Abstract: A system for wide-range spectral measurement includes one or more broadband sources, an adjustable Fabry-Perot etalon, and a detector. The one or more broadband sources is to illuminate a sample, wherein the one or more broadband sources have a short broadband source coherence length. The adjustable Fabry-Perot etalon is to optically process the reflected light to extract spectral information with fine spectral resolution. The detector is to detect reflected light from the sample, wherein the reflected light is comprised of multiple narrow-band subsets of the illumination light having long coherence lengths and is optically processed using a plurality of settings for the adjustable Fabry-Perot etalon, and wherein the plurality of settings includes a separation of the Fabry-Perot etalon plates that is greater than the broadband source coherence length.

Abstract: In an example implementation, a method includes illuminating a wafer with excitation light having a wavelength and intensity sufficient to induce photoluminescence in the wafer. The method also includes detecting photoluminescence emitted from a portion of the wafer in response to the illumination, and detecting excitation light reflected from the portion of the wafer. The method also includes comparing the photoluminescence emitted from the portion of the wafer and the excitation light reflected from the portion of the wafer, and identifying one or more defects in the wafer based on the comparison.

Abstract: A spectrometer includes an illuminating section; a receiving section configured to detect radiation reflected from an object including an optically inhomogeneous scattering medium; a hardware section configured to obtain a solution of an inverse problem to reconstruct an absorption spectrum of the optically inhomogeneous scattering medium, wherein the illuminating section includes at least one light-emitting diode source, a radiation spectral curve of which is divided, by at least two spectral filters having different spectral transmission curves, into at least two spectral regions, to form an equivalent radiation spectrum from at least two spectral sources, and wherein the hardware section applies the solution of the inverse problem based on information about a spectral content of the radiation of the illuminating section, a signal obtained in a form of a response from the optically inhomogeneous scattering medium, and a spectral sensitivity curve of the receiving section.

Abstract: The present invention is directed to a system and method for on-line real-time measuring the surface topography and out-of-plane deformation by using phase-shifting shadow moiré method. Digital Phase-Shifting Shadow Moiré Method is applied to a system, which receives the reflected images from the surface of transparent or non-transparent plate projected under a light beam passing through a grating. Next, by image correction program, the skewed interference fringe pattern is recovered to the image as if the image acquisition equipment is placed normal to the surface. Furthermore, the received images are processed with Phase-Shifting to show the surface topography of the plate.

Abstract: The present invention relates to the method and device to determination of the properties of gemstones and more particularly evolution of gemstone by detection of internal and external structure of gemstone. In particular, the present invention methods and device is used to identify the size, location of impurities/defects in raw gemstone with the help of optimize spectroscopy scanning. The present invention method and device is used for precise automatic evolution of gemstones and possibilities (estimation) of final value of planned gemstone after remaining gemstone processing cycle.

Abstract: A carrier concentration measuring method and an apparatus thereof including a focuser, a spectrometer and a processor are disclosed. The measuring method includes the following steps. Project a laser beam to an object. Analyze a Raman signal, obtained from a radiation propagating from the object projected by the laser beam, to obtain a measurement result of the object. Analyze the measurement result to obtain an intensity ratio or a Raman shift. Look up a carrier concentration of the object in a database according to the intensity ratio or the Raman shift.

Abstract: An optical probe includes an optical fiber with a first end and a second end, and an enhanced surface on a portion of the first end of the optical fiber. The enhanced surface includes a patterned base layer including multiple protruding nano-pyramids, an intermediate layer over the patterned base layer, and a graphene layer over the intermediate layer. Using a layer of graphene to cover the enhanced surface increases the sensitivity of a surface-enhanced Raman spectroscopy (SERS) process performed in conjunction with the enhanced surface, and further increases the chemical stability and bio-compatibility of the enhanced surface. Further, placing the enhanced surface at the end of the optical fiber provides a self-contained probe for use with a SERS process, thereby allowing for in-vivo characterization of a sample.

