and zenith angles are measured using respective position encoders. In accordance with some embodiments, the respective distances are measured using linear encoders (optical or magnetic); in accordance with other embodiments, the respective distances are measured using laser interferometer-based encoders.

Abstract: A probe for an optical measurement system includes a probe body arranged to be adjustably mounted in a measuring machine for optically measuring a test object. A single mode fiber optically coupled within the probe body transmits a source beam having an instantaneous or sequentially established bandwidth spanning a range of wavelengths to the probe body and also transmits a measurement beam from the probe body toward a detector. An adjustable beam manipulator within the probe body spatially excludes portions of the reference beam over a progression of different size portions from being focused within the acceptance cone of the single mode fiber to more closely balance the intensities of the reflected object beam and the reflected reference beam within the measurement beam.

Abstract: The present invention provides a plasma spectrochemical analysis method that can be carried out easily and achieves high analytical sensitivity, and includes: a step of concentrating an analyte in a sample in the vicinity of at least one of a pair of electrodes by applying a voltage to the pair of electrodes in the presence of the sample; and a step of generating plasma by applying a voltage to the pair of electrodes and detecting light emitted from the analyte excited by the plasma.

Abstract: An OCT apparatus includes: a light source unit that includes first and second wavelength sweeping light sources which sequentially emit light with first and second spectrum bandwidths; an SS-OCT optical system that splits the light into measurement light and reference light to receive interference signal light; a second detector that is a deviation detector detecting a phase deviation and a wavelength deviation and detects a signal including pieces of FPN; a calculation processor connecting first and second spectrum interference signals and processes the connected spectrum interference signals to acquire an OCT image and that obtains the phase deviation and the wavelength deviation; and a correction unit that corrects the phase deviation and the wavelength deviation and corrects the phase deviation and the wavelength deviation obtained by the calculation processor.

Abstract: A control computation unit causes an optical modulator to change a polarization state to shift a phase of polarized light with which an object is irradiated, computes a spatial gradient of tomographic distribution of phase difference of an interference signal on the basis of phase differences of interference signals each obtained by each phase shift of the polarized light, and visually displays tomographic distribution of spatial gradient in association with tomographic distribution of stress on the display device. The control computation unit computes deformation rate vector distribution at cross-sectional positions of the object on the basis of optical interference signals, and further computes tomographic distribution of strain rate tensor.

Abstract: Methods and corresponding metrology modules and systems, which measure metrology parameter(s) of a previous layer of a metrology target and/or an alignment mark, prior to producing a current layer of the metrology target, derive merit figure(s) from the measured metrology parameter(s) to indicate an inaccuracy, and compensate for the inaccuracy to enhance subsequent overlay measurements of the metrology target. In an example embodiment, methods and corresponding metrology modules and systems use stand-alone metrology tool(s) and track-integrated metrology tool(s) at distinct measurement patterns to address separately different aspects of variation among wafers.

Abstract: The light projection assemblies and opacity monitors described in this specification have an integrating sphere with an input aperture, an output aperture, and a spherical-shaped internal chamber. An LED source is located external to the chamber at the input aperture. A light baffle is located within the chamber at the output aperture. A condenser lens is located external to the chamber at the output aperture.

Abstract: A disposable set (100) includes a tube; and a sensing member (104) press-fittingly insertable into the tube, the sensing member including: a first end (106) having a first diameter and including at least one through hole (112) positioned along a perimeter of the first end; a second end (108) having a second diameter and including at least one through hole positioned along a perimeter of the second end, the first diameter and the second diameter being substantially equal to an interior diameter of the tube; and a middle portion (110) located between the first end and the second end having a diameter that is less than the first diameter, the middle portion including at least one SERS sensing element (114), wherein the through holes in the first and second ends enable fluid to pass through the sensing member.