Abstract: There are provided a localized surface plasmon resonance sensing chip in which a linewidth of an absorption spectrum originating from localized plasmon resonance is narrow and with which a peak wavelength shift of an optical spectrum accompanying a change in refractive index of a surface can be accurately measured, and a localized surface plasmon resonance sensing system using this sensing chip. A sensing chip 10 includes a base 14 having a flat-plate shape, a plurality of protruding portions 16, and a metal layer 18 covering each front surface of the plurality of protruding portions 16. The protruding portions 16 each have a shape like a semi-oblate spheroid which is one of three-dimensional parts obtained by dividing an oblate spheroid in half along an equatorial plane and are arranged such that a divided surface 16a of the semi-oblate spheroid faces a front surface 14a of the base 14.

Abstract: An optical filter includes: a first variable wavelength bandpass filter that can extract light of a first wavelength band (400 to 460 nm), the first wavelength band having a first spectral band having a central wavelength equal to a first wavelength in the first wavelength band and a second spectral band having a central wavelength equal to a second wavelength in the first wavelength band; and a second variable wavelength bandpass filter that can extract light of a second wavelength band (480 to 540 nm) adjacent to the first wavelength band, the second wavelength band having a third spectral band having a central wavelength equal to a third wavelength in the second wavelength band and a fourth spectral band having a central wavelength equal to a fourth wavelength in the second wavelength band.

Abstract: A measurement system includes a light source having semiconductor sources configured to generate an input optical beam, a multiplexer configured form an intermediate optical beam from the input optical beam, fibers including a fused silica fiber configured to receive the intermediate optical beam and to form an output optical beam. The output optical beam comprises wavelengths between 700 and 2500 nanometers with a bandwidth of at least 10 nanometers. A measurement apparatus is configured to deliver the output beam to a sample to generate a spectroscopy output beam. A receiver is configured to receive and process the spectroscopy output beam to generate an output signal, wherein the receiver processing includes chemometrics or multivariate analysis methods to permit identification of materials within the sample, the light source and the receiver are remote from the sample, and the sample includes plastics or food industry goods.

Abstract: A tiltmeter to measure a variation in inclination of a structure from a given starting position. The tiltmeter has two pots, each pot contains an identical volume and identical height of an identical liquid. A communication device connects the two pots and allows the liquid to flow between the two pots by the principle of communicating vessels. Two optical measuring devices are provided, one optical measuring device per pot. Each optical measuring device measures a variation in height of the level of liquid in the associated pot. The optical measuring devices are fiber optic devices coupled to a common light source.

Abstract: One or more embodiments are directed to optical test instruments, such as fiber optic inspection scopes and optical power meters, for testing optical communication links, such as fiber optic connectors. The optical test instruments include a single test port that is able to operate in two modes of operation. In a first mode of operation, the optical test instrument is configured to provide an image of the endface of a fiber optic connector under test. In a second mode of operation, the optical test instrument is configured to measure power or power loss in an optical fiber under test. In that regard, the fiber optic connector only has to be coupled to a single port of an optical test instrument for a visual inspection of an endface of a fiber optic connector and a power test of the optical fiber under test.

Abstract: A method of testing an electrode paste for producing an electrode for a secondary battery includes preparing an electrode paste obtained by kneading at least active material particles and water dispersible binder particles in an aqueous solvent; performing centrifugation on the electrode paste and collecting a supernatant containing the binder particles, and a free active material; and measuring an absorbance of the supernatant at an evaluation wavelength by using a spectrophotometer, wherein the evaluation wavelength is determined based on a relationship between an average particle size of the binder particles and the absorbance of the supernatant such that a proportion of an absorbance resulting from the binder particles in the absorbance of the supernatant becomes equal to or less than 30%, the relationship being determined in advance; and determining a quality of the electrode paste, based on the absorbance of the supernatant at the evaluation wavelength.

Abstract: An optical measurement method in which a series of light pulses are generated using a pulsed laser having a set of different mode hop sequences (e.g., an external-cavity quantum cascade laser (EC-QCL)), the light pulses are detected with the detector to generate a respective pulse data set for each of the light pulses, and the pulse data sets are sorted into classes based on correlation coefficients. Sorting the pulse data sets into classes allows the pulse data sets originating from each of the mode hop sequences of the pulsed laser to be treated independently of the pulse data sets originating from others of the mode hop sequences in subsequent processing.

Abstract: A detachable diffuse reflectance spectroscopy sample spinner (2) for use with a spectrometer (1) in diffuse reflectance spectroscopy. The sample spinner (2) comprises a sample receiving turntable (23) mounted for rotation and a motor unit (5) comprising a motor for rotatingly driving the turntable (23). The spinner (2) can comprise wireless electrical power receiver means (54) for receiving electrical power wirelessly for powering the motor (5).

Abstract: Disclosed is a spectroscopy device, including an analysis zone for receiving a sample; at least one light-emitting diode arranged to emit a light beam towards the analysis zone, having a luminous intensity spectral profile in a working wavelength interval; unit for varying with time the luminous intensity spectral profile emitted by the diode in the working wavelength interval of the diode; a detector, arranged to receive, during a variation with time of the luminous intensity spectral profile emitted by the diode, the light beam emitted by the diode and having crossed the analysis zone, and supplying a detection signal of the light beam emitted by the diode and received by the detector, in the form of a signal which depends on at least one characteristic representative of the luminous intensity spectral profile of the light-emitting diode. Application to derivative spectroscopy.

Abstract: An interferometric measurement method aims at calculating angular misalignment between fiber and ferrule axes for single fiber ferrules. The misalignment is measured by scanning side surface of reference fiber inserted into the ferrule and side surface of the ferrule. For single fiber connectors and ferrules, the method also aims at calculating fiber core concentricity and ferrule circularity and for single fiber connectors, end face angle of polish. The concentricity, the circularity and the angle of polish are measured by scanning side surface of the ferrule and end face of the connector or ferrule. Interferometric data from the side surfaces of the reference fiber and the ferrule, or from the end face of the connector or ferrule and the side surface of the ferrule, is gathered during one scanning session—either one simultaneous scan or several scans without moving or re-inserting the connector or ferrule.

Abstract: A method for providing film-thickness analysis with a spectrophotometer includes configuring an illuminator to emit a light beam at a film deposited on a substrate surface, configuring a linear sensor to receive light reflecting off the deposited film on the substrate surface via a gradient index lens and a linear variable filter, and configuring a processor to determine thickness of the film based on spectral reflectivity of the film received from the linear sensor.

Abstract: Methods and systems for performing broadband spectroscopic metrology with reduced sensitivity to focus errors are presented herein. Significant reductions in sensitivity to focus position error are achieved by imaging the measurement spot onto the detector such that the direction aligned with the plane of incidence on the wafer surface is oriented perpendicular to the direction of wavelength dispersion on the detector surface. This reduction in focus error sensitivity enables reduced focus accuracy and repeatability requirements, faster focus times, and reduced sensitivity to wavelength errors without compromising measurement accuracy. In a further aspect, the dimension of illumination field projected on the wafer plane in the direction perpendicular to the plane of incidence is adjusted to optimize the resulting measurement accuracy and speed based on the nature of target under measurement.

Abstract: An optical time domain reflectometer (OTDR) system with an integrated high speed optical modulator is capable of operating at a speed similar to the OTDR pulse width to improve the measurement resolution and reduce the time required to acquire a high dynamic range OTDR measurement over existing approaches. ASICs can be used to control the modulator and generation of pulses. The high-speed optical modulator enables high resolution single-photon OTDR measurement by blocking out all return light except from the region of fiber under examination.